JP2004337873A - Optical beam working apparatus - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an optical beam heating apparatus capable of performing optimum working by solving a problem that a work in a center portion in the irradiation range is heated earlier than the work in a peripheral portion, and the calorie transferred to each work becomes different when heating a plurality of works in the irradiation range of optical beams in a soldering device using optical beams which performs partial or local soldering by irradiating optical beams from a lamp or a laser beam source on parts to be soldered of the works. <P>SOLUTION: A plurality of works 1 are optimally heated by providing an intensity distribution adjustment plate 10 between the works 1 and a lens barrel 7 to irradiate optical beams. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a light beam processing apparatus that performs processing by irradiating a workpiece with a light beam.
[0002]
[Prior art]
Conventionally, a soldering apparatus using a light beam irradiates a part to be soldered with a light beam from a lamp or a laser light source to perform partial or local soldering. (For example, see Patent Document 1)
[0003]
[Patent Document 1]
Japanese Patent Laid-Open No. 6-198423
[Problems to be solved by the invention]
However, according to the conventional apparatus, the intensity of light irradiated in the entire area within the light irradiation range varies, and a uniform temperature rise cannot be obtained within the irradiation range.
[0005]
Further, due to variations in the heat capacities of the parts to be joined, a uniform temperature rise (uniform light amount) is not always optimal.
[0006]
An object of this invention is to provide the light beam heating apparatus which can perform an optimal process in view of the said subject.
[0007]
[Means for Solving the Problems]
In order to achieve the above object, the light beam processing apparatus of the present invention has a beam adjusting means for adjusting the intensity distribution of the light beam in the middle of the light path of the workpiece and the light irradiation when the workpiece is irradiated with the light beam. In addition, the light heat source can be controlled to control the light quantity itself.
[0008]
DETAILED DESCRIPTION OF THE INVENTION
(Embodiment 1)
Embodiments of the present invention will be described below with reference to the drawings.
[0009]
FIG. 1 is a schematic configuration diagram of a light beam processing apparatus according to an embodiment of the present invention. FIG. 2 is a view taken in the direction of arrow A in FIG.
[0010]
The electronic component 1 to be soldered is placed on a pre-printed solder paste 12 on a flexible substrate 2.
[0011]
The flexible substrate 2 on which the electronic component 1 is mounted is placed on a substrate lower support plate 3 having an opening hole shape 3a, and is held in a sandwiched manner by a substrate upper pressing plate similarly having an opening hole shape 4a. Yes.
[0012]
In addition, the light beam processing apparatus for heating the solder includes a light beam power supply control device 5 including a light beam light source (not shown), a control operation panel 11, and a light beam generated in the light beam power supply control device 5. And the optical fiber 6 that guides the lens to the lens barrel 7.
[0013]
Further, condensing lenses 8a and 8b are arranged in the lens barrel 7. Further, an intensity distribution adjustment plate 10 is disposed between the flexible substrate 2 to be heated and the lens barrel 7, and the light beam 9 a irradiated from the lens barrel 7 passes through the intensity distribution adjustment plate 10 and becomes an intensity distribution. As the adjusted light beam 9b, the flexible substrate 2 is irradiated from the opening hole 3a of the substrate lower support plate 3.
[0014]
The flexible substrate 2 is heated by irradiation with a light beam from below, and the solder paste 12 between the electronic component 1 is melted and the electronic component 1 is soldered to the flexible substrate 2.
[0015]
Next, the effect of the intensity distribution adjusting plate 10 will be described with reference to FIGS. FIG. 3 is an image diagram of the light intensity distribution when radiating from the lens barrel 7 and reaching the flexible substrate 2. As shown in FIG. 3, the light beam irradiation center has the strongest light intensity per unit area, and the light intensity decreases as it approaches the irradiation end.
[0016]
At this time, the solder temperature on the flexible substrate 2 is lowered in the peripheral portion in a form similar to the light intensity distribution. In particular, since the peripheral portion of the flexible substrate 2 is in contact with the substrate lower support plate 3 and the substrate upper holding plate 4, the phenomenon that the heat of the flexible substrate 2 is conducted and cooled is also taken into consideration. Next, FIG. 4 shows an embodiment of the intensity distribution adjusting plate 10. A small hole is made in a thin metal flat plate, and the size, number, density, etc. of the hole are changed between the central part and the peripheral part. As a result, the light transmittance per unit area differs between the central part and the peripheral part. I have to. In this example, the light transmittance at the central portion is lowered and the light transmittance at the peripheral portion is increased.
[0017]
5 shows the light intensity distribution of the light beam when the intensity distribution adjusting plate 10 of FIG. 4 is inserted between the lens barrel 7 and the heated flexible substrate 2 in the measurement state of FIG. It is an image figure of the result of having measured the temperature rise of the solder. By using the intensity distribution adjusting plate 10, the intensity per unit area of the light beam is slightly decreased in the central portion within the irradiation range and has a two-peak intensity distribution. Looking at the temperature distribution of the solder, it can be seen that the temperature is almost the same at the center and the periphery.
[0018]
This is presumably because there is a temperature rise at the same level in the central part of the irradiation range, and heat is conducted and cannot escape. When the intensity distribution adjusting plate 10 is used, the temperature of the paste solder on the flexible substrate 2 is lowered as a whole. This is because the light beam power supply controller 5 increases the total light amount of the light beam. Can be solved. As a result, if a specific numerical value is shown, heating is performed using lead-free solder having a melting point of about 220 ° C., and when the electronic component 1 is soldered, when the strength distribution adjusting plate 10 is not used, the central portion of the paste solder 12 is used. However, when the intensity distribution adjusting plate 10 is used, the temperature difference Δt can be suppressed to about 20-25 ° C.
[0019]
According to the embodiment described above, the heat conduction unevenness does not occur. Also, the deformation of the flexible substrate 2 that occurs during heating is not a problem because it is a non-contact heating method using a light beam. Furthermore, even when the electronic components 1 having different heat capacities are soldered simultaneously, the light beam intensity distribution adjusting plate 10 increases the light transmittance under the electronic components 1 having a large heat capacity, and other electronic components having a small heat capacity. Under 1, the electronic components 1 having different heat capacities can be soldered at the same time if a means for reducing the light transmittance is taken. Furthermore, for example, in the case where a bare IC or the like has been mounted in the previous process or the like within the same irradiation range of the light beam and the other electronic component 1 cannot be reheated when soldered, By completely shielding the light beam intensity distribution adjusting plate 10 only at the bottom of the bare IC, it is possible to prevent reheating without irradiating the light beam at all, and to solder only the electronic component 1 to be soldered. It is.
[0020]
6 and 7 show examples of the opening shape of the light beam intensity distribution adjusting plate 10. 6 and 7 are enlarged views of the main part of the intensity distribution adjusting plate 10. FIG. 6 shows an example in which the shape of the opening is square, and FIG. 7 shows an example in which the shape of the opening is also circular.
[0021]
【The invention's effect】
As described above, according to the light beam processing apparatus of the present invention, by using the intensity distribution adjusting plate, it is possible to solder the electronic components on the flexible substrate at a nearly uniform temperature, thereby improving the soldering quality. Can be improved. Also, electronic components having different heat capacities within the same irradiation range can be soldered simultaneously. Moreover, the problem of imbalance of heat conduction does not occur.
[Brief description of the drawings]
FIG. 1 is a schematic configuration diagram of a light beam processing apparatus according to an embodiment of the present invention. FIG. 2 is a view taken along an arrow A in FIG. 1. FIG. 3 is an image diagram of light intensity distribution according to an embodiment of the present invention. FIG. 4 is an explanatory diagram of an intensity distribution adjusting plate according to an embodiment of the present invention. FIG. 5 is an image diagram of light intensity distribution according to an embodiment of the present invention. FIG. 7 is an enlarged view of a main part of an intensity distribution adjusting plate showing an embodiment of the present invention.
DESCRIPTION OF SYMBOLS 1 ... Electronic component 2 ... Flexible board 3 ... Substrate lower support plate 3a ... Substrate lower support plate opening 4 ... Substrate upper press plate 4a ... Substrate upper press plate opening 5 ... Light beam power supply control device 6 ... Optical fiber 7 ... Lens mirror Tubes 8a, 8b ... Condensing lens,
9a, 9b ... light beam 10 ... intensity distribution adjusting plate 11 ... control operation panel 12 ... solder paste

Claims (8)

A light beam processing apparatus comprising: an irradiation unit that irradiates a workpiece with a light beam; and a beam adjusting unit that adjusts an intensity distribution of the light beam between the irradiation unit and the workpiece. 2. The light beam processing apparatus according to claim 1, wherein means for controlling the amount of light beam transmitted is used as the beam adjusting means, and the peripheral transmittance is made higher than the transmittance of the light beam at the central portion. 3. The light beam processing according to claim 1, wherein means for controlling the amount of light beam transmitted is used as the beam adjusting means, and the amount of light beam transmission is predetermined according to the surface of the workpiece irradiated with the light beam. apparatus. The light beam processing apparatus according to any one of claims 1 to 3, wherein the irradiation unit is disposed on the lower side in the gravity direction with respect to the workpiece. 5. The light beam processing apparatus according to claim 1, wherein a circuit board to which an electronic component is attached is used as a workpiece, and an irradiation unit is disposed on the back side of the surface of the circuit board to which the electronic component is attached. Using means for controlling the amount of light beam that is transmitted as beam adjusting means, the light transmittance of the central portion is applied so that a light beam of uniform intensity is irradiated to the back side of the surface of the circuit board on which the electronic component is mounted. 6. The light beam processing apparatus according to claim 5, wherein the peripheral transmittance is higher than that of the first embodiment. Using a circuit board with an electronic component attached as a workpiece, an irradiating part is arranged on the front side of the surface of the circuit board with the electronic component attached, and means for controlling the amount of light beam transmitted is used as a beam adjusting means. 4. The light beam processing apparatus according to claim 1, wherein the transmittance of the light beam is set so as to irradiate a light beam having an intensity corresponding to an electronic component of the circuit board. The shielding means for shielding the irradiation of the light beam is disposed between the beam adjusting means and the workpiece, and an opening is provided in the shielding means corresponding to the portion of the workpiece to be irradiated with the light beam. The light beam processing apparatus according to any one of 7.

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