JP2005030966A5 - - Google Patents

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Publication number
JP2005030966A5
JP2005030966A5 JP2003271925A JP2003271925A JP2005030966A5 JP 2005030966 A5 JP2005030966 A5 JP 2005030966A5 JP 2003271925 A JP2003271925 A JP 2003271925A JP 2003271925 A JP2003271925 A JP 2003271925A JP 2005030966 A5 JP2005030966 A5 JP 2005030966A5
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JP
Japan
Prior art keywords
image
inspection
sample
data
displayed
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Pending
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JP2003271925A
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English (en)
Japanese (ja)
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JP2005030966A (ja
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Priority to JP2003271925A priority Critical patent/JP2005030966A/ja
Priority claimed from JP2003271925A external-priority patent/JP2005030966A/ja
Publication of JP2005030966A publication Critical patent/JP2005030966A/ja
Publication of JP2005030966A5 publication Critical patent/JP2005030966A5/ja
Pending legal-status Critical Current

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JP2003271925A 2003-07-08 2003-07-08 検査データ設定方法及びそれを使った検査方法並びに装置 Pending JP2005030966A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003271925A JP2005030966A (ja) 2003-07-08 2003-07-08 検査データ設定方法及びそれを使った検査方法並びに装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003271925A JP2005030966A (ja) 2003-07-08 2003-07-08 検査データ設定方法及びそれを使った検査方法並びに装置

Publications (2)

Publication Number Publication Date
JP2005030966A JP2005030966A (ja) 2005-02-03
JP2005030966A5 true JP2005030966A5 (enExample) 2006-07-27

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ID=34209638

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003271925A Pending JP2005030966A (ja) 2003-07-08 2003-07-08 検査データ設定方法及びそれを使った検査方法並びに装置

Country Status (1)

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JP (1) JP2005030966A (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5091460B2 (ja) * 2006-11-08 2012-12-05 株式会社日立国際電気 検査測定装置
JP5147305B2 (ja) * 2007-06-19 2013-02-20 株式会社アイビット ダイボンダ装置
JP5306682B2 (ja) * 2008-03-26 2013-10-02 パナソニック株式会社 Ｘ線異物検査装置
KR102023231B1 (ko) * 2012-08-28 2019-09-19 스미또모 가가꾸 가부시끼가이샤 결함 검사 장치 및 결함 검사 방법
JP5997989B2 (ja) * 2012-09-13 2016-09-28 株式会社キーエンス 画像測定装置、その制御方法及び画像測定装置用のプログラム
JP2015227809A (ja) * 2014-05-30 2015-12-17 住友ベークライト株式会社 被検物の検査方法
CN104713481A (zh) * 2015-03-21 2015-06-17 江阴新杰科技有限公司 基于平面成像技术的视觉检测方法
JP7018770B2 (ja) * 2018-01-15 2022-02-14 東芝Ｉｔコントロールシステム株式会社 放射線検査装置

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