JP2004006927A5 - - Google Patents

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Publication number
JP2004006927A5
JP2004006927A5 JP2003188072A JP2003188072A JP2004006927A5 JP 2004006927 A5 JP2004006927 A5 JP 2004006927A5 JP 2003188072 A JP2003188072 A JP 2003188072A JP 2003188072 A JP2003188072 A JP 2003188072A JP 2004006927 A5 JP2004006927 A5 JP 2004006927A5
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JP
Japan
Prior art keywords
pad
solder
solder bump
height
wiring board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003188072A
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Japanese (ja)
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JP2004006927A (en
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Publication date
Application filed filed Critical
Priority to JP2003188072A priority Critical patent/JP2004006927A/en
Priority claimed from JP2003188072A external-priority patent/JP2004006927A/en
Publication of JP2004006927A publication Critical patent/JP2004006927A/en
Publication of JP2004006927A5 publication Critical patent/JP2004006927A5/ja
Pending legal-status Critical Current

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Description

【0016】
【課題を解決するための手段】
請求項1の発明は、 配線基板のパッドの径が150μm以下で、かつ該パッド上に形成された半田バンプの高さが平均値で70μm以下で、その高さのバラツキが該平均値の±20%の範囲内であることを特徴とする。
本発明では、配線基板のパッドの径が150μm以下で、半田バンプの高さが平均値で70μm以下と小さい半田バンプの場合でも、その高さのバラツキが平均値の±20%の範囲内と少ないので、例えばフリップチップとの接合性が高くなる。
請求項2の発明は、前記パッドが、同一高さの半田バンプを形成するのに異なる量の半田を要するパッドが混在しているパッド群であることを特徴とする。
配線基板のパッドが、同一高さの半田バンプを形成するのに異なる量の半田を要するパッドが混在しているパッド群(例えば図9(a)に示す様な、パッドの形状又はサイズ(径等)が異なるパッドが混在するパッド群)であることを特徴とする場合には、フリップチップ等との接合性が悪化しがちであるが、高さバラツキが少ないので、良好な接合性を得ることができる。
請求項3の発明は、前記パッドが、ビア部パッド及び非ビア部パッドであることを特徴とする([0086]参照)。
尚、前記配線基板の製造に用いることができる半田バンプ形成用メタルマスクについて簡単に説明する。
半田バンプを形成するために、配線基板に対して半田ペーストを印刷する際に用いられるメタルマスクとして、形成する半田バンプに対応したパターン穴の縦断面形状が、開口端の径より中央部の径が大きい略樽形状のものを用いることができる。
[0016]
[Means for Solving the Problems]
According to the first aspect of the present invention, the diameter of the pad of the wiring substrate is 150 μm or less, and the height of the solder bump formed on the pad is 70 μm or less in average value, and the variation of the height is ±± of the average value. It is characterized by being in the range of 20%.
In the present invention, even in the case of a solder bump in which the diameter of the pad of the wiring substrate is 150 μm or less and the height of the solder bumps is as small as 70 μm in average, the height variation is within ± 20% of the average value. As the amount is small, for example, the bondability with the flip chip is enhanced.
The invention according to claim 2 is characterized in that the pad is a pad group in which pads requiring different amounts of solder to form solder bumps of the same height are mixed.
A pad group in which pads on the wiring substrate require different amounts of solder to form solder bumps of the same height (for example, the shape or size (diameter of the pad as shown in FIG. 9A) In the case of a pad group in which pads different from each other are mixed) , the bonding property to a flip chip or the like tends to deteriorate, but since the height variation is small, good bonding property can be obtained. be able to.
The invention of claim 3 is characterized in that the pad is a via pad and a non-via pad (see [0086]).
A metal mask for solder bump formation that can be used for manufacturing the wiring substrate will be briefly described.
The vertical cross-sectional shape of the pattern hole corresponding to the solder bump to be formed is a diameter of the central portion from the diameter of the opening end as a metal mask used when printing solder paste on the wiring substrate to form the solder bump A substantially barrel-shaped one can be used.

Claims (3)

線基板のパッドの径が150μm以下で、かつ該パッド上に形成された半田バンプの高さが平均値で70μm以下で、その高さのバラツキが該平均値の±20%の範囲内であることを特徴とする半田バンプを有する配線基板。 Diameter of the wiring board pads at 150μm or less, and the height of the solder bump formed on the pad at 70μm or less in average, variation in the height within the range of ± 20% of the mean value A wiring board having a solder bump characterized in that 前記パッドが、同一高さの半田バンプを形成するのに異なる量の半田を要するパッドが混在しているパッド群であることを特徴とする前記請求項1に記載の半田バンプを有する配線基板。The wiring board having a solder bump according to claim 1, wherein the pad is a pad group in which pads requiring different amounts of solder to form solder bumps of the same height are mixed. 前記パッドが、ビア部パッド及び非ビア部パッドであることを特徴とする前記請求項1又は2に記載の半田バンプを有する配線基板。The wiring board having a solder bump according to claim 1, wherein the pad is a via pad and a non-via pad.
JP2003188072A 2003-06-30 2003-06-30 Wiring board with solder bump, method of manufacturing the same, and metal mask for forming solder bump Pending JP2004006927A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003188072A JP2004006927A (en) 2003-06-30 2003-06-30 Wiring board with solder bump, method of manufacturing the same, and metal mask for forming solder bump

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003188072A JP2004006927A (en) 2003-06-30 2003-06-30 Wiring board with solder bump, method of manufacturing the same, and metal mask for forming solder bump

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP11135197A Division JP3462363B2 (en) 1997-04-28 1997-04-28 Method of manufacturing wiring board having solder bumps and metal mask for forming solder bumps

Publications (2)

Publication Number Publication Date
JP2004006927A JP2004006927A (en) 2004-01-08
JP2004006927A5 true JP2004006927A5 (en) 2005-04-14

Family

ID=30438405

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003188072A Pending JP2004006927A (en) 2003-06-30 2003-06-30 Wiring board with solder bump, method of manufacturing the same, and metal mask for forming solder bump

Country Status (1)

Country Link
JP (1) JP2004006927A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7075481B2 (en) * 2018-04-12 2022-05-25 株式会社Fuji Printed circuit board forming method and printed circuit board forming device

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