JP2004361228A - Chip testing device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a chip testing device capable of doubling test efficiency and allowing application even to the testing work of a micro-chip. <P>SOLUTION: The each chip is distributed from a chip feeder to be dropped into each groove of each chip transporting rotary disk, so as to be advanced frontwards according to the chip transporting rotary disk, and the classified chips are collected in chip collection tanks corresponding to respective classes through guide tubes, by the chip feeder. The two sets of chip transporting rotary disks are provided in parallel, the sets are driven by one transmission and one motor synchronizedly, the two chip transporting rotary disks are rotated reverse-directionally each other to receive the chips fed in order from the single chip feeder to be tested, the chips in the plurality of trains of the two chip transporting rotary disks are tested synchronizedly by a single testing device, and the chips are classified into the classes of the chips by chip discharge devices located in both sides of the two chip transporting rotary disks to collect the chips into the chip collection tanks corresponding to the respective classes. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a chip test apparatus, and particularly to a single chip feeder and a single test apparatus for synchronously and efficiently transporting chips mounted on a two-chip transport rotating disk that is rotating correspondingly. The present invention relates to a chip test device for testing.
[0002]
[Prior art]
At present, tests for each type of chip, such as inductance, capacitance, and resistance, have already been carried out using a highly efficient chip tester, and the chip tester automatically transports, tests, classifies, and concentrates. By such automatic processing, the test operation of the chip can be made faster and the quality control of the chip can be ensured.
[0003]
FIG. 10 shows a conventional chip test apparatus. The apparatus main body 10 includes a control set 101, a chip feeding apparatus 102, a chip transport rotating disk 103, a test apparatus 104, a chip discharging apparatus 105, A chip to be tested, which is composed of a chip receiving tank 106, is put into a chip transporting rotating disk 103 from a chip feeding device 102, and the chip is rotated by the chip transporting rotating disk 103 so that the chip is moved up and down by a vertical probe (see FIG. (Not shown), and each performance value is measured. After classifying the performance values according to the measured performance values, the chips corresponding to each class are discharged to each chip receiving tank 106 by the chip discharge device 105.
[0004]
Also, in order to improve the test efficiency, more chips are stored by providing a plurality of grooves in the chip transport rotary disk 103, and the upper and lower probes in the test apparatus 104 are such that the chips pass through the upper and lower probes. In this case, the distance between the upper and lower probes is adjusted according to the size of the tip so as to obtain each measurement value by appropriate contact (the inventor of the present invention filed on January 17, 2000 and obtained Taiwan Patent No. 89200743). T).
[0005]
[Problems to be solved by the invention]
However, although the above-mentioned chip test apparatus can achieve a predetermined purpose and effect of use, the following problems have occurred in the above-mentioned chip test apparatus as the chip becomes smaller.
[0006]
(B) The chip transport rotary disk becomes thinner as the chip design becomes smaller and smaller, but the chip transport rotary disk is generally made of glass fiber reinforced resin (FRP). The larger the value, the worse the phenomena such as deformation and torsion, which adversely affected the stability and efficiency of the test. Also, in order to improve the test efficiency, it is better to increase the number of the chip receiving grooves on the chip transporting rotating disk, but if the number of the chip receiving grooves is too large, the thickness becomes too thin, and there is a possibility of deformation. Therefore, it is difficult to increase the number of chip receiving grooves. Accordingly, the test efficiency cannot be further improved.
[0007]
(B) When the number of the chip receiving grooves is increased in order to improve the production efficiency, the chip transporting rotating disk is easily deformed, so that a smaller chip cannot be tested. However, if a smaller chip is tested, the chip receiving groove must be reduced to reduce the size of the chip transport rotating disk. Indeed, both cannot be considered at the same time.
[0008]
The main object of the present invention is to install a two-chip transport rotating disk in parallel in the apparatus main body, and on the two-chip transport rotating disk, a plurality of concentric grooves are provided, and by driving one driving device The two-chip transport rotating disk is rotated in the opposite direction, and a number of chips distributed and fed from the chip feeding device are received in the grooves on the two-chip transport rotating disk, and then transported to a single test device. And the chip ejector classifies the chips into classes according to the tested data and ejects them to each chip collecting tank, so that the two-chip transport rotating disk can be connected to a single chip feeder. Provided is a chip test apparatus that can achieve twice the test efficiency in combination with a single test apparatus and can also simplify the mechanism of the apparatus.
[0009]
The next object of the present invention is to improve the test efficiency by using two chip transporting rotating disks, so that even if the groove on the chip transporting rotating disk is optimally designed, the test efficiency is not adversely affected. Even if the size of the chip transporting rotating disk is not significantly reduced, the predetermined test efficiency and the output can be maintained, so that the chip transporting rotating disk is not deformed and the test can be performed even with a finer chip. Provide a chip testing device capable of
[0010]
[Means for Solving the Problems]
In order to achieve the above object, a first aspect of the present invention is directed to an apparatus main body in which mechanisms such as a chip feeding device, a chip transport rotating disk, a test device, and a chip discharging device are separately provided. Yes, chips are distributed from the chip feeding device and fall into each groove of the chip transporting rotary disk, and the holes move forward as the chip transporting rotary disk rotates. When passing through the probe, the chip is tested by the upper and lower probes and the chip class is divided according to the recorded test value.The chips that have been classified are classified into the respective classes via the guide tube by the chip discharge device. In a chip testing apparatus for collecting chips in a corresponding chip collecting tank, the chip transporting rotating disks are parallelly arranged in two sets, and are driven synchronously by one transmission device and one motor, and The two-chip transport rotating discs rotate in opposite directions to each other, so that they can receive the chips to be tested sequentially supplied from a single tip feeder, and the two-chip transport rotating discs A plurality of rows of chips can be tested synchronously by a single testing device, and the chips are separated and classified by the chip discharging devices on both sides of the two-chip transporting rotating disk to classify the chips. The gist of the present invention is to provide a chip test apparatus characterized by being concentrated in a chip collecting tank corresponding to each class.
[0011]
According to claim 2 of the present application, the device main body is provided with a mechanism such as a chip feeding device, a chip transport rotating disk, a test device, a chip discharging device, and the like. Distribute and fall into each groove of the chip transport rotating disk, the hole also advances forward according to the rotation of the chip transport rotating disk, and when the chip passes through the upper and lower probes on the arc-shaped plate of the test equipment The chips are tested by the upper and lower probes, and the chip class is divided according to the test numerical values recorded. The chips that have been classified are collected in the chip collecting tank corresponding to each class via the guide tube by the chip discharging device. In the chip test apparatus, the chip transporting rotating disks are arranged in parallel in two sets, and are driven synchronously by one transmission device and one motor. Is summarized in that the forced in the chip by a chip delivery device, a chip testing apparatus characterized by testing the chips resting on the chip transport rotary disc by the same of the test apparatus.
[0012]
According to a third aspect of the present invention, there is provided a chip test apparatus according to the first aspect, wherein a one-chip guide cover covers the two-chip transporting rotating disk.
[0013]
According to a fourth aspect of the present invention, there is provided a chip test apparatus according to the second aspect, wherein a one-chip guide cover covers the two-chip transporting rotating disk.
[0014]
According to a fifth aspect of the present invention, there is provided a tip test apparatus according to the third aspect, wherein the tip guide cover is provided with a plurality of transparent viewing windows.
[0015]
According to a sixth aspect of the present invention, there is provided the chip test apparatus according to the fourth aspect, wherein the tip guide cover is provided with a plurality of transparent viewing windows.
[0016]
According to claim 7 of the present application, the chip transport rotary disk is synchronously driven by a stepping motor of a transmission device, and a pulley is provided on a rotary shaft of the first chip transport rotary disk, and one timing belt is a stepping motor. And a pulley attached to the rotary shaft, and a spur gear is provided at an end of the rotary shaft.The spur gear meshes with another spur gear nearby, and the other spur gear meshes with the other spur gear. The spur gear drives the small rotating shaft in the direction opposite to the rotating direction of the stepping motor, and the other end of the small rotating shaft is provided with a pulley, and is connected to the end of the rotating shaft of the second chip transporting rotating disk. The chip test apparatus according to claim 1, wherein a pulley is provided, and a pulley attached to a rotating shaft of the two-chip transport rotating disk is connected by another timing belt. It is summarized in that it.
[0017]
According to claim 8 of the present application, the chip transport rotary disk is synchronously driven by a stepping motor of a transmission device, and a pulley is provided on a rotary shaft of the first chip transport rotary disk, and one timing belt is driven by a stepping motor. And a pulley attached to the rotating shaft, and a spur gear is provided at an end of the rotating shaft.The spur gear meshes with another spur gear nearby, and the other spur gear meshes with the other spur gear. The spur gear drives the small rotating shaft in the direction opposite to the rotating direction of the stepping motor, and the other end of the small rotating shaft is provided with a pulley, and is connected to the end of the rotating shaft of the second chip transporting rotating disk. 3. The chip test apparatus according to claim 2, wherein a pulley is provided, and the pulley attached to the rotating shaft of the two-chip transport rotating disk is connected by another timing belt. It is summarized in that it.
[0018]
BEST MODE FOR CARRYING OUT THE INVENTION
First, reference is made to FIGS. In the chip testing apparatus of the present invention, a mechanism such as a chip feeding device 2, a chip transport rotating disk 3, a testing device 4, a chip discharging device 5, and the like are separately provided in a device main body 1.
[0019]
Next, reference is made to FIGS. The chip feeding device 2 includes a support frame 21, a pedestal 22, a hopper 23, a vibrating chip feeding groove 24, a distribution hopper, and a supporting frame 21 installed in front of the chip transport rotary disk set 3 on the device main body 1. 25 and one stepping motor 26. On the bottom surface of the pedestal 22, there is provided a sliding seat 221 that can be freely moved back and forth and positioned on the sliding rail 211 of the support frame 21. The hopper 23 provided on the pedestal 22 stores a number of chips to be tested, and the entrance of the vibrating chip feed groove 24 is located just below the exit of the hopper 23, Due to the vibration of 231, the chips that have fallen into the vibrating chip feed groove 24 continue to advance, and the distribution hopper 25 is located below the outlet of the vibrating chip feed groove 24 and the rear end of the distribution hopper 25. Has a slide seat 251 fitted on a slide rail 252 at the end of the pedestal 22. The distribution hopper 25 reciprocates sideways by driving the stepping motor 26 and the timing belt 261. It can be stopped above the entrance of the two-chip transport rotating disks 31, 32 of the chip transport rotating disk set 3.
[0020]
Please refer to FIG. 5 to FIG. The chip transport rotating disk set 3 is provided on the front inclined plate 11 of the apparatus main body 1 in an inclined manner. In addition, the chip transport rotary disk set 3 includes a two-chip transport rotary disk 31, 32 arranged in parallel, a guide cover 33, and a transmission device 34. The first chip transporting rotating disk 31 and the second chip transporting rotating disk 32 have the same configuration and are symmetrically installed (see FIGS. 2 and 5). Grooves 311 and 321 are provided, and holes 3111 and 3211 are provided on the grooves 311 and 321 for accommodating chips distributed concentrically and equidistantly. On the two-chip transport rotating disks 31 and 32, one guide cover 33 (see FIGS. 7 and 8) covers them, and the guide cover 33 transports chips in the respective grooves 311 and 321. A plurality of transparent viewing windows 331 for checking the situation are provided. Opposite portions of the two-chip transport rotating disks 31 and 32 are entrances 332 and 334, respectively. The distribution hopper 25 of the chip feeding device 2 reciprocates in the distribution hopper 25 sideways by the driving of the stepping motor 26. The chips can be stopped above the entrances 332, 334 of the two-chip transport rotating discs 31, 32, so that the chips fall and are stored in the grooves 311, 321 and the chips are rotated by the rotation of the respective tip transport rotating discs 31, 32. Be advanced.
[0021]
Further, the two-chip transport rotating disks 31 and 32 are intermittently rotated in different rotation directions synchronously by a stepping motor 341 of the transmission device 34. A pulley 313 is provided on the rotating shaft 312 of the first chip transporting rotating disk 31 (see FIGS. 5 to 7), and one timing is provided between the pulley 313 and the pulley 3411 provided on the stepping motor 341. A belt 314 is wound around and connects them, and at the end of the rotating shaft, there is provided a spur gear 342 meshing with another spur gear 343 nearby, and the spur gear 343 controls the rotation of the stepping motor 341. The rotation is transmitted to the small rotation shaft 344 to drive the small rotation shaft 344 in the reverse direction. At the other end of the small rotation shaft 344, a transmission pulley 345 is provided. A pulley 323 is also provided on the rotating shaft 322, and another timing belt 324 is wound between the two pulleys 345 and 323 to Connecting the-up transport rotary disk 31, Then, it is possible to the stepping motor 341 is rotated intermittently in the rotational direction different synchronizing the two chip transport rotary disk 31.
[0022]
The test device 4 is located above the two-chip transport rotating disks 31 and 32 (see FIGS. 5 to 9), and its pedestal 41 is provided on the apparatus main body 1. An arc-shaped plate 42 is provided on the bottom side, and the arc-shaped plate 42 simultaneously covers the two-chip transport rotating disks 31 and 32 and is fixed or pivoted to the pedestal 41. The distance between the two-chip transport rotating disks 31, 32 can be finely adjusted by installing the slide seat 43, the slide rail 44, and the fine adjuster. The arc-shaped plate 42 is provided with a plurality of sets of upper probes 421 having a quantity and a position corresponding to the grooves 311 and 321 on the two-chip transport rotating disks 31 and 32, respectively. The upper probe 421 faces the lower probe 422 located below the two-chip transport rotating disks 31 and 32 of the apparatus main body 1. Then, the test can be performed when the chips placed in the grooves 311 of the two-chip transport rotating disks 31 and 32 pass through the upper and lower probes 421 and 422.
[0023]
The chip discharging device 5 is located outside the two-chip transport rotating disks 31 and 32 (see FIGS. 6 to 9), and on the covers 51 and 52, chips are collected in respective chip collecting tanks of the device main body 1. A number of insertion holes 511 and 521 for connecting to a guide tube (not shown) for guiding the inside of the cover 53 are provided, and the covers 51 and 52 are pivoted out to open. The bottom ends of the covers 51 and 52 are pivotally mounted on the apparatus main body 1. Further, the covers 51 and 52 are provided on the bottom of the adjustable plate 54 fitted on the slide rail 541, so that the distance between the covers 51 and 52 and the two-chip transport rotating disks 31 and 32 is adjusted. Alternatively, the chips which have been tested and classified can be reliably fed from the guide tube into the respective chip collecting tanks 53 corresponding to the classes.
[0024]
When the present invention is used, the chip to be tested falls from the hopper 23 of the chip feeding device 2 into the vibrating chip feeding groove 24, advances and falls into the distribution hopper 25, and the distribution hopper 25 It reciprocates by the driving of the stepping motor 26, and distributes the chips to the respective grooves 311 and 321 on the first and second chip transport rotating disks 31 and 32 on average. At this time, the first and second chip transport rotary disks 31 and 32 are also intermittently rotated in opposite directions synchronously by members such as the transmission device 34, the stepping motor 341 and the gears, so that the two-chip transport rotary disks 31 and 32 are rotated. Is transported to the test apparatus 4.
[0025]
When the chips on the two-chip transport rotating disks 31 and 32 reach the test device 4 and pass through the upper and lower probes 421 and 422, the test device 4 tests and records the chips and classifies them, The tested chips are continuously transported backward by the intermittent rotation of the two-chip transport rotating disks 31 and 32. When the tested chips reach the chip discharging device 5, the chips are classified according to the above classification result. Is fed into each chip collecting tank 53 corresponding to the class via the guide tube. The chips to be tested can be fed from the distribution hopper 25 to the grooves 311 and 321 on the two-chip transport rotating disks 31 and 32 via the holes 3111 and 3211. Then, the two-chip transport rotating disks 31 and 32 successively intermittently rotate in opposite directions synchronously to transport the chips placed thereon and perform the test. Can be collected according to the classification.
[0026]
【The invention's effect】
The present invention has the following effects.
(B) The two-chip transport rotating disk is driven by one stepping motor to transport the chips, the chips are distributed by a single chip feeding device, and the chips are mounted on the two-chip transport rotating disk by a single testing device. Since the chip is tested synchronously, double test efficiency can be achieved and the mechanism of the device can be simplified.
[0027]
(B) In response to the trend of chip miniaturization, it is possible to optimally design the number of grooves on the rotating disk without increasing the size of the rotating disk for chip transportation, and the rotating disk for chip transportation will be deformed. The test efficiency and productivity can be improved because the number of rotating disks for chip transport is two, without performing the test.
[0028]
(C) The test efficiency and productivity can be improved without increasing the size of the chip transporting rotating disk, and the chip transporting rotating disk does not deform. The invention can also be applied to smaller chip testing operations, since the transport spinning disk can be designed.
[Brief description of the drawings]
FIG. 1 is a schematic side view of a chip test apparatus of the present invention.
FIG. 2 is a schematic front view of the chip test apparatus of the present invention.
FIG. 3 is a schematic plan view of the chip test apparatus of the present invention.
FIG. 4 is a plan view schematically showing an arrangement of a chip feeding device according to the chip test device of the present invention.
FIG. 5 is a front view schematically showing a chip transport rotary disk set according to the chip test apparatus of the present invention.
FIG. 6 is a schematic view of a transmission device of a chip transport rotary disk set according to the chip test apparatus of the present invention.
FIG. 7 is a side view schematically showing a test apparatus and the like according to the chip test apparatus of the present invention.
FIG. 8 is a front view of a chip transport rotary disk according to the chip test apparatus of the present invention.
FIG. 9 is a schematic view showing an arrangement of a chip transport device and other devices according to the chip test device of the present invention.
FIG. 10 is a perspective view schematically showing a conventional chip test apparatus.
[Explanation of symbols]
(Conventional part)
Reference Signs List 10 Device main body 101 Control group 102 Chip feeding device 103 Chip transport rotating disk 104 Test device 105 Chip discharging device 106 Chip receiving tank (part of the present invention)
DESCRIPTION OF SYMBOLS 1 Device main body 11 Front inclined plate 2 Chip feeding device 21 Support frame 211 Sliding rail 22 Base 221 Sliding seat 23 Hopper 231 Vibrator 24 Vibrating chip feeding groove 25 Distribution hopper 251 Sliding seat 252 Sliding rail 26 Stepping motor 261 Timing belt 3 Chip transporting rotating disk set 31 First chip transporting rotating disk 311 Groove 3111 Hole 312 Rotating shaft 313 Pulley 314 Timing belt 321 Groove 32 Second chip transporting rotating disk 322 Rotating shaft 3211 Groove 323 Pulley 324 Timing belt 33 Guide cover 331 Viewing window 34 Transmission device 341 Stepping motor 3411 Pulley 342 Spur gear 343 Spur gear 344 Rotating shaft 345 Transmission pulley 4 Test device 41 Pedestal 42 Arc-shaped plate 421 Upper probe 422 Lower probe 43 Sliding seat 44 Sliding Lumpur 45 fine regulator 5 chip discharge device 51 covers 511 insertion holes 52 covers 521 insertion hole 53 chips collected tank 54 freely plate 541 sliding rail

Claims (8)

In the main body of the device, mechanisms such as a chip feeding device, a chip transport rotating disk, a test device, a chip discharging device, etc. are provided separately, and chips are distributed from the chip feeding device to each groove of the chip transport rotating disk. When the tip falls and the hole moves forward according to the rotation of the tip transport rotating disk, the tip is tested and recorded by the upper and lower probes when the tip passes through the upper and lower probes on the arc-shaped plate of the test apparatus. The chip class is divided according to the test value, and the chips divided into classes are collected in a chip collecting tank corresponding to each class via a guide tube by a chip discharging device.
The chip transporting rotating disks are paralleled in two sets and driven synchronously by one transmission device and one motor, wherein the two chip transporting rotating disks rotate in opposite directions to each other, so that a single chip transporting disk is rotated. Receiving the chips to be tested sequentially sent from the input device, and performing a test synchronously with a single test device on a plurality of rows of chips of the two-chip transport rotating disk; and A chip testing device, wherein chips are classified and classified by chip discharging devices on both sides of the two-chip transport rotating disk, and chips are collected in chip collecting tanks corresponding to each class. In the main body of the device, mechanisms such as a chip feeding device, a chip transport rotating disk, a test device, a chip discharging device, etc. are provided separately, and chips are distributed from the chip feeding device to each groove of the chip transport rotating disk. When the tip falls and the hole moves forward according to the rotation of the tip transport rotating disk, the tip is tested and recorded by the upper and lower probes when the tip passes through the upper and lower probes on the arc-shaped plate of the test apparatus. The chip class is divided according to the test value, and the chips divided into classes are collected in a chip collecting tank corresponding to each class via a guide tube by a chip discharging device.
The chip transporting rotating disks are arranged in parallel in two sets, and are driven synchronously by one transmission device and one motor, and each chip transporting rotating disk receives chips by the same chip feeding device and receives the same chips. A chip test apparatus for testing chips mounted on each chip transporting rotating disk by a test apparatus. The chip test apparatus according to claim 1, wherein a one-chip guide cover covers the two-chip transport rotating disk. The chip test apparatus according to claim 2, wherein a one-chip guide cover covers the two-chip transport rotating disk. The chip test apparatus according to claim 3, wherein the chip guide cover is provided with a plurality of transparent viewing windows. The chip test apparatus according to claim 4, wherein the chip guide cover is provided with a plurality of transparent viewing windows. The chip transporting rotating disk is driven synchronously by a stepping motor of a transmission device, and a pulley is provided on a rotating shaft of the first chip transporting rotating disk, and one timing belt is provided with a pulley attached to the stepping motor and the rotation. A pulley attached to a shaft is connected, and a spur gear is provided at the end of the rotating shaft, the spur gear meshes with another spur gear nearby, and the other spur gear connects a small rotating shaft. Driving in the direction opposite to the rotation direction of the stepping motor, one pulley is provided at the other end of the small rotary shaft, and one pulley is also provided at the end of the rotary shaft of the second chip transport rotary disk. The chip test apparatus according to claim 1, wherein a pulley attached to a rotating shaft of the two-chip transport rotating disk is connected with another timing belt. The chip transporting rotating disk is driven synchronously by a stepping motor of a transmission device, and a pulley is provided on a rotating shaft of the first chip transporting rotating disk, and one timing belt is provided with a pulley attached to the stepping motor and the rotation. A pulley attached to a shaft is connected, and a spur gear is provided at the end of the rotating shaft, the spur gear meshes with another spur gear nearby, and the other spur gear connects a small rotating shaft. Driving in the direction opposite to the rotation direction of the stepping motor, one pulley is provided at the other end of the small rotary shaft, and one pulley is also provided at the end of the rotary shaft of the second chip transport rotary disk. 3. The chip test apparatus according to claim 2, wherein a pulley attached to a rotating shaft of the two-chip transport rotating disk is connected by another timing belt.

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