JP2004526969A5 - - Google Patents

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Publication number
JP2004526969A5
JP2004526969A5 JP2002579783A JP2002579783A JP2004526969A5 JP 2004526969 A5 JP2004526969 A5 JP 2004526969A5 JP 2002579783 A JP2002579783 A JP 2002579783A JP 2002579783 A JP2002579783 A JP 2002579783A JP 2004526969 A5 JP2004526969 A5 JP 2004526969A5
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JP
Japan
Prior art keywords
sample
light source
recording
imaging device
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002579783A
Other languages
English (en)
Japanese (ja)
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JP2004526969A (ja
JP3933581B2 (ja
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Publication date
Application filed filed Critical
Priority claimed from PCT/EP2002/003682 external-priority patent/WO2002082063A1/en
Publication of JP2004526969A publication Critical patent/JP2004526969A/ja
Publication of JP2004526969A5 publication Critical patent/JP2004526969A5/ja
Application granted granted Critical
Publication of JP3933581B2 publication Critical patent/JP3933581B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2002579783A 2001-04-06 2002-03-28 表面評価の方法および装置 Expired - Fee Related JP3933581B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP01201276 2001-04-06
PCT/EP2002/003682 WO2002082063A1 (en) 2001-04-06 2002-03-28 Method and device for surface evaluation

Publications (3)

Publication Number Publication Date
JP2004526969A JP2004526969A (ja) 2004-09-02
JP2004526969A5 true JP2004526969A5 (ru) 2005-12-22
JP3933581B2 JP3933581B2 (ja) 2007-06-20

Family

ID=8180117

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002579783A Expired - Fee Related JP3933581B2 (ja) 2001-04-06 2002-03-28 表面評価の方法および装置

Country Status (9)

Country Link
EP (1) EP1373867A1 (ru)
JP (1) JP3933581B2 (ru)
KR (1) KR100875806B1 (ru)
CN (1) CN100403011C (ru)
AU (1) AU2002338353B2 (ru)
BR (1) BR0208660A (ru)
RU (1) RU2292037C2 (ru)
WO (1) WO2002082063A1 (ru)
ZA (1) ZA200307712B (ru)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0625890D0 (en) * 2006-12-23 2007-02-07 Colormatrix Holdings Inc Polymeric materials
US9025153B2 (en) * 2011-11-16 2015-05-05 Axalta Coating Systems Ip Co., Llc Process for predicting degree of mottling in coating compositions by wet color measurement
JP5475057B2 (ja) 2012-04-20 2014-04-16 株式会社 オフィス・カラーサイエンス 変角分光イメージング測定方法およびその装置
JP6289450B2 (ja) * 2012-05-09 2018-03-07 シーゲイト テクノロジー エルエルシーＳｅａｇａｔｅ Ｔｅｃｈｎｏｌｏｇｙ ＬＬＣ 表面特徴マッピング
CN103674903A (zh) * 2013-12-31 2014-03-26 爱彼思（苏州）自动化科技有限公司 非接触式光泽度仪
US9880098B2 (en) * 2014-10-28 2018-01-30 Axalta Coatings Systems Ip Co., Llc Method and systems for quantifying differences between colored surfaces
US9678018B2 (en) * 2015-03-30 2017-06-13 Gemological Institute Of America Inc. (Gia) Apparatus and method for assessing optical quality of gemstones
CN106908149A (zh) * 2017-04-11 2017-06-30 上海电机学院 一种机器人物体颜色识别系统及方法
KR102047206B1 (ko) * 2018-10-31 2019-11-20 한국과학기술원 체적함수비별 반사율 측정을 위한 함수특성곡선-초분광 캠 테스트 방법 및 장치
JP7341835B2 (ja) * 2019-10-09 2023-09-11 株式会社日立製作所 粉体混合システム及び粉体混合方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2588297B2 (ja) * 1990-06-20 1997-03-05 日産自動車株式会社 塗装表面の鮮映性評価方法
US5078496A (en) * 1990-08-14 1992-01-07 Autospect, Inc. Machine vision surface characterization system
US5640237A (en) * 1995-08-29 1997-06-17 Kla Instruments Corporation Method and apparatus for detecting non-uniformities in reflective surafaces
JP3312849B2 (ja) * 1996-06-25 2002-08-12 松下電工株式会社 物体表面の欠陥検出方法
US5909276A (en) * 1997-03-31 1999-06-01 Microtherm, Llc Optical inspection module and method for detecting particles and defects on substrates in integrated process tools

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