JP2004521500A5 - - Google Patents

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Publication number
JP2004521500A5
JP2004521500A5 JP2002572689A JP2002572689A JP2004521500A5 JP 2004521500 A5 JP2004521500 A5 JP 2004521500A5 JP 2002572689 A JP2002572689 A JP 2002572689A JP 2002572689 A JP2002572689 A JP 2002572689A JP 2004521500 A5 JP2004521500 A5 JP 2004521500A5
Authority
JP
Japan
Prior art keywords
light source
laser
laser light
monitor
laser diode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002572689A
Other languages
English (en)
Japanese (ja)
Other versions
JP2004521500A (ja
Filing date
Publication date
Priority claimed from GBGB0105651.4A external-priority patent/GB0105651D0/en
Application filed filed Critical
Priority claimed from PCT/GB2002/000870 external-priority patent/WO2002073757A2/en
Publication of JP2004521500A publication Critical patent/JP2004521500A/ja
Publication of JP2004521500A5 publication Critical patent/JP2004521500A5/ja
Pending legal-status Critical Current

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JP2002572689A 2001-03-08 2002-02-27 波長安定化レーザー光源 Pending JP2004521500A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB0105651.4A GB0105651D0 (en) 2001-03-08 2001-03-08 Temperature stabilised laser diode and gas reference package
GB0124426A GB2373096B (en) 2001-03-08 2001-10-11 A wavelength stabilised laser source
PCT/GB2002/000870 WO2002073757A2 (en) 2001-03-08 2002-02-27 A wavelength stablilised laser source

Publications (2)

Publication Number Publication Date
JP2004521500A JP2004521500A (ja) 2004-07-15
JP2004521500A5 true JP2004521500A5 (https=) 2006-05-18

Family

ID=26245794

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002572689A Pending JP2004521500A (ja) 2001-03-08 2002-02-27 波長安定化レーザー光源

Country Status (7)

Country Link
US (1) US20040190571A1 (https=)
EP (1) EP1368872A2 (https=)
JP (1) JP2004521500A (https=)
CN (1) CN1507683A (https=)
AU (1) AU2002234766A1 (https=)
CA (1) CA2477247A1 (https=)
WO (1) WO2002073757A2 (https=)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1460740B1 (en) * 2003-03-20 2006-06-07 Agilent Technologies, Inc. - a Delaware corporation - An optoelectronic module and a thermal switch therefor
US7086274B2 (en) * 2003-12-17 2006-08-08 Alcoa Inc. Method and apparatus for measuring gas concentration levels in liquids
US20060022213A1 (en) * 2004-08-02 2006-02-02 Posamentier Joshua D TO-can heater on flex circuit
DE502005006894D1 (de) * 2004-09-14 2009-04-30 Fraunhofer Ges Forschung Verfahren zum messen mindestens einer gaskomponente
DE102007039317A1 (de) * 2007-08-20 2009-02-26 Ses-Entwicklung Gmbh Verfahren und Vorrichtung zur exakten und geregelten Schwerpunktswellenlängenjustage der emittierten Strahlung einer Leuchtdiode
WO2009119790A1 (ja) * 2008-03-28 2009-10-01 株式会社堀場製作所 光分析計及び分析計用波長安定化レーザ装置
US20100002235A1 (en) * 2008-07-07 2010-01-07 IRMicrosystems SA Laser diode arrangements and method for gas detection
DK2948761T3 (da) 2013-01-23 2023-09-04 California Inst Of Techn Indstilleligt miniaturelaserspektrometer til registrering af en sporgas
CN109188614B (zh) 2018-08-28 2020-02-14 武汉电信器件有限公司 双载波集成光器件及光电模块
CN109406438A (zh) * 2018-11-06 2019-03-01 宁波海尔欣光电科技有限公司 光源封装体和用于检测气体的浓度的系统
CN112730178A (zh) * 2020-12-22 2021-04-30 杭州春来科技有限公司 一种车载透射式烟度计及车辆
US12560754B2 (en) * 2022-05-27 2026-02-24 Ii-Vi Delaware, Inc. Wavelength reference having repeating spectral features and unique spectral features
DE102024112684A1 (de) * 2024-05-06 2025-11-06 Endress+Hauser Group Services Ag Verfahren zur Bestimmung und/oder Überwachung einer Messgröße mittels photothermischer Spektroskopie und photothermisches Spektrometer

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5946434B2 (ja) * 1978-01-10 1984-11-12 キヤノン株式会社 半導体レ−ザ装置
JPS6370589A (ja) * 1986-09-12 1988-03-30 Nec Corp 半導体レ−ザモジユ−ル
JPH04105572U (ja) * 1991-02-26 1992-09-10 ソニー株式会社 レーザ装置
US5329539A (en) * 1991-10-28 1994-07-12 Lightwave Electronics Efficient laser configuration
DE4235768A1 (de) * 1992-10-24 1994-05-19 Cho Ok Kyung Modifizierte Halbleiterlaserdiode mit integriertem Temperaturregelungsteil
DE4429582C2 (de) * 1994-08-19 1998-02-26 Draegerwerk Ag Strahlungsquelle für ein Meßsystem
US5771254A (en) * 1996-01-25 1998-06-23 Hewlett-Packard Company Integrated controlled intensity laser-based light source
DE19717145C2 (de) * 1997-04-23 1999-06-02 Siemens Ag Verfahren zur selektiven Detektion von Gasen und Gassensor zu dessen Durchführung
DE19726455A1 (de) * 1997-06-21 1999-01-07 Draegerwerk Ag Strahlungsquelle für die Laserspektroskopie
US6477190B1 (en) * 1999-02-15 2002-11-05 Fujitsu Limited Optical module

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