JP2005099133A - Method for accelerated testing of deterioration in electrophotographic photoreceptor and electrostatic charger used for the same - Google Patents
Method for accelerated testing of deterioration in electrophotographic photoreceptor and electrostatic charger used for the same Download PDFInfo
- Publication number
- JP2005099133A JP2005099133A JP2003330028A JP2003330028A JP2005099133A JP 2005099133 A JP2005099133 A JP 2005099133A JP 2003330028 A JP2003330028 A JP 2003330028A JP 2003330028 A JP2003330028 A JP 2003330028A JP 2005099133 A JP2005099133 A JP 2005099133A
- Authority
- JP
- Japan
- Prior art keywords
- charging device
- deterioration
- casing
- wires
- electrophotographic photoreceptor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
- Cleaning In Electrography (AREA)
- Electrostatic Charge, Transfer And Separation In Electrography (AREA)
Abstract
Description
本発明は、電子写真用感光体の特性を評価するための劣化加速試験方法とそれに用いられる帯電装置に関する。 The present invention relates to a deterioration acceleration test method for evaluating the characteristics of an electrophotographic photoreceptor and a charging device used therefor.
従来、光導電性層が設けられた電子写真用感光体の特性の1つである寿命を評価する方法が提案されている。
像形成サイクルのサイクル操作寿命が確認されてある少なくとも1つの電子写真用感光体を用意し、該電子写真用感光体を静電気帯電工程と光放電工程を含むサイクルに繰り返しかけて、サイクル中に発生する光導電性層の暗減衰を、暗減衰量が最高値に達するまで測定し、該最高値を基にして暗減衰最高値対像形成サイクルの標準データを確立した後、新らたに作製された電子写真用感光体について同様にして、静電気帯電工程と光放電工程を含む上記サイクルに、更にサイクル操作にかけても実質的に一定のままである最高値に暗減衰量が達するまで繰り返しかけ、上記新鮮な電子写真像形成部材の暗減衰最高値を上記参照データと比較して、該新らたに作製された電子写真用感光体の推定サイクル寿命を確認する方法がある(例えば、特許文献1参照。)。
この方法は、静電気帯電工程と光放電工程を含むサイクルに繰り返しかけて、新らたに作製された電子写真用感光体と、劣化した電子写真用感光体の暗減衰とを比較して、前者の推定サイクル寿命を確認することを特徴とするものであるが、具体的には透明ガラスを圧着させてバイアス印可と光を照射させ、実際の電子写真プロセスで適用されるコロナ帯電・ローラ帯電というとは異なる方法で行なう劣化試験である。
また、この方法は、寿命に到ったサンプルの暗減衰特性を予め確認しておく必要があり、そのために、一旦電子写真用感光体をマシンに搭載して通紙試験を行なわなければならず、多大な手間がかかってしまう問題があった。
Conventionally, a method for evaluating the lifetime, which is one of the characteristics of an electrophotographic photoreceptor provided with a photoconductive layer, has been proposed.
Prepare at least one electrophotographic photoconductor having a confirmed cycle operation life of an image forming cycle, and repeat the electrophotographic photoconductor through a cycle including an electrostatic charging step and a photodischarge step. The dark decay of the photoconductive layer is measured until the dark attenuation reaches the maximum value. Based on the maximum value, the dark decay maximum value vs. the image formation cycle standard data is established, and then newly prepared. In the same manner for the electrophotographic photosensitive member, the cycle including the electrostatic charging step and the photodischarge step was repeated until the dark attenuation amount reached the maximum value that remained substantially constant even after the cycle operation, There is a method of confirming the estimated cycle life of the newly produced electrophotographic photoreceptor by comparing the dark decay maximum value of the fresh electrophotographic image forming member with the reference data (for example, Patent Document 1 reference.).
This method is repeated through a cycle including an electrostatic charging process and a light discharge process, and the newly prepared electrophotographic photoreceptor is compared with the dark decay of a deteriorated electrophotographic photoreceptor. This is characterized by the fact that the estimated cycle life is confirmed. Specifically, it is called corona charging / roller charging applied in an actual electrophotographic process by pressing a transparent glass and applying bias and irradiating light. Is a deterioration test performed by a different method.
In addition, in this method, it is necessary to confirm in advance the dark decay characteristics of a sample that has reached the end of its life. For this reason, a photosensitive member for electrophotography must be once mounted in a machine and a paper passing test must be performed. There was a problem that took a lot of time and effort.
そこで、通紙試験を行なわないで寿命を確認する方法として、電子写真用感光体を高速で回転させた状態(1,000〜2,000r.p.m)で、その周囲に配置された帯電器、露光装置で帯電、露光を繰り返し、寿命を予測する方法がある。この方法は、さらに2つの試験方法に分かれる。
第一の方法は、帯電器の出力と露光装置の光量をあらかじめ決めた条件で固定し、決められた時間内で試験を行ない、その後電子写真用感光体の特性を評価する測定を行ない、劣化状態を判定する。
第二の方法は、試験中の電子写真用感光体の露光後電位Vと電子写真用感光体を通して流れる通過電流Iを計測し、この2つが常に決められたレベルにあるように帯電器の出力と露光装置の光量を調整しながら行なうことを特徴とするものである。
これらの2つの方法で重要な点は、試験中に電子写真用感光体に流れた通過電流を計測し、この値を変換して電荷量(単位面積当りの値)Qを求める。一方、A4サイズ1枚を実機でプリントアウトする際の電子写真用感光体に流れる通過電流は、感光体の静電容量C(単位面積当りの値)と帯電電位Vから、感光体のサイズはA4紙1枚が感光体上をダブリなく印字されるサイズとすると、C・Vから求められ、その結果、Q/(C・V)の値によって寿命試験時間を実機のプリント枚数に対応させることができることである。
さらに別の重要な点は、この試験が加速寿命試験になっていることである。
すなわち、具体的に示すと、電子写真用感光体に5μA/10cm2の試料通過電流を流して20時間の試験を行なうと(1日10時間の試験とすると2日間)、5/10×10-6×20×60×60=0.036(C/cm2)の電荷が感光体を通過したことになる。そして、A4用紙縦送りで印字する場合を想定すると、電子写真用感光体の静電容量を100(pF/cm2)、帯電電位を−700(V)、除電後も含めた露光後電位を0(V)とすると、100×10-12×700=7×10-8(C/cm2)が、A4−1枚をプリントアウトする際の感光体を通過する電荷になるので、0.036/(7×10-8)≒514,000(枚)のプリントアウトしたことになり、大幅な加速試験になる。
このため2つ目の方法で寿命試験が行なわれることが多いが、前述の具体的な計算で分かるように、試験中に感光体を通過する電流が一定であれば、プリントアウト何枚相当の試験を行なったのか、計算がしやすい。
そのため、一般的に、試験は通過電流を一定にするようにして実施される。その本質は通過電荷量を知ることにある。また、感光体によっては帯電電位がどのレベルにあるかによって寿命試験の結果が異なることがあり、帯電電位も一定にして試験を行なうことが要求される。
このように、帯電電位および通過電流を一定にするために、帯電器の高圧電源出力調整、および露光装置の光量調整を行なうシステムが必要となり、従来の寿命試験装置が構築された。
Therefore, as a method for confirming the life without carrying out the paper passing test, the charging is arranged around the electrophotographic photosensitive member rotated at a high speed (1,000 to 2,000 rpm). There is a method of predicting the lifetime by repeatedly charging and exposing with a light source and an exposure apparatus. This method is further divided into two test methods.
The first method is to fix the output of the charger and the light intensity of the exposure device under predetermined conditions, perform the test within a predetermined time, and then perform the measurement to evaluate the characteristics of the electrophotographic photosensitive member. Determine the state.
The second method measures the post-exposure potential V of the electrophotographic photoreceptor under test and the passing current I flowing through the electrophotographic photoreceptor, and outputs the charger so that these two are always at a predetermined level. And adjusting the light quantity of the exposure apparatus.
The important point in these two methods is that the current passing through the electrophotographic photoreceptor during the test is measured, and this value is converted to obtain the charge amount (value per unit area) Q. On the other hand, the current passing through the electrophotographic photoreceptor when an A4 size sheet is printed out with an actual machine is determined by the electrostatic capacity C (value per unit area) of the photoreceptor and the charging potential V. The size of the photoreceptor is Assuming that the size of one A4 sheet can be printed on the photoconductor without duplication, it is obtained from C · V, and as a result, the life test time is made to correspond to the number of prints of the actual machine by the value of Q / (C · V). It is possible to do.
Yet another important point is that this test is an accelerated life test.
Specifically, when a 20-hour test is conducted by passing a sample-passing current of 5 μA / 10 cm 2 through the electrophotographic photosensitive member (10 days a day for 2 days), 5/10 × 10 5 −6 × 20 × 60 × 60 = 0.036 (C / cm 2 ) of charge passed through the photoconductor. Assuming that printing is performed with A4 paper vertical feed, the electrostatic capacity of the electrophotographic photosensitive member is 100 (pF / cm 2 ), the charging potential is −700 (V), and the post-exposure potential including after static elimination is set. Assuming 0 (V), 100 × 10 −12 × 700 = 7 × 10 −8 (C / cm 2 ) becomes a charge that passes through the photoconductor when the A4-1 sheet is printed out. This means that 036 / (7 × 10 −8 ) ≈514,000 (sheets) has been printed out, which is a significant acceleration test.
For this reason, the life test is often performed by the second method. As can be seen from the specific calculation described above, if the current passing through the photoconductor is constant during the test, the number of printouts corresponding to It is easy to calculate whether the test was done.
Therefore, in general, the test is performed with a constant passing current. The essence is to know the passing charge amount. Depending on the level of the charged potential depending on the photosensitive member, the result of the life test may differ, and it is required to perform the test with the charged potential kept constant.
Thus, in order to make the charging potential and the passing current constant, a system for adjusting the high-voltage power supply output of the charger and adjusting the light amount of the exposure apparatus is required, and a conventional life test apparatus has been constructed.
この従来のシステムにおける、2つの測定量、表面電位X,通過電流Yと、2つの操作量、帯電器高圧電源の出力制御値A、除電露光ランプ光量の出力制御値Bの関係は、Aを増加するとX,Yは増加し、Aを減少させるとX,Yも減少し、Bを増加するとXは減少、Yは増加し、Bを減少するとXは増加し、Yは減少する関係があり、仮にXが目標値からはずれ、これを目標範囲に入れようとAまたはBを操作すると、もう1つの測定量Yが変化してしまい、Yにとっては外乱が作用することになる。
これを目標範囲に維持しようとAまたはBを操作すると、今度はXが変化するという状態になってしまい、複雑な制御を行なわなければならなかった。
また、劣化加速試験中に感光体表面電位・通過電流の瞬間的なバラツキがあった場合でも、それらが瞬間的な誤差として通過電荷量算出に反映されないシステムとなっており、正確な劣化加速試験を行なうことが出来ていなかった。
In this conventional system, the relationship between the two measured quantities, the surface potential X, the passing current Y, the two manipulated variables, the output control value A of the charger high-voltage power supply, and the output control value B of the discharge lamp light quantity is X and Y increase when increasing, X and Y decrease when A decreases, X decreases when Y increases, Y increases, X decreases when B decreases, and Y decreases If X deviates from the target value and A or B is manipulated so as to be within the target range, another measured amount Y changes, and disturbances act on Y.
If A or B is operated to maintain this within the target range, X will change this time, and complicated control must be performed.
In addition, even if there is a momentary variation in the photoreceptor surface potential / passing current during the deterioration acceleration test, it is a system that does not reflect this in the calculation of the passing charge as an instantaneous error. Could not be done.
そこで、これらの問題を解決する方法が提案されている(例えば、特許文献2参照。)。
この特許文献2では、電子写真用感光体を高速回転させ、帯電装置による静電気帯電工程と光放電とを含むサイクルを繰り返し実行し、感光体の表面電位を一定条件に保つように制御され、計測された通過電流から通過電荷量を算出されることによって、単純で精度の良い電子写真感光体の劣化加速試験装置が考えられている。
この特許文献2に示されている劣化加速試験装置の概略を図1に示す。
Thus, a method for solving these problems has been proposed (see, for example, Patent Document 2).
In
An outline of the deterioration acceleration test apparatus shown in
ターンテーブル(1)の開口部(3)に、電子写真用感光体の試料片の感光層面を下向きに装着して試料片押さえ板(2)によりセットした後、コロナ帯電器(4)で試料片の感光層面を帯電処理する。
帯電処理する間、ターンテーブル(1)は、電子写真用感光体試料片を前記コロナ帯電器(4)に対向静止させるような位置で停止することが出来、また、実機と同程度のスピードで回転させることが出来、また、試料片を帯電させて帯電の立ちあがりの様子を観察するため、高速で回転させて試料片を帯電器に何度も通過させることが出来る。
コロナ帯電器(4)から試料片に与えられ試料片を充電するパルス電流は、電流計(6)に送られその中の平滑化回路で平滑化等がされた後、A/D変換器(8)で変換されコントローラー(9)に送られ演算処理される。
また、試料片の表面電位は、コロナ帯電器(4)と別の位置に配置された表面電位計(7)のモニタ部である表面電位計電極(5)でモニタされ、モニタされた信号は表面電位計(7)に送られその中の増幅器で増幅等がされた後、A/D変換器(8)で変換され、コントローラー(9)に送られ演算処理される。劣化加速試験では、ターンテーブルを高速で回転させ、劣化試験用コロナ帯電器(4)で試料片の感光面を帯電処理し、その後露光装置(5)によって光放電処理をする。これを繰り返し行なうことによって、感光層中の電荷を強制的に通過させ、実機よりも早く寿命を判断することが出来るようになっている。しかし、このような従来の劣化加速試験装置では、高寿命化された感光体の寿命を判断するためには多大な時間が必要である。
The photosensitive layer surface of the sample piece of the electrophotographic photosensitive member is mounted face down in the opening (3) of the turntable (1) and set by the sample piece holding plate (2), and then the sample is collected by the corona charger (4). The photosensitive layer surface of one piece is charged.
During the charging process, the turntable (1) can be stopped at a position where the electrophotographic photoconductor sample piece is placed stationary against the corona charger (4), and at the same speed as the actual machine. In addition, since the sample piece is charged and the state of the rising of the charge is observed, the sample piece can be passed through the charger many times by rotating at high speed.
The pulse current applied to the sample piece from the corona charger (4) and charged to the sample piece is sent to the ammeter (6) and smoothed by the smoothing circuit therein, and then the A / D converter ( In 8), it is converted and sent to the controller (9) for calculation processing.
Further, the surface potential of the sample piece is monitored by the surface electrometer electrode (5) which is a monitor unit of the surface electrometer (7) arranged at a position different from the corona charger (4), and the monitored signal is After being sent to the surface electrometer (7) and amplified by an amplifier therein, it is converted by the A / D converter (8), sent to the controller (9) and processed. In the deterioration acceleration test, the turntable is rotated at a high speed, the photosensitive surface of the sample piece is charged with the corona charger (4) for deterioration test, and then the photodischarge process is performed with the exposure device (5). By repeating this, the charge in the photosensitive layer is forcibly passed and the lifetime can be judged earlier than the actual machine. However, in such a conventional deterioration acceleration test apparatus, it takes a lot of time to determine the life of the photoconductor having a long life.
従って、本発明の目的は、上記従来技術に鑑みて、サンプルの単位面積当りに流れる電流の増加等による、安定かつ一層の加速した劣化加速試験方法の提供することを目的とする。 Accordingly, an object of the present invention is to provide a stable and accelerated accelerated acceleration test method by increasing the current flowing per unit area of a sample in view of the above prior art.
上記課題は、本発明の(1)「電子写真用感光体に静電気帯電工程と露光工程とを含むサイクルを繰り返しかけて電子写真用感光体の劣化を加速させる試験方法であって、該静電気帯電工程に用いられる帯電装置が、メッシュ状に張架された複数のワイヤを有し、かつ該ワイヤを囲むケーシングの形状が該電子写真用感光体面に対して平行な面には全てケーシングされていないものであることを特徴とする感光体劣化加速試験方法」、
(2)「電子写真用感光体面と帯電装置のワイヤとの距離を2mm以上にすることを特徴とする前記第(1)項に記載の電子写真用感光体劣化加速試験方法」、
(3)「該静電気帯電工程と該露光工程とを同時に行なうことを特徴とする前記第(1)項又は第(2)項に記載の感光体劣化加速試験方法」により達成される。
The above-described problem is (1) a test method for accelerating deterioration of an electrophotographic photosensitive member by repeating a cycle including an electrostatic charging step and an exposure step on the electrophotographic photosensitive member. The charging device used in the process has a plurality of wires stretched in a mesh shape, and the casing surrounding the wires is not entirely casing on a surface parallel to the electrophotographic photoreceptor surface. Photoreceptor deterioration acceleration test method characterized by being ",
(2) “Electrophotographic photosensitive member deterioration acceleration test method according to item (1), wherein the distance between the electrophotographic photosensitive member surface and the charging device wire is 2 mm or more”;
(3) This is achieved by the “photoconductor deterioration acceleration test method according to (1) or (2), wherein the electrostatic charging step and the exposure step are performed simultaneously”.
また、上記課題は、本発明の(4)「電子写真用感光体に静電気帯電工程と露光工程とを含むサイクルを繰り返しかけて電子写真用感光体の劣化を加速させる試験方法の該静電気帯電工程に用いられる帯電装置であって、メッシュ状に張架された複数のワイヤを有し、かつ該ワイヤを囲むケーシングの形状が該電子写真用感光体面に対して平行な面には全てケーシングされていないものであることを特徴とする帯電装置」、
(5)「ケーシング部分の表面が絶縁性部材によって形成されていることを特徴とする前記第(4)項に記載の帯電装置」、
(6)「複数のワイヤの間隔が2mmより大きいことを特徴とする前記第(4)項又は第(5)項に記載の帯電装置」により達成される。
In addition, the above-described problem is solved by (4) the electrostatic charging step of the test method of the present invention in which a cycle including an electrostatic charging step and an exposure step is repeated on the electrophotographic photosensitive member to accelerate the deterioration of the electrophotographic photosensitive member. And a plurality of wires stretched in a mesh shape, and the casing surrounding the wires is entirely casing on a surface parallel to the surface of the electrophotographic photoreceptor. A charging device characterized in that it is not, "
(5) “Charging device according to item (4), wherein the surface of the casing portion is formed of an insulating member”;
(6) “A charging device according to the item (4) or (5), wherein the interval between the plurality of wires is larger than 2 mm”.
本発明において、電子写真用感光体を静電気帯電工程と、露光工程を含むサイクルを繰り返しかけ、静電気帯電工程における帯電装置として、ワイヤがメッシュ状に張架されるよう複数のワイヤを有し、かつワイヤを囲むケーシングの形状が、感光体面に対して平行な面は全てケーシングされていないものを用いて行なう電子写真用感光体の劣化を加速させる試験方法は、感光体面に流れる単位面積当りの電流量を増加することができる。
また、本発明の試験方法に用いられる帯電装置が、そのケーシング部分の表面が絶縁性部材によって形成されたものであると、ケーシング部分へ電流が流れるのを防ぐことができ、感光体面に流れる単位面積当りの電流量をさらに増加させることができる。
また、本発明の試験方法に用いられる帯電装置として、帯電装置のワイヤ間隔が2mmより大きいものを用いると、感光体面への火花放電を防ぐことができる。
また、本発明の試験方法において、感光体面と帯電装置のワイヤとの距離を2mm以上にすると、感光体面への火花放電を防ぐのに有効である。
また、本発明の試験方法において、静電気帯電工程と露光工程を同時に行なうと、感光体劣化を加速させ、劣化加速試験時間を短縮させることができる。
In the present invention, the electrophotographic photoreceptor is repeatedly subjected to a cycle including an electrostatic charging step and an exposure step, and has a plurality of wires as a charging device in the electrostatic charging step so that the wires are stretched in a mesh shape, and The test method for accelerating the deterioration of the electrophotographic photosensitive member using a casing that surrounds the wire and whose surface parallel to the photosensitive member surface is not casing is the current per unit area flowing on the photosensitive member surface. The amount can be increased.
In addition, when the charging device used in the test method of the present invention is such that the surface of the casing portion is formed of an insulating member, it is possible to prevent a current from flowing to the casing portion, and a unit that flows on the surface of the photoreceptor. The amount of current per area can be further increased.
Further, when a charging device having a wire interval of more than 2 mm is used as the charging device used in the test method of the present invention, it is possible to prevent spark discharge on the surface of the photoreceptor.
In the test method of the present invention, if the distance between the photoreceptor surface and the wire of the charging device is 2 mm or more, it is effective to prevent spark discharge to the photoreceptor surface.
In the test method of the present invention, if the electrostatic charging step and the exposure step are performed simultaneously, the photoreceptor deterioration can be accelerated and the deterioration acceleration test time can be shortened.
以上及び以下の詳細かつ具体的な説明から明らかなように、電子写真用感光体を静電気帯電工程と、露光工程を含むサイクルを繰り返しかけて電子写真用感光体の劣化を加速させる試験方法において、静電気帯電工程に用いられる帯電装置は、ワイヤがメッシュ状に張架されるよう複数のワイヤを有しており、かつワイヤを囲むケーシングの形状は、感光体面に対して平行な面は全てケーシングされていない帯電装置であるため、感光体面に流れる単位面積当りの電流量を増加させることが出来、劣化加速試験での試験時間を短縮することが出来る。
また、帯電装置のケーシング部分は表面が絶縁性部材によって形成されているため、ケーシング部分へ電流を流すのを防ぎ、感光体面へ流れる単位面積当りの電流量を増加させることが出来るため、劣化加速試験での試験時間を短縮するのにより効果的である。
また、帯電装置のワイヤ間隔を2mmより大きくすると、感光体面への火花放電を防ぐことが出来、正確な劣化加速試験を行なうことが出来る。
また、感光体面と帯電装置のワイヤとの距離を2mm以上にすると、感光体面への火花放電を防ぐことが出来、正確な劣化加速試験を行なうことが出来る。
また、帯電装置に印可する電圧にACを重畳させると、感光体へ流れる電流の調整幅が広がり、扱いやすくなる。
また、静電気帯電工程と露光工程を同時に行なうと、感光体劣化を加速させ劣化加速試験時間を短縮させることが出来る。
As is clear from the above and the following detailed and specific explanation, in the test method for accelerating the deterioration of the electrophotographic photoreceptor by repeating the electrostatic charging process and the cycle including the exposure process on the electrophotographic photoreceptor, The charging device used for the electrostatic charging process has a plurality of wires so that the wires are stretched in a mesh shape, and the shape of the casing surrounding the wires is that all surfaces parallel to the photoreceptor surface are casing. Therefore, the amount of current per unit area flowing on the surface of the photoreceptor can be increased, and the test time in the deterioration acceleration test can be shortened.
In addition, since the surface of the casing portion of the charging device is formed of an insulating member, it is possible to prevent current from flowing to the casing portion and increase the amount of current per unit area that flows to the surface of the photosensitive member. It is more effective to shorten the test time in the test.
Further, if the wire interval of the charging device is larger than 2 mm, it is possible to prevent spark discharge on the surface of the photosensitive member, and an accurate deterioration acceleration test can be performed.
Further, when the distance between the photosensitive member surface and the wire of the charging device is 2 mm or more, spark discharge to the photosensitive member surface can be prevented, and an accurate deterioration acceleration test can be performed.
In addition, when AC is superimposed on the voltage applied to the charging device, the adjustment range of the current flowing to the photosensitive member is widened, and the handling becomes easy.
Further, if the electrostatic charging step and the exposure step are performed simultaneously, the photoreceptor deterioration can be accelerated and the deterioration acceleration test time can be shortened.
以下に、本発明の実施例により具体的に説明するが、本発明はこれに限定されるものではない。
〔実施例1〕
帯電装置として、サンプルに平行な面にケーシングはなく、50×50(mm)の開口枠を有し、その枠内に10mm間隔でメッシュ状にワイヤ(材質:金メッキタングステンワイヤー、ワイヤ径:60μm)が張られ、帯電装置の枠は絶縁性部材(材質:ポリテトラフロロエチレン系フッ素樹脂)を使用した帯電装置(帯電装置概略図を図2−1と図2−2に示す。)を使用し、サンプルとワイヤの距離を5mmとしたときに、アルミ板へコロナ放電させたときのコロナ電流を測定した結果を図6に示す。(実験装置概略図を図3に示す。)
一方、該実施例1に対応する比較例1として、サンプル対向面のみに開口部をもったケーシングを有し、ケーシング内部には1方向のみワイヤ(材質:金メッキタングステンワイヤ、ワイヤ径:60μm)を10mm間隔で2本張り、ワイヤとサンプル面との間隔を5mmとした場合に、アルミ板へコロナ放電させたときのコロナ電流を測定した結果についても図6に示す。(帯電装置概略図を図3、実験装置概略図を図4に示す。)
図6の結果から、帯電装置は複数本のワイヤを有し、ワイヤはメッシュ状に張架されており、かつワイヤを囲むケーシングの形状は、感光体面に対して平行な面は全てケーシングされていないことにより、感光体対向面のみに開口部を持ったケーシングを有し、ケーシング内部には1方向のみワイヤで張架された帯電装置よりも同じ印加電圧で電流量を大きくすることが出来ることがわかる。
Hereinafter, the present invention will be specifically described with reference to examples, but the present invention is not limited thereto.
[Example 1]
As a charging device, there is no casing on the surface parallel to the sample, and there is an opening frame of 50 x 50 (mm), and a wire in a mesh shape at intervals of 10 mm in the frame (material: gold-plated tungsten wire, wire diameter: 60 μm) The charging device frame uses a charging device using an insulating member (material: polytetrafluoroethylene-based fluororesin) (a schematic diagram of the charging device is shown in FIGS. 2-1 and 2-2). FIG. 6 shows the result of measuring the corona current when the distance between the sample and the wire is 5 mm and the aluminum plate is corona discharged. (A schematic diagram of the experimental apparatus is shown in FIG. 3.)
On the other hand, as Comparative Example 1 corresponding to Example 1, a casing having an opening only on the sample facing surface is provided, and a wire (material: gold-plated tungsten wire, wire diameter: 60 μm) is provided only in one direction inside the casing. FIG. 6 also shows the results of measuring the corona current when corona discharge is applied to an aluminum plate when two wires are stretched at intervals of 10 mm and the distance between the wire and the sample surface is 5 mm. (The schematic diagram of the charging device is shown in FIG. 3, and the schematic diagram of the experimental device is shown in FIG. 4.)
From the result of FIG. 6, the charging device has a plurality of wires, the wires are stretched in a mesh shape, and the shape of the casing surrounding the wires is all casings parallel to the photoreceptor surface. By having no casing, the casing has an opening only on the surface facing the photoreceptor, and the amount of current can be increased with the same applied voltage as compared with a charging device stretched with a wire only in one direction inside the casing. I understand.
〔実施例2(請求項2に対応)〕
帯電装置として、サンプルに平行な面にケーシングはなく50×50(mm)の開口枠を有し、その枠内に10mm間隔でメッシュ状にワイヤ(材質:金メッキタングステンワイヤー、ワイヤ径:60μm)が張られ、帯電装置の枠は絶縁性部材(材質:ポリテトラフロロエチレン系フッ素樹脂)を使用した帯電装置を使用し、サンプルとワイヤの距離を5mmとしたときに、アルミ板へコロナ放電させたときのコロナ電流を測定した結果を図7に示す。(帯電装置概略図は実施例1同様、図2−1と図2−2、実験装置概略図は図3に示す。)
該実施例2に対応する比較例2として、帯電装置がサンプルに平行な面にケーシングはなく50×50(mm)の開口枠を有し、その枠内に10mm間隔でメッシュ状にワイヤ(材質:金メッキタングステンワイヤー、ワイヤ径:60μm)を張り、帯電装置の枠は導電性部材(材質:アルミ)を使用した帯電装置を使用し、サンプルとワイヤの距離を5mmとしたときに、アルミ板へコロナ放電させたときのコロナ電流を測定した結果についても図7に示す。(帯電装置概略図は実施例2同様、図2−1と図2−2、実験装置概略図を図3に示す。)
図7の結果から、帯電装置の表面を絶縁性部材にすることによって、サンプルへ流れる電流量が増加することがわかる。
[Example 2 (corresponding to claim 2)]
As a charging device, there is no casing on the surface parallel to the sample, and there is an opening frame of 50 x 50 (mm), and a wire (material: gold-plated tungsten wire, wire diameter: 60 μm) is formed in the frame at intervals of 10 mm. The charging device frame was a corona discharge to an aluminum plate when a charging device using an insulating member (material: polytetrafluoroethylene-based fluororesin) was used and the distance between the sample and the wire was 5 mm. The result of measuring the corona current is shown in FIG. (Similar to Example 1, the schematic diagram of the charging device is shown in FIGS. 2-1 and 2-2, and the schematic diagram of the experimental device is shown in FIG. 3.)
As Comparative Example 2 corresponding to Example 2, the charging device has a casing of 50 × 50 (mm) on a surface parallel to the sample, and has an opening frame of 50 × 50 (mm). : Gold-plated tungsten wire, wire diameter: 60 μm), and the charging device frame uses a charging device using a conductive member (material: aluminum), and when the distance between the sample and the wire is 5 mm, the aluminum plate The results of measuring the corona current when corona discharge is also shown in FIG. (Similar to Example 2, the schematic diagram of the charging device is shown in FIGS. 2-1 and 2-2, and the schematic diagram of the experimental device is shown in FIG. 3.)
From the result of FIG. 7, it can be seen that the amount of current flowing to the sample is increased by using an insulating member on the surface of the charging device.
〔実施例3〕
帯電装置として、サンプルに平行な面にケーシングはなく50×50(mm)の開口枠を有し、その枠内にメッシュ状にワイヤ(材質:金メッキタングステンワイヤー、ワイヤ径:60μm)が張られ、帯電装置の枠は絶縁性部材(材質:ポリテトラフロロエチレン系フッ素樹脂)を使用した帯電装置を使用し、サンプルとワイヤの距離を5mmとした。 ワイヤ間隔の水準を振ったときに、アルミ板へコロナ放電させたときの放電開始電圧の結果を表1に示す。(帯電装置概略図は実施例1、2同様、図2−1と図2−2、実験装置概略図は図3に示す。)
Example 3
As a charging device, there is no casing on the surface parallel to the sample, and there is an opening frame of 50 × 50 (mm), and a wire (material: gold-plated tungsten wire, wire diameter: 60 μm) is stretched in the frame, As the frame of the charging device, a charging device using an insulating member (material: polytetrafluoroethylene-based fluororesin) was used, and the distance between the sample and the wire was 5 mm. Table 1 shows the results of the discharge start voltage when corona discharge is applied to the aluminum plate when the wire spacing level is varied. (A schematic diagram of the charging device is shown in FIGS. 2-1 and 2-2 as in Examples 1 and 2, and a schematic diagram of the experimental device is shown in FIG. 3.)
〔実施例4〕
帯電装置として、サンプルに平行な面にケーシングはなく50×50(mm)の開口枠を有し、その枠内に10mm間隔でメッシュ状にワイヤ(材質:金メッキタングステンワイヤー、ワイヤ径:60μm)が張られ、帯電装置の枠は絶縁性部材(材質:ポリテトラフロロエチレン系フッ素樹脂)を使用した帯電装置を使用し、サンプルとワイヤ間の距離の水準を振ったときに、アルミ板へコロナ放電させたときの放電開始電圧の結果を表2に示す。(帯電装置概略図は実施例1〜3同様、図2−1と図2−2、実験装置概略図は図3に示す。)
Example 4
As a charging device, there is no casing on the surface parallel to the sample, and there is an opening frame of 50 x 50 (mm), and wires (material: gold-plated tungsten wire, wire diameter: 60 μm) are formed in the frame at intervals of 10 mm. The charging device frame uses a charging device that uses an insulating member (material: polytetrafluoroethylene fluoropolymer), and corona discharge to the aluminum plate when the distance between the sample and the wire is varied. Table 2 shows the results of the discharge start voltage when the discharge is performed. (The schematic diagram of the charging device is the same as in Examples 1-3, and FIGS. 2-1 and 2-2, and the schematic diagram of the experimental device is shown in FIG. 3.)
〔実施例5〕
帯電装置として、サンプルに平行な面にケーシングはなく50×50(mm)の開口枠を有し、その枠内に10mm間隔でメッシュ状にワイヤ(材質:金メッキタングステンワイヤー、ワイヤ径:60μm)が張られ、帯電装置の枠は絶縁性部材(材質:ポリテトラフロロエチレン系フッ素樹脂)を使用した帯電装置を使用し、サンプルとワイヤの距離を5mmとしたときに、アルミ板へコロナ放電させたときのコロナ電流を測定した結果を図8に示す。(帯電装置概略図は実施例1〜4同様、図2−1と図2−2、実験装置概略図は図3に示す。)
この実施例5に対応する比較例3として、図1に示す従来の劣化加速試験装置を使用し、かつ帯電器には、サンプル対向面のみに開口部をもったケーシングを有し、ケーシング内部には1方向のみワイヤ(材質:金メッキタングステンワイヤ、ワイヤ径:60μm)を10mm間隔で2本張り、ワイヤとサンプルとの間隔を5mmとした帯電器を利用し、劣化加速試験と同様に回転(1100rpm)させたときに、アルミ板へコロナ放電させたときのコロナ電流を測定した結果も図8に示す。(帯電装置概略図を図3に示す。また比較例3では、回転中にコロナ電流は平滑化回路によって平滑化されるため、回転中に電流値は変動せず一定である。)
図8の結果から、感光体面に平行な面にケーシングがない帯電器を使用し、更に感光体面に平行な面はケーシングされていないことにより、帯電工程と同時に露光工程を実施できるため、従来の劣化加速試験と比較し非常に大きな電流を得ることができ、劣化加速試験時間の短縮につながることが分かる。
Example 5
As a charging device, there is no casing on the surface parallel to the sample, and there is an opening frame of 50 x 50 (mm), and wires (material: gold-plated tungsten wire, wire diameter: 60 μm) are formed in the frame at intervals of 10 mm. A charging device using an insulating member (material: polytetrafluoroethylene-based fluororesin) was used as the frame of the charging device, and when the distance between the sample and the wire was 5 mm, corona discharge was applied to the aluminum plate. The result of measuring the corona current is shown in FIG. (A schematic diagram of the charging device is shown in FIGS. 2-1 and 2-2 as in Examples 1 to 4, and a schematic diagram of the experimental device is shown in FIG. 3.)
As Comparative Example 3 corresponding to Example 5, the conventional deterioration acceleration test apparatus shown in FIG. 1 was used, and the charger had a casing having an opening only on the sample-facing surface. Uses a charger in which wires (material: gold-plated tungsten wire, wire diameter: 60 μm) are stretched at 10 mm intervals and the distance between the wires and the sample is 5 mm, and rotates in the same way as the deterioration acceleration test (1100 rpm) 8), the results of measuring the corona current when corona discharge is applied to the aluminum plate are also shown in FIG. (A schematic diagram of the charging device is shown in FIG. 3. In Comparative Example 3, the corona current is smoothed by the smoothing circuit during the rotation, so that the current value does not change during the rotation and is constant.)
From the result of FIG. 8, the exposure process can be performed simultaneously with the charging process by using a charger without a casing on the surface parallel to the surface of the photoconductor, and further without the casing parallel to the surface of the photoconductor. It can be seen that a much larger current can be obtained compared with the accelerated deterioration test, leading to a reduction in the accelerated deterioration test time.
1 ターンテーブル
2 試料片押え板
3 開口部
4 コロナ帯電器
5 表面電位計電極部・露光装置
6 電流計
7 表面電位計
8 インターフェース(A/D変換)
9 コントローラー
10 ケーシング
11 ワイヤ
12 アルミ板
13 サンプル台
14 高圧電源
DESCRIPTION OF SYMBOLS 1
9
Claims (6)
The charging device according to claim 4, wherein an interval between the plurality of wires is larger than 2 mm.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003330028A JP2005099133A (en) | 2003-09-22 | 2003-09-22 | Method for accelerated testing of deterioration in electrophotographic photoreceptor and electrostatic charger used for the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003330028A JP2005099133A (en) | 2003-09-22 | 2003-09-22 | Method for accelerated testing of deterioration in electrophotographic photoreceptor and electrostatic charger used for the same |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2005099133A true JP2005099133A (en) | 2005-04-14 |
Family
ID=34459120
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003330028A Pending JP2005099133A (en) | 2003-09-22 | 2003-09-22 | Method for accelerated testing of deterioration in electrophotographic photoreceptor and electrostatic charger used for the same |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2005099133A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007155993A (en) * | 2005-12-02 | 2007-06-21 | Ricoh Co Ltd | Method for accelerated testing of degradation in electrophotographic photoreceptor and accelerated testing machine for degradation in electrophotographic photoreceptor |
Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5180232A (en) * | 1975-01-08 | 1976-07-13 | Nippon Electric Co | DENSHISHASHINKANKOBANNO TOKUSEISOKUTEIHOSHIKI |
JPS6317475A (en) * | 1986-07-10 | 1988-01-25 | Canon Inc | Electrostatic discharging device |
JPH0588593A (en) * | 1991-09-30 | 1993-04-09 | Ricoh Co Ltd | Electrophotographic method |
JPH07271149A (en) * | 1994-03-29 | 1995-10-20 | Mita Ind Co Ltd | Corona electrifier |
JPH0889853A (en) * | 1994-07-29 | 1996-04-09 | Nissan Motor Co Ltd | Corona discharge method and electrostatic coating apparatus |
JPH09101651A (en) * | 1995-10-03 | 1997-04-15 | Konica Corp | Method and device for image forming and device unit |
JPH10241827A (en) * | 1996-12-27 | 1998-09-11 | Nippon Paint Co Ltd | Corona discharge generator |
JPH11109717A (en) * | 1997-09-30 | 1999-04-23 | Brother Ind Ltd | Image forming device |
JP2000147871A (en) * | 1998-11-13 | 2000-05-26 | Fuji Xerox Co Ltd | Electrostatic charging device, developing device and image forming device |
JP2000348847A (en) * | 1999-06-02 | 2000-12-15 | Ricoh Co Ltd | Ion generating device, electrifying device, transferring device, static eliminating device and image forming device |
JP2002149005A (en) * | 2000-11-10 | 2002-05-22 | Ricoh Co Ltd | Test device for accelerating deterioration of photoreceptor |
-
2003
- 2003-09-22 JP JP2003330028A patent/JP2005099133A/en active Pending
Patent Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5180232A (en) * | 1975-01-08 | 1976-07-13 | Nippon Electric Co | DENSHISHASHINKANKOBANNO TOKUSEISOKUTEIHOSHIKI |
JPS6317475A (en) * | 1986-07-10 | 1988-01-25 | Canon Inc | Electrostatic discharging device |
JPH0588593A (en) * | 1991-09-30 | 1993-04-09 | Ricoh Co Ltd | Electrophotographic method |
JPH07271149A (en) * | 1994-03-29 | 1995-10-20 | Mita Ind Co Ltd | Corona electrifier |
JPH0889853A (en) * | 1994-07-29 | 1996-04-09 | Nissan Motor Co Ltd | Corona discharge method and electrostatic coating apparatus |
JPH09101651A (en) * | 1995-10-03 | 1997-04-15 | Konica Corp | Method and device for image forming and device unit |
JPH10241827A (en) * | 1996-12-27 | 1998-09-11 | Nippon Paint Co Ltd | Corona discharge generator |
JPH11109717A (en) * | 1997-09-30 | 1999-04-23 | Brother Ind Ltd | Image forming device |
JP2000147871A (en) * | 1998-11-13 | 2000-05-26 | Fuji Xerox Co Ltd | Electrostatic charging device, developing device and image forming device |
JP2000348847A (en) * | 1999-06-02 | 2000-12-15 | Ricoh Co Ltd | Ion generating device, electrifying device, transferring device, static eliminating device and image forming device |
JP2002149005A (en) * | 2000-11-10 | 2002-05-22 | Ricoh Co Ltd | Test device for accelerating deterioration of photoreceptor |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007155993A (en) * | 2005-12-02 | 2007-06-21 | Ricoh Co Ltd | Method for accelerated testing of degradation in electrophotographic photoreceptor and accelerated testing machine for degradation in electrophotographic photoreceptor |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7715743B2 (en) | Charger with a probe and controller | |
US10359728B2 (en) | Image forming apparatus | |
JP2005099133A (en) | Method for accelerated testing of deterioration in electrophotographic photoreceptor and electrostatic charger used for the same | |
JP5293100B2 (en) | Method and apparatus for evaluating characteristics of electrophotographic photosensitive member | |
JP2005099111A (en) | Method for accelerated testing of deterioration in electrophotographic photoreceptor and electrostatic charger used for it | |
JP4428527B2 (en) | Electrophotographic photoconductor degradation acceleration test method and degradation acceleration test equipment | |
JP4953185B2 (en) | Electrophotographic photoreceptor deterioration acceleration test method and acceleration test apparatus | |
JP4324519B2 (en) | Electrophotographic photoreceptor deterioration acceleration test method and acceleration test apparatus | |
JP4234080B2 (en) | Photoconductor deterioration acceleration test method and acceleration test apparatus | |
JP4964702B2 (en) | Device for evaluating characteristics of electrophotographic photosensitive member | |
JP2005352176A (en) | Photoreceptor deterioration acceleration test method and acceleration test equipment | |
JP4914250B2 (en) | Method and apparatus for evaluating characteristics of electrophotographic photoreceptor | |
JP3759400B2 (en) | Photoconductor deterioration acceleration test equipment | |
JP2007155993A (en) | Method for accelerated testing of degradation in electrophotographic photoreceptor and accelerated testing machine for degradation in electrophotographic photoreceptor | |
US3886416A (en) | Method and apparatus for adjusting corotron currents | |
JP4546784B2 (en) | Photoreceptor characteristic evaluation device | |
JPH08178898A (en) | Method and equipment for measuring electric property of electrophotography medium | |
JP2012189952A (en) | Characteristic evaluation apparatus and characteristic evaluation method for electrophotographic photoreceptor | |
JP4057448B2 (en) | Electrophotographic photoreceptor test equipment | |
JP2007206242A (en) | Deterioration accelerating test method for photoreceptor | |
JPH0777853A (en) | Process controller | |
JP2010286612A (en) | Device for evaluating characteristic of electrophotographic photoreceptor | |
JP2002139958A (en) | Photoreceptor deterioration acceleration test device | |
JP2019053254A (en) | Inspection apparatus of electrophotographic photoreceptor | |
JP2013064909A (en) | Characteristic evaluation method and characteristic evaluation device for electrophotographic photoreceptor |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Effective date: 20060828 Free format text: JAPANESE INTERMEDIATE CODE: A621 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20090604 |
|
A131 | Notification of reasons for refusal |
Effective date: 20090619 Free format text: JAPANESE INTERMEDIATE CODE: A131 |
|
A521 | Written amendment |
Effective date: 20090817 Free format text: JAPANESE INTERMEDIATE CODE: A523 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20091117 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100118 |
|
A131 | Notification of reasons for refusal |
Effective date: 20100309 Free format text: JAPANESE INTERMEDIATE CODE: A131 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100510 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20100812 |