JP2004214077A5 - - Google Patents

Download PDF

Info

Publication number
JP2004214077A5
JP2004214077A5 JP2003001003A JP2003001003A JP2004214077A5 JP 2004214077 A5 JP2004214077 A5 JP 2004214077A5 JP 2003001003 A JP2003001003 A JP 2003001003A JP 2003001003 A JP2003001003 A JP 2003001003A JP 2004214077 A5 JP2004214077 A5 JP 2004214077A5
Authority
JP
Japan
Prior art keywords
ions
ion
ion trap
voltage
frequency voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2003001003A
Other languages
English (en)
Japanese (ja)
Other versions
JP3800178B2 (ja
JP2004214077A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2003001003A priority Critical patent/JP3800178B2/ja
Priority claimed from JP2003001003A external-priority patent/JP3800178B2/ja
Priority to US10/740,750 priority patent/US7256397B2/en
Publication of JP2004214077A publication Critical patent/JP2004214077A/ja
Publication of JP2004214077A5 publication Critical patent/JP2004214077A5/ja
Application granted granted Critical
Publication of JP3800178B2 publication Critical patent/JP3800178B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

JP2003001003A 2003-01-07 2003-01-07 質量分析装置及び質量分析方法 Expired - Lifetime JP3800178B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2003001003A JP3800178B2 (ja) 2003-01-07 2003-01-07 質量分析装置及び質量分析方法
US10/740,750 US7256397B2 (en) 2003-01-07 2003-12-22 Mass analyzer and mass analyzing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003001003A JP3800178B2 (ja) 2003-01-07 2003-01-07 質量分析装置及び質量分析方法

Publications (3)

Publication Number Publication Date
JP2004214077A JP2004214077A (ja) 2004-07-29
JP2004214077A5 true JP2004214077A5 (https=) 2005-09-02
JP3800178B2 JP3800178B2 (ja) 2006-07-26

Family

ID=32677480

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003001003A Expired - Lifetime JP3800178B2 (ja) 2003-01-07 2003-01-07 質量分析装置及び質量分析方法

Country Status (2)

Country Link
US (1) US7256397B2 (https=)
JP (1) JP3800178B2 (https=)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3960306B2 (ja) * 2003-12-22 2007-08-15 株式会社島津製作所 イオントラップ装置
WO2005106921A1 (en) * 2004-05-05 2005-11-10 Mds Inc. Doing Business Through Its Mds Sciex Division Ion guide for mass spectrometer
JP4701720B2 (ja) * 2005-01-11 2011-06-15 株式会社島津製作所 Ｍａｌｄｉイオントラップ型質量分析装置及び分析方法
WO2007079589A1 (en) * 2006-01-11 2007-07-19 Mds Inc., Doing Business Through Its Mds Sciex Division Fragmenting ions in mass spectrometry
JP4735490B2 (ja) * 2006-09-20 2011-07-27 株式会社島津製作所 質量分析装置
JP4844633B2 (ja) * 2006-12-14 2011-12-28 株式会社島津製作所 イオントラップ飛行時間型質量分析装置
WO2008072326A1 (ja) * 2006-12-14 2008-06-19 Shimadzu Corporation イオントラップ飛行時間型質量分析装置
US8754368B2 (en) 2008-06-20 2014-06-17 Shimadzu Corporation Mass spectrometer
JP5293562B2 (ja) * 2009-10-30 2013-09-18 株式会社島津製作所 イオントラップ質量分析装置
DE102012013038B4 (de) 2012-06-29 2014-06-26 Bruker Daltonik Gmbh Auswerfen einer lonenwolke aus 3D-HF-lonenfallen
GB201409074D0 (en) 2014-05-21 2014-07-02 Thermo Fisher Scient Bremen Ion ejection from a quadrupole ion trap
EP3525231A4 (en) 2016-10-04 2020-05-20 Shimadzu Corporation HIGH VOLTAGE POWER SOURCE DEVICE
JP6725080B2 (ja) 2017-09-04 2020-07-15 株式会社島津製作所 質量分析装置
DE102018121942B3 (de) 2018-09-07 2020-01-16 Quantum Factory GmbH Ionenfalle, Verfahren zum Regeln der Ionenfalle und Verwendungen als Antrieb einer Ionenfalle

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9802111D0 (en) 1998-01-30 1998-04-01 Shimadzu Res Lab Europe Ltd Time-of-flight mass spectrometer
CA2355193C (en) 1998-12-21 2006-10-17 Shimadzu Research Laboratory (Europe) Ltd. Method of fast start and/or fast termination of a radio frequency resonator
JP2003507874A (ja) * 1999-08-26 2003-02-25 ユニバーシティ オブ ニュー ハンプシャー 多段型の質量分析計
JP2005166369A (ja) * 2003-12-01 2005-06-23 Shimadzu Corp イオン蓄積装置

Similar Documents

Publication Publication Date Title
JP2004214077A5 (https=)
JP2008130401A5 (https=)
US9870903B2 (en) Adaptive and targeted control of ion populations to improve the effective dynamic range of mass analyser
CA2749587C (en) Mass spectrometer arranged to perform ms/ms/ms
JP2006526265A5 (https=)
US9887074B2 (en) Method and apparatus for mass spectrometry of macromolecular complexes
WO2008071923A3 (en) A time-of-flight mass spectrometer and a method of analysing ions in a time-of-flight mass spectrometer
WO2008109137A3 (en) Chemical structure-insensitive method and apparatus for dissociating ions
JP7306727B2 (ja) リアル・タイム分析および信号最適化による電荷検出質量分光分析法
WO2004051225A3 (en) Processes for designing mass separators and ion traps, methods for producing mass separators and ion traps. mass spectrometers, ion traps, and methods for analysing samples
EP1564783A3 (en) Mass spectrometer
WO2015007165A1 (zh) 一种在离子阱质量分析器中进行的串级质谱分析方法
US20210013022A1 (en) Mass spectrometer
CN107690691B (zh) 陷阱填充时间动态范围增强
WO2010028083A3 (en) Methods of calibrating and operating an ion trap mass analyzer to optimize mass spectral peak characteristics
US20170047212A1 (en) Mass Spectrometer With Interleaved Acquistion
JP2012243439A (ja) イオントラップ装置
JP2005353428A5 (https=)
EP2965344B1 (en) Charging plate for enhancing multiply charged ions by laser desorption
JP3800178B2 (ja) 質量分析装置及び質量分析方法
GB2530367A (en) Monitoring liquid chromatography elution to determine when to perform a lockmass calibration
JP2007080828A (ja) イオン処理セルとしてのセグメント化ロッド多重極
JP2006294582A5 (https=)
JP2020516031A5 (https=)
JP6075311B2 (ja) イオントラップ質量分析装置及び該装置を用いた質量分析方法