JP2005117025A5 - - Google Patents
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- Publication number
- JP2005117025A5 JP2005117025A5 JP2004249925A JP2004249925A JP2005117025A5 JP 2005117025 A5 JP2005117025 A5 JP 2005117025A5 JP 2004249925 A JP2004249925 A JP 2004249925A JP 2004249925 A JP2004249925 A JP 2004249925A JP 2005117025 A5 JP2005117025 A5 JP 2005117025A5
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- integrated circuit
- power supply
- voltage
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000009966 trimming Methods 0.000 claims 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/679,108 US7157813B2 (en) | 2003-10-03 | 2003-10-03 | Method and apparatus for mode selection for high voltage integrated circuits |
| US10/679,108 | 2003-10-03 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011025182A Division JP5214750B2 (ja) | 2003-10-03 | 2011-02-08 | 高電圧集積回路用のモード選択のための方法と装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005117025A JP2005117025A (ja) | 2005-04-28 |
| JP2005117025A5 true JP2005117025A5 (enExample) | 2007-09-13 |
| JP4761739B2 JP4761739B2 (ja) | 2011-08-31 |
Family
ID=34394098
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004249925A Expired - Fee Related JP4761739B2 (ja) | 2003-10-03 | 2004-08-30 | 高電圧集積回路用のモード選択のための方法と装置 |
| JP2011025182A Expired - Fee Related JP5214750B2 (ja) | 2003-10-03 | 2011-02-08 | 高電圧集積回路用のモード選択のための方法と装置 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011025182A Expired - Fee Related JP5214750B2 (ja) | 2003-10-03 | 2011-02-08 | 高電圧集積回路用のモード選択のための方法と装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (4) | US7157813B2 (enExample) |
| EP (2) | EP1528682B1 (enExample) |
| JP (2) | JP4761739B2 (enExample) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7157813B2 (en) | 2003-10-03 | 2007-01-02 | Power Integrations, Inc. | Method and apparatus for mode selection for high voltage integrated circuits |
| US7425834B2 (en) * | 2005-08-26 | 2008-09-16 | Power Integrations, Inc. | Method and apparatus to select a parameter/mode based on a time measurement |
| US7576528B2 (en) | 2006-10-04 | 2009-08-18 | Power Integrations, Inc. | Control circuit responsive to an impedance |
| US7518885B2 (en) | 2006-10-04 | 2009-04-14 | Power Integrations, Inc. | Method and apparatus for a control circuit with multiple operation modes |
| US7502236B2 (en) * | 2006-10-04 | 2009-03-10 | Power Integrations, Inc. | Power supply controller responsive to a feedforward signal |
| GB0812335D0 (en) * | 2008-07-05 | 2008-08-13 | Qinetiq Ltd | Circuit breaker |
| US8116106B2 (en) * | 2008-09-19 | 2012-02-14 | Power Integrations, Inc. | Method and apparatus to select a parameter/mode based on a measurement during an initialization period |
| CN101969304B (zh) * | 2010-09-09 | 2012-09-12 | 杭州士兰微电子股份有限公司 | 一种用于高压集成电路的脉冲发生电路及其方法 |
| JP2012112788A (ja) * | 2010-11-24 | 2012-06-14 | Seiko Instruments Inc | テストモード設定回路 |
| KR101887905B1 (ko) * | 2016-12-09 | 2018-08-13 | 현대오트론 주식회사 | 고전압 배터리 전압 모니터링 및 이상전압 진단 장치 및 방법 |
| EP4283852A1 (en) | 2018-07-12 | 2023-11-29 | Power Integrations, Inc. | Protecting semiconductor switches in switched mode power converters |
| US12021439B2 (en) | 2019-05-24 | 2024-06-25 | Power Integrations, Inc. | Switching delay for communication |
| US10998843B2 (en) | 2019-09-23 | 2021-05-04 | Power Integrations, Inc. | External adjustment of a drive control of a switch |
| US11418121B2 (en) | 2019-12-30 | 2022-08-16 | Power Integrations, Inc | Auxiliary converter to provide operating power for a controller |
| US11258369B2 (en) | 2020-02-19 | 2022-02-22 | Power Integrations, Inc. | Inductive charging circuit to provide operative power for a controller |
| US11437911B2 (en) | 2020-12-22 | 2022-09-06 | Power Integrations, Inc. | Variable drive strength in response to a power converter operating condition |
| US11979090B2 (en) | 2021-08-12 | 2024-05-07 | Power Integrations, Inc. | Power converter controller with branch switch |
| CN114123834B (zh) * | 2021-10-29 | 2024-03-29 | 广东汇芯半导体有限公司 | 半导体电路 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2721151B2 (ja) * | 1986-04-01 | 1998-03-04 | 株式会社東芝 | 半導体集積回路装置 |
| JPH01308059A (ja) * | 1988-06-07 | 1989-12-12 | Fujitsu Ltd | 半導体集積回路装置 |
| US5072136A (en) * | 1990-04-16 | 1991-12-10 | Advanced Micro Devices, Inc. | Ecl output buffer circuit with improved compensation |
| US5072138A (en) * | 1990-08-17 | 1991-12-10 | Sgs-Thomson Microelectronics, Inc. | Semiconductor memory with sequential clocked access codes for test mode entry |
| US5313381A (en) | 1992-09-01 | 1994-05-17 | Power Integrations, Inc. | Three-terminal switched mode power supply integrated circuit |
| JP3105808B2 (ja) * | 1997-01-24 | 2000-11-06 | 日本電気アイシーマイコンシステム株式会社 | 半導体装置およびこの半導体装置のモード設定方法 |
| JP3866444B2 (ja) * | 1998-04-22 | 2007-01-10 | 東芝マイクロエレクトロニクス株式会社 | 半導体装置及びその内部信号モニタ方法 |
| US6081466A (en) * | 1998-10-30 | 2000-06-27 | Stmicroelectronics, Inc. | Stress test mode entry at power up for low/zero power memories |
| US6388853B1 (en) | 1999-09-28 | 2002-05-14 | Power Integrations, Inc. | Method and apparatus providing final test and trimming for a power supply controller |
| WO2001040816A1 (en) * | 1999-11-29 | 2001-06-07 | Koninklijke Philips Electronics N.V. | A method and integrated circuit arranged for feeding a test forcing pattern on a single shared pin of the circuit |
| EP1132963B1 (en) * | 2000-03-08 | 2007-10-17 | Matsushita Electric Industrial Co., Ltd. | Semiconductor integrated circuit |
| US6407581B1 (en) | 2001-03-27 | 2002-06-18 | Microchip Technology Incorporated | High voltage multipurpose input/output circuit |
| JP2003174771A (ja) * | 2001-12-06 | 2003-06-20 | Matsushita Electric Ind Co Ltd | スイッチング電源装置 |
| US6603331B1 (en) | 2001-12-18 | 2003-08-05 | Xilinx, Inc. | Low-voltage non-degenerative transmitter circuit |
| US6784717B1 (en) * | 2002-08-28 | 2004-08-31 | Cypress Semiconductor Corporation | Input buffer system using low voltage transistors |
| US7592824B2 (en) * | 2003-02-26 | 2009-09-22 | Rambus Inc. | Method and apparatus for test and characterization of semiconductor components |
| US7183792B2 (en) * | 2003-04-01 | 2007-02-27 | Micron Technology, Inc. | Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same |
| US7157813B2 (en) * | 2003-10-03 | 2007-01-02 | Power Integrations, Inc. | Method and apparatus for mode selection for high voltage integrated circuits |
-
2003
- 2003-10-03 US US10/679,108 patent/US7157813B2/en not_active Expired - Fee Related
-
2004
- 2004-07-28 EP EP20040254520 patent/EP1528682B1/en not_active Expired - Lifetime
- 2004-07-28 EP EP20100176898 patent/EP2285001A1/en not_active Withdrawn
- 2004-08-30 JP JP2004249925A patent/JP4761739B2/ja not_active Expired - Fee Related
-
2006
- 2006-09-26 US US11/527,803 patent/US7385312B2/en not_active Expired - Fee Related
-
2008
- 2008-05-12 US US12/119,373 patent/US7535130B2/en not_active Expired - Fee Related
-
2009
- 2009-03-30 US US12/414,473 patent/US7804202B2/en not_active Expired - Fee Related
-
2011
- 2011-02-08 JP JP2011025182A patent/JP5214750B2/ja not_active Expired - Fee Related
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