JP2005055437A5 - - Google Patents

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Publication number
JP2005055437A5
JP2005055437A5 JP2004224161A JP2004224161A JP2005055437A5 JP 2005055437 A5 JP2005055437 A5 JP 2005055437A5 JP 2004224161 A JP2004224161 A JP 2004224161A JP 2004224161 A JP2004224161 A JP 2004224161A JP 2005055437 A5 JP2005055437 A5 JP 2005055437A5
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JP
Japan
Prior art keywords
local oscillator
oscillator signal
dut
extended
lens array
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004224161A
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English (en)
Japanese (ja)
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JP2005055437A (ja
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Publication date
Priority claimed from US10/634,358 external-priority patent/US7023557B2/en
Application filed filed Critical
Publication of JP2005055437A publication Critical patent/JP2005055437A/ja
Publication of JP2005055437A5 publication Critical patent/JP2005055437A5/ja
Pending legal-status Critical Current

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JP2004224161A 2003-08-05 2004-07-30 拡張局部発振器信号を用いた並列干渉計測 Pending JP2005055437A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/634,358 US7023557B2 (en) 2003-08-05 2003-08-05 Parallel interferometric measurements using an expanded local oscillator signal

Publications (2)

Publication Number Publication Date
JP2005055437A JP2005055437A (ja) 2005-03-03
JP2005055437A5 true JP2005055437A5 (enExample) 2007-08-02

Family

ID=33552901

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004224161A Pending JP2005055437A (ja) 2003-08-05 2004-07-30 拡張局部発振器信号を用いた並列干渉計測

Country Status (5)

Country Link
US (1) US7023557B2 (enExample)
EP (1) EP1505364A3 (enExample)
JP (1) JP2005055437A (enExample)
CN (1) CN1580727A (enExample)
TW (1) TWI233990B (enExample)

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US7087965B2 (en) * 2004-04-22 2006-08-08 International Business Machines Corporation Strained silicon CMOS on hybrid crystal orientations
WO2007028345A1 (fr) * 2005-09-09 2007-03-15 Accelergy Shanghai R & D Center Co., Ltd Procede de detection a haut debit destine aux echantillons solides et systeme correspondant
CN1329711C (zh) * 2005-09-14 2007-08-01 哈尔滨工业大学 基于双光纤耦合的微小内腔体尺寸测量装置与方法
DE102007029822B4 (de) * 2007-06-28 2010-01-07 Siemens Ag Interferometer
US7821619B2 (en) * 2008-03-19 2010-10-26 Raytheon Company Rapid scan LADAR 3D imaging with compact digital beam formation
WO2010108365A1 (en) * 2009-03-24 2010-09-30 Harbin Institute Of Technology Micro focal-length collimation based micro-cavity measuring method and detecting equipment thereof
CA2777593A1 (en) * 2009-10-14 2011-04-21 The University Of Sydney Integrated photonic spectrograph
TWI418774B (zh) * 2010-08-06 2013-12-11 大區域光學檢測裝置及其運作方法
CN101949840B (zh) * 2010-08-17 2011-11-16 中国农业大学 生肉肌红蛋白快速无损检测方法及系统
JP2012063377A (ja) * 2010-09-14 2012-03-29 Enplas Corp レンズアレイおよびそのレンズエッジ検出方法
ES2404673B2 (es) * 2011-10-20 2014-04-24 Universidad De Sevilla Método y aparato de medida para la caracterización de dispositivos ópticos y fotónicos
JP6112192B2 (ja) 2013-03-15 2017-04-12 日本電気株式会社 光送受信器、光通信システムおよび光送受信方法
WO2015052071A1 (en) * 2013-10-09 2015-04-16 Carl Zeiss Meditec Ag Improved line-field imaging systems and methods
US9791346B1 (en) * 2016-04-20 2017-10-17 Stmicroelectronics Sa Semiconductor device and wafer with reference circuit and related methods
CN107884157A (zh) * 2017-11-28 2018-04-06 维沃移动通信有限公司 一种光学衍射元件的异常检测方法、移动终端
FR3077888B1 (fr) 2018-02-13 2020-02-28 Stmicroelectronics (Crolles 2) Sas Puce optoelectronique et procede de test de circuits photoniques d'une telle puce
FR3077887B1 (fr) 2018-02-13 2021-07-23 St Microelectronics Crolles 2 Sas Puce optoelectronique et procede de test de circuits photoniques d'une telle puce
US10838047B2 (en) 2018-04-17 2020-11-17 Santec Corporation Systems and methods for LIDAR scanning of an environment over a sweep of wavelengths
US11808658B2 (en) * 2019-09-27 2023-11-07 Panduit Corp. Visual inspector attachment for fiber connector cleaners
US12023734B2 (en) * 2019-12-16 2024-07-02 National Research Council Of Canada Apparatus and method for temperature controlled cold spray
US11513228B2 (en) 2020-03-05 2022-11-29 Santec Corporation Lidar sensing arrangements
US11486792B2 (en) * 2020-06-05 2022-11-01 Santec Corporation Tunable light source for optical fiber proximity and testing
CN111693509B (zh) * 2020-06-23 2021-04-23 清华大学 差分复用的干涉增强双光梳相干拉曼光谱探测系统与方法
US12135373B2 (en) 2021-04-16 2024-11-05 santec Holdings Corporation Systems and methods for LIDAR sensing
US12313883B2 (en) 2023-03-03 2025-05-27 santec Holdings Corporation Photonic beam steering device with wavelength sweep
JP7737172B1 (ja) 2024-04-09 2025-09-10 株式会社OptoComb 光学式多点計測装置

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US4696061A (en) 1983-12-28 1987-09-22 Sperry Corporation Acousto-optic R-F receiver which is tunable and has adjustable bandwidth
US5946092A (en) 1998-02-27 1999-08-31 Pacific Scientific Instruments Company Dual laser heterodyne optical particle detection technique
JP3594875B2 (ja) * 2000-05-25 2004-12-02 独立行政法人 科学技術振興機構 ２次元光ヘテロダイン検出法を用いた光画像計測装置
US6766115B1 (en) * 2000-08-22 2004-07-20 Agilent Technologies, Inc. Multiport optical component testing using a single optical receiver
WO2003025537A1 (en) * 2001-09-18 2003-03-27 Mitsubishi Denki Kabushiki Kaisha Optical system misalignment estimating device, optical system misalignment adjusting device, optical system misalignment estimating method, and optical system misalignment correcting method
US7006231B2 (en) * 2001-10-18 2006-02-28 Scimed Life Systems, Inc. Diffraction grating based interferometric systems and methods
US6750973B2 (en) * 2002-02-20 2004-06-15 Agilent Technologies, Inc. Test structure for simultaneously characterizing two ports of an optical component using interferometer-based optical network analysis
DE60232105D1 (de) * 2002-06-29 2009-06-04 Agilent Technologies Inc Polarisationsdiversitätserfassung unter verwendung eines polarisationsmultiplexierten überlagerungsoszillators

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