JP2004038141A5 - - Google Patents

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Publication number
JP2004038141A5
JP2004038141A5 JP2003054280A JP2003054280A JP2004038141A5 JP 2004038141 A5 JP2004038141 A5 JP 2004038141A5 JP 2003054280 A JP2003054280 A JP 2003054280A JP 2003054280 A JP2003054280 A JP 2003054280A JP 2004038141 A5 JP2004038141 A5 JP 2004038141A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003054280A
Other languages
Japanese (ja)
Other versions
JP2004038141A (ja
Filing date
Publication date
Application filed filed Critical
Publication of JP2004038141A publication Critical patent/JP2004038141A/ja
Publication of JP2004038141A5 publication Critical patent/JP2004038141A5/ja
Pending legal-status Critical Current

Links

JP2003054280A 2002-03-01 2003-02-28 フォトレジスト組成物 Pending JP2004038141A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US36112402P 2002-03-01 2002-03-01

Publications (2)

Publication Number Publication Date
JP2004038141A JP2004038141A (ja) 2004-02-05
JP2004038141A5 true JP2004038141A5 (enExample) 2006-03-09

Family

ID=27789073

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003054280A Pending JP2004038141A (ja) 2002-03-01 2003-02-28 フォトレジスト組成物

Country Status (5)

Country Link
US (1) US20030228474A1 (enExample)
EP (1) EP1347334A1 (enExample)
JP (1) JP2004038141A (enExample)
KR (1) KR20040002447A (enExample)
TW (1) TW200403522A (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0537524A1 (en) 1991-10-17 1993-04-21 Shipley Company Inc. Radiation sensitive compositions and methods
TW200401164A (en) * 2002-03-01 2004-01-16 Shipley Co Llc Photoresist compositions
US8012670B2 (en) 2002-04-11 2011-09-06 Rohm And Haas Electronic Materials Llc Photoresist systems
US7696292B2 (en) * 2003-09-22 2010-04-13 Commonwealth Scientific And Industrial Research Organisation Low-polydispersity photoimageable acrylic polymers, photoresists and processes for microlithography
JP4628809B2 (ja) * 2005-02-01 2011-02-09 東京応化工業株式会社 ネガ型レジスト組成物およびレジストパターン形成方法
US7977037B2 (en) 2006-08-24 2011-07-12 Micron Technology, Inc. Photoresist processing methods
KR20240138130A (ko) * 2018-09-19 2024-09-20 허니웰 인터내셔날 인코포레이티드 코팅 응용을 위한 플루오로공중합체

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US58198A (en) * 1866-09-25 Improvement in carriage-jacks
US51936A (en) * 1866-01-09 Improvement in rotary pumps
US3772102A (en) * 1969-10-27 1973-11-13 Gen Electric Method of transferring a desired pattern in silicon to a substrate layer
EP0537524A1 (en) * 1991-10-17 1993-04-21 Shipley Company Inc. Radiation sensitive compositions and methods
US5879856A (en) * 1995-12-05 1999-03-09 Shipley Company, L.L.C. Chemically amplified positive photoresists
EP1131677B1 (en) * 1998-09-23 2005-08-03 E.I. Dupont De Nemours And Company Photoresists, polymers and processes for microlithography
TWI224241B (en) * 1999-04-28 2004-11-21 Jsr Corp Positive resist composition
KR20020012206A (ko) * 1999-05-04 2002-02-15 메리 이. 보울러 플루오르화 중합체, 포토레지스트 및 마이크로리소그래피방법
EP1085379B1 (en) * 1999-09-17 2006-01-04 JSR Corporation Radiation-sensitive resin composition
US6692888B1 (en) * 1999-10-07 2004-02-17 Shipley Company, L.L.C. Copolymers having nitrile and alicyclic leaving groups and photoresist compositions comprising same
JP3672780B2 (ja) * 1999-11-29 2005-07-20 セントラル硝子株式会社 ポジ型レジスト組成物およびパターン形成方法
US6306554B1 (en) * 2000-05-09 2001-10-23 Shipley Company, L.L.C. Polymers containing oxygen and sulfur alicyclic units and photoresist compositions comprising same
TW588221B (en) * 2000-09-07 2004-05-21 Shinetsu Chemical Co Polymers, resist compositions and patterning process
WO2002021212A2 (en) * 2000-09-08 2002-03-14 Shipley Company, L.L.C. Fluorinated phenolic polymers and photoresist compositions comprising same
EP1379920A2 (en) * 2000-11-29 2004-01-14 E. I. du Pont de Nemours and Company Photoresist compositions comprising bases and surfactants for microlithography
TW200401164A (en) * 2002-03-01 2004-01-16 Shipley Co Llc Photoresist compositions

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