JP2004030598A5 - - Google Patents
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- Publication number
- JP2004030598A5 JP2004030598A5 JP2003116105A JP2003116105A JP2004030598A5 JP 2004030598 A5 JP2004030598 A5 JP 2004030598A5 JP 2003116105 A JP2003116105 A JP 2003116105A JP 2003116105 A JP2003116105 A JP 2003116105A JP 2004030598 A5 JP2004030598 A5 JP 2004030598A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/127,744 US6757625B2 (en) | 2002-04-22 | 2002-04-22 | Method, apparatus, and article of manufacture for predicting electrical behavior of a multiport device having balanced device ports |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2004030598A JP2004030598A (ja) | 2004-01-29 |
| JP2004030598A5 true JP2004030598A5 (enExample) | 2006-06-15 |
Family
ID=29215322
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003116105A Pending JP2004030598A (ja) | 2002-04-22 | 2003-04-21 | 平衡デバイスポートを有する多ポートデバイスの電気的挙動を予測するシステム |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US6757625B2 (enExample) |
| JP (1) | JP2004030598A (enExample) |
| DE (1) | DE10318202A1 (enExample) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6920407B2 (en) * | 2000-09-18 | 2005-07-19 | Agilent Technologies, Inc. | Method and apparatus for calibrating a multiport test system for measurement of a DUT |
| US6614237B2 (en) * | 2000-09-18 | 2003-09-02 | Agilent Technologies, Inc. | Multiport automatic calibration device for a multiport test system |
| US6744262B2 (en) | 2002-03-14 | 2004-06-01 | Agilent Technologies, Inc. | Method, apparatus, and article of manufacture for characterizing a device and predicting electrical behavior of the device in a circuit |
| US6853198B2 (en) * | 2002-11-14 | 2005-02-08 | Agilent Technologies, Inc. | Method and apparatus for performing multiport through-reflect-line calibration and measurement |
| US7034548B2 (en) * | 2003-04-11 | 2006-04-25 | Agilent Technologies, Inc. | Balanced device characterization including test system calibration |
| US7013229B2 (en) * | 2003-11-13 | 2006-03-14 | Agilent Technologies, Inc. | Obtaining calibration parameters for a three-port device under test |
| US7126346B2 (en) * | 2003-12-18 | 2006-10-24 | Agilent Technologies, Inc. | Method, apparatus, and article of manufacture for manufacturing high frequency balanced circuits |
| JP2005274373A (ja) * | 2004-03-25 | 2005-10-06 | Fujitsu Ltd | Ｓパラメータ算出装置，ｓパラメータ算出方法，ｓパラメータ算出プログラムおよびそのプログラムを記録したコンピュータ読み取り可能な記録媒体 |
| JP2007207168A (ja) * | 2006-02-06 | 2007-08-16 | Nec Electronics Corp | Ｅｍｉシミュレーションモデル、ｅｍｉシミュレーションシステムと方法 |
| US8476326B2 (en) * | 2006-09-22 | 2013-07-02 | Dow Global Technologies Llc | Fibrillated polyolefin foam |
| US20080195344A1 (en) * | 2007-02-14 | 2008-08-14 | Suss Microtec Test Systems Gmbh | Method for determining measurement errors in scattering parameter measurements |
| US7679434B2 (en) | 2008-01-21 | 2010-03-16 | Infineon Technologies Ag | Amplifier modulation method and apparatus |
| WO2010016200A1 (ja) * | 2008-08-08 | 2010-02-11 | 日本電気株式会社 | 差動型トランスインピーダンスアンプの評価方法、光受信回路評価方法、そのプログラムが格納された記憶媒体および装置 |
| EP2363719A1 (en) * | 2010-02-12 | 2011-09-07 | ATE Systems, Inc | Method and apparatus for calibrating a test system for measuring a device under test |
| CN103323688B (zh) * | 2012-03-20 | 2015-11-25 | 华北电力科学研究院有限责任公司 | 一种电力系统的谐波状态估计方法及设备 |
| CN107943641A (zh) * | 2017-11-16 | 2018-04-20 | 郑州云海信息技术有限公司 | 一种生成多端口s参数文档的方法及装置 |
| US10938490B1 (en) * | 2018-10-31 | 2021-03-02 | Christos Tsironis | Calibration method for coupler-tuner assembly |
| CN116245065A (zh) * | 2022-12-14 | 2023-06-09 | 中国南方电网有限责任公司 | 交直流混联系统的阻抗网络建模方法及装置 |
| CN119558248B (zh) * | 2025-01-24 | 2025-04-22 | 四川大学 | 计及不同电压等级的风电场谐波不稳定灵敏度计算方法、系统 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5025402A (en) | 1989-04-07 | 1991-06-18 | Northern Telecom Limited | Method of transient simulation of transmission line networks using a circuit simulator |
| US4962359A (en) * | 1989-06-29 | 1990-10-09 | Hewlett-Packard Company | Dual directional bridge and balun used as reflectometer test set |
| US5434511A (en) | 1993-05-24 | 1995-07-18 | Atn Microwave, Inc. | Electronic microwave calibration device |
| US5467021A (en) | 1993-05-24 | 1995-11-14 | Atn Microwave, Inc. | Calibration method and apparatus |
| US5793213A (en) | 1996-08-01 | 1998-08-11 | Motorola, Inc. | Method and apparatus for calibrating a network analyzer |
| US6106563A (en) | 1997-09-26 | 2000-08-22 | Motorola, Inc. | Method and apparatus for extracting parameters for an electrical structure |
| US6347382B1 (en) * | 1998-11-30 | 2002-02-12 | Advantest Corp. | Multi-port device analysis apparatus and method |
| US6292070B1 (en) * | 1999-03-11 | 2001-09-18 | Anaren Microwave, Inc. | Balun formed from symmetrical couplers and method for making same |
| US20020003455A1 (en) * | 2000-03-30 | 2002-01-10 | Gerd Vandersteen | Broadband high frequency differential coupler |
| US6614237B2 (en) | 2000-09-18 | 2003-09-02 | Agilent Technologies, Inc. | Multiport automatic calibration device for a multiport test system |
| US6483415B1 (en) * | 2001-05-21 | 2002-11-19 | Industrial Technology Research Institute | Multi-layer LC resonance balun |
| TW535322B (en) * | 2001-06-27 | 2003-06-01 | Ind Tech Res Inst | Multi-layer radio frequency chip balun |
| US6665628B2 (en) * | 2002-01-15 | 2003-12-16 | Anritsu Company | Methods for embedding and de-embedding balanced networks |
| US6744262B2 (en) | 2002-03-14 | 2004-06-01 | Agilent Technologies, Inc. | Method, apparatus, and article of manufacture for characterizing a device and predicting electrical behavior of the device in a circuit |
-
2002
- 2002-04-22 US US10/127,744 patent/US6757625B2/en not_active Expired - Lifetime
-
2003
- 2003-04-21 JP JP2003116105A patent/JP2004030598A/ja active Pending
- 2003-04-22 DE DE10318202A patent/DE10318202A1/de not_active Ceased