JP2004043936A - Substrate holder and plating apparatus - Google Patents

Substrate holder and plating apparatus Download PDF

Info

Publication number
JP2004043936A
JP2004043936A JP2002206289A JP2002206289A JP2004043936A JP 2004043936 A JP2004043936 A JP 2004043936A JP 2002206289 A JP2002206289 A JP 2002206289A JP 2002206289 A JP2002206289 A JP 2002206289A JP 2004043936 A JP2004043936 A JP 2004043936A
Authority
JP
Japan
Prior art keywords
substrate
holding member
substrate holder
movable holding
plating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002206289A
Other languages
Japanese (ja)
Other versions
JP3778282B2 (en
Inventor
Yokou Kaku
郭 誉綱
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ebara Corp
Original Assignee
Ebara Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ebara Corp filed Critical Ebara Corp
Priority to JP2002206289A priority Critical patent/JP3778282B2/en
Publication of JP2004043936A publication Critical patent/JP2004043936A/en
Application granted granted Critical
Publication of JP3778282B2 publication Critical patent/JP3778282B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Abstract

<P>PROBLEM TO BE SOLVED: To reduce the wear of a component member by rotating a retaining member with low frictional force while preventing the dislocation of a support. <P>SOLUTION: In the substrate holder in which a substrate W is arranged between a fixed holding member 54 and a movable holding member 58 fitted with sealing members 62 and 68, a retaining member 60 is moved, and the movable holding member 58 is tightened on the fixed holding member 54 to hold the substrate W. In this case, the retaining member 60 is moved in a state where the movable holding member 58 is pressed against the fixed holding member 54 and the sealing members 62 and 68 are crushed to hold the substrate W. <P>COPYRIGHT: (C)2004,JPO

Description

【0001】
【発明が属する技術分野】
本発明は、例えば基板の被めっき面にめっきを施すめっき装置、特に半導体ウエハ等の表面に設けられた微細な配線用溝やホール、レジスト開口部にめっき膜を形成したり、半導体ウエハの表面にパッケージの電極等と電気的に接続するバンプ(突起状電極)を形成したりするめっき装置等に使用される基板ホルダ、及び係る基板ホルダを備えためっき装置に関する。
【0002】
【従来の技術】
例えば、TAB(Tape Automated Bonding)やフリップチップにおいては、配線が形成された半導体チップの表面の所定箇所(電極)に金、銅、はんだ、或いはニッケル、更にはこれらを多層に積層した突起状接続電極(バンプ)を形成し、このバンプを介してパッケージの電極やTAB電極と電気的に接続することが広く行われている。このバンプの形成方法としては、電解めっき法、蒸着法、印刷法、ボールバンプ法といった種々の手法があるが、半導体チップのI/O数の増加、細ピッチ化に伴い、微細化が可能で性能が比較的安定している電解めっき法が多く用いられるようになってきている。
【0003】
ここで、電解めっき法は、半導体ウエハ等の基板の被めっき面を下向き(フェースダウン)にして水平に置き、めっき液を下から噴き上げてめっきを施す噴流式またはカップ式と、めっき槽の中に基板を垂直に立て、めっき液をめっき槽の下から注入しオーバーフローさせつつめっきを施すディップ式に大別される。ディップ方式を採用した電解めっき法は、めっきの品質に悪影響を与える泡の抜けが良く、フットプリントが小さいという利点を有しており、このため、めっき穴の寸法が比較的大きく、めっきにかなりの時間を要するバンプめっきに適していると考えられる。
【0004】
従来のディップ方式を採用した電解めっき装置にあっては、半導体ウエハ等の基板をその端面と裏面をシールし表面(被めっき面)を露出させて着脱自在に保持する基板ホルダを備え、この基板ホルダを基板ごとめっき液中に浸漬させて基板の表面にめっきを施すようにしており、気泡が抜けやすくできる利点を有している。
【0005】
基板ホルダは、めっき液中に浸漬させて使用するため、この基板ホルダで基板を保持した時に、基板の裏面(反被めっき面)側へめっき液が周り込まないよう、基板の外周部を確実にシールする必要がある。このため、例えば、一対のサポート(保持部材)で基板を着脱自在に保持するようにした基板ホルダにあっては、一方のサポートにシール部材を取付け、このシール部材を他方のサポートに載置保持した基板の周縁部に圧接させることで、基板の外周部をシールするようにしている。
【0006】
ここで、基板の保持をワンタッチで行うようにするため、一方のサポートに押え部材を回転自在かつ脱出不能に装着し、押え部材を一方向に回転させ該サポートを他方のサポートに向けて押圧し締付けることで、基板を保持することが行われている。
【0007】
【発明が解決しようとする課題】
従来のこの種の押え部材を一方向に回転させて基板を保持するようにした基板ホルダにあっては、一般に、押え部材の回転に伴って該押え部材とクランパ等の締付け部材同士、更には押え部材とサポートとが互いに摺接するように構成されており、このため、この摺接部の摩擦抵抗がかなり大きく、押え部材を回転させるためにかなり大きな力が必要となって、これらの摺接部材に大きな摩耗が発生してしまう。しかも、押え部材の回転に伴って該押え部材を装着したサポートが共廻りして位置ずれを起こし、これによって、基板のセンタリングに影響を与えたり、シール部材が捻れてシール性が損なわれたりすることがあるといった問題があった。
【0008】
本発明は上記事情に鑑みて為されたもので、サポートの位置ずれを防止しつつ、押え部材を低摩擦力で回転させて、構成部材の摩耗を減少させることができるようにした基板ホルダ及び該基板ホルダを備えためっき装置を提供することを目的とする。
【0009】
【課題を解決するための手段】
請求項1に記載の発明は、固定保持部材とシール部材を取付けた可動保持部材との間に基板を介在させ、押え部材を移動させ前記可動保持部材を前記固定保持部材に締付けて基板を保持するようにした基板ホルダにおいて、前記可動保持部材を前記固定保持部材に向けて押圧し前記シール部材を潰した状態で前記押え部材を移動させて基板を保持するように構成したことを特徴とする基板ホルダである。
【0010】
これにより、例えば押え部材を回転させて基板を保持するようにした基板ホルダにあっては、押え部材の回転に伴って、可動保持部材が回転しないようにして、可動保持部材の位置ずれを防止し、しかも、押え部材と他の摺動部材との間に作用する垂直荷重を減少させて、押え部材を低摩擦で回転させることができる。このことは、押え部材を水平方向に移動させ基板を保持するようにした基板ホルダにあっても同様である。
【0011】
請求項2に記載の発明は、前記可動保持部材の前記固定保持部材に向けた押圧を、前記可動保持部材の外周に沿った所定の位置でスポット状に行うようにしたことを特徴とする請求項1記載の基板ホルダである。
【0012】
請求項3に記載の発明は、前記可動保持部材の前記固定保持部材に向けた押圧を、前記可動保持部材の外周に沿った全周に亘る位置で行うようにしたことを特徴とする請求項1記載の基板ホルダである。これにより、シール部材の外周に沿った全周に亘って、より均一に押圧力が作用するようにして、シール部材を一様に潰すことができる。
【0013】
請求項4に記載の発明は、固定保持部材とシール部材を取付けた可動保持部材との間に基板を介在させ、押え部材を移動させ前記可動保持部材を前記固定保持部材に締付けて基板を保持するにあたり、前記可動保持部材を前記固定保持部材に向けて押圧し前記シール部材を潰した状態で前記押え部材を移動させることを特徴とする基板ホルダの締付け方法である。
【0014】
請求項5に記載の発明は、固定保持部材とシール部材を取付けた可動保持部材との間に基板を介在させ、押え部材を移動させ前記可動保持部材を前記固定保持部材に締付けて基板を保持するようにした基板ホルダであって、前記可動保持部材を前記固定保持部材に向けて押圧し前記シール部材を潰した状態で前記押え部材を移動させて基板を保持するように構成した基板ホルダを有することを特徴とするめっき装置である。
【0015】
【発明の実施の形態】
以下、本発明の実施の形態を図面を参照して説明する。
図1は、本発明の実施の形態に係る基板ホルダを備えためっき装置の全体配置図を示す。図1に示すように、このめっき装置には、半導体ウエハ等の基板Wを収納したカセット10を搭載する2台のカセットテーブル12と、基板Wのオリフラやノッチなどの位置を所定の方向に合わせるアライナ14と、めっき処理後の基板Wを高速回転させて乾燥させるスピンドライヤ16が備えられている。更に、この近くには、基板ホルダ18を載置して基板Wの該基板ホルダ18との着脱を行う基板着脱部20が設けられ、これらのユニットの中央には、これらの間で基板Wを搬送する搬送用ロボットからなる基板搬送装置22が配置されている。
【0016】
そして、基板着脱部20側から順に、基板ホルダ18の保管及び一時仮置きを行うストッカ24、基板Wを純水に浸漬させるプリウェット槽26、基板Wの表面に形成したシード層500(図14参照)表面の酸化膜をエッチング除去するプリソーク槽28、基板Wの表面を純水で水洗する第1の水洗槽30a、洗浄後の基板Wの水切りを行うブロー槽32、第2の水洗槽30b及びめっき槽34が順に配置されている。このめっき槽34は、オーバーフロー槽36の内部に複数の銅めっきユニット38を収納して構成され、各銅めっきユニット38は、内部に1個の基板Wを収納して、銅めっき等のめっきを施すようになっている。なお、この例では、銅めっきについて説明するが、ニッケルやはんだ、銀、更には金めっきにおいても同様であることは勿論である。
【0017】
更に、これらの各機器の側方に位置して、これらの各機器の間で基板ホルダ18を基板Wとともに搬送する、例えばリニアモータ方式を採用した基板ホルダ搬送装置40が備えられている。この基板ホルダ搬送装置40は、基板着脱部20とストッカ24との間で基板Wを搬送する第1のトランスポータ42と、ストッカ24、プリウェット槽26、プリソーク槽28、水洗槽30a,30b、ブロー槽32及び銅めっき槽34との間で基板Wを搬送する第2のトランスポータ44を有している。なお、第2のトランスポータ44を備えることなく、第1のトランスポータ42のみを備えるようにしてもよい。
【0018】
また、この基板ホルダ搬送装置40のオーバーフロー槽36を挟んだ反対側には、各銅めっきユニット38の内部に位置してめっき液を攪拌する掻き混ぜ棒としてのパドル(図示せず)を駆動するパドル駆動装置46が配置されている。
【0019】
基板着脱部20は、レール50に沿って横方向にスライド自在な平板状の載置プレート52を備えており、この載置プレート52に2個の基板ホルダ18を水平状態で並列に載置して、この一方の基板ホルダ18と基板搬送装置22との間で基板Wの受渡しを行った後、載置プレート52を横方向にスライドさせて、他方の基板ホルダ18と基板搬送装置22との間で基板Wの受渡しを行うようになっている。
【0020】
前記基板ホルダ18は、図2乃至図7に示すように、例えば塩化ビニル製で矩形平板状の固定保持部材54と、この固定保持部材54にヒンジ56を介して開閉自在に取付けた可動保持部材58とを有している。この可動保持部材58は、基部58aとリング状部58bとを有し、例えば塩化ビニル製で、下記の押え部材60との滑りを良くしており、そのリング状部58bの固定保持部材54と反対側の表面には、内側シール部材62がボルト64(図6参照)を介して内方に突出して取付けられ、固定保持部材54側の表面には、蟻溝状のシール溝66が設けられ、このシール溝66の内部に外側シール部材68が装着されている。
【0021】
内側シール部材62は、基板ホルダ18で基板Wを保持した時、基板Wの表面(被めっき面)の周縁部に圧接して、ここをシールするためのものであり、内周端に、尖塔状に可動保持部材58側に突出して基板Wの周縁部と線状に接触するシール部62aが設けられている。そして、この内側シール部材62は、これを保持する、例えばチタン製の保持部材70のほぼ全表面を被覆することで、保持部材70と一体に構成されている。
【0022】
このように、内側シール部材62と該内側シール部材62を保持する保持部材70とを一体構造とすることで、めっき終了後、可動保持部材58を移動させ基板Wの保持を解いて、基板Wを基板ホルダ18から取出す際に、内側シール部材62のシール部62aが基板Wに付着して内側シール部材62が保持部材70から捲れてしまうことを防止して、内側シール部材62と基板Wとの剥離性を向上させることができる。しかも、シール部62aを介して、内側シール部材62が基板Wと線状に接触するようにすることで、低締付け圧で確実にシールするとともに、基板Wのパターン形成領域として有効に利用できる面積を広めることができる。
【0023】
一方、外側シール部材68は、基板ホルダ18で基板Wを保持した時、内側シール部材62の外周において、固定保持部材54の可動保持部材58側表面に圧接して、ここをシールするためのものであり、この例では、外側シール部材68として、下方に突出する2つのリング状シール部68a,68b、更にはこの中央に他のシール部68cを有する多重シール構造体が使用されている。
【0024】
このように、外側シール部材68として、多重シール構造体を使用することで、可動保持部材58と該可動保持部材58に取付けた外側シール部材68が当接する固定保持部材54との間を多重シール構造体からなる外側シール部材68で多重にシールして、ここでのシール性のより完全性を図ることができる。
【0025】
更に、この例では、外側シール部材68として、シール部68a,68b,68cの反対側に向けて末広がりで、ここを幅方向に押圧すると容易に潰れて幅が狭まり、この押圧力を解くと弾性力で外方に復帰する、横断面W字状のものが使用されている。これにより、外側シール部材68を蟻溝形状のシール溝66へ装着する際に、外側シール部材68の装着側端部を幅方向に潰すことで、外側シール部材68のシール溝66内への装着を容易に行うとともに、装着後の外側シール部材68をその弾性力で外方に拡がらせることで、外側シール部材68のシール溝66からの脱出を確実に防止することができる。また、シール溝66の側壁面に外側シール部材68の側面が一定の弾性力を持って接触部するようにすることで、この接触部に液が溜まってしまうことを防止することができる。
【0026】
可動保持部材58の外周部には、段部が設けられ、この段部に、押え部材60が押え板72を介して脱出不能かつ回転自在に装着されている。この押え部材60は、酸化性環境に対して耐食性に優れ、十分な剛性を有する、例えばチタンから構成されている。
【0027】
押え部材60の外側方に位置して、固定保持部材54には、内方に突出する突出部を有する逆L字状のクランパ74が円周方向に沿って等間隔で立設されている。そして、押え部材60の表面及び該表面を覆うように位置するクランパ74の内方突出部の下面は、回転方向に沿って互いに逆方向に傾斜するテーパ面となっている。更に、押え部材60の円周方向に沿った複数箇所(例えば4カ所)には、下記のように、内部に回転ピン112を挿入し、この回転ピン112を回転させることで、押え部材60を回転させる長孔60aが設けられている。
【0028】
これにより、可動保持部材58を開いた状態で、固定保持部材54の中央部に基板Wを挿入し、ヒンジ56を介して可動保持部材58を閉じ、押え部材60を時計回りに回転させて、押え部材60の外周部をクランパ74の内方突出部の内部に滑り込ませることで、押え部材60とクランパ74にそれそれぞれ設けたテーパ面を介して、固定保持部材54と可動保持部材58とを互いに締付けてロックし、押え部材60を反時計回りに回転させて逆L字状のクランパ74の突出部から引き抜くことで、このロックを解くようになっている。そして、このようにして可動保持部材58をロックした時、内側シール部材62のシール部62aが基板Wの表面に、外側シール部材68のシール部68a,68b,68cが固定保持部材54の表面にそれぞれ圧接し、シール部材62,68を均一に押圧して、ここを確実にシールするようになっている。
【0029】
固定保持部材54の中央部には、基板Wの大きさに合わせてリング状に突出し、表面が基板Wの周縁部に当接して該基板Wを支持する支持面80となる突条部82が設けられており、この突条部82の円周方向に沿った所定位置に凹部84が設けられている。
【0030】
そして、図5に示すように、この各凹部84内に、下記のハンド120に設けた外部接点から延びる複数の配線にそれぞれ接続した複数(図示では12個)の導電体(電気接点)86が配置されて、固定保持部材54の支持面80上に基板Wを載置した際、この導電体86の端部が基板Wの側方で固定保持部材54の表面にばね性を有した状態で露出するようになっている。
【0031】
一方、可動保持部材58のリング状部58bの導電体86に対向した位置に、電気接点88の脚部88aが固着されている。この電気接点88は、板ばね形状に形成され、更に基板Wの位置決め(センタリング)機能を有している。つまり、この電気接点88は、内側シール部材62の外方に位置して、内方に板ばね状に突出する接点部88bを有しており、この接点部88bにおいて、その弾性力によるばね性を有して容易に屈曲し、しかも固定保持部材54と可動保持部材58で基板Wを保持した時に、電気接点88の接点部88bが、固定保持部材54の支持面80上に支持された基板Wの外周面に弾性的に接触するように構成されている。
【0032】
そして、図5(a)に示すように、固定保持部材54の支持面80上に基板Wを載置し、更に図5(b)〜図5(c)に示すように、可動保持部材58を固定保持部材54の方向に移動させロックして基板Wを保持した時、導電体86の露出部が電気接点88の脚部88aの下面に導電体86の露出部の弾性力を介して弾性的に接触して電気的に接続され、基板Wが電気接点88の接点部88bに該接点部88bの弾性力を介して弾性的に接触する。これによって、基板Wをシール部材62,68でシールして基板ホルダ18で保持した状態で、電気接点88を介して基板Wに給電が行えるようになっている。
【0033】
このように、電気接点88を板ばね形状に形成し、この電気接点88自体の弾性力を介して電気接点88の接点部88bの先端が基板Wに接触するようにすることで、接点不良を減少させ、しかも、電気接点88が基板Wのより外周部で該基板Wと接触するようにして、基板Wのパターン形成領域として有効に利用できる面積を広めることができる。さらに、基板ホルダ18で基板Wを保持する際に、基板Wを板ばね形状の電気接点88の接点部88bの弾性力で内方に付勢することで、この電気接点88を介して、基板Wの基板ホルダ18に対する位置決め(センタリング)を行うことができる。
なお、導電体86の表面の、少なくとも電気接点88との当接面に、例えば金または白金めっきを施して被覆することが好ましい。
【0034】
また、図6に示すように、固定保持部材54の突条部82の一部には、尖塔状のテーパ面を有するテーパ部82aが設けられ、また、可動保持部材58のリング状部58bの内周面の該テーパ部82aと対向する位置には、該テーパ部82aのテーパ面と逆テーパ面で、固定保持部材54と可動保持部材58とで基板Wを保持した時に互いに係合して両者54,58の中心に対する位置決めを行うテーパ部90が設けられている。つまり、図6(a)に示すように、固定保持部材54の支持面80上に基板Wを載置し、更に図6(b)〜図6(c)に示すように、可動保持部材58を固定保持部材54の方向に移動させロックして基板Wを保持する際、テーパ部82a,90が互いに案内となって、可動保持部材58の固定保持部材54に対する(またはその逆の)位置決めが行われるようになっている。
【0035】
このように、固定保持部材54の突条部82と可動保持部材58のリング状部58bに互いに係合するテーパ部82a,90を設けることにより、固定保持部材54と可動保持部材58が離れた位置では両者54,58の位置合わせが正確でなくとも、基板Wを固定保持部材54と可動保持部材58で保持する過程で、互いに係合するテーパ部82a,90を介して、両者54,58の中心に対する位置決めを自動的に行うことができる。
【0036】
これにより、前述のようにして、基板Wを固定保持部材54と可動保持部材58で保持する過程で、両者54,58の中心に対する位置決めを行い、更に板ばね形状の電気接点88を介して、基板Wの基板ホルダ18、ひいては内側シール部材62に対する位置決め(センタリング)を同時に行うことができる。
【0037】
更に、図2に示すように、固定保持部材54の突条部82には、ヒンジ56の反対側に位置して、やや幅広な凹部92が、この例では22カ所に設けられ、この各凹部92内に吸着パッド94が収容配置されている。この吸着パッド94は、図7に詳細に示すように、ゴム等の可撓性材料からなり、内部を真空部とした円錐状のカップ部96を有し、ボルト100を介して固定保持部材54に取付けられている。そして、基板ホルダ18で基板Wを保持した時、この基板Wがカップ部96を押圧し、このカップ部96を外方に押し拡げることで、カップ部96内の真空部を介して基板の裏面側を吸着するようになっている。
【0038】
これにより、めっき終了後、可動保持部材58を移動させ基板Wの保持を解いて、基板Wを基板ホルダ18から取出す際に、吸着パッド94で基板Wの裏面側を吸着することで、基板Wが内側シール部材62にひっついたまま該シール部材62と一緒に移動することを防止することができる。しかも、自動搬送装置を用いて自動運転する場合に、基板Wが持ち上がったりすることがないので、常に安定して基板Wを基板ホルダ18から取出すことができる。この吸着パッド94の吸着力は、前述のように、基板Wを基板ホルダ18から取出す際に、基板Wを内側シール部材62から容易に分離でき、かつロボットとの間で基板の受渡しが行える大きさに設定される。
【0039】
また、吸着パッド94を、基板ホルダ18で保持した基板Wの中心を挟んだヒンジ56の反対側の基板Wの周縁部に対応する位置に設けることで、ヒンジ56を介して可動保持部材58を開く際に、内側シール部材62に付着して最初に持ち上がろうとする箇所の持ち上がりを吸着パッド94で防止して、基板Wを内側シール部材62から効果的に分離することができる。
【0040】
可動保持部材58の開閉は、図示しないシリンダと可動保持部材58の自重によって行われる。つまり、固定保持部材54には通孔54aが設けられ、載置プレート52の上に基板ホルダ18を載置した時に該通孔54aに対向する位置にシリンダが設けられている。これにより、シリンダロッドを伸展させ、通孔54aを通じて押圧棒で可動保持部材58の基部58aを上方に押上げることで可動保持部材58を開き、シリンダロッドを収縮させることで、可動保持部材58をその自重で閉じるようになっている。
【0041】
この例にあっては、押え部材60を回転させることにより、可動保持部材58のロック・アンロックを行うようになっている。図8及び図9に、このロック・アンロック機構110を示す。このロック・アンロック機構110は、天井側に設けられており、載置プレート52の上に載置した基板ホルダ18内に基板Wを入れ、ヒンジ56を介して可動保持部材58を閉じた時、この中央側に位置する基板ホルダ18の押え部材60の各長孔60aに対応する位置に位置させた回転ピン112を有しており、この回転ピン112は、正逆回転可能な回転板114の下面に垂設されている。更に、上下動自在で、載置プレート52の上に載置した基板ホルダ18の可動保持部材58のリング状部58bを固定保持部材54に向けて押圧する押圧ロッド116が備えられ、回転板114の該押圧ロッド116に対向する位置には、円周方向に延びる長孔114aが設けられている。
【0042】
これによって、前述のようにして、基板Wを入れて可動保持部材58を閉じた基板ホルダ18を載置プレート52とともに上昇させ、押え部材60の長孔60a内に回転ピン112を位置させた後、押圧ロッド116を下降させて、可動保持部材58を下方に押圧し、これによって、先ずシール部材62,68を潰して可動保持部材58を回転しないようにしておき、この状態で、回転ピン112を回転させて押え部材60を回転させ、押え部材60をクランパ74内に入り込ませて、可動保持部材58をロックするようになっている。
【0043】
このように、先ず押圧ロッド116を下降させて可動保持部材58が回転しないようにした状態で、回転ピン112を介して押え部材60を回転させることで、この押え部材60の回転を低摩擦で行うことができる。これによって、押え部材60とクランパ74、更には可動保持部材58の摩耗を減らし、しかも、可動保持部材58の押え部材60の回転に伴う共廻りによる位置ずれを防止して、基板Wのセンタリングに影響を与えたり、シール部材62,68が捻れてこれらのシール性が悪化したりすることを防止することができる。
【0044】
なお、回転体としてリング状のものを、また押圧ロッド116の代わりに、図9に斜線で示す円筒状の押圧部材116aをそれぞれ使用し、これによって、この押圧部材116aによって、可動保持部材58のリング状部58bをその全周に亘ってより均一に押圧するようにしてもよい。
【0045】
このロック・アンロック機構110は、1個備えられ、載置プレート52の上に載置した2個の基板ホルダ18の一方をロック(またはアンロック)した後、載置プレート52を横方向にスライドさせて、他方の基板ホルダ18をロック(またはアンロック)するようになっている。また、基板ホルダ18には、基板Wを装着した時の該基板Wと接点との接触状態を確認するセンサが備えられ、このセンサからの信号がコントローラ(図示せず)に入力されるようになっている。
【0046】
基板ホルダ18の固定保持部材54の端部には、基板ホルダ18を搬送したり、吊下げ支持したりする際の支持部となる一対の略T字状のハンド120が連接されている。そして、ストッカ24内においては、この周壁上面にハンド120の突出端部を引っ掛けることで、これを垂直に吊下げ保持し、この吊下げ保持した基板ホルダ18のハンド120を基板ホルダ搬送装置40のトランスポータ42で把持して基板ホルダ18を搬送するようになっている。なお、プリウェット槽26、プリソーク槽28、水洗槽30a,30b、ブロー槽32及び銅めっき槽34内においても、基板ホルダ18は、ハンド120を介してそれらの周壁に吊下げ保持される。
【0047】
このように構成しためっき装置による一連のバンプめっき処理を説明する。先ず、図14(a)に示すように、表面に給電層としてのシード層500を成膜し、このシード層500の表面に、例えば高さHが20〜120μmのレジスト502を全面に塗布した後、このレジスト502の所定の位置に、例えば直径Dが20〜200μm程度の開口部502aを設けた基板をその表面(被めっき面)を上にした状態でカセット10に収容し、このカセット10をカセットテーブル12に搭載する。
【0048】
このカセットテーブル12に搭載したカセット10から、基板搬送装置22で基板を1枚取出し、アライナ14に載せてオリフラやノッチなどの位置を所定の方向に合わせる。このアライナ14で方向を合わせた基板を基板搬送装置22で基板着脱部20まで搬送する。
【0049】
基板着脱部20においては、ストッカ24内に収容されていた基板ホルダ18を基板ホルダ搬送装置40のトランスポータ42で2基同時に把持して、基板着脱部20まで搬送する。そして、基板ホルダ18を水平な状態として下降させ、これによって、2基の基板ホルダ18を基板着脱部20の載置プレート52の上に同時に載置し、シリンダを作動させて基板ホルダ18の可動保持部材58を開いた状態にしておく。
【0050】
この状態で、中央側に位置する基板ホルダ18に基板搬送装置22で搬送した基板を挿入し、シリンダを逆作動させて可動保持部材58を閉じ、しかる後、ロック・アンロック機構で可動保持部材58をロックする。そして、一方の基板ホルダ18への基板の装着が完了した後、載置プレート52を横方向にスライドさせて、同様にして、他方の基板ホルダ18に基板を装着し、しかる後、載置プレート52を元の位置に戻す。
【0051】
これにより、基板Wは、そのめっき処理を行う面を基板ホルダ18の開口部から露出させた状態で、周囲をシール部材62,68でめっき液が浸入しないようにシールされ、シールによってめっき液に触れない部分において複数の接点と電気的に導通するように固定される。ここで、接点からは基板ホルダ18のハンド120まで配線が繋がっており、ハンド120の部分に電源を接続することにより基板のシード層500に給電することができる。
【0052】
次に、基板Wを装着した基板ホルダ18を基板ホルダ搬送装置40のトランスポータ42で2基同時に把持し、ストッカ24まで搬送する。そして、基板ホルダ18を垂直な状態となして下降させ、これによって、2基の基板ホルダ18をストッカ24に吊下げ保持(仮置き)する。
【0053】
これらの基板搬送装置22、基板着脱部20及び基板ホルダ搬送装置40のトランスポータ42においては、前記作業を順次繰り返して、ストッカ24内に収容された基板ホルダ18に順次基板を装着し、ストッカ24の所定の位置に順次吊り下げ保持(仮置き)する。
なお、基板ホルダ18に備えられていた基板と接点との接触状態を確認するセンサで、この接触状態が不良であると判断した時には、その信号をコントローラ(図示せず)に入力する。
【0054】
一方、基板ホルダ搬送装置40の他方のトランスポータ44にあっては、基板を装着しストッカ24に仮置きした基板ホルダ18を2基同時に把持し、プリウェット槽26まで搬送して下降させ、これによって、2基の基板ホルダ18をプリウェット槽26内に入れる。
【0055】
なお、この時、基板ホルダ18に備えられていた基板と接点との接触状態を確認するセンサで、この接触状態が不良であると判断した基板を収納した基板ホルダ18は、ストッカ24に仮置きしたままにしておく。これにより、基板ホルダ18に基板を装着した時に該基板と接点との間に接触不良が生じても、装置を停止させることなく、めっき作業を継続することができる。この接触不良を生じた基板にはめっき処理が施されないが、この場合には、カセットを戻した後にめっき未処理の基板をカセットから排除することで、これに対処することができる。
【0056】
次に、この基板を装着した基板ホルダ18を、前記と同様にして、プリソーク槽28に搬送し、プリソーク槽28で酸化膜をエッチングし、清浄な金属面を露出させる。更に、この基板を装着した基板ホルダ18を、前記と同様にして、水洗槽30aに搬送し、この水洗槽30aに入れた純水で基板の表面を水洗する。
【0057】
水洗が終了した基板を装着した基板ホルダ18を、前記と同様にして、めっき液を満たしためっき槽34に搬送し、めっきユニット38に吊り下げ保持する。基板ホルダ搬送装置40のトランスポータ44は、上記作業を順次繰り返し行って、基板を装着した基板ホルダ18を順次めっき槽34のめっきユニット38に搬送して所定の位置に吊下げ保持する。
【0058】
全ての基板ホルダ18の吊下げ保持が完了した後、オーバーフロー槽36のめっき液を循環させ、かつ、オーバーフローさせながら、めっき槽34内のアノード(図示せず)と基板Wとの間にめっき電圧を印加し、同時にパドル駆動装置46によりパドルを基板の表面と平行に往復移動させることで、基板の表面にめっきを施す。この時、基板ホルダ18は、めっきユニット38の上部でハンド120により吊り下げられて固定され、めっき電源から導電体86及び電気接点88を通して、シード層500(図14参照)に給電される。
【0059】
めっきが終了した後、めっき電源の印加、めっき液の供給及びパドル往復運動を停止し、めっき後の基板Wを装着した基板ホルダ18を基板ホルダ搬送装置40のトランスポータ44で2基同時に把持し、前述と同様にして、水洗槽30bまで搬送し、この水洗槽30bに入れた純水に浸漬させて基板の表面を純水洗浄する。次に、この基板Wを装着した基板ホルダ18を、前記と同様にして、ブロー槽32に搬送し、ここで、エアーの吹き付けによって基板ホルダ18に付着した水滴を除去する。しかる後、この基板Wを装着した基板ホルダ18を、前記と同様にして、ストッカ24の所定の位置に戻して吊下げ保持する。
【0060】
基板ホルダ搬送装置40のトランスポータ44は、上記作業を順次繰り返し、めっきが終了した基板を装着した基板ホルダ18を順次ストッカ24の所定の位置に戻して吊下げ保持する。
【0061】
一方、基板ホルダ搬送装置40の他方のトランスポータ42にあっては、めっき処理後の基板Wを装着しストッカ24に戻した基板ホルダ18を2基同時に把持し、前記と同様にして、基板着脱部20の載置プレート52の上に載置する。この時、基板ホルダ18に備えられていた基板と接点との接触状態を確認するセンサで、この接触状態が不良であると判断した基板を装着しストッカ24に仮置きしたままの基板ホルダ18も同時に搬送して載置プレート52の上に載置する。
【0062】
そして、中央側に位置する基板ホルダ18の可動保持部材58のロックを、ロック・アンロック機構を介して解き、シリンダを作動させて可動保持部材58を開く。この時、前述のように、基板Wが可動保持部材58にくっついたまま可動保持部材58が開くことが防止される。この状態で、基板ホルダ18内のめっき処理後の基板Wを基板搬送装置22で取出して、スピンドライヤ16に運び、このスピンドライヤ16の高速回転によってスピンドライ(水切り)した基板を基板搬送装置22でカセット10に戻す。
【0063】
そして、一方の基板ホルダ18に装着した基板をカセット10に戻した後、或いはこれと並行して、載置プレート52を横方向にスライドさせて、同様にして、他方の基板ホルダ18に装着した基板をスピンドライしてカセット10に戻す。
【0064】
載置プレート52を元の状態に戻した後、基板を取出した基板ホルダ18を基板ホルダ搬送装置40のトランスポータ42で2基同時に把持し、前記と同様にして、これをストッカ24の所定の場所に戻す。しかる後、めっき処理後の基板を装着しストッカ24に戻した基板ホルダ18を基板ホルダ搬送装置40で2基同時に把持し、前記と同様にして、基板着脱部20の載置プレート52の上に載置して、前記と同様な作業を繰り返す。
【0065】
そして、めっき処理後の基板を装着しストッカ24に戻した基板ホルダ18から全ての基板を取出し、スピンドライしてカセット10に戻して作業を完了する。これにより、図14(b)に示すように、レジスト502に設けた開口部502a内にめっき膜504を成長させた基板Wが得られる。
【0066】
次に、前述のようにしてスピンドライした基板Wを、例えば温度が50〜60℃のアセトン等の溶剤に浸漬させて、図14(c)に示すように、基板W上のレジスト502を剥離除去する。そして、図14(d)に示すように、めっき後の外部に露出する不要となったシード層500を除去して、めっき膜504からなるバンプを形成する。
【0067】
なお、この例では、基板着脱部20と銅めっきユニット38との間に基板ホルダ18を縦置きで収納するストッカ24を配置し、基板着脱部20とストッカ24との間での基板ホルダ18の搬送を基板ホルダ搬送装置40の第1のトランスポータ42で、ストッカ24と銅めっきユニット38との間での基板ホルダ18の搬送を第2のトランスポータ44でそれぞれ行うことで、不使用時の基板ホルダ18をストッカ24に保管しておき、またストッカ24を挟んだ前後における基板ホルダ18の搬送をスムーズに行ってスループットを向上させるようにしている。1つのトランスポータで全ての搬送を行うようにしても良いことは勿論である。
【0068】
また、基板搬送装置22として、ドライハンドとウェットハンドを有するロボットを使用し、基板ホルダ18からめっき後の基板を取出す時にのみウェットハンドを使用し、他はドライハンドを使用するようにしている。基板ホルダ18のシールによって基板の裏面はめっき液に接触しないように保たれており、原則的にはウェットハンドとすることは必ずしも必要ではないが、このようにハンドを使い分けることで、リンス水の回り込みやシール不良によるめっき液汚染が生じ、この汚染が新しい基板の裏面を汚染することを防止することができる。
【0069】
なお、上記の例では、電気接点88を1枚の板ばね形状に形成された板体で構成した例を示しているが、図10に示すように、板ばね形状の2枚以上の板体122a,122bを重ね合わせた重ね板ばね124で電気接点88を構成するようにしてもよい。
【0070】
これにより、設置スペースがかなり狭い場所であっても、塑性変形を起こすことなく、長いストロークを確保することができる電気接点88(重ね板ばね124)を設置し、この電気接点88(重ね板ばね124)を介して、基板ホルダ18で基板Wを保持する過程で、基板Wの基板ホルダ18に対する位置決め(センタリング)と、基板Wへの通電を行うことができる。
【0071】
この例では、重ね板ばね124が電気接点88を兼用するようにすることで、基板の位置決め(センタリング)を行うことのみを目的とする専用の重ね板ばねを別途設ける必要をなくして、構造の簡素化を図っているが、基板の位置決め(センタリング)を行うことのみを目的とする専用の重ね板ばねを別途設けるようにしてもよい。
【0072】
また、図11乃至図13に示すように、外側シール部材68として、幅方向の両側に2個のリング状シール部126a,126bを有し、更に、円周方向に沿った所定の位置に、幅方向に延びる仕切りシール部126cを設けた多重シール構造体128を使用してもよい。これによっても、シール性のより完全性を図り、しかも、例えば図12において、リング状シール部126a,126bの互いに仕切りシール部126cを挟んで隣接するX部とX部にダメージを受けても、このダメージを受けたX部とX部との間に位置する仕切りシール部126cでシール性を維持することができる。
【0073】
以上説明したように、このめっき装置によれば、基板を収納したカセットをカセットテーブルにセットして装置を始動することで、ディップ方式を採用した電解めっきを全自動で行って、基板の表面にバンプ等に適した金属めっき膜を自動的に形成することができる。
なお、上記の例にあっては、押え部材を回転させることで基板を保持するようにした基板ホルダに適用した例を示しているが、押え部材を一方向に平行移動させて基板を保持するようにした基板ホルダにも適用できることは勿論である。
【0074】
【発明の効果】
以上説明したように、本発明によれば、例えば押え部材を回転させて基板を保持するようにした基板ホルダの該押え部材の回転に伴って、可動保持部材が回転しないようにして、可動保持部材の位置ずれを防止し、これによって、基板のセンタリングが影響されたり、シール部材が捻れてシール性が損なわれたりするのを防止することができる。しかも、押え部材と他の摺動部材との間に作用する垂直荷重を減少させて、押え部材を低摩擦で回転させることができ、これによって、構成部材の摩耗や発塵を減少させることができる。
【図面の簡単な説明】
【図1】本発明の実施の形態に係る基板ホルダを備えためっき装置の全体配置図である。
【図2】図1に示す基板ホルダの平面図である。
【図3】図1に示す基板ホルダの右側面図である。
【図4】図1に示す基板ホルダの縦断正面図である。
【図5】図1に示す基板ホルダで基板を保持する時の導電体と電気接点との関係を工程順に示す断面図である。
【図6】図1に示す基板ホルダで基板を保持する時の固定保持部材のテーパ部と可動保持部材のテーパ部の関係を工程順に示す断面図である。
【図7】図1に示す基板ホルダにおける吸着パッドの装着部の断面図である。
【図8】ロック・アンロック機構で基板ホルダをロックする時の状態を示す断面図である。
【図9】ロック・アンロック機構の平面図である。
【図10】電気接点を重ね板ばねで構成した例を示す断面図である。
【図11】外側シール部材の他の例を示す平面図である。
【図12】図11のA部拡大図である。
【図13】図11の横断面図である。
【図14】基板上にバンプ(突起状電極)を形成する過程を工程順に示す断面図である。
【符号の説明】
10 カセット
12 カセットテーブル
14 アライナ
16 スピンドライヤ
18 基板ホルダ
20 基板着脱部
22 基板搬送装置
24 ストッカ
26 プリウェット槽
28 プリソーク槽
30a,30b 水洗槽
32 ブロー槽
34 めっき槽
36 オーバーフロー槽
38 めっきユニット
40 基板ホルダ搬送装置
42,44 トランスポータ
46 パドル駆動装置
54 固定保持部材
56 ヒンジ
58 可動保持部材
58a 基部
58b リング状部
60 押え部材
62 内側シール部材
66 シール溝
68 外側シール部材
74 クランパ
80 支持面
82 突条部
86 導電体
88 電気接点
94 吸着パッド
96 カップ部
98 真空部
110 ロック・アンロック機構
112 回転ピン
114 回転板
116 押圧ロッド
122a,122b 板体
124 重ね板ばね
128 多重シール構造体
[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention provides, for example, a plating apparatus for plating a surface to be plated of a substrate, particularly, a fine wiring groove or hole provided on a surface of a semiconductor wafer or the like, a plating film formed on a resist opening, or a surface of a semiconductor wafer. The present invention relates to a substrate holder used for a plating apparatus or the like for forming a bump (protruding electrode) electrically connected to a package electrode or the like, and a plating apparatus provided with the substrate holder.
[0002]
[Prior art]
For example, in a TAB (Tape Automated Bonding) or a flip chip, gold, copper, solder, or nickel, or a protruding connection in which these are stacked in a multilayer at predetermined positions (electrodes) on the surface of a semiconductor chip on which wiring is formed. 2. Description of the Related Art It is widely practiced to form electrodes (bumps) and electrically connect to electrodes of a package or TAB electrodes via the bumps. As a method for forming the bump, there are various methods such as an electrolytic plating method, a vapor deposition method, a printing method, and a ball bump method. However, with the increase in the number of I / Os and the fine pitch of the semiconductor chip, miniaturization is possible. Electroplating methods, which have relatively stable performance, have come to be used frequently.
[0003]
Here, the electrolytic plating method is a jet type or a cup type in which the surface to be plated of a substrate such as a semiconductor wafer is placed horizontally with the surface to be plated facing downward (face down), and a plating solution is blown up from below to perform plating. The substrate is set up vertically, and the plating solution is roughly divided into a dip type in which a plating solution is poured from below the plating tank and plating is performed while overflowing. The electroplating method using the dip method has the advantages that the bubbles that adversely affect the plating quality are well removed and the footprint is small, so the dimensions of the plating holes are relatively large and It is considered that it is suitable for bump plating which requires time.
[0004]
In a conventional electrolytic plating apparatus employing a dipping method, a substrate holder such as a semiconductor wafer or the like, which is provided with a substrate holder that seals an end surface and a back surface, exposes a surface (plated surface), and detachably holds the substrate, is provided. The holder is immersed in the plating solution together with the substrate to apply plating to the surface of the substrate, which has an advantage that bubbles can be easily removed.
[0005]
Since the substrate holder is used by immersing it in the plating solution, when the substrate is held by this substrate holder, make sure that the outer periphery of the substrate does not enter the plating solution to the back surface (anti-plating surface) side of the substrate. Need to be sealed. Therefore, for example, in a substrate holder in which a substrate is detachably held by a pair of supports (holding members), a seal member is attached to one support, and the seal member is placed and held on the other support. The outer peripheral portion of the substrate is sealed by being pressed against the peripheral portion of the substrate.
[0006]
Here, in order to hold the substrate with one touch, a holding member is rotatably and irremovably attached to one support, and the holding member is rotated in one direction to press the support toward the other support. By tightening, the substrate is held.
[0007]
[Problems to be solved by the invention]
In a conventional substrate holder in which a holding member of this type is rotated in one direction to hold a substrate, generally, the holding member and a tightening member such as a clamper, etc. The holding member and the support are configured to be in sliding contact with each other. For this reason, the frictional resistance of the sliding contact portion is considerably large, and a considerably large force is required to rotate the holding member. Large wear occurs on the member. In addition, the support on which the holding member is attached rotates together with the holding member, causing a positional shift, thereby affecting the centering of the substrate, and the sealing member is twisted to deteriorate the sealing performance. There was a problem that there was.
[0008]
The present invention has been made in view of the above circumstances, and a substrate holder capable of rotating a holding member with low frictional force while preventing displacement of a support to reduce wear of a component member. An object is to provide a plating apparatus provided with the substrate holder.
[0009]
[Means for Solving the Problems]
According to the first aspect of the present invention, a substrate is interposed between a fixed holding member and a movable holding member to which a seal member is attached, and a holding member is moved to hold the substrate by tightening the movable holding member to the fixed holding member. In the substrate holder, the movable holding member is pressed toward the fixed holding member, and the holding member is moved in a state where the seal member is crushed to hold the substrate. It is a substrate holder.
[0010]
Thereby, for example, in a substrate holder in which the holding member is rotated to hold the substrate, the movable holding member is prevented from rotating with the rotation of the holding member, thereby preventing displacement of the movable holding member. In addition, the vertical load acting between the holding member and another sliding member is reduced, and the holding member can be rotated with low friction. The same applies to a substrate holder that holds a substrate by moving a pressing member in a horizontal direction.
[0011]
The invention described in claim 2 is characterized in that the pressing of the movable holding member toward the fixed holding member is performed in a spot shape at a predetermined position along the outer periphery of the movable holding member. Item 2. A substrate holder according to item 1.
[0012]
The invention described in claim 3 is characterized in that the pressing of the movable holding member toward the fixed holding member is performed at a position over the entire circumference along the outer circumference of the movable holding member. 1. The substrate holder according to 1. Thereby, the sealing member can be uniformly crushed so that the pressing force acts more uniformly over the entire periphery along the outer periphery of the sealing member.
[0013]
According to a fourth aspect of the present invention, a substrate is interposed between a fixed holding member and a movable holding member to which a seal member is attached, and a holding member is moved to hold the substrate by tightening the movable holding member to the fixed holding member. In doing so, there is provided a method for tightening a substrate holder, wherein the movable holding member is pressed toward the fixed holding member and the holding member is moved in a state where the seal member is crushed.
[0014]
According to a fifth aspect of the present invention, a substrate is interposed between a fixed holding member and a movable holding member to which a seal member is attached, a pressing member is moved, and the movable holding member is fastened to the fixed holding member to hold the substrate. A substrate holder configured to hold the substrate by pressing the movable holding member toward the fixed holding member and moving the pressing member in a state where the seal member is crushed. It is a plating apparatus characterized by having.
[0015]
BEST MODE FOR CARRYING OUT THE INVENTION
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
FIG. 1 shows an overall layout of a plating apparatus provided with a substrate holder according to an embodiment of the present invention. As shown in FIG. 1, in this plating apparatus, two cassette tables 12 on which a cassette 10 containing a substrate W such as a semiconductor wafer is mounted, and a position such as an orientation flat or a notch of the substrate W are aligned in a predetermined direction. An aligner 14 and a spin dryer 16 for rotating the substrate W after the plating process at a high speed and drying the substrate W are provided. Further, near this, there is provided a substrate attaching / detaching portion 20 for mounting the substrate holder 18 and attaching / detaching the substrate W to / from the substrate holder 18, and in the center of these units, the substrate W is placed between them. A substrate transfer device 22 including a transfer robot for transferring is provided.
[0016]
Then, in order from the substrate attaching / detaching portion 20, the stocker 24 for storing and temporarily placing the substrate holder 18, the pre-wet bath 26 for immersing the substrate W in pure water, and the seed layer 500 formed on the surface of the substrate W (FIG. Reference) A presoak tank 28 for etching and removing an oxide film on the surface, a first washing tank 30a for washing the surface of the substrate W with pure water, a blow tank 32 for draining the washed substrate W, and a second washing tank 30b. And a plating tank 34 are arranged in this order. The plating tank 34 is configured by housing a plurality of copper plating units 38 inside an overflow tank 36, and each copper plating unit 38 houses one substrate W inside and performs plating such as copper plating. To be applied. In this example, copper plating will be described, but it goes without saying that the same applies to nickel, solder, silver, and even gold plating.
[0017]
Further, there is provided a substrate holder transfer device 40 which is located at a side of each of these devices and which transfers the substrate holder 18 together with the substrate W between the respective devices, for example, adopts a linear motor system. The substrate holder transport device 40 includes a first transporter 42 that transports a substrate W between the substrate attaching / detaching portion 20 and the stocker 24, a stocker 24, a pre-wet tank 26, a pre-soak tank 28, a washing tank 30a, 30b, A second transporter 44 for transporting the substrate W between the blow tank 32 and the copper plating tank 34 is provided. Note that the second transporter 44 may not be provided, and only the first transporter 42 may be provided.
[0018]
A paddle (not shown) serving as a stirring rod for stirring the plating solution, which is located inside each copper plating unit 38, is driven on the opposite side of the overflow holder 36 of the substrate holder transporting device 40. A paddle driving device 46 is provided.
[0019]
The substrate attaching / detaching portion 20 includes a flat mounting plate 52 that is slidable along the rail 50 in the horizontal direction, and the two substrate holders 18 are mounted on the mounting plate 52 in a horizontal state in parallel. After the transfer of the substrate W between the one substrate holder 18 and the substrate transfer device 22, the mounting plate 52 is slid in the horizontal direction, and the transfer between the other substrate holder 18 and the substrate transfer device 22 is performed. The transfer of the substrate W is performed between them.
[0020]
As shown in FIGS. 2 to 7, the substrate holder 18 is, for example, a rectangular flat plate-shaped fixed holding member 54 made of vinyl chloride, and a movable holding member which is attached to the fixed holding member 54 via a hinge 56 so as to be freely opened and closed. 58. The movable holding member 58 has a base portion 58a and a ring-shaped portion 58b, and is made of, for example, vinyl chloride to improve sliding with a pressing member 60 described below. On the opposite surface, an inner seal member 62 is attached by protruding inward via bolts 64 (see FIG. 6), and on the surface on the fixed holding member 54 side, a dovetail-shaped seal groove 66 is provided. An outer seal member 68 is mounted inside the seal groove 66.
[0021]
When the substrate W is held by the substrate holder 18, the inner seal member 62 presses against the peripheral edge of the surface (plated surface) of the substrate W to seal the peripheral edge thereof. A sealing portion 62a is provided which protrudes toward the movable holding member 58 side and linearly contacts the peripheral portion of the substrate W. The inner seal member 62 is formed integrally with the holding member 70 by holding substantially the entire surface of the holding member 70 made of, for example, titanium.
[0022]
In this way, by forming the inner seal member 62 and the holding member 70 holding the inner seal member 62 into an integral structure, the movable holding member 58 is moved to release the holding of the substrate W after plating, and the substrate W When removing the inner seal member 62 from the substrate holder 18, the seal portion 62 a of the inner seal member 62 is prevented from attaching to the substrate W and the inner seal member 62 is prevented from rolling up from the holding member 70, and the inner seal member 62 and the substrate W Can be improved. Moreover, by making the inner seal member 62 linearly contact the substrate W via the seal portion 62a, the inner seal member 62 is reliably sealed with a low tightening pressure, and an area that can be effectively used as a pattern formation region of the substrate W. Can be spread.
[0023]
On the other hand, when the substrate W is held by the substrate holder 18, the outer seal member 68 presses the outer surface of the inner seal member 62 against the surface of the fixed holding member 54 on the side of the movable holding member 58 to seal it. In this example, a multiple seal structure having two ring-shaped seal portions 68a and 68b projecting downward and another seal portion 68c at the center thereof is used as the outer seal member 68.
[0024]
As described above, by using the multiple seal structure as the outer seal member 68, the multiple seal structure is formed between the movable holding member 58 and the fixed holding member 54 to which the outer seal member 68 attached to the movable holding member 58 contacts. Multiple sealing is performed by the outer sealing member 68 made of a structure, so that the sealing performance here can be more complete.
[0025]
Further, in this example, the outer seal member 68 diverges toward the opposite side of the seal portions 68a, 68b, 68c, and when pressed in the width direction, easily collapses to reduce the width. A W-shaped cross section that returns outward by force is used. Accordingly, when the outer seal member 68 is mounted in the dovetail-shaped seal groove 66, the mounting side end of the outer seal member 68 is crushed in the width direction, so that the outer seal member 68 is mounted in the seal groove 66. Is easily performed, and the outer seal member 68 after being attached is expanded outward by its elastic force, whereby the escape of the outer seal member 68 from the seal groove 66 can be reliably prevented. Further, by making the side surface of the outer seal member 68 contact the side wall surface of the seal groove 66 with a certain elastic force, it is possible to prevent the liquid from accumulating in the contact portion.
[0026]
A step is provided on the outer peripheral portion of the movable holding member 58, and a pressing member 60 is mounted on the step via a pressing plate 72 so as not to escape and to be rotatable. The holding member 60 has excellent corrosion resistance to an oxidizing environment and has sufficient rigidity, for example, is made of titanium.
[0027]
An inverted L-shaped clamper 74 having a protruding portion protruding inward is provided on the fixed holding member 54 at equal intervals along the circumferential direction, located outside the pressing member 60. The lower surface of the surface of the presser member 60 and the lower surface of the inwardly protruding portion of the clamper 74 located so as to cover the surface are tapered surfaces inclined in opposite directions along the rotation direction. Further, as described below, the rotating pin 112 is inserted into a plurality of locations (for example, four places) along the circumferential direction of the holding member 60, and the holding member 60 is rotated by rotating the rotating pin 112. An elongated hole 60a to be rotated is provided.
[0028]
Thus, with the movable holding member 58 opened, the substrate W is inserted into the center of the fixed holding member 54, the movable holding member 58 is closed via the hinge 56, and the pressing member 60 is rotated clockwise. By sliding the outer peripheral portion of the holding member 60 into the inwardly protruding portion of the clamper 74, the fixed holding member 54 and the movable holding member 58 are connected via the tapered surfaces respectively provided on the holding member 60 and the clamper 74. The lock is released by tightening and locking each other, rotating the presser member 60 counterclockwise and pulling it out of the protrusion of the inverted L-shaped clamper 74. When the movable holding member 58 is locked in this manner, the sealing portion 62a of the inner sealing member 62 is on the surface of the substrate W, and the sealing portions 68a, 68b, 68c of the outer sealing member 68 are on the surface of the fixed holding member 54. The respective members are pressed against each other to uniformly press the seal members 62 and 68 so as to securely seal them.
[0029]
At the center of the fixed holding member 54, a ridge 82 that projects in a ring shape according to the size of the substrate W, and whose surface comes into contact with the peripheral edge of the substrate W to become a support surface 80 that supports the substrate W is provided. A concave portion 84 is provided at a predetermined position along the circumferential direction of the ridge portion 82.
[0030]
As shown in FIG. 5, in each of the concave portions 84, a plurality (12 in the figure) of conductors (electric contacts) 86 connected to a plurality of wirings extending from external contacts provided on the hand 120 described below, respectively. When the substrate W is placed and placed on the support surface 80 of the fixed holding member 54, the end of the conductor 86 has a spring property on the surface of the fixed holding member 54 on the side of the substrate W. It is exposed.
[0031]
On the other hand, a leg 88a of an electric contact 88 is fixed to a position of the ring-shaped portion 58b of the movable holding member 58 facing the conductor 86. The electric contact 88 is formed in a leaf spring shape, and has a function of positioning (centering) the substrate W. That is, the electric contact 88 has a contact portion 88b located outside of the inner seal member 62 and protruding inward in a leaf spring shape. When the substrate W is easily bent by holding the substrate W with the fixed holding member 54 and the movable holding member 58, the contact portion 88b of the electric contact 88 is supported on the support surface 80 of the fixed holding member 54. It is configured to elastically contact the outer peripheral surface of W.
[0032]
Then, as shown in FIG. 5A, the substrate W is placed on the support surface 80 of the fixed holding member 54, and further, as shown in FIGS. 5B to 5C, the movable holding member 58 When the substrate W is held by being moved and locked in the direction of the fixed holding member 54, the exposed portion of the conductor 86 is elastically attached to the lower surface of the leg 88 a of the electric contact 88 via the elastic force of the exposed portion of the conductor 86. Then, the substrate W is elastically contacted with the contact portion 88b of the electrical contact 88 via the elastic force of the contact portion 88b. Thus, power can be supplied to the substrate W via the electric contacts 88 while the substrate W is sealed by the seal members 62 and 68 and held by the substrate holder 18.
[0033]
As described above, the electric contact 88 is formed in a leaf spring shape, and the contact end of the contact portion 88b of the electric contact 88 is brought into contact with the substrate W through the elastic force of the electric contact 88 itself. In addition, the electrical contact 88 can be brought into contact with the substrate W at the outer peripheral portion of the substrate W, so that the area that can be effectively used as a pattern formation region of the substrate W can be increased. Further, when the substrate W is held by the substrate holder 18, the substrate W is urged inward by the elastic force of the contact portion 88 b of the electrical contact 88 in the form of a leaf spring, so that the substrate W is Positioning (centering) of the W with respect to the substrate holder 18 can be performed.
It is preferable that at least the surface of the conductor 86 that is in contact with the electric contact 88 be covered with gold or platinum plating, for example.
[0034]
As shown in FIG. 6, a tapered portion 82 a having a spire-shaped tapered surface is provided on a part of the ridge portion 82 of the fixed holding member 54, and a ring-shaped portion 58 b of the movable holding member 58 is provided. When the substrate W is held by the fixed holding member 54 and the movable holding member 58 at positions on the inner peripheral surface facing the tapered portion 82a, the tapered surface and the reverse tapered surface of the tapered portion 82a engage with each other. A tapered portion 90 is provided for positioning with respect to the center of both 54 and 58. In other words, as shown in FIG. 6A, the substrate W is placed on the support surface 80 of the fixed holding member 54, and further, as shown in FIGS. 6B to 6C, the movable holding member 58 When the substrate W is moved and locked in the direction of the fixed holding member 54 to hold the substrate W, the tapered portions 82a and 90 guide each other, and the positioning of the movable holding member 58 with respect to the fixed holding member 54 (or vice versa). Is being done.
[0035]
As described above, by providing the tapered portions 82a and 90 that are engaged with the protrusions 82 of the fixed holding member 54 and the ring-shaped portion 58b of the movable holding member 58, the fixed holding member 54 and the movable holding member 58 are separated. Even if the positioning of the two members 54 and 58 is not accurate at the position, the two members 54 and 58 are formed via the tapered portions 82 a and 90 engaged with each other in the process of holding the substrate W with the fixed holding member 54 and the movable holding member 58. Can be automatically positioned with respect to the center.
[0036]
Thus, in the process of holding the substrate W with the fixed holding member 54 and the movable holding member 58 as described above, the substrate W is positioned with respect to the centers of the two members 54 and 58, and further, via the leaf-spring-shaped electric contacts 88. The positioning (centering) of the substrate W with respect to the substrate holder 18 and eventually the inner seal member 62 can be performed simultaneously.
[0037]
Further, as shown in FIG. 2, the protrusions 82 of the fixed holding member 54 are provided with slightly wide recesses 92 at 22 places in this example, which are located on the opposite side of the hinge 56. A suction pad 94 is accommodated in the inside 92. As shown in detail in FIG. 7, the suction pad 94 is made of a flexible material such as rubber, has a conical cup portion 96 having a vacuum inside, and holds the fixed holding member 54 through a bolt 100. Mounted on. Then, when the substrate W is held by the substrate holder 18, the substrate W presses the cup portion 96, and the cup portion 96 is pushed outward, so that the back surface of the substrate is passed through the vacuum portion in the cup portion 96. It is designed to adsorb the side.
[0038]
Thus, after the plating is completed, the movable holding member 58 is moved to release the holding of the substrate W, and when the substrate W is taken out from the substrate holder 18, the back surface side of the substrate W is sucked by the suction pad 94, so that the substrate W Can be prevented from moving together with the inner seal member 62 while being stuck to the inner seal member 62. In addition, when the automatic operation is performed using the automatic transfer device, the substrate W is not lifted, so that the substrate W can always be stably taken out from the substrate holder 18. As described above, when the substrate W is taken out from the substrate holder 18, the suction force of the suction pad 94 is large enough to easily separate the substrate W from the inner seal member 62 and to transfer the substrate to and from the robot. Is set to
[0039]
In addition, by providing the suction pad 94 at a position corresponding to the peripheral portion of the substrate W opposite to the hinge 56 with the center of the substrate W held by the substrate holder 18 therebetween, the movable holding member 58 can be moved via the hinge 56. At the time of opening, the suction pad 94 prevents lifting of a portion which is attached to the inner seal member 62 and is first lifted, so that the substrate W can be effectively separated from the inner seal member 62.
[0040]
The movable holding member 58 is opened and closed by the weight of a cylinder (not shown) and the movable holding member 58. That is, the fixed holding member 54 is provided with a through hole 54a, and a cylinder is provided at a position facing the through hole 54a when the substrate holder 18 is mounted on the mounting plate 52. Thus, the cylinder rod is extended, the movable holding member 58 is opened by pushing up the base 58a of the movable holding member 58 upward with a pressing rod through the through-hole 54a, and the movable rod 58 is contracted by contracting the cylinder rod. It is designed to close under its own weight.
[0041]
In this example, the movable holding member 58 is locked / unlocked by rotating the holding member 60. 8 and 9 show the lock / unlock mechanism 110. This lock / unlock mechanism 110 is provided on the ceiling side, and when the substrate W is put into the substrate holder 18 placed on the placing plate 52 and the movable holding member 58 is closed via the hinge 56. A rotating pin 112 located at a position corresponding to each elongated hole 60a of the holding member 60 of the substrate holder 18 located at the center side. Is vertically provided on the lower surface of the main body. Further, a pressing rod 116 is provided which is vertically movable and presses the ring-shaped portion 58b of the movable holding member 58 of the substrate holder 18 mounted on the mounting plate 52 toward the fixed holding member 54. A long hole 114 a extending in the circumferential direction is provided at a position facing the pressing rod 116.
[0042]
Thereby, as described above, the substrate holder 18 in which the substrate W is inserted and the movable holding member 58 is closed is raised together with the mounting plate 52, and after the rotation pin 112 is positioned in the long hole 60a of the holding member 60. Then, the pressing rod 116 is lowered to press the movable holding member 58 downward, whereby the seal members 62 and 68 are first crushed so that the movable holding member 58 is not rotated. Is rotated to rotate the holding member 60, and the holding member 60 is inserted into the clamper 74 to lock the movable holding member 58.
[0043]
As described above, by first rotating the pressing member 60 via the rotating pin 112 in a state where the movable holding member 58 is prevented from rotating by lowering the pressing rod 116, the rotation of the pressing member 60 can be performed with low friction. It can be carried out. Thereby, the wear of the pressing member 60, the clamper 74, and the movable holding member 58 is reduced, and the displacement of the movable holding member 58 due to the co-rotation caused by the rotation of the pressing member 60 is prevented. It is possible to prevent the seal members 62 and 68 from being twisted and the sealing properties from being deteriorated.
[0044]
In addition, a ring-shaped thing is used as a rotating body, and instead of the pressing rod 116, a cylindrical pressing member 116 a shown by oblique lines in FIG. 9 is used, whereby the movable holding member 58 is moved by the pressing member 116 a. You may make it press the ring-shaped part 58b more uniformly over the perimeter.
[0045]
This lock / unlock mechanism 110 is provided, locks (or unlocks) one of the two substrate holders 18 placed on the mounting plate 52, and then moves the mounting plate 52 in the horizontal direction. By sliding, the other substrate holder 18 is locked (or unlocked). The substrate holder 18 is provided with a sensor for confirming a contact state between the substrate W and the contact when the substrate W is mounted, and a signal from this sensor is input to a controller (not shown). Has become.
[0046]
A pair of substantially T-shaped hands 120 serving as support portions for transporting and suspending and supporting the substrate holder 18 are connected to an end of the fixed holding member 54 of the substrate holder 18. Then, in the stocker 24, the protruding end of the hand 120 is hooked on the upper surface of the peripheral wall to suspend it vertically, and the hand 120 of the suspended substrate holder 18 is moved to the The substrate holder 18 is transported while being held by the transporter 42. In the pre-wet tank 26, the pre-soak tank 28, the rinsing tanks 30a and 30b, the blow tank 32, and the copper plating tank 34, the substrate holder 18 is also suspended from the peripheral wall via the hand 120 and held.
[0047]
A series of bump plating processes performed by the plating apparatus configured as described above will be described. First, as shown in FIG. 14A, a seed layer 500 as a power supply layer was formed on the surface, and a resist 502 having a height H of, for example, 20 to 120 μm was applied to the entire surface of the seed layer 500. Thereafter, a substrate provided with an opening 502a having a diameter D of, for example, about 20 to 200 μm at a predetermined position of the resist 502 is accommodated in the cassette 10 with its surface (plated surface) facing upward. Is mounted on the cassette table 12.
[0048]
One substrate is taken out from the cassette 10 mounted on the cassette table 12 by the substrate transfer device 22, placed on the aligner 14, and the orientation of the orientation flat or notch is adjusted in a predetermined direction. The substrate aligned by the aligner 14 is transported to the substrate attaching / detaching portion 20 by the substrate transporting device 22.
[0049]
In the substrate attaching / detaching section 20, two substrate holders 18 accommodated in the stocker 24 are simultaneously held by the transporters 42 of the substrate holder transporting device 40, and are transported to the substrate attaching / detaching section 20. Then, the substrate holder 18 is lowered in a horizontal state, whereby the two substrate holders 18 are simultaneously mounted on the mounting plate 52 of the substrate attaching / detaching portion 20, and the cylinder is operated to move the substrate holder 18. The holding member 58 is kept open.
[0050]
In this state, the substrate transferred by the substrate transfer device 22 is inserted into the substrate holder 18 located on the center side, the cylinder is reversely operated to close the movable holding member 58, and then the movable holding member 58 is locked and unlocked by the lock / unlock mechanism. Lock 58. After the mounting of the substrate on one of the substrate holders 18 is completed, the mounting plate 52 is slid in the lateral direction, and the substrate is mounted on the other substrate holder 18 in the same manner. Return 52 to its original position.
[0051]
Thereby, the substrate W is sealed with the sealing members 62 and 68 so that the plating solution does not enter, with the surface on which the plating process is performed exposed from the opening of the substrate holder 18, and the substrate W is sealed with the plating solution by the seal. It is fixed so as to be electrically connected to a plurality of contacts at a portion that does not touch. Here, wiring is connected from the contact point to the hand 120 of the substrate holder 18, and power can be supplied to the seed layer 500 of the substrate by connecting a power source to the hand 120.
[0052]
Next, the two substrate holders 18 on which the substrates W are mounted are simultaneously held by the transporters 42 of the substrate holder transport device 40 and transported to the stocker 24. Then, the substrate holder 18 is lowered in a vertical state, whereby the two substrate holders 18 are suspended and held (temporarily placed) on the stocker 24.
[0053]
In the substrate transporter 22, the substrate attaching / detaching unit 20, and the transporter 42 of the substrate holder transporter 40, the above-described operation is sequentially repeated, and the substrates are sequentially mounted on the substrate holders 18 accommodated in the stocker 24. At a predetermined position (temporary placement).
A sensor provided on the substrate holder 18 for checking the contact state between the substrate and the contact. When it is determined that the contact state is defective, a signal is input to a controller (not shown).
[0054]
On the other hand, in the other transporter 44 of the substrate holder transport device 40, the two substrate holders 18 on which the substrates are mounted and temporarily placed on the stocker 24 are simultaneously grasped, transported to the pre-wet tank 26 and lowered. Thereby, the two substrate holders 18 are put into the pre-wet bath 26.
[0055]
At this time, the sensor for checking the contact state between the substrate and the contact provided on the substrate holder 18, and the substrate holder 18 containing the substrate determined to have a bad contact state is temporarily placed in the stocker 24. And leave. Thus, even if a contact failure occurs between the substrate and the contact when the substrate is mounted on the substrate holder 18, the plating operation can be continued without stopping the apparatus. The substrate having the poor contact is not subjected to the plating treatment. In this case, it is possible to cope with this by removing the unplated substrate from the cassette after returning the cassette.
[0056]
Next, the substrate holder 18 on which the substrate is mounted is transferred to the presoak tank 28 in the same manner as described above, and the oxide film is etched in the presoak tank 28 to expose a clean metal surface. Further, the substrate holder 18 on which the substrate is mounted is transported to the washing tank 30a in the same manner as described above, and the surface of the substrate is washed with pure water in the washing tank 30a.
[0057]
The substrate holder 18 on which the rinsed substrate is mounted is transported to the plating bath 34 filled with the plating solution and suspended and held by the plating unit 38 in the same manner as described above. The transporter 44 of the substrate holder transport device 40 sequentially repeats the above-described operations, sequentially transports the substrate holders 18 on which the substrates are mounted to the plating unit 38 of the plating tank 34, and suspends the substrate holders 18 at predetermined positions.
[0058]
After the suspension of all the substrate holders 18 is completed, the plating solution in the overflow tank 36 is circulated, and the plating voltage is applied between the anode (not shown) in the plating tank 34 and the substrate W while overflowing. Is applied, and at the same time, the paddle is reciprocated by the paddle driving device 46 in parallel with the surface of the substrate, thereby plating the surface of the substrate. At this time, the substrate holder 18 is suspended and fixed by the hand 120 above the plating unit 38, and is supplied with power from the plating power supply to the seed layer 500 (see FIG. 14) through the conductor 86 and the electrical contacts 88.
[0059]
After the plating is completed, the application of the plating power supply, the supply of the plating solution, and the reciprocating motion of the paddle are stopped. In the same manner as described above, the substrate is conveyed to the washing tank 30b, and is immersed in pure water in the washing tank 30b to wash the surface of the substrate with pure water. Next, the substrate holder 18 on which the substrate W is mounted is transported to the blow tank 32 in the same manner as described above, where water droplets attached to the substrate holder 18 are removed by blowing air. Thereafter, the substrate holder 18 on which the substrate W is mounted is returned to a predetermined position of the stocker 24 and suspended and held in the same manner as described above.
[0060]
The transporter 44 of the substrate holder transport device 40 sequentially repeats the above operation, and returns the substrate holder 18 on which the plated substrate is mounted to the predetermined position of the stocker 24 in sequence, and suspends and holds the substrate holder 18.
[0061]
On the other hand, in the other transporter 42 of the substrate holder transport device 40, the two substrate holders 18 having the plated substrates W mounted thereon and returned to the stocker 24 are simultaneously grasped, and the substrate is removed and attached in the same manner as described above. It is mounted on the mounting plate 52 of the unit 20. At this time, the sensor provided on the substrate holder 18 for checking the contact state between the substrate and the contact point is mounted on the substrate holder 18 which is determined to have a bad contact state and is temporarily placed in the stocker 24. At the same time, they are transported and placed on the placement plate 52.
[0062]
Then, the lock of the movable holding member 58 of the substrate holder 18 located at the center side is released via the lock / unlock mechanism, and the movable holding member 58 is opened by operating the cylinder. At this time, as described above, the movable holding member 58 is prevented from being opened while the substrate W is attached to the movable holding member 58. In this state, the substrate W after the plating process in the substrate holder 18 is taken out by the substrate transport device 22 and transported to the spin dryer 16, and the spin-dried (water drained) substrate is rotated by the high speed rotation of the spin dryer 16. To return to the cassette 10.
[0063]
Then, after the substrate mounted on one substrate holder 18 was returned to the cassette 10 or in parallel with this, the mounting plate 52 was slid in the horizontal direction, and similarly mounted on the other substrate holder 18. The substrate is spin-dried and returned to the cassette 10.
[0064]
After the mounting plate 52 is returned to the original state, the two substrate holders 18 from which the substrates have been taken out are simultaneously held by the transporters 42 of the substrate holder transporting device 40, and in the same manner as described above, this is Return to place. Thereafter, the two substrate holders 18 on which the plated substrates have been mounted and returned to the stocker 24 are simultaneously held by the substrate holder transport device 40, and placed on the mounting plate 52 of the substrate attaching / detaching portion 20 in the same manner as described above. Place it and repeat the same operation as above.
[0065]
Then, all the substrates are taken out from the substrate holder 18 having the plated substrate mounted thereon and returned to the stocker 24, spin-dried and returned to the cassette 10 to complete the operation. Thus, as shown in FIG. 14B, a substrate W in which the plating film 504 is grown in the opening 502a provided in the resist 502 is obtained.
[0066]
Next, the substrate W spin-dried as described above is immersed in a solvent such as acetone at a temperature of, for example, 50 to 60 ° C., and the resist 502 on the substrate W is peeled off as shown in FIG. Remove. Then, as shown in FIG. 14D, the unnecessary seed layer 500 exposed to the outside after the plating is removed, and a bump made of the plating film 504 is formed.
[0067]
In this example, a stocker 24 for vertically storing the substrate holder 18 is disposed between the substrate attaching / detaching portion 20 and the copper plating unit 38, and the substrate holder 18 between the substrate attaching / detaching portion 20 and the stocker 24 is disposed. The first transporter 42 of the substrate holder transport device 40 transports the substrate holder 18 between the stocker 24 and the copper plating unit 38 by the second transporter 44, so that the transport when not in use is performed. The substrate holder 18 is stored in the stocker 24, and the transfer of the substrate holder 18 before and after sandwiching the stocker 24 is performed smoothly to improve the throughput. Needless to say, all transports may be performed by one transporter.
[0068]
In addition, a robot having a dry hand and a wet hand is used as the substrate transfer device 22, a wet hand is used only when the substrate after plating is taken out from the substrate holder 18, and a dry hand is used in other cases. The back surface of the substrate is kept out of contact with the plating solution by the seal of the substrate holder 18, and in principle, it is not always necessary to use a wet hand. Plating solution contamination due to wraparound or poor sealing occurs, and this contamination can be prevented from contaminating the back surface of a new substrate.
[0069]
Note that, in the above example, the electrical contact 88 is configured by a single plate-shaped plate having a leaf spring shape. However, as shown in FIG. 10, two or more plate spring-shaped plate members are formed. The electrical contact 88 may be constituted by a leaf spring 124 in which the 122a and 122b are overlapped.
[0070]
Thus, even in a place where the installation space is considerably narrow, the electric contact 88 (laminated leaf spring 124) capable of securing a long stroke without causing plastic deformation is installed. 124), the substrate W can be positioned (centered) with respect to the substrate holder 18 and energized to the substrate W in the process of holding the substrate W with the substrate holder 18.
[0071]
In this example, the leaf spring 124 also serves as the electric contact 88, so that it is not necessary to separately provide a dedicated leaf spring solely for positioning (centering) the substrate. Although a simplification has been made, a dedicated leaf spring may be provided separately only for the purpose of positioning (centering) the substrate.
[0072]
As shown in FIGS. 11 to 13, the outer seal member 68 has two ring-shaped seal portions 126 a and 126 b on both sides in the width direction, and is further provided at a predetermined position along the circumferential direction. A multiple seal structure 128 provided with a partition seal portion 126c extending in the width direction may be used. This also achieves more complete sealing, and, for example, in FIG. 12, X adjacent to the ring-shaped seal portions 126a and 126b with the partition seal portion 126c interposed therebetween. 1 Division and X 2 Even if the part is damaged, this damaged X 1 Division and X 2 The sealability can be maintained by the partition seal portion 126c located between the first and second portions.
[0073]
As described above, according to this plating apparatus, by setting the cassette containing the substrate on the cassette table and starting the apparatus, the electroplating employing the dipping method is performed fully automatically, and the plating is performed on the surface of the substrate. A metal plating film suitable for a bump or the like can be formed automatically.
In the above example, an example is shown in which the holding member is rotated and the substrate is held by rotating the holding member. However, the holding member is moved in parallel in one direction to hold the substrate. Needless to say, the present invention can be applied to the substrate holder configured as described above.
[0074]
【The invention's effect】
As described above, according to the present invention, for example, the movable holding member is prevented from rotating with the rotation of the holding member of the substrate holder configured to hold the substrate by rotating the holding member. The displacement of the members can be prevented, thereby preventing the centering of the substrate from being affected and the sealing member from being twisted to deteriorate the sealing performance. In addition, the vertical load acting between the holding member and other sliding members can be reduced, and the holding member can be rotated with low friction, thereby reducing wear and dust generation of the constituent members. it can.
[Brief description of the drawings]
FIG. 1 is an overall layout view of a plating apparatus provided with a substrate holder according to an embodiment of the present invention.
FIG. 2 is a plan view of the substrate holder shown in FIG.
FIG. 3 is a right side view of the substrate holder shown in FIG.
FIG. 4 is a vertical sectional front view of the substrate holder shown in FIG. 1;
FIG. 5 is a cross-sectional view showing a relationship between a conductor and an electric contact when the substrate is held by the substrate holder shown in FIG.
6 is a cross-sectional view illustrating a relationship between a tapered portion of a fixed holding member and a tapered portion of a movable holding member when the substrate is held by the substrate holder illustrated in FIG.
FIG. 7 is a cross-sectional view of a mounting portion of a suction pad in the substrate holder shown in FIG.
FIG. 8 is a cross-sectional view showing a state where the substrate holder is locked by the lock / unlock mechanism.
FIG. 9 is a plan view of a lock / unlock mechanism.
FIG. 10 is a cross-sectional view showing an example in which the electric contact is constituted by a leaf spring.
FIG. 11 is a plan view showing another example of the outer seal member.
FIG. 12 is an enlarged view of a portion A in FIG. 11;
FIG. 13 is a cross-sectional view of FIG.
FIG. 14 is a cross-sectional view showing a process of forming a bump (protruding electrode) on a substrate in the order of steps.
[Explanation of symbols]
10 cassettes
12 cassette table
14 Aligner
16 Spin dryer
18 Substrate holder
20 Board detachable part
22 Substrate transfer device
24 Stocker
26 Pre-wet tank
28 presoak tank
30a, 30b Rinse tank
32 blow tank
34 Plating tank
36 Overflow tank
38 Plating unit
40 Substrate holder transfer device
42,44 Transporter
46 paddle drive
54 Fixed holding member
56 Hinge
58 Movable holding member
58a base
58b ring-shaped part
60 Holding member
62 Inner seal member
66 Seal groove
68 Outer seal member
74 Clamper
80 Support surface
82 ridge
86 conductor
88 electrical contacts
94 Suction pad
96 cups
98 vacuum section
110 Lock / Unlock mechanism
112 Rotating pin
114 rotating plate
116 Push rod
122a, 122b plate
124 leaf spring
128 multiple seal structure

Claims (5)

固定保持部材とシール部材を取付けた可動保持部材との間に基板を介在させ、押え部材を移動させ前記可動保持部材を前記固定保持部材に締付けて基板を保持するようにした基板ホルダにおいて、
前記可動保持部材を前記固定保持部材に向けて押圧し前記シール部材を潰した状態で前記押え部材を移動させて基板を保持するように構成したことを特徴とする基板ホルダ。
In a substrate holder in which a substrate is interposed between a fixed holding member and a movable holding member to which a seal member is attached, a holding member is moved, and the movable holding member is fastened to the fixed holding member to hold the substrate.
A substrate holder, wherein the movable holding member is pressed toward the fixed holding member to move the pressing member in a state where the seal member is crushed, thereby holding the substrate.
前記可動保持部材の前記固定保持部材に向けた押圧を、前記可動保持部材の外周に沿った所定の位置でスポット状に行うようにしたことを特徴とする請求項1記載の基板ホルダ。The substrate holder according to claim 1, wherein the movable holding member is pressed toward the fixed holding member in a spot shape at a predetermined position along an outer periphery of the movable holding member. 前記可動保持部材の前記固定保持部材に向けた押圧を、前記可動保持部材の外周に沿った全周に亘る位置で行うようにしたことを特徴とする請求項1記載の基板ホルダ。2. The substrate holder according to claim 1, wherein the movable holding member is pressed toward the fixed holding member at a position over the entire circumference along the outer circumference of the movable holding member. 固定保持部材とシール部材を取付けた可動保持部材との間に基板を介在させ、押え部材を移動させ前記可動保持部材を前記固定保持部材に締付けて基板を保持するにあたり、
前記可動保持部材を前記固定保持部材に向けて押圧し前記シール部材を潰した状態で前記押え部材を移動させることを特徴とする基板ホルダの締付け方法。
In interposing the substrate between the fixed holding member and the movable holding member to which the seal member is attached, and moving the pressing member to fasten the movable holding member to the fixed holding member to hold the substrate,
A method for tightening a substrate holder, wherein the movable holding member is pressed toward the fixed holding member, and the pressing member is moved in a state where the seal member is crushed.
固定保持部材とシール部材を取付けた可動保持部材との間に基板を介在させ、押え部材を移動させ前記可動保持部材を前記固定保持部材に締付けて基板を保持するようにした基板ホルダであって、
前記可動保持部材を前記固定保持部材に向けて押圧し前記シール部材を潰した状態で前記押え部材を移動させて基板を保持するように構成した基板ホルダを有することを特徴とするめっき装置。
A substrate holder, wherein a substrate is interposed between a fixed holding member and a movable holding member to which a seal member is attached, a holding member is moved, and the movable holding member is fastened to the fixed holding member to hold the substrate. ,
A plating apparatus comprising: a substrate holder configured to press the movable holding member toward the fixed holding member and move the pressing member in a state where the seal member is crushed to hold the substrate.
JP2002206289A 2002-07-15 2002-07-15 Substrate holder and plating apparatus Expired - Lifetime JP3778282B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002206289A JP3778282B2 (en) 2002-07-15 2002-07-15 Substrate holder and plating apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002206289A JP3778282B2 (en) 2002-07-15 2002-07-15 Substrate holder and plating apparatus

Publications (2)

Publication Number Publication Date
JP2004043936A true JP2004043936A (en) 2004-02-12
JP3778282B2 JP3778282B2 (en) 2006-05-24

Family

ID=31711315

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002206289A Expired - Lifetime JP3778282B2 (en) 2002-07-15 2002-07-15 Substrate holder and plating apparatus

Country Status (1)

Country Link
JP (1) JP3778282B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101489051B1 (en) 2012-01-30 2015-02-02 가부시키가이샤 에바라 세이사꾸쇼 Substrate holder and plating apparatus
JP2015187306A (en) * 2010-10-21 2015-10-29 株式会社荏原製作所 Plating apparatus
US9728435B2 (en) 2010-10-21 2017-08-08 Ebara Corporation Plating apparatus and plating method
KR20200060226A (en) 2018-11-21 2020-05-29 에바라코포레이숀 Method for holding substrate to substrate holder

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015187306A (en) * 2010-10-21 2015-10-29 株式会社荏原製作所 Plating apparatus
US9728435B2 (en) 2010-10-21 2017-08-08 Ebara Corporation Plating apparatus and plating method
US9984910B2 (en) 2010-10-21 2018-05-29 Ebara Corporation Plating apparatus and plating method
US9991145B2 (en) 2010-10-21 2018-06-05 Ebara Corporation Plating apparatus and plating method
KR101489051B1 (en) 2012-01-30 2015-02-02 가부시키가이샤 에바라 세이사꾸쇼 Substrate holder and plating apparatus
KR20200060226A (en) 2018-11-21 2020-05-29 에바라코포레이숀 Method for holding substrate to substrate holder
US11236435B2 (en) 2018-11-21 2022-02-01 Ebara Corporation Method for holding substrate on substrate holder

Also Published As

Publication number Publication date
JP3778282B2 (en) 2006-05-24

Similar Documents

Publication Publication Date Title
JP4722955B2 (en) Substrate holder and electrolytic plating apparatus
US9506162B2 (en) Electrochemical deposition method
JP5993065B2 (en) Board holder
JP4669019B2 (en) Substrate holder and electrolytic plating apparatus
JP5643239B2 (en) Substrate holder and plating apparatus
US9593430B2 (en) Electrochemical deposition method
JP2018104799A (en) Method and device for treating substrate
KR102565317B1 (en) Substrate cleaning method
JP2002363794A (en) Substrate holder and plating device
JP2004043936A (en) Substrate holder and plating apparatus
JP6018961B2 (en) Plating apparatus and plating method
JP2002363797A (en) Electrical contact, method of producing the same, and plating device
JP2002363793A (en) Substrate holder and plating device

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20050203

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20051117

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20051129

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20060127

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20060221

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20060221

R150 Certificate of patent or registration of utility model

Ref document number: 3778282

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100310

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110310

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110310

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120310

Year of fee payment: 6

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120310

Year of fee payment: 6

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130310

Year of fee payment: 7

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130310

Year of fee payment: 7

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140310

Year of fee payment: 8

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term