US5914613A
(en)
|
1996-08-08 |
1999-06-22 |
Cascade Microtech, Inc. |
Membrane probing system with local contact scrub
|
US6256882B1
(en)
|
1998-07-14 |
2001-07-10 |
Cascade Microtech, Inc. |
Membrane probing system
|
US6445202B1
(en)
|
1999-06-30 |
2002-09-03 |
Cascade Microtech, Inc. |
Probe station thermal chuck with shielding for capacitive current
|
US6965226B2
(en)
|
2000-09-05 |
2005-11-15 |
Cascade Microtech, Inc. |
Chuck for holding a device under test
|
US6914423B2
(en)
|
2000-09-05 |
2005-07-05 |
Cascade Microtech, Inc. |
Probe station
|
DE20114544U1
(de)
|
2000-12-04 |
2002-02-21 |
Cascade Microtech Inc |
Wafersonde
|
WO2003052435A1
(en)
|
2001-08-21 |
2003-06-26 |
Cascade Microtech, Inc. |
Membrane probing system
|
US7019535B2
(en)
*
|
2002-09-16 |
2006-03-28 |
Agilent Technologies, Inc. |
Method and system for calibrating a measurement device path and for measuring a device under test in the calibrated measurement device path
|
JP3992715B2
(ja)
*
|
2003-02-24 |
2007-10-17 |
富士通株式会社 |
ケーブルアセンブリの電気特性測定装置、ケーブルアセンブリの電気特性測定プログラムおよびケーブルアセンブリの電気特性測定方法
|
US7130756B2
(en)
*
|
2003-03-28 |
2006-10-31 |
Suss Microtec Test System Gmbh |
Calibration method for carrying out multiport measurements on semiconductor wafers
|
US7057404B2
(en)
|
2003-05-23 |
2006-06-06 |
Sharp Laboratories Of America, Inc. |
Shielded probe for testing a device under test
|
US7492172B2
(en)
|
2003-05-23 |
2009-02-17 |
Cascade Microtech, Inc. |
Chuck for holding a device under test
|
US7068049B2
(en)
*
|
2003-08-05 |
2006-06-27 |
Agilent Technologies, Inc. |
Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration
|
JP4274462B2
(ja)
*
|
2003-09-18 |
2009-06-10 |
株式会社アドバンテスト |
誤差要因取得用装置、方法、プログラムおよび記録媒体
|
US7250626B2
(en)
|
2003-10-22 |
2007-07-31 |
Cascade Microtech, Inc. |
Probe testing structure
|
US7013229B2
(en)
*
|
2003-11-13 |
2006-03-14 |
Agilent Technologies, Inc. |
Obtaining calibration parameters for a three-port device under test
|
WO2005065258A2
(en)
|
2003-12-24 |
2005-07-21 |
Cascade Microtech, Inc. |
Active wafer probe
|
US7187188B2
(en)
|
2003-12-24 |
2007-03-06 |
Cascade Microtech, Inc. |
Chuck with integrated wafer support
|
DE102005005056B4
(de)
*
|
2004-09-01 |
2014-03-20 |
Rohde & Schwarz Gmbh & Co. Kg |
Verfahren zum Kalibrieren eines Netzwerkanalysators
|
WO2006031646A2
(en)
|
2004-09-13 |
2006-03-23 |
Cascade Microtech, Inc. |
Double sided probing structures
|
US7068046B2
(en)
*
|
2004-11-18 |
2006-06-27 |
Anritsu Company |
Calibration techniques for simplified high-frequency multiport differential measurements
|
US7030625B1
(en)
*
|
2005-01-18 |
2006-04-18 |
Agilent Technologies, Inc. |
Method and apparatus for performing a minimum connection multiport through-reflect-line calibration and measurement
|
US7535247B2
(en)
|
2005-01-31 |
2009-05-19 |
Cascade Microtech, Inc. |
Interface for testing semiconductors
|
US7656172B2
(en)
|
2005-01-31 |
2010-02-02 |
Cascade Microtech, Inc. |
System for testing semiconductors
|
US7764072B2
(en)
|
2006-06-12 |
2010-07-27 |
Cascade Microtech, Inc. |
Differential signal probing system
|
US7403028B2
(en)
|
2006-06-12 |
2008-07-22 |
Cascade Microtech, Inc. |
Test structure and probe for differential signals
|
US7723999B2
(en)
|
2006-06-12 |
2010-05-25 |
Cascade Microtech, Inc. |
Calibration structures for differential signal probing
|
DE102007027142B4
(de)
*
|
2006-06-21 |
2020-03-19 |
Rohde & Schwarz GmbH & Co. Kommanditgesellschaft |
Verfahren und Vorrichtung zur Kalibrierung eines Netzwerkanalysators für Messungen an differentiellen Anschlüssen
|
DE102007028725A1
(de)
*
|
2007-06-21 |
2008-12-24 |
Rohde & Schwarz Gmbh & Co. Kg |
Verfahren und Vorrichtung zur Kalibrierung von Netzwerkanalysatoren mit einem Kammgenerator
|
US7876114B2
(en)
|
2007-08-08 |
2011-01-25 |
Cascade Microtech, Inc. |
Differential waveguide probe
|
US7888957B2
(en)
|
2008-10-06 |
2011-02-15 |
Cascade Microtech, Inc. |
Probing apparatus with impedance optimized interface
|
WO2010059247A2
(en)
|
2008-11-21 |
2010-05-27 |
Cascade Microtech, Inc. |
Replaceable coupon for a probing apparatus
|
US8319503B2
(en)
|
2008-11-24 |
2012-11-27 |
Cascade Microtech, Inc. |
Test apparatus for measuring a characteristic of a device under test
|
US8706438B2
(en)
*
|
2010-02-01 |
2014-04-22 |
Teledyne Lecroy, Inc. |
Time domain network analyzer
|
EP2363719A1
(en)
*
|
2010-02-12 |
2011-09-07 |
ATE Systems, Inc |
Method and apparatus for calibrating a test system for measuring a device under test
|
JP6055215B2
(ja)
*
|
2012-06-29 |
2016-12-27 |
キーサイト テクノロジーズ, インク. |
インピーダンス測定方法及び測定装置
|
CN103076589B
(zh)
*
|
2013-01-29 |
2015-08-05 |
绍兴电力局 |
一种数字万用表自动检定装置及其检定方法
|
CN104569885B
(zh)
*
|
2013-10-21 |
2017-07-25 |
哈尔滨飞机工业集团有限责任公司 |
一种实现同步发送器/解析器现场校准的方法
|
US10794837B2
(en)
|
2017-07-12 |
2020-10-06 |
Rohde & Schwarz Gmbh & Co. Kg |
On-wafer calibration device
|
US10938490B1
(en)
*
|
2018-10-31 |
2021-03-02 |
Christos Tsironis |
Calibration method for coupler-tuner assembly
|
CN112051534B
(zh)
*
|
2020-08-31 |
2023-08-25 |
中电科思仪科技股份有限公司 |
一种提高微波网络测量与校准精度的外置式装置及方法
|
CN111983431B
(zh)
*
|
2020-08-31 |
2022-11-15 |
中电科思仪科技股份有限公司 |
一种提高矢量网络分析仪端口反射系数模拟精度的方法
|
CN112986888B
(zh)
*
|
2021-04-25 |
2021-08-06 |
武汉磐电科技股份有限公司 |
一种变压器短路阻抗测试仪的检定方法及检定装置
|