JP2003344509A - 集積回路（ｉｃ）をテストする方法 - Google Patents

集積回路（ｉｃ）をテストする方法

Info

Publication number
JP2003344509A
JP2003344509A JP2003098935A JP2003098935A JP2003344509A JP 2003344509 A JP2003344509 A JP 2003344509A JP 2003098935 A JP2003098935 A JP 2003098935A JP 2003098935 A JP2003098935 A JP 2003098935A JP 2003344509 A JP2003344509 A JP 2003344509A
Authority
JP
Japan
Prior art keywords
test
driver
circuit
pad
ate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2003098935A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003344509A5 (enExample
Inventor
Jeffrey R Rearick
ジェフリー・アール・リアリック
John G Rohrbaugh
ジョン・ジー・ローバウフ
Shad Shepston
シャッド・シェプストン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2003344509A publication Critical patent/JP2003344509A/ja
Publication of JP2003344509A5 publication Critical patent/JP2003344509A5/ja
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31715—Testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of input or output driver, receiver, buffer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/022—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in I/O circuitry

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2003098935A 2002-04-18 2003-04-02 集積回路（ｉｃ）をテストする方法 Withdrawn JP2003344509A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/125,338 2002-04-18
US10/125,338 US6762614B2 (en) 2002-04-18 2002-04-18 Systems and methods for facilitating driver strength testing of integrated circuits

Publications (2)

Publication Number Publication Date
JP2003344509A true JP2003344509A (ja) 2003-12-03
JP2003344509A5 JP2003344509A5 (enExample) 2006-04-13

Family

ID=29214776

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003098935A Withdrawn JP2003344509A (ja) 2002-04-18 2003-04-02 集積回路（ｉｃ）をテストする方法

Country Status (4)

Country Link
US (2) US6762614B2 (enExample)
JP (1) JP2003344509A (enExample)
DE (1) DE10304880A1 (enExample)
SG (1) SG115504A1 (enExample)

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US6717429B2 (en) * 2000-06-30 2004-04-06 Texas Instruments Incorporated IC having comparator inputs connected to core circuitry and output pad
US7154260B2 (en) * 2003-02-21 2006-12-26 Semtech Corporation Precision measurement unit having voltage and/or current clamp power down upon setting reversal
US7239170B2 (en) * 2003-07-08 2007-07-03 Lsi Corporation Apparatus and methods for improved input/output cells
JP3901151B2 (ja) * 2003-12-25 2007-04-04 セイコーエプソン株式会社 ドライバｉｃ並びにドライバｉｃ及び出力装置の検査方法
US7002365B2 (en) * 2003-12-30 2006-02-21 Intel Corporation Method and an apparatus for testing transmitter and receiver
WO2005073740A1 (ja) * 2004-01-29 2005-08-11 Advantest Corporation 試験装置及び試験方法
US6963212B2 (en) * 2004-03-23 2005-11-08 Agilent Technologies, Inc. Self-testing input/output pad
US7574634B2 (en) * 2004-06-21 2009-08-11 Micron Technology, Inc. Real time testing using on die termination (ODT) circuit
DE102004034606B4 (de) * 2004-07-16 2012-03-29 Infineon Technologies Ag Schaltungsanordnung aus einer elektronischen Testschaltung für einen zu testenden Transceiver und aus dem zu testenden Transceiver sowie Verfahren zum Prüfen eines Transceivers
US7323897B2 (en) * 2004-12-16 2008-01-29 Verigy (Singapore) Pte. Ltd. Mock wafer, system calibrated using mock wafer, and method for calibrating automated test equipment
US7342447B2 (en) * 2005-05-09 2008-03-11 Texas Instruments Incorporated Systems and methods for driving an output transistor
US20070124628A1 (en) * 2005-11-30 2007-05-31 Lsi Logic Corporation Methods of memory bitmap verification for finished product
US7881430B2 (en) * 2006-07-28 2011-02-01 General Electric Company Automatic bus management
US7541825B2 (en) * 2006-09-28 2009-06-02 Micron Technology, Inc. Isolation circuit
US7411407B2 (en) * 2006-10-13 2008-08-12 Agilent Technologies, Inc. Testing target resistances in circuit assemblies
US9391794B2 (en) * 2007-05-01 2016-07-12 Mentor Graphics Corporation Generating worst case test sequences for non-linearly driven channels
US7836372B2 (en) 2007-06-08 2010-11-16 Apple Inc. Memory controller with loopback test interface
US7629849B1 (en) * 2008-06-02 2009-12-08 Mediatek Singapore Pte Ltd. Driving amplifier circuit with digital control
IT1392071B1 (it) * 2008-11-27 2012-02-09 St Microelectronics Srl Metodo per eseguire un testing elettrico di dispositivi elettronici
US8111564B2 (en) * 2009-01-29 2012-02-07 International Business Machines Corporation Setting controller termination in a memory controller and memory device interface in a communication bus
US7990768B2 (en) * 2009-01-29 2011-08-02 International Business Machines Corporation Setting memory controller driver to memory device termination value in a communication bus
US7848175B2 (en) * 2009-01-29 2010-12-07 International Business Machines Corporation Calibration of memory driver with offset in a memory controller and memory device interface in a communication bus
US7978538B2 (en) * 2009-01-29 2011-07-12 International Business Machines Corporation Setting memory device termination in a memory device and memory controller interface in a communication bus
US8102724B2 (en) * 2009-01-29 2012-01-24 International Business Machines Corporation Setting controller VREF in a memory controller and memory device interface in a communication bus
US7974141B2 (en) * 2009-01-29 2011-07-05 International Business Machines Corporation Setting memory device VREF in a memory controller and memory device interface in a communication bus
US20110140708A1 (en) * 2009-12-11 2011-06-16 William Henry Lueckenbach System, method, and apparatus for providing redundant power control using a digital output module
US8681571B2 (en) 2010-06-15 2014-03-25 International Business Machines Corporation Training a memory controller and a memory device using multiple read and write operations
US8289784B2 (en) 2010-06-15 2012-10-16 International Business Machines Corporation Setting a reference voltage in a memory controller trained to a memory device
KR20150026288A (ko) * 2013-09-02 2015-03-11 에스케이하이닉스 주식회사 반도체 장치 및 테스트 방법
DE102014113321B4 (de) * 2014-09-16 2023-06-01 Infineon Technologies Ag Chip und Verfahren zum Testen eines Chips
JP6438353B2 (ja) * 2015-05-27 2018-12-12 ルネサスエレクトロニクス株式会社 半導体装置及び診断テスト方法
US10319453B2 (en) * 2017-03-16 2019-06-11 Intel Corporation Board level leakage testing for memory interface
US11450378B2 (en) * 2020-09-29 2022-09-20 Micron Technology, Inc. Apparatuses and methods of power supply control for threshold voltage compensated sense amplifiers

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Publication number Priority date Publication date Assignee Title
US5117129A (en) * 1990-10-16 1992-05-26 International Business Machines Corporation Cmos off chip driver for fault tolerant cold sparing
US5504432A (en) * 1993-08-31 1996-04-02 Hewlett-Packard Company System and method for detecting short, opens and connected pins on a printed circuit board using automatic test equipment
US5682392A (en) * 1994-09-28 1997-10-28 Teradyne, Inc. Method and apparatus for the automatic generation of boundary scan description language files
US5796260A (en) * 1996-03-12 1998-08-18 Honeywell Inc. Parametric test circuit
DE19713748A1 (de) * 1997-04-04 1998-10-08 Omicron Electronics Gmbh Verfahren und Vorrichtung zur Prüfung von Differentialschutzrelais/-systemen
US6275962B1 (en) * 1998-10-23 2001-08-14 Teradyne, Inc. Remote test module for automatic test equipment
US6324485B1 (en) * 1999-01-26 2001-11-27 Newmillennia Solutions, Inc. Application specific automated test equipment system for testing integrated circuit devices in a native environment
US6448865B1 (en) * 1999-02-25 2002-09-10 Formfactor, Inc. Integrated circuit interconnect system
US6397361B1 (en) * 1999-04-02 2002-05-28 International Business Machines Corporation Reduced-pin integrated circuit I/O test
US6365859B1 (en) * 2000-06-28 2002-04-02 Advanced Micro Devices Processor IC performance metric
US6556938B1 (en) * 2000-08-29 2003-04-29 Agilent Technologies, Inc. Systems and methods for facilitating automated test equipment functionality within integrated circuits
US6577980B1 (en) * 2000-11-28 2003-06-10 Agilent Technologies, Inc. Systems and methods for facilitating testing of pad receivers of integrated circuits
US6658613B2 (en) * 2001-03-21 2003-12-02 Agilent Technologies, Inc. Systems and methods for facilitating testing of pad receivers of integrated circuits

Also Published As

Publication number Publication date
DE10304880A1 (de) 2003-11-06
US6859059B2 (en) 2005-02-22
US20040130344A1 (en) 2004-07-08
SG115504A1 (en) 2005-10-28
US20030197520A1 (en) 2003-10-23
US6762614B2 (en) 2004-07-13

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