JP2003511690A5 - - Google Patents

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Publication number
JP2003511690A5
JP2003511690A5 JP2001530545A JP2001530545A JP2003511690A5 JP 2003511690 A5 JP2003511690 A5 JP 2003511690A5 JP 2001530545 A JP2001530545 A JP 2001530545A JP 2001530545 A JP2001530545 A JP 2001530545A JP 2003511690 A5 JP2003511690 A5 JP 2003511690A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001530545A
Other languages
Japanese (ja)
Other versions
JP2003511690A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2000/021978 external-priority patent/WO2001027581A2/en
Publication of JP2003511690A publication Critical patent/JP2003511690A/ja
Publication of JP2003511690A5 publication Critical patent/JP2003511690A5/ja
Pending legal-status Critical Current

Links

JP2001530545A 1999-09-23 2000-09-21 複数の充填及び/又は空きチャンネルと、他の属性とを備える力測定装置 Pending JP2003511690A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
IL132021 1999-09-23
IL13202199 1999-09-23
PCT/US2000/021978 WO2001027581A2 (en) 1999-09-23 2000-09-21 Force sensing devices with multiple filled and/or empty channels and other attributes

Publications (2)

Publication Number Publication Date
JP2003511690A JP2003511690A (ja) 2003-03-25
JP2003511690A5 true JP2003511690A5 (enExample) 2007-11-08

Family

ID=11073270

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001530545A Pending JP2003511690A (ja) 1999-09-23 2000-09-21 複数の充填及び/又は空きチャンネルと、他の属性とを備える力測定装置

Country Status (3)

Country Link
EP (1) EP1218947A4 (enExample)
JP (1) JP2003511690A (enExample)
WO (1) WO2001027581A2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6680617B2 (en) * 2000-09-20 2004-01-20 Neocera, Inc. Apertured probes for localized measurements of a material's complex permittivity and fabrication method
US8601608B2 (en) 2005-03-31 2013-12-03 Japan Science And Technology Agency Cantilever for scanning probe microscope and scanning probe microscope equipped with it
JP6359331B2 (ja) * 2014-05-02 2018-07-18 株式会社中原光電子研究所 プローブ、光モジュール及びプローブの製造方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2608722A (en) * 1950-09-06 1952-09-02 Otmar M Stuetzer Process for making microspacers
EP0185782B1 (en) * 1984-12-28 1989-03-15 International Business Machines Corporation Waveguide for an optical near-field microscope
US5264698A (en) * 1988-07-17 1993-11-23 Raoul Kopelman Nanometer dimension optical device with microimaging and nanoillumination capabilities
US5185922A (en) * 1990-08-17 1993-02-16 Cornell Research Foundation, Inc. Method of making submicrometer microelectrodes
IL113551A0 (en) * 1995-04-30 1995-07-31 Fish Galina Tapered structure suitable for microthermocouples microelectrodes field emission tips and micromagnetic sensors with force sensing capabilities
US5986261A (en) * 1996-04-29 1999-11-16 Nanoptics, Inc. Tapered structure suitable for microthermocouples microelectrodes, field emission tips and micromagnetic sensors with force sensing capabilities

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