JP2005148027A5 - - Google Patents

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Publication number
JP2005148027A5
JP2005148027A5 JP2003390177A JP2003390177A JP2005148027A5 JP 2005148027 A5 JP2005148027 A5 JP 2005148027A5 JP 2003390177 A JP2003390177 A JP 2003390177A JP 2003390177 A JP2003390177 A JP 2003390177A JP 2005148027 A5 JP2005148027 A5 JP 2005148027A5
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JP
Japan
Prior art keywords
light
sample
refractive index
incident
index measuring
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JP2003390177A
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English (en)
Japanese (ja)
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JP2005148027A (ja
JP4316991B2 (ja
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Priority to JP2003390177A priority Critical patent/JP4316991B2/ja
Priority claimed from JP2003390177A external-priority patent/JP4316991B2/ja
Publication of JP2005148027A publication Critical patent/JP2005148027A/ja
Publication of JP2005148027A5 publication Critical patent/JP2005148027A5/ja
Application granted granted Critical
Publication of JP4316991B2 publication Critical patent/JP4316991B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2003390177A 2003-11-20 2003-11-20 屈折率測定装置および濃度測定装置 Expired - Fee Related JP4316991B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003390177A JP4316991B2 (ja) 2003-11-20 2003-11-20 屈折率測定装置および濃度測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003390177A JP4316991B2 (ja) 2003-11-20 2003-11-20 屈折率測定装置および濃度測定装置

Publications (3)

Publication Number Publication Date
JP2005148027A JP2005148027A (ja) 2005-06-09
JP2005148027A5 true JP2005148027A5 (enExample) 2007-03-01
JP4316991B2 JP4316991B2 (ja) 2009-08-19

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ID=34696646

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003390177A Expired - Fee Related JP4316991B2 (ja) 2003-11-20 2003-11-20 屈折率測定装置および濃度測定装置

Country Status (1)

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JP (1) JP4316991B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9291444B2 (en) 2009-04-23 2016-03-22 Konica Minolta Holdings, Inc. Light reflection mechanism, optical interferometer and spectrometric analyzer
WO2016152108A1 (ja) * 2015-03-25 2016-09-29 日本電気株式会社 光測定装置
CN108489936B (zh) * 2018-04-08 2024-03-19 吉林省富生医疗器械有限公司 一种家用型胱抑素c浓度快速测定仪及其测定方法

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