JP2004045404A - 監視回路要素 - Google Patents

監視回路要素 Download PDF

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Publication number
JP2004045404A
JP2004045404A JP2003189236A JP2003189236A JP2004045404A JP 2004045404 A JP2004045404 A JP 2004045404A JP 2003189236 A JP2003189236 A JP 2003189236A JP 2003189236 A JP2003189236 A JP 2003189236A JP 2004045404 A JP2004045404 A JP 2004045404A
Authority
JP
Japan
Prior art keywords
current
signal
transistor
transistors
sense
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2003189236A
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English (en)
Japanese (ja)
Other versions
JP2004045404A5 (enExample
Inventor
Joan Figueras
ジョーン　フィゲラス
Fidel Muradali
フィデル　マラダリ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2004045404A publication Critical patent/JP2004045404A/ja
Publication of JP2004045404A5 publication Critical patent/JP2004045404A5/ja
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2003189236A 2002-07-11 2003-07-01 監視回路要素 Withdrawn JP2004045404A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/193,949 US6714036B2 (en) 2002-07-11 2002-07-11 Monitor circuitry and method for testing analog and/or mixed signal integrated circuits

Publications (2)

Publication Number Publication Date
JP2004045404A true JP2004045404A (ja) 2004-02-12
JP2004045404A5 JP2004045404A5 (enExample) 2006-08-10

Family

ID=29735347

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003189236A Withdrawn JP2004045404A (ja) 2002-07-11 2003-07-01 監視回路要素

Country Status (4)

Country Link
US (1) US6714036B2 (enExample)
EP (1) EP1380847B1 (enExample)
JP (1) JP2004045404A (enExample)
DE (1) DE60317859D1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8437720B2 (en) 2002-12-02 2013-05-07 Broadcom Corporation Variable-gain low noise amplifier for digital terrestrial applications
US7471941B2 (en) * 2002-12-02 2008-12-30 Broadcom Corporation Amplifier assembly including variable gain amplifier, parallel programmable amplifiers, and AGC
US7260377B2 (en) * 2002-12-02 2007-08-21 Broadcom Corporation Variable-gain low noise amplifier for digital terrestrial applications
US7309998B2 (en) * 2002-12-02 2007-12-18 Burns Lawrence M Process monitor for monitoring an integrated circuit chip
US6798286B2 (en) * 2002-12-02 2004-09-28 Broadcom Corporation Gain control methods and systems in an amplifier assembly
US20050056375A1 (en) * 2003-09-16 2005-03-17 Sanford, L.P. Applicator tip for a corrective tape dispenser
US7265629B2 (en) * 2005-03-29 2007-09-04 Sirific Wireless Corporation Circuit and method for automatic gain control
CA2733891C (en) * 2008-10-01 2017-05-16 Dh Technologies Development Pte. Ltd. Method, system and apparatus for multiplexing ions in msn mass spectrometry analysis
US8492892B2 (en) 2010-12-08 2013-07-23 International Business Machines Corporation Solder bump connections
CN104680945B (zh) 2015-03-23 2018-05-29 京东方科技集团股份有限公司 像素排列方法、像素渲染方法及图像显示装置
CN112485654B (zh) * 2020-11-16 2023-07-21 上海唯捷创芯电子技术有限公司 一种芯片端口状态检测电路、芯片及通信终端

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5938670B2 (ja) * 1976-10-15 1984-09-18 日本電気株式会社 差信号増巾回路
US4158241A (en) * 1978-06-15 1979-06-12 Fujitsu Limited Semiconductor memory device with a plurality of memory cells and a sense amplifier circuit thereof
US5698998A (en) * 1996-04-12 1997-12-16 Hewlett-Packard Co. Fast, low power, differential sense amplifier
US6191620B1 (en) * 1999-11-04 2001-02-20 International Business Machines Corporation Sense amplifier/comparator circuit and data comparison method

Also Published As

Publication number Publication date
EP1380847B1 (en) 2007-12-05
EP1380847A3 (en) 2005-11-30
US20040008049A1 (en) 2004-01-15
EP1380847A2 (en) 2004-01-14
US6714036B2 (en) 2004-03-30
DE60317859D1 (de) 2008-01-17

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