JP2004537157A5 - - Google Patents

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Publication number
JP2004537157A5
JP2004537157A5 JP2002553187A JP2002553187A JP2004537157A5 JP 2004537157 A5 JP2004537157 A5 JP 2004537157A5 JP 2002553187 A JP2002553187 A JP 2002553187A JP 2002553187 A JP2002553187 A JP 2002553187A JP 2004537157 A5 JP2004537157 A5 JP 2004537157A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002553187A
Other languages
Japanese (ja)
Other versions
JP2004537157A (ja
JP4790970B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2000/035394 external-priority patent/WO2002052347A1/en
Publication of JP2004537157A publication Critical patent/JP2004537157A/ja
Publication of JP2004537157A5 publication Critical patent/JP2004537157A5/ja
Application granted granted Critical
Publication of JP4790970B2 publication Critical patent/JP4790970B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

JP2002553187A 2000-12-21 2000-12-21 放射線誘起表面汚染の軽減 Expired - Lifetime JP4790970B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2000/035394 WO2002052347A1 (en) 2000-12-21 2000-12-21 Mitigation of radiation induced surface contamination

Publications (3)

Publication Number Publication Date
JP2004537157A JP2004537157A (ja) 2004-12-09
JP2004537157A5 true JP2004537157A5 (enExample) 2005-12-22
JP4790970B2 JP4790970B2 (ja) 2011-10-12

Family

ID=21742108

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002553187A Expired - Lifetime JP4790970B2 (ja) 2000-12-21 2000-12-21 放射線誘起表面汚染の軽減

Country Status (5)

Country Link
EP (1) EP1344110B1 (enExample)
JP (1) JP4790970B2 (enExample)
AT (1) ATE460688T1 (enExample)
DE (1) DE60043998D1 (enExample)
WO (1) WO2002052347A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6724460B2 (en) * 2001-11-19 2004-04-20 Asml Netherlands B.V. Lithographic projection apparatus, device manufacturing method, device manufactured thereby, cleaning unit and method of cleaning contaminated objects
TWI254839B (en) * 2002-09-30 2006-05-11 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
EP1403715A3 (en) * 2002-09-30 2006-01-18 ASML Netherlands B.V. Lithographic apparatus and device manufacturing method
EP1431830A3 (en) * 2002-12-20 2004-10-20 ASML Netherlands B.V. Lithographic apparatus, device manufacturing method, and device manufactured thereby
SG139554A1 (en) 2002-12-20 2008-02-29 Asml Netherlands Bv Lithographic apparatus, device manufacturing method, and device manufactured thereby
TWI299505B (en) * 2003-04-08 2008-08-01 Cymer Inc Systems and methods for removal of debris on a reflecting surface of an euv collector in an euv light source
GB0408543D0 (en) * 2004-04-16 2004-05-19 Boc Group Plc Cleaning of multi-layer mirrors
US20060196525A1 (en) * 2005-03-03 2006-09-07 Vrtis Raymond N Method for removing a residue from a chamber
JP4599342B2 (ja) * 2005-12-27 2010-12-15 エーエスエムエル ネザーランズ ビー.ブイ. 光学装置、リソグラフィ装置、および、デバイス製造方法
EP2157584A3 (en) * 2008-08-14 2011-07-13 ASML Netherlands B.V. Radiation source, lithographic apparatus and device manufacturing method
JP5381607B2 (ja) * 2009-10-19 2014-01-08 富士通セミコンダクター株式会社 極端紫外光利用装置
JP6564451B2 (ja) * 2015-03-27 2019-08-21 ギガフォトン株式会社 極端紫外光生成装置及びその設計方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2752386B1 (fr) * 1996-08-14 1998-09-11 Commissariat Energie Atomique Procede de nettoyage ou de decontamination d'un objet au moyen d'un faisceau laser ultraviolet et dispositif pour sa mise en oeuvre
JPH11224839A (ja) * 1998-02-04 1999-08-17 Canon Inc 露光装置とデバイス製造方法、ならびに該露光装置の光学素子クリーニング方法
JP2000091207A (ja) * 1998-09-14 2000-03-31 Nikon Corp 投影露光装置及び投影光学系の洗浄方法
TW548524B (en) * 2000-09-04 2003-08-21 Asm Lithography Bv Lithographic projection apparatus, device manufacturing method and device manufactured thereby

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