JP2004030598A - 平衡デバイスポートを有する多ポートデバイスの電気的挙動を予測するシステム - Google Patents

平衡デバイスポートを有する多ポートデバイスの電気的挙動を予測するシステム Download PDF

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JP2004030598A
JP2004030598A JP2003116105A JP2003116105A JP2004030598A JP 2004030598 A JP2004030598 A JP 2004030598A JP 2003116105 A JP2003116105 A JP 2003116105A JP 2003116105 A JP2003116105 A JP 2003116105A JP 2004030598 A JP2004030598 A JP 2004030598A
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Japan
Prior art keywords
impedance
matching network
balanced
network
matrix
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JP2003116105A
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Japanese (ja)
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JP2004030598A5 (enExample
Inventor
Vahe Adamian
ベーヘ・アダミアン
J Bradford Cole
ジェイ・ブラッドフォード・コール
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Agilent Technologies Inc
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Agilent Technologies Inc
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Publication of JP2004030598A publication Critical patent/JP2004030598A/ja
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/36—Circuit design at the analogue level
    • G06F30/367—Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP2003116105A 2002-04-22 2003-04-21 平衡デバイスポートを有する多ポートデバイスの電気的挙動を予測するシステム Pending JP2004030598A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/127,744 US6757625B2 (en) 2002-04-22 2002-04-22 Method, apparatus, and article of manufacture for predicting electrical behavior of a multiport device having balanced device ports

Publications (2)

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JP2004030598A true JP2004030598A (ja) 2004-01-29
JP2004030598A5 JP2004030598A5 (enExample) 2006-06-15

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JP2003116105A Pending JP2004030598A (ja) 2002-04-22 2003-04-21 平衡デバイスポートを有する多ポートデバイスの電気的挙動を予測するシステム

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US (1) US6757625B2 (enExample)
JP (1) JP2004030598A (enExample)
DE (1) DE10318202A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007207168A (ja) * 2006-02-06 2007-08-16 Nec Electronics Corp Ｅｍｉシミュレーションモデル、ｅｍｉシミュレーションシステムと方法
WO2010016200A1 (ja) * 2008-08-08 2010-02-11 日本電気株式会社 差動型トランスインピーダンスアンプの評価方法、光受信回路評価方法、そのプログラムが格納された記憶媒体および装置

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EP1320763A4 (en) * 2000-09-18 2005-07-27 Agilent Technologies Inc METHOD AND APPARATUS FOR CHARACTERIZING ASYMMETRIC OR SYMMETRIC MULTITERMINAL DEVICES
US6920407B2 (en) * 2000-09-18 2005-07-19 Agilent Technologies, Inc. Method and apparatus for calibrating a multiport test system for measurement of a DUT
US6744262B2 (en) * 2002-03-14 2004-06-01 Agilent Technologies, Inc. Method, apparatus, and article of manufacture for characterizing a device and predicting electrical behavior of the device in a circuit
US6853198B2 (en) * 2002-11-14 2005-02-08 Agilent Technologies, Inc. Method and apparatus for performing multiport through-reflect-line calibration and measurement
US7034548B2 (en) * 2003-04-11 2006-04-25 Agilent Technologies, Inc. Balanced device characterization including test system calibration
US7013229B2 (en) * 2003-11-13 2006-03-14 Agilent Technologies, Inc. Obtaining calibration parameters for a three-port device under test
US7126346B2 (en) * 2003-12-18 2006-10-24 Agilent Technologies, Inc. Method, apparatus, and article of manufacture for manufacturing high frequency balanced circuits
JP2005274373A (ja) * 2004-03-25 2005-10-06 Fujitsu Ltd Ｓパラメータ算出装置，ｓパラメータ算出方法，ｓパラメータ算出プログラムおよびそのプログラムを記録したコンピュータ読み取り可能な記録媒体
US8476326B2 (en) * 2006-09-22 2013-07-02 Dow Global Technologies Llc Fibrillated polyolefin foam
US20080195344A1 (en) * 2007-02-14 2008-08-14 Suss Microtec Test Systems Gmbh Method for determining measurement errors in scattering parameter measurements
US7679434B2 (en) 2008-01-21 2010-03-16 Infineon Technologies Ag Amplifier modulation method and apparatus
US20110199107A1 (en) * 2010-02-12 2011-08-18 Ate Systems, Inc. Method and apparatus for calibrating a test system for measuring a device under test
CN103323688B (zh) * 2012-03-20 2015-11-25 华北电力科学研究院有限责任公司 一种电力系统的谐波状态估计方法及设备
CN107943641A (zh) * 2017-11-16 2018-04-20 郑州云海信息技术有限公司 一种生成多端口s参数文档的方法及装置
US10938490B1 (en) * 2018-10-31 2021-03-02 Christos Tsironis Calibration method for coupler-tuner assembly
CN116245065A (zh) * 2022-12-14 2023-06-09 中国南方电网有限责任公司 交直流混联系统的阻抗网络建模方法及装置
CN119558248B (zh) * 2025-01-24 2025-04-22 四川大学 计及不同电压等级的风电场谐波不稳定灵敏度计算方法、系统

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US5025402A (en) 1989-04-07 1991-06-18 Northern Telecom Limited Method of transient simulation of transmission line networks using a circuit simulator
US4962359A (en) * 1989-06-29 1990-10-09 Hewlett-Packard Company Dual directional bridge and balun used as reflectometer test set
US5434511A (en) 1993-05-24 1995-07-18 Atn Microwave, Inc. Electronic microwave calibration device
US5467021A (en) 1993-05-24 1995-11-14 Atn Microwave, Inc. Calibration method and apparatus
US5793213A (en) 1996-08-01 1998-08-11 Motorola, Inc. Method and apparatus for calibrating a network analyzer
US6106563A (en) * 1997-09-26 2000-08-22 Motorola, Inc. Method and apparatus for extracting parameters for an electrical structure
US6347382B1 (en) * 1998-11-30 2002-02-12 Advantest Corp. Multi-port device analysis apparatus and method
US6292070B1 (en) * 1999-03-11 2001-09-18 Anaren Microwave, Inc. Balun formed from symmetrical couplers and method for making same
US20020003455A1 (en) * 2000-03-30 2002-01-10 Gerd Vandersteen Broadband high frequency differential coupler
EP1320763A4 (en) 2000-09-18 2005-07-27 Agilent Technologies Inc METHOD AND APPARATUS FOR CHARACTERIZING ASYMMETRIC OR SYMMETRIC MULTITERMINAL DEVICES
US6483415B1 (en) * 2001-05-21 2002-11-19 Industrial Technology Research Institute Multi-layer LC resonance balun
TW535322B (en) * 2001-06-27 2003-06-01 Ind Tech Res Inst Multi-layer radio frequency chip balun
US6665628B2 (en) * 2002-01-15 2003-12-16 Anritsu Company Methods for embedding and de-embedding balanced networks
US6744262B2 (en) 2002-03-14 2004-06-01 Agilent Technologies, Inc. Method, apparatus, and article of manufacture for characterizing a device and predicting electrical behavior of the device in a circuit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007207168A (ja) * 2006-02-06 2007-08-16 Nec Electronics Corp Ｅｍｉシミュレーションモデル、ｅｍｉシミュレーションシステムと方法
WO2010016200A1 (ja) * 2008-08-08 2010-02-11 日本電気株式会社 差動型トランスインピーダンスアンプの評価方法、光受信回路評価方法、そのプログラムが格納された記憶媒体および装置

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Publication number Publication date
US20030200039A1 (en) 2003-10-23
DE10318202A1 (de) 2003-11-06
US6757625B2 (en) 2004-06-29

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