WO2001027581A2 - Force sensing devices with multiple filled and/or empty channels and other attributes - Google Patents
Force sensing devices with multiple filled and/or empty channels and other attributes Download PDFInfo
- Publication number
- WO2001027581A2 WO2001027581A2 PCT/US2000/021978 US0021978W WO0127581A2 WO 2001027581 A2 WO2001027581 A2 WO 2001027581A2 US 0021978 W US0021978 W US 0021978W WO 0127581 A2 WO0127581 A2 WO 0127581A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- micro
- channel
- tip
- materials
- force sensing
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L3/00—Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
- B01L3/56—Labware specially adapted for transferring fluids
- B01L3/561—Tubes; Conduits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/02—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples
- G01K7/028—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples using microstructures, e.g. made of silicon
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/02—Multiple-type SPM, i.e. involving more than one SPM techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
- G01Q70/08—Probe characteristics
- G01Q70/10—Shape or taper
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L2300/00—Additional constructional details
- B01L2300/08—Geometry, shape and general structure
- B01L2300/0832—Geometry, shape and general structure cylindrical, tube shaped
- B01L2300/0838—Capillaries
Definitions
- probes that could have multiple attributes such as chemical sensors in one channel with gas in another channel, micro vacuum devices with single channels that could suck up materials and air in a second channel to release such materials, unique nanometric thermocouples, micro voltage, micro capacitance, micro inductive, micromagnetic devices depending on electrical isolation or contact at the tip of electrically conducting materials, microlight detectors if the conductors in the channels are covered with photodetecting materials, microlight sources if the channels of conducting material are coated with electroluminescent materials, multiple channel fountain pens, multiple channel tips for multiple electrochemical and/or optical measurements, micro heating elements, stable micro devices for annealing, soldering, cutting, etc., Peltier microcooling devices, microdynamic cavitation bubble forming devices, generating devices with two isolated electrodes with appropriate electrical inputs, etc.
Landscapes
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Radiology & Medical Imaging (AREA)
- Crystallography & Structural Chemistry (AREA)
- Clinical Laboratory Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Micromachines (AREA)
- Force Measurement Appropriate To Specific Purposes (AREA)
- Measuring Fluid Pressure (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001530545A JP2003511690A (en) | 1999-09-23 | 2000-09-21 | Force measuring device comprising a plurality of filled and / or empty channels and other attributes |
US10/048,980 US6737331B1 (en) | 1999-09-23 | 2000-09-21 | Force sensing devices with multiple filled and/or empty channels and other attributes |
EP00991370A EP1218947A4 (en) | 1999-09-23 | 2000-09-21 | Force sensing devices with multiple filled and/or empty channels and other attributes |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IL132021 | 1999-09-23 | ||
IL13202199 | 1999-09-23 |
Publications (3)
Publication Number | Publication Date |
---|---|
WO2001027581A2 true WO2001027581A2 (en) | 2001-04-19 |
WO2001027581A3 WO2001027581A3 (en) | 2001-11-22 |
WO2001027581A9 WO2001027581A9 (en) | 2002-09-12 |
Family
ID=11073270
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2000/021978 WO2001027581A2 (en) | 1999-09-23 | 2000-09-21 | Force sensing devices with multiple filled and/or empty channels and other attributes |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP1218947A4 (en) |
JP (1) | JP2003511690A (en) |
WO (1) | WO2001027581A2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1408327A2 (en) * | 2002-10-09 | 2004-04-14 | Neocera, Inc. | Apertured probes for localized measurements of a material's complex permittivity and fabrication method |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006106818A1 (en) * | 2005-03-31 | 2006-10-12 | Japan Science And Technology Agency | Cantilever for scanning probe microscope and scanning probe microscope equipped with it |
JP6359331B2 (en) * | 2014-05-02 | 2018-07-18 | 株式会社中原光電子研究所 | Probe, optical module, and probe manufacturing method |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5986261A (en) * | 1996-04-29 | 1999-11-16 | Nanoptics, Inc. | Tapered structure suitable for microthermocouples microelectrodes, field emission tips and micromagnetic sensors with force sensing capabilities |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2608722A (en) * | 1950-09-06 | 1952-09-02 | Otmar M Stuetzer | Process for making microspacers |
EP0185782B1 (en) * | 1984-12-28 | 1989-03-15 | International Business Machines Corporation | Waveguide for an optical near-field microscope |
US5264698A (en) * | 1988-07-17 | 1993-11-23 | Raoul Kopelman | Nanometer dimension optical device with microimaging and nanoillumination capabilities |
US5185922A (en) * | 1990-08-17 | 1993-02-16 | Cornell Research Foundation, Inc. | Method of making submicrometer microelectrodes |
IL113551A0 (en) * | 1995-04-30 | 1995-07-31 | Fish Galina | Tapered structure suitable for microthermocouples microelectrodes field emission tips and micromagnetic sensors with force sensing capabilities |
-
2000
- 2000-09-21 WO PCT/US2000/021978 patent/WO2001027581A2/en active Application Filing
- 2000-09-21 EP EP00991370A patent/EP1218947A4/en not_active Withdrawn
- 2000-09-21 JP JP2001530545A patent/JP2003511690A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5986261A (en) * | 1996-04-29 | 1999-11-16 | Nanoptics, Inc. | Tapered structure suitable for microthermocouples microelectrodes, field emission tips and micromagnetic sensors with force sensing capabilities |
Non-Patent Citations (1)
Title |
---|
See also references of EP1218947A2 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1408327A2 (en) * | 2002-10-09 | 2004-04-14 | Neocera, Inc. | Apertured probes for localized measurements of a material's complex permittivity and fabrication method |
EP1408327A3 (en) * | 2002-10-09 | 2004-04-21 | Neocera, Inc. | Apertured probes for localized measurements of a material's complex permittivity and fabrication method |
Also Published As
Publication number | Publication date |
---|---|
EP1218947A2 (en) | 2002-07-03 |
WO2001027581A9 (en) | 2002-09-12 |
EP1218947A4 (en) | 2007-05-30 |
WO2001027581A3 (en) | 2001-11-22 |
JP2003511690A (en) | 2003-03-25 |
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