JP2003289103A - Semiconductor device and semiconductor-mounting apparatus - Google Patents

Semiconductor device and semiconductor-mounting apparatus

Info

Publication number
JP2003289103A
JP2003289103A JP2002091513A JP2002091513A JP2003289103A JP 2003289103 A JP2003289103 A JP 2003289103A JP 2002091513 A JP2002091513 A JP 2002091513A JP 2002091513 A JP2002091513 A JP 2002091513A JP 2003289103 A JP2003289103 A JP 2003289103A
Authority
JP
Japan
Prior art keywords
output
power supply
transistor
supplied
power source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002091513A
Other languages
Japanese (ja)
Inventor
Yoshiyuki Shimizu
禎之 清水
Masaki Tsukide
正樹 築出
Takafumi Takatsuka
挙文 高塚
Hirotoshi Sato
広利 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2002091513A priority Critical patent/JP2003289103A/en
Priority to US10/252,679 priority patent/US20030183926A1/en
Publication of JP2003289103A publication Critical patent/JP2003289103A/en
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/50Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor for integrated circuit devices, e.g. power bus, number of leads
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/065Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
    • H01L25/0655Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00 the devices being arranged next to each other
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0008Arrangements for reducing power consumption
    • H03K19/0016Arrangements for reducing power consumption by using a control or a clock signal, e.g. in order to apply power supply
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3011Impedance

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Logic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Dram (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Electronic Switches (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To solve the problem wherein through-currents from another chip tend to flow to an output circuit, even at turning off of the power source of a chip itself at the mounting of a plurality semiconductor chips on the same package, and sharing the power source of the output circuits of these chips. <P>SOLUTION: The semiconductor device is added with a circuit for turning off a transistor configuring the output circuit of each semiconductor chip, for setting high impedance at the time of turning off a power source for an inside circuit of each semiconductor chip. This circuit can be realized by a using only simple device, such as an inverter. <P>COPYRIGHT: (C)2004,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】この発明は、複数の半導体チ
ップが同一パッケージ内に搭載されるデバイスに関する
ものであり、特に電源をOFF時にしたチップの出力回
路で貫通電流を流さないようにした半導体集積回路に関
するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a device in which a plurality of semiconductor chips are mounted in the same package, and in particular, a semiconductor integrated device in which an output circuit of the chip when the power is turned off does not pass a through current. It is about circuits.

【0002】[0002]

【従来の技術】内部用の電源と出力用の電源を持つデバ
イスの場合、チップを使用しない時は、内部用の電源と
出力用の電源の双方をOFFしており、片方のみをOF
Fすることはない。しかし、図1に示すように、複数
(図1では2個)の半導体チップA、Bが同一パッケージ
内に搭載されるデバイスで、各チップに個別の内部用電
源VDD1、VDD2を持ち、出力用の電源VDDQ1
は両チップで共用する場合、不必要とする一方のチップ
の内部用電源をOFFしても、出力用の電源は他のチッ
プと共有しているので、出力用電源VDDQ1はONの
ままになっている。
2. Description of the Related Art In the case of a device having an internal power supply and an output power supply, both the internal power supply and the output power supply are turned off when the chip is not used, and only one of them is OF.
There is no F. However, as shown in FIG.
A device in which (two in FIG. 1) semiconductor chips A and B are mounted in the same package, each chip has individual internal power supplies VDD1 and VDD2, and an output power supply VDDQ1
When shared by both chips, the output power supply VDDQ1 remains ON because the output power supply is shared with other chips even if the unnecessary internal power supply for one chip is turned off. ing.

【0003】[0003]

【発明が解決しようとする課題】この場合、出力回路に
は電源が印加されたままなので、その出力回路には、O
N状態となっている他のチップの出力電流が貫通電流と
して流れ、誤動作の原因となった。
In this case, since power is still applied to the output circuit, the output circuit is
The output current of the other chip in the N state flows as a through current, causing a malfunction.

【0004】この発明は、上記のような課題を解消する
ためになされたもので、電源をOFFしたチップの出力
回路で貫通電流が流れないようにすることを目的とす
る。
The present invention has been made to solve the above problems, and an object thereof is to prevent a through current from flowing in an output circuit of a chip whose power is turned off.

【0005】[0005]

【課題を解決するための手段】請求項1の発明である半
導体装置は、第1の電源が供給される内部回路と、前記
第1の電源と独立した第2の電源が供給され、前記内部
回路の出力信号に応じてデータを外部へ出力する出力ト
ランジスタを含み、前記第1の電源の供給が停止し、か
つ、第2の電源が供給されるとき、前記出力トランジス
タをOFF状態とする出力回路とを備えることを特徴と
する。
According to another aspect of the present invention, there is provided a semiconductor device comprising: an internal circuit to which a first power source is supplied; and a second power source independent of the first power source. An output that includes an output transistor that outputs data to the outside according to an output signal of the circuit, and that turns off the output transistor when the supply of the first power supply is stopped and the second power supply is supplied. And a circuit.

【0006】請求項2の発明は、上記出力回路が、上記
出力トランジスタを構成するトランジスタがP型MOS
トランジスタの場合、上記第2の電源と同電位が前記P
型MOSトランジスタのゲート電極に与えられ、上記出
力トランジスタを構成するトランジスタがN型トランジ
スタの場合、接地電位が上記N型MOSトランジスタの
ゲート電極に与えられる。
According to a second aspect of the present invention, in the output circuit, the transistor forming the output transistor is a P-type MOS.
In the case of a transistor, the same potential as that of the second power source is P
When the transistor forming the output transistor is an N-type transistor, the ground potential is applied to the gate electrode of the N-type MOS transistor.

【0007】請求項3の発明の発明である半導体実装装
置は、第1の電源が供給される内部回路と、前記第1の
電源と独立した第2の電源が供給され、前記内部回路の
出力信号に応じてデータを外部へ出力する出力トランジ
スタを含み、前記第1の電源の供給が停止し、かつ、第
2の電源が供給されるとき、前記出力トランジスタをO
FF状態とする出力回路とを備える第1と第2の半導体
装置が実装され、前記第1の半導体装置の第1の電源が
第1の外部電源から供給され、前記第2の半導体装置の
第1の電源が第2の外部電源から供給され、前記第1お
よび第2の半導体装置の第2の電源が第3の外部電源か
ら供給されることを特徴とする。
According to a third aspect of the present invention, there is provided a semiconductor mounting device, wherein an internal circuit to which a first power source is supplied and a second power source independent of the first power source are supplied, and the output of the internal circuit is output. An output transistor for outputting data to the outside in response to a signal is included, and when the supply of the first power supply is stopped and the second power supply is supplied, the output transistor is turned on.
First and second semiconductor devices each including an output circuit for setting an FF state are mounted, a first power source of the first semiconductor device is supplied from a first external power source, and a second power source of the second semiconductor device is supplied. The first power source is supplied from a second external power source, and the second power sources of the first and second semiconductor devices are supplied from a third external power source.

【0008】請求項4の発明は、第1と第2の金導体装
置が、同一パッケージ内に実装され、前記第1と第2の
半導体装置に第2の電源を供給するパッケージのピンが
共通である。
According to a fourth aspect of the present invention, the first and second gold conductor devices are mounted in the same package, and the pins of the package for supplying the second power source to the first and second semiconductor devices are common. Is.

【0009】[0009]

【発明の実施の形態】実施形態1 図2にこの発明が適用されるパッケージP1の外観を示
し、内部に2つの半導体チップA、Bが搭載されてい
る。内部構成は図1と同じである。又、図3にチップA
の回路構成を示し、ロジックデバイスであるインバータ
INV11などが追加されている。チップBについてもこれ
と同一の回路構成を持つ。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS First Embodiment FIG. 2 shows the appearance of a package P1 to which the present invention is applied, in which two semiconductor chips A and B are mounted. The internal configuration is the same as in FIG. Moreover, in FIG.
The circuit configuration of the inverter is a logic device
INV11 etc. have been added. The chip B also has the same circuit configuration as this.

【0010】例えばチップAはフラッシュメモリで、チ
ップBは、疑似SRAM(DRAM構成をなすが内部で
リフレッシュを行うためSRAMとして用いることが可
能なもの)であり、消費電流の削減のため、不要なチッ
プをOFFにすることが多用される。
For example, the chip A is a flash memory and the chip B is a pseudo SRAM (which has a DRAM structure but can be used as an SRAM for refreshing internally), and is unnecessary for reducing current consumption. It is often used to turn off the tip.

【0011】このパッケージP1には、チップAの内部
用電源VDD1に接続するためのピンP_VDD1と、チップ
Bの内部用電源VDD2に接続するためのピンP_VDD2
、および両チップA、Bで共用の出力用(入出力用)電
源VDDQ1に接続するための共用のピンP_VDDQ1、お
よび、両チップA、Bで共用のデータ入出力ピンP_DQ1
を備える。
The package P1 has a pin P_VDD1 for connecting to the internal power supply VDD1 of the chip A and a pin P_VDD2 for connecting to the internal power supply VDD2 of the chip B.
, And a shared pin P_VDDQ1 for connecting to the output (input / output) power supply VDDQ1 shared by both chips A and B, and a data input / output pin P_DQ1 shared by both chips A and B.
Equipped with.

【0012】尚、各チップA、Bの出力回路にそれぞれ
専用の電源ピン(図1のようにP_VDDQ1およびP_VDDQ2)を
備え、パッケージ外部で両ピンを相互接続してもよい。
また、データ入出力ピンはチップ毎に個別に備えてもよ
い。更に前記データ入出力ピンは、専用のデータ出力ピ
ンであってもよい。
The output circuits of the chips A and B may be provided with dedicated power supply pins (P_VDDQ1 and P_VDDQ2 as shown in FIG. 1), and both pins may be connected to each other outside the package.
Further, the data input / output pin may be individually provided for each chip. Further, the data input / output pin may be a dedicated data output pin.

【0013】図3の回路構成において、内部回路1は内
部用電源VDD1より給電され、出力回路を構成するト
ランジスタQ11、Q12、Q13およびインバータIN
V11は出力用電源VDDQ1より給電され、チップBの
出力回路もこの出力用電源VDDQ1より給電される。
In the circuit configuration of FIG. 3, the internal circuit 1 is supplied with power from the internal power supply VDD1 and the transistors Q11, Q12, Q13 and the inverter IN which form the output circuit.
V11 is supplied with power from the output power supply VDDQ1, and the output circuit of the chip B is also supplied with power from this output power supply VDDQ1.

【0014】この出力回路部の動作を以下に説明する。
チップAを休止させるために、チップA用の内部電源V
DD1のみをOFFした場合、所定の時間後には、チッ
プAの内部回路1のノードは、電荷が抜け、すべてGN
D電位となり、図示したノード N11、N12、N14もGND
電位となり、トランジスタQ12はOFFとなる。イン
バータ INV11は給電されているため、このインバータ I
NV11より“H”(つまり電源VDDQ1と同電位)が出力
される。その“H”がトランジスタQ11のゲートに供
給されるためトランジスタQ11もOFFとなる。
The operation of this output circuit section will be described below.
In order to suspend the chip A, the internal power supply V for the chip A
When only DD1 is turned off, after a predetermined time, the electric charge is removed from the node of the internal circuit 1 of chip A and
The potential becomes D, and the illustrated nodes N11, N12, and N14 are also GND.
The potential is applied, and the transistor Q12 is turned off. Since the inverter INV11 is powered, this inverter I
"H" (that is, the same potential as the power supply VDDQ1) is output from NV11. Since the "H" is supplied to the gate of the transistor Q11, the transistor Q11 is also turned off.

【0015】トランジスタQ11がNチャンネルであれ
ば、内部回路1の電源OFF時に、インバータ INV11よ
り“L”(つまりGND電位)が出力されるようにする。
If the transistor Q11 is the N channel, "L" (that is, the GND potential) is output from the inverter INV11 when the power source of the internal circuit 1 is turned off.

【0016】より正確に言えば、上記トランジスタQ1
1がPチャンネルの場合、(出力用電源電圧−前記トラ
ンジスタのゲート電位)を、そのトランジスタQ11の
閾値以上にし、また、上記トランジスタQ11がNチャ
ンネルの場合、そのトランジスタQ11のゲート電位
を、そのトランジスタQ11の閾値以下にする。
More precisely, the transistor Q1
When 1 is a P-channel, (output power supply voltage-gate potential of the transistor) is equal to or higher than the threshold value of the transistor Q11, and when the transistor Q11 is an N-channel, the gate potential of the transistor Q11 is set to the transistor Q11. It is set to be equal to or less than the threshold value of Q11.

【0017】このように、内部回路1の電源VDD1を
OFFにすると、出力部のトランジスタQ11、Q12
が共にOFFになり、ハイインピーダンス状態となるの
で、出力用電源VDDQ1がON状態であっても、他方
のチップBの出力部に流れる電圧がこのチップAの出力
部に貫通電流として流れることはない。
Thus, when the power supply VDD1 of the internal circuit 1 is turned off, the transistors Q11 and Q12 in the output section are turned on.
Are both turned off and are in a high impedance state. Therefore, even if the output power supply VDDQ1 is on, the voltage flowing to the output part of the other chip B does not flow to the output part of this chip A as a through current. .

【0018】当然、電源VDD1のOFF時、ノード N
11 がトランジスタ Q13の閾値以下、ノード N14 が
トランジスタ Q12の閾値以下、ノード N13 がトラン
ジスタ Q11 の閾値以上であれば、トランジスタQ1
1、Q12、Q13をOFFにできる。
Of course, when the power supply VDD1 is OFF, the node N
If 11 is less than the threshold value of the transistor Q13, node N14 is less than the threshold value of the transistor Q12, and node N13 is more than the threshold value of the transistor Q11, the transistor Q1
1, Q12, Q13 can be turned off.

【0019】実施形態2 3つのチップA、B、Cを搭載するパッケージP2の外
観を図4に示し、その内部構成を図5に示す。P_VDD1、
P_VDD2、P_VDD3は、それぞれチップA、B、C用の内部
電源のためのピンであり、そして、PVDDQ1は、例えばチ
ップAの出力用電源のためのピンであり、PVDDQ2は、例
えばチップBおよびCで共用の出力用電源のためのピン
である。尚、3つのチップA、B、Cの出力回路を一つ
の出力用電源で共有することもできる。
Embodiment 2 FIG. 4 shows the appearance of a package P2 on which the three chips A, B and C are mounted, and FIG. 5 shows the internal structure thereof. P_VDD1,
P_VDD2 and P_VDD3 are pins for the internal power supply for the chips A, B and C, respectively, and PVDDQ1 is a pin for the output power supply of the chip A, and PVDDQ2 is for example the chips B and C. It is a pin for the power supply for output that is shared by. The output circuits of the three chips A, B, and C can be shared by one output power supply.

【0020】このように3個、もしくはより多くのチッ
プを搭載した場合でも、内部回路の電源をOFFにした
チップの出力部のトランジスタをOFFにできるため、
その出力部に貫通電流が流れることはない。
Even when three or more chips are mounted in this way, the transistor in the output section of the chip whose internal circuit is powered off can be turned off.
No through current flows through the output section.

【0021】従来においては、パッケージから各チップ
ごとに出力回路用の電源ピンを取り出していた。このた
めチップごとに出力回路の電源を切ることも可能であ
り、そうすることで、出力回路での貫通電流の問題が解
消できる。しかし各チップ毎に出力回路用の電源ピンが
必要となる。本発明の出力回路を用いることで、例え複
数のチップで出力回路の電源ピンを共通としても、出力
回路での貫通電流の問題が生じない。これによりピン数
を削減できる。
Conventionally, the power supply pin for the output circuit is taken out from the package for each chip. For this reason, it is possible to turn off the power supply of the output circuit for each chip, and by doing so, the problem of shoot-through current in the output circuit can be solved. However, each chip requires a power supply pin for an output circuit. By using the output circuit of the present invention, even if a plurality of chips share the power supply pin of the output circuit, the problem of shoot-through current in the output circuit does not occur. This can reduce the number of pins.

【0022】[0022]

【発明の効果】請求項1の半導体装置の発明は、第1の
電源が供給される内部回路と、別の第2の電源が供給さ
れ、前記内部回路の出力信号に応じてデータを外部へ出
力する出力トランジスタを含み、前記第1の電源の供給
が停止して第2の電源が供給されるとき、前記出力トラ
ンジスタをOFF状態とする出力回路とを備えたので、
第1の電源の供給が停止して第2の電源が供給されると
き、出力トランジスタに貫通電流が流れることを防止で
きる。
According to the invention of a semiconductor device of claim 1, a second power source is supplied from an internal circuit to which a first power source is supplied, and data is output to the outside according to an output signal of the internal circuit. An output circuit that includes an output transistor for outputting, and that turns off the output transistor when the second power source is supplied after the supply of the first power source is stopped.
When the supply of the first power supply is stopped and the second power supply is supplied, it is possible to prevent the through current from flowing through the output transistor.

【0023】請求項2の発明は、上記出力回路が、上記
出力トランジスタを構成するトランジスタがP型MOS
トランジスタの場合、上記第2の電源と同電位を前記P
型MOSトランジスタのゲート電極に与え、上記出力ト
ランジスタを構成するトランジスタがN型トランジスタ
の場合、接地電位を上記N型MOSトランジスタのゲー
ト電極に与えており、この構成により、安定して出力ト
ランジスタをOFF状態にでき、貫通電流をなくすこと
ができる。
According to a second aspect of the present invention, in the output circuit, the transistor forming the output transistor is a P-type MOS.
In the case of a transistor, the same potential as the second power source is applied to the P
When the transistor forming the output transistor is an N-type transistor, the ground potential is supplied to the gate electrode of the N-type MOS transistor. With this configuration, the output transistor is stably turned off. It can be put into a state and a through current can be eliminated.

【0024】請求項3の半導体実装の発明は、第1の電
源が供給される内部回路と、別の第2の電源が供給さ
れ、前記内部回路の出力信号に応じてデータを外部へ出
力する出力トランジスタを含み、前記第1の電源の供給
が停止して第2の電源が供給されるとき、前記出力トラ
ンジスタをOFF状態とする出力回路とを備える第1と
第2の半導体装置を実装し、前記第1の半導体装置の第
1の電源を第1の外部電源から供給し、前記第2の半導
体装置の第1の電源を第2の外部電源から供給し、前記
第1および第2の半導体装置の第2の電源を第3の外部
電源から供給するようにしたので、第1もしくは第2の
半導体装置の第1の電源が供給停止となっても、出力ト
ランジスタに貫通電流が流れることはない。
According to a third aspect of the invention of semiconductor mounting, an internal circuit supplied with a first power supply and a second power supply different from the first power supply are supplied, and data is output to the outside according to an output signal of the internal circuit. Mounting a first and a second semiconductor device including an output transistor, and an output circuit that turns off the output transistor when the supply of the first power is stopped and the second power is supplied. , A first power source of the first semiconductor device is supplied from a first external power source, a first power source of the second semiconductor device is supplied from a second external power source, and the first and second Since the second power source of the semiconductor device is supplied from the third external power source, even if the first power source of the first or second semiconductor device is stopped, a through current flows through the output transistor. There is no.

【0025】請求項4の発明は、第1と第2の金導体装
置を、同一パッケージ内に実装し、前記第1と第2の半
導体装置に第2の電源を供給するパッケージのピンを共
通としており、このようにピンを共通にしても、出力ト
ランジスタに貫通電流が流れることはない。
According to a fourth aspect of the present invention, the first and second gold conductor devices are mounted in the same package, and the pins of the package for supplying the second power source to the first and second semiconductor devices are common. Therefore, even if the pins are shared in this way, a through current does not flow in the output transistor.

【図面の簡単な説明】[Brief description of drawings]

【図1】 半導体集積回路のパッケージ内部の構成を示
した図
FIG. 1 is a diagram showing a configuration inside a package of a semiconductor integrated circuit.

【図2】 本発明の第1の実施形態になる半導体集積回
路のパッケージ外観図
FIG. 2 is an external view of a package of a semiconductor integrated circuit according to the first embodiment of the present invention.

【図3】 図2の半導体集積回路のパッケージ内部の構
成を示した図
FIG. 3 is a diagram showing a configuration inside a package of the semiconductor integrated circuit of FIG.

【図4】 本発明の第2の実施形態になる半導体集積回
路のパッケージ外観図
FIG. 4 is an external view of a package of a semiconductor integrated circuit according to a second embodiment of the present invention.

【図5】 図4の半導体集積回路のパッケージ内部の構
成を示した図
5 is a diagram showing a configuration inside a package of the semiconductor integrated circuit of FIG.

【符号の説明】[Explanation of symbols]

1 内部回路、Q トランジスタ、INV11 インバー
タ、A、B 半導体チップ、VDDQ1 出力用電源、
VDD1、VDD2 内部回路用電源、P パッケージ
1 Internal circuit, Q transistor, INV11 inverter, A, B semiconductor chip, VDDQ1 output power supply,
VDD1, VDD2 Internal circuit power supply, P package

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H03K 19/0175 (72)発明者 高塚 挙文 東京都千代田区丸の内二丁目2番3号 三 菱電機株式会社内 (72)発明者 佐藤 広利 東京都千代田区丸の内二丁目2番3号 三 菱電機株式会社内 Fターム(参考) 5F038 DF17 EZ20 5F064 BB07 BB28 CC12 DD32 DD34 FF07 5J055 AX27 BX16 CX00 DX13 DX14 DX22 DX72 EZ07 GX01 5J056 AA04 BB19 CC00 DD13 DD28 EE11 ─────────────────────────────────────────────────── ─── Continuation of front page (51) Int.Cl. 7 Identification code FI Theme Coat (reference) H03K 19/0175 (72) Inventor Koubun Takatsuka 2-3-3 Marunouchi, Chiyoda-ku, Tokyo Sanryo Electric Co., Ltd. In-house (72) Inventor Hirotoshi Sato 2-3-3 Marunouchi, Chiyoda-ku, Tokyo Sanryo Electric Co., Ltd. F-term (reference) 5F038 DF17 EZ20 5F064 BB07 BB28 CC12 DD32 DD34 FF07 5J055 AX27 BX16 CX00 DX13 DX14 DX22 DX72 EZ07 GX01 5J056 AA04 BB19 CC00 DD13 DD28 EE11

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 第1の電源が供給される内部回路と、 前記第1の電源と独立した第2の電源が供給され、前記
内部回路の出力信号に応じてデータを外部へ出力する出
力トランジスタを含み、前記第1の電源の供給が停止
し、かつ、第2の電源が供給されるとき、前記出力トラ
ンジスタをOFF状態とする出力回路とを備えることを
特徴とする半導体装置。
1. An internal circuit supplied with a first power supply, and an output transistor supplied with a second power supply independent of the first power supply and outputting data to the outside according to an output signal of the internal circuit. And a output circuit for turning off the output transistor when the supply of the first power supply is stopped and the second power supply is supplied.
【請求項2】 上記出力回路は、上記出力トランジスタ
を構成するトランジスタがP型MOSトランジスタの場
合、上記第2の電源と同電位が前記P型MOSトランジ
スタのゲート電極に与えられ、上記出力トランジスタを
構成するトランジスタがN型トランジスタの場合、接地
電位が上記N型MOSトランジスタのゲート電極に与え
られる請求項1記載の半導体装置。
2. In the output circuit, when the transistor forming the output transistor is a P-type MOS transistor, the same potential as that of the second power supply is applied to the gate electrode of the P-type MOS transistor, and the output transistor is 2. The semiconductor device according to claim 1, wherein when the transistor to be formed is an N-type transistor, the ground potential is applied to the gate electrode of the N-type MOS transistor.
【請求項3】 第1の電源が供給される内部回路と、前
記第1の電源と独立した第2の電源が供給され、前記内
部回路の出力信号に応じてデータを外部へ出力する出力
トランジスタを含み、前記第1の電源の供給が停止し、
かつ、第2の電源が供給されるとき、前記出力トランジ
スタをOFF状態とする出力回路とを備える第1と第2
の半導体装置が実装され、 前記第1の半導体装置の第1の電源が第1の外部電源か
ら供給され、 前記第2の半導体装置の第1の電源が第2の外部電源か
ら供給され、 前記第1および第2の半導体装置の第2の電源が第3の
外部電源から供給されることを特徴とする半導体実装装
置。
3. An internal circuit supplied with a first power supply and an output transistor supplied with a second power supply independent of the first power supply and outputting data to the outside according to an output signal of the internal circuit. The supply of the first power supply is stopped,
And first and second output circuits that turn off the output transistor when the second power is supplied.
The semiconductor device is mounted, the first power source of the first semiconductor device is supplied from a first external power source, the first power source of the second semiconductor device is supplied from a second external power source, A semiconductor mounting device, wherein the second power source of the first and second semiconductor devices is supplied from a third external power source.
【請求項4】 第1と第2の金導体装置は、同一パッケ
ージ内に実装され、 前記第1と第2の半導体装置に第2の電源を供給するパ
ッケージのピンが共通である請求項3記載の半導体実装
装置。
4. The first and second gold conductor devices are mounted in the same package, and the pins of the package for supplying the second power source to the first and second semiconductor devices are common. The semiconductor mounting device described.
JP2002091513A 2002-03-28 2002-03-28 Semiconductor device and semiconductor-mounting apparatus Pending JP2003289103A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2002091513A JP2003289103A (en) 2002-03-28 2002-03-28 Semiconductor device and semiconductor-mounting apparatus
US10/252,679 US20030183926A1 (en) 2002-03-28 2002-09-24 Semiconductor device and semiconductor packaging device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002091513A JP2003289103A (en) 2002-03-28 2002-03-28 Semiconductor device and semiconductor-mounting apparatus

Publications (1)

Publication Number Publication Date
JP2003289103A true JP2003289103A (en) 2003-10-10

Family

ID=28449597

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002091513A Pending JP2003289103A (en) 2002-03-28 2002-03-28 Semiconductor device and semiconductor-mounting apparatus

Country Status (2)

Country Link
US (1) US20030183926A1 (en)
JP (1) JP2003289103A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005222581A (en) * 2004-02-03 2005-08-18 Renesas Technology Corp Semiconductor memory device
CN103853220B (en) * 2012-12-05 2016-01-20 艾尔瓦特集成电路科技(天津)有限公司 A kind of feed circuit, electronic equipment and correlation method

Also Published As

Publication number Publication date
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