JP2004219126A5 - - Google Patents
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- Publication number
- JP2004219126A5 JP2004219126A5 JP2003003951A JP2003003951A JP2004219126A5 JP 2004219126 A5 JP2004219126 A5 JP 2004219126A5 JP 2003003951 A JP2003003951 A JP 2003003951A JP 2003003951 A JP2003003951 A JP 2003003951A JP 2004219126 A5 JP2004219126 A5 JP 2004219126A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003003951A JP2004219126A (ja) | 2003-01-10 | 2003-01-10 | 電流レンジを自動的に変更する方法 |
| US10/736,198 US6911831B2 (en) | 2003-01-10 | 2003-12-15 | Method for automatically changing current ranges |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003003951A JP2004219126A (ja) | 2003-01-10 | 2003-01-10 | 電流レンジを自動的に変更する方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2004219126A JP2004219126A (ja) | 2004-08-05 |
| JP2004219126A5 true JP2004219126A5 (enExample) | 2005-11-04 |
Family
ID=32708930
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003003951A Pending JP2004219126A (ja) | 2003-01-10 | 2003-01-10 | 電流レンジを自動的に変更する方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US6911831B2 (enExample) |
| JP (1) | JP2004219126A (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005354825A (ja) * | 2004-06-11 | 2005-12-22 | Nissan Motor Co Ltd | ハイブリッド車両のｓｏｃ演算装置 |
| US7202676B2 (en) * | 2005-02-28 | 2007-04-10 | Keithley Instruments, Inc. | Source measure circuit |
| US7521934B1 (en) | 2006-10-16 | 2009-04-21 | Yazaki North America, Inc. | Battery current measurement with real time pre-gain adjust and programmable excitation source |
| US7906977B1 (en) * | 2008-03-24 | 2011-03-15 | Keithley Instruments, Inc. | Dual output stage source measure circuit |
| US7812589B2 (en) | 2008-08-28 | 2010-10-12 | Qualitau, Inc. | Modified current source (MCS) with seamless range switching |
| JP2010259254A (ja) | 2009-04-27 | 2010-11-11 | Panasonic Corp | 電流制御装置及び保護装置 |
| US8547120B1 (en) * | 2009-05-13 | 2013-10-01 | Keithley Instruments, Inc. | High speed AC current source |
| US9207282B2 (en) | 2013-03-14 | 2015-12-08 | Teradyne, Inc. | Smooth vi mode crossover method at compliance limit threshold |
| US9568504B2 (en) | 2013-03-15 | 2017-02-14 | Milwaukee Electric Tool Corporation | Digital multi-meter |
| US10228397B2 (en) | 2015-11-20 | 2019-03-12 | Keysight Technologies, Inc. | Apparatus and associated methods for monitoring noise level of a signal |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3546582A (en) * | 1968-01-15 | 1970-12-08 | Ibm | Computer controlled test system for performing functional tests on monolithic devices |
| US3875506A (en) * | 1973-12-27 | 1975-04-01 | Keithley Instruments | Electronic protective circuit |
| JPS5875073A (ja) * | 1981-10-29 | 1983-05-06 | Yokogawa Hewlett Packard Ltd | 直流特性測定システム |
| JPS58148507A (ja) | 1982-02-26 | 1983-09-03 | Yokogawa Hewlett Packard Ltd | 複合制御増幅器 |
| JP3273047B2 (ja) * | 1991-07-26 | 2002-04-08 | アジレント・テクノロジー株式会社 | 電流−電圧特性測定方法 |
| JPH0894703A (ja) * | 1994-09-20 | 1996-04-12 | Mitsubishi Electric Corp | 半導体電気的特性測定装置 |
| JP3457091B2 (ja) | 1995-03-17 | 2003-10-14 | アジレント・テクノロジー株式会社 | 電圧電流特性測定装置 |
| US6127836A (en) * | 1996-07-22 | 2000-10-03 | Micro Instrument Company | Electronic test apparatus |
| US6069484A (en) * | 1997-09-25 | 2000-05-30 | Keithley Instruments, Inc. | Source measure unit current preamplifier |
| US6262670B1 (en) * | 1998-04-10 | 2001-07-17 | Kevin R. Ballou | Source measure unit having secondary feedback for eliminating transients during range changing |
| US6489797B1 (en) * | 1999-07-15 | 2002-12-03 | Ltx Corporation | Test system including a test head with integral device for generating and measuring output having variable current or voltage characteristics |
| KR20020081417A (ko) * | 2000-03-10 | 2002-10-26 | 인피네온 테크놀로지스 아게 | 다수의 트랜지스터를 테스트하기 위한 테스트 회로 배열및 방법 |
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2003
- 2003-01-10 JP JP2003003951A patent/JP2004219126A/ja active Pending
- 2003-12-15 US US10/736,198 patent/US6911831B2/en not_active Expired - Fee Related