JP2003257242A - Thick membrane resistor paste - Google Patents

Thick membrane resistor paste

Info

Publication number
JP2003257242A
JP2003257242A JP2002101904A JP2002101904A JP2003257242A JP 2003257242 A JP2003257242 A JP 2003257242A JP 2002101904 A JP2002101904 A JP 2002101904A JP 2002101904 A JP2002101904 A JP 2002101904A JP 2003257242 A JP2003257242 A JP 2003257242A
Authority
JP
Japan
Prior art keywords
thick film
film resistor
resistor paste
glass frit
glass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002101904A
Other languages
Japanese (ja)
Other versions
JP4079669B2 (en
Inventor
Atsushi Nishino
西野  敦
Yasuhiro Shindo
泰宏 進藤
Yasuhiro Sudo
泰博 須藤
Masao Iwasaki
正雄 岩崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kojima Chemicals Co Ltd
Original Assignee
Kojima Chemicals Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kojima Chemicals Co Ltd filed Critical Kojima Chemicals Co Ltd
Priority to JP2002101904A priority Critical patent/JP4079669B2/en
Priority to KR10-2004-7013364A priority patent/KR20040084940A/en
Priority to EP03743065A priority patent/EP1480233A4/en
Priority to AU2003211482A priority patent/AU2003211482A1/en
Priority to PCT/JP2003/002322 priority patent/WO2003073442A1/en
Publication of JP2003257242A publication Critical patent/JP2003257242A/en
Application granted granted Critical
Publication of JP4079669B2 publication Critical patent/JP4079669B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

<P>PROBLEM TO BE SOLVED: To provide a thick membrane resistor paste which is superior in acid resistance by using SiO<SB>2</SB>-Bi<SB>2</SB>O<SB>3</SB>-BaO system non-lead non-alkaline glass having a specific range of bismuth content as a binder glass of the thick membrane resistor paste and in which three layers of the electrode part, resistor part and surface coat part can be fired simultaneously and which can contribute to the earth environment protection. <P>SOLUTION: This is a thick membrane resistor paste made mainly of a conductive powder, glass frit, and an organic vehicle. The glass frit is constituted of a composition in weight ratio of 1% or less alkaline metal, 10-30% Bi<SB>2</SB>O<SB>3</SB>, 25-40% SiO<SB>2</SB>, 30-40% BaO, 5-7% ZnO, 4-7% Al<SB>2</SB>O<SB>3</SB>, and 0.01-8% B<SB>2</SB>O<SB>3</SB>, and does not contain PbO. <P>COPYRIGHT: (C)2003,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、スクリーン印刷技
術によりセラミック基板上へ所定のパターンを印刷、焼
成し、印刷型厚膜抵抗器を得るための厚膜抵抗体ペース
トに関し、特にガラスフリットとして耐酸性に優れ、P
bOを含有しないビスマス系ガラスを使用した厚膜抵抗
体ペーストに関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thick film resistor paste for obtaining a printing type thick film resistor by printing and firing a predetermined pattern on a ceramic substrate by a screen printing technique, and particularly as an acid resistant glass frit. Excellent in P
The present invention relates to a thick film resistor paste using bismuth-based glass that does not contain bO.

【0002】[0002]

【従来の技術】通常使用されている厚膜抵抗体ペースト
は、RuO、パイロクロア型ルテニウム酸鉛(Pb
Ru7−x)等の導電性微粉末とガラスフリットを
有機質ビヒクルと混合し、3本ロールミルで混練して調
製されている。このパイロクロア型ルテニウム酸鉛(P
Ru)をRuOと併用するのは、パイロク
ロア型ルテニウム酸鉛はRuOに比べて抵抗温度係数
(TCR)が小さくRuOを単独で少量使用した場
合、抵抗値が不安定になるのを安定化する役目をなすも
のである。これら従来の厚膜抵抗体ペーストのバインダ
ーガラスの役目をなすガラスフリットとしては、ルテニ
ウム酸鉛との相溶性が良好でガラスの融点を下げる効果
が極めて大きいPbOを大量に含有したホウケイ酸鉛系
ガラスが主に使用されている。 上記のホウケイ酸鉛
系ガラスは、低融点ガラスで耐酸性など耐薬品性にも優
れている利点を有している。
2. Description of the Related Art Thick film resistor pastes that are commonly used are RuO 2 and pyrochlore type lead ruthenate (Pb 2).
It is prepared by mixing conductive fine powder such as Ru 2 O 7-x ) and glass frit with an organic vehicle and kneading with a three-roll mill. This pyrochlore-type lead ruthenate (P
b 2 Ru 2 O 7) and for use with RuO 2 is pyrochlore lead ruthenate When using a small amount of temperature coefficient of resistance (TCR) is smaller RuO 2 as compared to the RuO 2 alone, the resistance value is unstable It serves to stabilize the process of becoming. As a glass frit which serves as a binder glass of these conventional thick film resistor pastes, lead borosilicate glass containing a large amount of PbO, which has a good compatibility with lead ruthenate and has an extremely large effect of lowering the melting point of the glass. Is mainly used. The lead borosilicate glass is a low-melting glass and has the advantage of excellent chemical resistance such as acid resistance.

【0003】[0003]

【発明が解決しようとする課題】現在、地球環境保全が
叫ばれ、省エネで、持続可能な経済発展が掲げられる
中、エレクトロニクス分野にも着実に改善対策が要求さ
れる段階に入ってきた。電子部品である印刷型厚膜抵抗
器は電子機器の使用部品の中で、量的には大きな比重を
占めている。その印刷型厚膜抵抗器の抵抗体材料に厚膜
抵抗体ペーストが用いられており、その殆どのペースト
にPbOを大量に含有したホウケイ酸鉛系ガラスフリッ
トが使用されている。一方、最近、地球環境保全の面よ
り鉛フリーの材料や電子部品が望まれており、印刷型厚
膜抵抗器に使用する厚膜抵抗体ペーストについてもPb
Oを含まないガラスフリットを採用するが要望されるよ
うになった。PbOを含まないガラスフリットとして例
えば、ホウケイ酸ビスマス系ガラス、ホウケイ酸亜鉛系
ガラス及びホウ酸塩系ガラス等な知られており、これら
の鉛フリーガラスフリットの使用も既に試みられている
が、耐酸性試験において満足されるものが得られていな
かった。
Nowadays, as the protection of the global environment is being emphasized, energy saving and sustainable economic development are being promoted, the electronics field has reached a stage where steady improvement measures are required. The printed type thick film resistor, which is an electronic component, occupies a large specific weight quantitatively among the components used in electronic devices. The thick film resistor paste is used as the resistor material of the printing type thick film resistor, and lead borosilicate glass frit containing a large amount of PbO is used for most of the paste. On the other hand, recently, lead-free materials and electronic parts have been desired from the viewpoint of global environment protection, and Pb is also used for thick film resistor pastes used for printing type thick film resistors.
There has been a demand for adopting a glass frit that does not contain O. As the glass frit containing no PbO, for example, bismuth borosilicate type glass, zinc borosilicate type glass, borate type glass and the like are known, and the use of these lead-free glass frit has been tried, but the acid resistance Satisfaction was not obtained in the sex test.

【0004】また、他方では印刷型厚膜抵抗器の構成
で、電極形成、抵抗形成及び保護ガラス膜形成のそれぞ
れに対し印刷、乾燥及び焼成をおこなうため、工程数が
多く省エネと低コスト化の観点からも問題点を有してい
た。そのため、厚膜抵抗体ペーストを使用した電極形
成、抵抗形成及び保護ガラス膜形成の同時焼成法も試み
られているが、従来の厚膜抵抗体ペーストを使用した同
時焼成法では、特に焼成工程において電極部と抵抗体部
の接続部において亀裂等が生じ、品質上の問題点を有し
ていた。本発明は上記従来の問題点を解決するもので、
厚膜抵抗体ペーストのバインダーガラスとしてPbOを
含まず耐酸性に優れたものを使用し、電極部、抵抗体部
及びプリコートガラス部の3層を一度に同時焼成を行な
うことのできる地球環境にも貢献できる厚膜抵抗体ペー
ストを提供することを目的とするものである。
On the other hand, in the structure of the printing type thick film resistor, printing, drying and firing are performed for each of the electrode formation, the resistance formation and the protective glass film formation, so that the number of steps is large and energy saving and cost reduction are achieved. There was also a problem from the viewpoint. Therefore, the simultaneous firing method of electrode formation using a thick film resistor paste, resistance formation and protective glass film formation has also been attempted, but in the conventional simultaneous firing method using a thick film resistor paste, especially in the firing step. A crack or the like is generated at the connecting portion between the electrode portion and the resistor portion, which causes a problem in quality. The present invention solves the above-mentioned conventional problems,
The binder glass of the thick film resistor paste, which does not contain PbO and has excellent acid resistance, is used in the global environment in which three layers of the electrode part, the resistor part and the precoat glass part can be simultaneously fired. It is an object of the present invention to provide a thick film resistor paste that can contribute.

【0005】[0005]

【課題を解決するための手段】本発明者らは上記目的を
達成するために、種々研究を重ねた結果、厚膜抵抗体ペ
ーストのバインダーガラスとしてビスマスの含有量を特
定の範囲としたSiO2−Bi−Ba系無鉛無アルカリ
ガラスを用いることによって耐酸性に優れ、電極部と抵
抗体部及び表面コート部を同時焼成することが可能とな
ることを知見して本発明に到達した。すなわち、本発明
は、(1)導電性性粉末、ガラスフリット及び有機ビヒ
クルを主成分とする厚膜抵抗体ペーストであって、前記
ガラスフリットは重量比率で、アルカリ金属 1%以
下、Bi 10〜30%、SiO 25〜40
%、BaO 30〜40%、ZnO 5〜7%、Al
4〜7%、B 0.01〜8%の組成で構成
されPbOを含有しないことを特徴とする厚膜抵抗体ペ
ースト、(2)導電性粉末がRuO及びBiRu
7−xである請求項1記載の厚膜抵抗体ペースト、
(3)導電性粉末がRuO、BiRu7−x
少なくとも1種及びRu(OH)、SrRuO、B
aRuO、CaRuO、LiRuO、BiIr
、Bi1.5In0.5u2、NdBiR
O7、BiInRuから選ばれた1種乃至2
種以上である請求項1記載の厚膜抵抗体ペースト、
(4)ガラスフリットの軟化点が700〜900℃であ
る請求項1記載の厚膜抵抗体ペースト、に関するもので
ある。
Means for Solving the Problems The present inventors have conducted various studies in order to achieve the above-mentioned object, and as a result, as a binder glass of a thick film resistor paste, the content of bismuth within a specific range of SiO2- The present inventors have found that the use of a Bi-Ba-based lead-free and alkali-free glass is excellent in acid resistance, and that the electrode part, the resistor part, and the surface coat part can be co-fired, and the present invention has been reached. That is, the present invention provides (1) a thick film resistor paste containing conductive powder, glass frit and an organic vehicle as main components, the glass frit being 1% by weight or less of alkali metal and Bi 2 O. 3 10-30%, SiO 2 25-40
%, BaO 30-40%, ZnO 5-7%, Al 2
A thick film resistor paste, characterized in that it is composed of O 3 4 to 7% and B 2 O 3 0.01 to 8% and does not contain PbO, (2) the conductive powder is RuO 2 and Bi 2 Ru. Two
The thick film resistor paste according to claim 1, which is O 7-x .
(3) The conductive powder is RuO 2 , at least one of Bi 2 Ru 2 O 7-x , Ru (OH) 4 , SrRuO 3 , and B.
aRuO 3 , CaRuO 3 , LiRuO 3 , Bi 2 Ir
2 O 7 , Bi 1.5 In 0.5 R u2 O 7 , NdBiR
1 to 2 selected from u 2 O 7 and BiInRu 2 O 7
2. The thick film resistor paste according to claim 1, which is more than one kind.
(4) The thick film resistor paste according to claim 1, wherein the softening point of the glass frit is 700 to 900 ° C.

【0006】[0006]

【発明の実施の形態】以下、本発明の実施の形態につい
て説明する。本発明において使用する導電性粉末とは、
例えば、RuO、Ru(OH)、SrRuO、B
aRuO、CaRuO、LiRuO、BiRu
7−x、BiIr、Bi1.5In0.5
Ru、NdBiRuO7及びBiInRu
等が挙げられる。この導電性粉末とガラスフリットと
の比率は要求される抵抗体の抵抗値によって決められ
る。即ち、高抵抗値が要求される場合は導電性粉末の量
を少なくし、低抵抗値が要求される場合はその量を多く
する。しかし、5重量%に達しない場合は生成した抵抗
体膜の抵抗値はほぼ絶縁体となり、また70重量%を越
えると抵抗値が低くなりすぎ、抵抗体としての機能を果
たさなくなるので好ましくない。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described below. The conductive powder used in the present invention,
For example, RuO 2 , Ru (OH) 4 , SrRuO 3 , B
aRuO 3 , CaRuO 3 , LiRuO 3 , Bi 2 Ru
2 O 7-x , Bi 2 Ir 2 O 7 , Bi 1.5 In 0.5
Ru 2 O 7 , NdBiRu 2 O 7 and BiInRu 2 O
7 etc. are mentioned. The ratio between the conductive powder and the glass frit is determined by the required resistance value of the resistor. That is, when a high resistance value is required, the amount of conductive powder is reduced, and when a low resistance value is required, the amount is increased. However, if it does not reach 5% by weight, the resistance value of the produced resistor film becomes almost an insulator, and if it exceeds 70% by weight, the resistance value becomes too low, and the function as the resistor is not achieved.

【0007】本発明で使用するガラスフリットとは、S
iO2−Bi−Ba系無鉛無アルカリガラスであり、前
記ガラスフリットは重量比率で、アルカリ金属 1%以
下、Bi 10〜30%、SiO25〜40
%、BaO 30〜40%、ZnO 5〜7%、Al
4〜7%、B 0.01〜8%の組成で構成
され、その軟化点は700〜900℃である。Bi
の含有率が10%未満で軟化点が700℃未満の場
合には耐酸性が低下するので好ましくない。また、Bi
の含有率が30%以上で軟化点が900℃以上
になると厚膜抵抗体ペースト焼成時流れが悪くなり焼結
不良となるので好ましくない。前記ガラスフリットの含
有量は本発明の厚膜抵抗体ペーストの25〜90重量%
であり、その含有量が25重量%未満の場合は安定した
電気抵抗が得られにくくなり、90重量%を越える場合
は電気抵抗が高く不安定になり実用に供し得ない。
The glass frit used in the present invention means S
iO2-Bi-Ba-based and lead-free non-alkali glass, the glass frit in a weight ratio of alkali metal less than 1%, Bi 2 O 3 10~30%, SiO 2 25~40
%, BaO 30-40%, ZnO 5-7%, Al 2
It is composed of O 3 4 to 7% and B 2 O 3 0.01 to 8%, and its softening point is 700 to 900 ° C. Bi 2 O
If the content of 3 is less than 10% and the softening point is less than 700 ° C., the acid resistance decreases, which is not preferable. Also, Bi
When the content of 2 O 3 is 30% or more and the softening point is 900 ° C. or more, the flow during firing of the thick film resistor paste is deteriorated and sintering is unsatisfactory, which is not preferable. The content of the glass frit is 25 to 90% by weight of the thick film resistor paste of the present invention.
When the content is less than 25% by weight, it becomes difficult to obtain a stable electric resistance, and when the content exceeds 90% by weight, the electric resistance becomes high and unstable, and cannot be put to practical use.

【0008】次に本発明で使用する有機ビヒクルとは、
例えば、メチルセルロース、エチルセルロース、カルボ
キシメチルセルロース、オキシエチルセルロース、ベン
ジルセルロース、プロピルセルロース等のセルロースエ
ーテル類を有機溶媒、例えば、ターピネオール、ブチル
カルビトールアセテート、エチルカルビトールアセテー
ト等に溶解したビヒクルやメチル(メタ)アクリレー
ト、エチル(メタ)アクリレート、ブチル(メタ)アク
リテート、2−ヒドロオキシエチルメタアクリレート等
のアクリル系樹脂を有機溶媒例えば、メチルエチルケト
ン、ターピネオール、ブチルカルビトールアセテート、
エチルカルビトールアセテート等に溶解せしめたビヒク
ル或いはロジン系樹脂、例えば水添ロジン、重合ロジ
ン、及びロジンエステル等を上記の有機溶媒に溶解した
ものが挙げられる。本発明で使用する有機ビヒクル含有
量は本発明の厚膜抵抗体ペーストの10〜40重量%で
ある。10重量%未満の場合はペーストの粘度が高くな
り印刷物の切れが悪くなるので好ましくない。一方、4
0重量%を越えると導電性材料の分散不良が生じ安定し
た抵抗値が得にくくなるので好ましくない。
Next, the organic vehicle used in the present invention is
For example, a vehicle or a methyl (meth) acrylate prepared by dissolving a cellulose ether such as methyl cellulose, ethyl cellulose, carboxymethyl cellulose, oxyethyl cellulose, benzyl cellulose, or propyl cellulose in an organic solvent such as terpineol, butyl carbitol acetate, or ethyl carbitol acetate. , Ethyl (meth) acrylate, butyl (meth) acrylate, 2-hydroxyoxymethacrylate, and other acrylic resins as organic solvents such as methyl ethyl ketone, terpineol, butyl carbitol acetate,
Examples thereof include vehicles or rosin-based resins dissolved in ethyl carbitol acetate, etc., such as hydrogenated rosin, polymerized rosin, and rosin ester dissolved in the above organic solvent. The organic vehicle content used in the present invention is 10 to 40% by weight of the thick film resistor paste of the present invention. If it is less than 10% by weight, the viscosity of the paste becomes high and the cutness of the printed matter becomes poor, which is not preferable. On the other hand, 4
When it exceeds 0% by weight, poor dispersion of the conductive material occurs and it becomes difficult to obtain a stable resistance value, which is not preferable.

【0009】本発明では上記の必須成分の他に、抵抗温
度特性(TCR)を調整するため種々の金属酸化物を添
加することができる。このような金属酸化物としては、
例えば、Nb、Sb、Fe、Ca
O、Al、TiO、ZrO、MnO、Cu
O、Bi、Ta、MoO、およびMgO
等が挙げられる。上記のTCR調整剤(金属酸化物)の
添加量は抵抗値の安定性、ペーストの接着力、ガラス成
分の安定性などを考慮して導電性粉末とガラスフリット
から成る固形分に対して0.1〜5重量%使用される。
In the present invention, in addition to the above essential components, various metal oxides can be added in order to adjust the resistance temperature characteristic (TCR). As such a metal oxide,
For example, Nb 2 O 5 , Sb 2 O 3 , Fe 2 O 3 , Ca
O, Al 2 O 3 , TiO 2 , ZrO 2 , MnO 2 , Cu
O, Bi 2 O 3, Ta 2 O 5, MoO 3 and MgO,
Etc. The TCR adjuster (metal oxide) is added in an amount of 0. 0 with respect to the solid content of the conductive powder and the glass frit in consideration of stability of resistance value, adhesive strength of paste, stability of glass component and the like. 1-5% by weight is used.

【0010】本発明では前記各成分の他に分散剤として
ステアリン酸のアルミニウム、カルシウム、マグネシウ
ム、ストロンチウム及び亜鉛等の飽和脂肪酸金属塩、ス
テアリン酸アミド、オレイン酸アミド及びエルカ酸アミ
ド等の脂肪酸アミド、ポリエチレンワックス、パラフイ
ンワックス、マイクロクリスタンワックス及びカルナバ
ワックス等のワックス類及びロジン等を含んでいてもよ
い。
In the present invention, a saturated fatty acid metal salt of stearic acid such as aluminum, calcium, magnesium, strontium, and zinc, a fatty acid amide such as stearic acid amide, oleic acid amide, and erucic acid amide, as a dispersant, in addition to the above components. Waxes such as polyethylene wax, paraffin wax, microcristan wax and carnauba wax, and rosin may be contained.

【0011】本発明の抵抗体ペーストは前記の構成成分
をニーダー等の混合機により予備混合し、更に3本ロー
ルミルで混練することによって製造される。具体的な製
造例としては、まず、平均粒径2μm以下の酸化ルテニ
ウム及びルテニウム酸ビスマス或いは前記した他の導電
性微粉末と平均粒径5μm以下のガラスフリット及びT
CR調整剤を所定の割合で混合し、有機質ビヒクルを加
えてニーダー等の強力混合機で予備混合を行なう。次い
で、この混合物を3本ロールミルへ移して常温で混練し
てペーストを得る。なお、ペーストを所望の粘度とする
のには3本ロールミル混練中に有機質ビヒクルを添加す
るか又はターピネオール、ブチルカルビトール等の有機
溶媒を添加して行なう。導電性微粉末とガラスフリット
の混合割合は、印刷等で設けた厚膜抵抗体層が必要とす
る抵抗値によって決まる。すなわち、が低抵抗値である
厚膜抵抗体ペーストを目的とした場合にはガラスフリッ
トの配合割合を少なくし、逆に厚膜抵抗体層が高抵抗値
である厚膜抵抗体ペーストを目的とした場合にはガラス
フリットの配合割合を多くすればよい。
The resistor paste of the present invention is manufactured by premixing the above-mentioned constituents with a mixer such as a kneader and further kneading with a three-roll mill. As a specific production example, first, ruthenium oxide and bismuth ruthenate having an average particle diameter of 2 μm or less, or the other conductive fine powder described above, and a glass frit having an average particle diameter of 5 μm or less and T are used.
The CR adjuster is mixed at a predetermined ratio, an organic vehicle is added, and premixing is performed with a powerful mixer such as a kneader. Then, this mixture is transferred to a three-roll mill and kneaded at room temperature to obtain a paste. The paste is made to have a desired viscosity by adding an organic vehicle during kneading with a three-roll mill or by adding an organic solvent such as terpineol or butyl carbitol. The mixing ratio of the conductive fine powder and the glass frit is determined by the resistance value required for the thick film resistor layer provided by printing or the like. That is, when a thick film resistor paste having a low resistance value is intended, the compounding ratio of the glass frit is reduced, and conversely, the thick film resistor layer aims at a thick film resistor paste having a high resistance value. In that case, the compounding ratio of the glass frit may be increased.

【0012】導電性微粉末の平均粒径を2μm以下とす
るのは厚膜抵抗体層において導電性微粉末がガラスと結
合して導電性微粉末が網状に構築された導電性ネットワ
ークを構成するためで、細かいほど安定した導電性ネッ
トワークが得られる。ガラスフリットの平均粒径5μm
以下とするのは、粒径が粗くなると流動性が悪くなり細
かいパターンをスクリーン印刷する際にスクリーンの目
詰まりを起こすのを防止するためでもある。
The average particle diameter of the conductive fine powder is set to 2 μm or less so that the conductive fine powder is bonded to glass in the thick film resistor layer to form a conductive network in which the conductive fine powder is reticulated. Therefore, the finer the particle size, the more stable the conductive network can be obtained. Glass frit average particle size 5μm
The reason for the following is also to prevent clogging of the screen when screen-printing a fine pattern due to poor fluidity when the particle size becomes coarse.

【0013】本発明の厚膜抵抗体ペーストは、アルミナ
基板上に予め設けた電極層上にスクリーン印刷法により
所定形状に印刷し、温度120〜150℃で10〜20
分間予備乾燥した後、焼成炉において800〜900℃
で焼成される。また、焼成時間は30〜60分間とし、
ピーク温度にて10〜15分間保持する。焼結雰囲気は
空気中で行なうことができる。このような焼成によって
厚膜抵抗体層が得られる。この場合、厚膜抵抗体層の膜
厚は6〜25μmの範囲に定めることが好ましい。な
お、本発明の厚膜抵抗体ペーストは指触乾燥した電極層
上へ印刷し、電極層と共に一体同時焼成することができ
る。その場合、電極のバインダーガラスとして本発明の
厚膜抵抗体ペーストに使用したガラスフリットと同様の
ものを用いるのが好ましい。電極と厚膜抵抗体を同時焼
成することにより作業工程が短縮される利点を有し、ま
た、鉛レスの抵抗器を提供することができる。
The thick film resistor paste of the present invention is printed in a predetermined shape on an electrode layer provided in advance on an alumina substrate by a screen printing method, and the temperature is 120 to 150 ° C. for 10 to 20.
After pre-drying for minutes, in a firing furnace at 800-900 ° C
Is baked in. The firing time is 30 to 60 minutes,
Hold at peak temperature for 10-15 minutes. The sintering atmosphere can be performed in air. A thick film resistor layer is obtained by such firing. In this case, the thickness of the thick film resistor layer is preferably set within the range of 6 to 25 μm. The thick film resistor paste of the present invention can be printed on the electrode layer that has been touch-dried and can be co-fired together with the electrode layer. In that case, it is preferable to use the same glass frit as that used in the thick film resistor paste of the present invention as the binder glass of the electrode. Simultaneous firing of the electrode and the thick film resistor has the advantage of shortening the working process, and can provide a leadless resistor.

【0014】[0014]

【実施例】以下、実施例により本発明を具体的に説明す
る。本発明は以下に述べる実施例に何ら限定されるもの
ではない。
EXAMPLES The present invention will be specifically described below with reference to examples. The present invention is not limited to the examples described below.

【実施例1】酸化ルテニウム(RuO)1.26重量
部、ルテニウム酸ビスマス(BiRu)0.8
4重量部、ビスマス系ガラスフリット(Bi
5重量%、SiO 25量%、BaO 35重量%、
ZnO 5重量%、Al7重量%、B
重量%)4.9重量部、有機質ビヒクル(8%エチルセ
ルロースのターピネオール溶液)4.5重量部をセラミ
ック3本ロールミルを用いてよく混練し、厚膜抵抗体ペ
ーストを得た。上記ペーストを、予め電極(前記ビスマ
ス系ガラスフリットを使用して調製したAg電極)を印
刷して指触乾燥しておいたアルミナ基板上に幅2mm長
さ6mmのパターンにスクリーン印刷を行い、120℃
で15分間乾燥後、ピーク温度850℃、10分間の条
件に設定した連続式電気炉にて30分間焼成を行なっ
た。冷却後、上記により設けた厚膜抵抗体層表面へ前記
ビスマス系ガラスフリットから成るガラス層を設け、8
50℃で焼成、厚膜抵抗体層表面へ保護ガラス膜を設け
抵抗器を作成した。前記抵抗器を50℃ 5%硫酸溶液
中に5時間浸漬し、抵抗値変化を調べた。その結果を表
1に示す。
Example 1 1.26 parts by weight of ruthenium oxide (RuO 2 ) and 0.8 of bismuth ruthenate (Bi 2 Ru 2 O 7 ).
4 parts by weight, bismuth-based glass frit (Bi 2 O 3 1
5% by weight, 25% by weight of SiO 2 , 35% by weight of BaO,
ZnO 5% by weight, Al 2 O 3 7% by weight, B 2 O 3 3
% By weight) and 4.5 parts by weight of an organic vehicle (8% ethyl cellulose in terpineol solution) were well kneaded using a ceramic three-roll mill to obtain a thick film resistor paste. An electrode (Ag electrode prepared by using the bismuth-based glass frit) was printed in advance on the alumina substrate which had been touch-dried, and the paste was screen-printed in a pattern with a width of 2 mm and a length of 6 mm. ℃
After being dried for 15 minutes, it was baked for 30 minutes in a continuous electric furnace set to a peak temperature of 850 ° C. for 10 minutes. After cooling, a glass layer made of the bismuth-based glass frit is provided on the surface of the thick film resistor layer provided as described above.
A resistor was prepared by firing at 50 ° C. and providing a protective glass film on the surface of the thick film resistor layer. The resistor was immersed in a 5% sulfuric acid solution at 50 ° C. for 5 hours, and the change in resistance value was examined. The results are shown in Table 1.

【0015】[0015]

【実施例2】酸化ルテニウム(RuO)1.26重量
部、ルテニウム酸ビスマス(BiRu)0.8
4重量部、ビスマス系ガラスフリット(Bi
5重量%、SiO 29重量%、BaO 31重量
%、ZnO 6重量%、Al 6重量%、B
0.5重量%)4.9重量部、有機質ビヒクル(8
%エチルセルロースのターピネオール溶液)4.5重量
部をセラミック3本ロールミルによりよく混練し、厚膜
抵抗体ペーストを得た。上記ペーストを、予め電極(前
記ビスマス系ガラスフリットを使用して調製したAg電
極)を印刷して指触乾燥しておいたアルミナ基板上に幅
2mm長さ6mmのパターンにスクリーン印刷を行い、
120℃で15分間乾燥後、ピーク温度850℃、10
分間の条件に設定した連続式電気炉にて30分間焼成を
行なった。冷却後、上記により設けた厚膜抵抗体層表面
へ前記ビスマス系ガラスフリットから成るガラス層を設
け、850℃で焼成、厚膜抵抗体層表面へ保護ガラス膜
を設け抵抗器を作成した。前記抵抗器を50℃ 5%硫
酸溶液中に5時間浸漬し、抵抗値変化を調べた。その結
果を表1に示す。
Example 2 1.26 parts by weight of ruthenium oxide (RuO 2 ) and 0.8 of bismuth ruthenate (Bi 2 Ru 2 O 7 ).
4 parts by weight, bismuth-based glass frit (Bi 2 O 3 2
5 wt%, SiO 2 29 wt%, BaO 31 wt%, ZnO 6 wt%, Al 2 O 3 6 wt%, B 2 O
3 0.5% by weight) 4.9 parts by weight, organic vehicle (8
% Ethyl cellulose terpineol solution) (4.5 parts by weight) was well kneaded with a three-roll ceramic mill to obtain a thick film resistor paste. An electrode (Ag electrode prepared using the bismuth-based glass frit) was printed in advance on the alumina substrate which had been touch-dried, and the paste was screen-printed in a pattern of width 2 mm and length 6 mm,
After drying at 120 ° C for 15 minutes, peak temperature 850 ° C, 10
Firing was performed for 30 minutes in a continuous electric furnace set to the condition of minute. After cooling, a glass layer made of the bismuth-based glass frit was provided on the surface of the thick film resistor layer formed as described above, followed by firing at 850 ° C., and a protective glass film was provided on the surface of the thick film resistor layer to form a resistor. The resistor was immersed in a 5% sulfuric acid solution at 50 ° C. for 5 hours, and the change in resistance value was examined. The results are shown in Table 1.

【0016】[0016]

【実施例3】予め電極(前記実施例1のビスマス系ガラ
スフリットを使用して調製したAg電極)を印刷して指
触乾燥しておいたアルミナ基板上の前記電極間へ実施例
1で得た厚膜抵抗体ペーストを幅2mm長さ6mmのパ
ターンにスクリーン印刷を行い、120℃で15分間乾
燥を行ない抵抗体層を形成する。次いで前記抵抗体層の
表面に実施例1で使用したガラスフリットを用いペース
ト化したプリコートガラスを同様のパターンで印刷し、
120℃で15分間乾燥を行ないプリコート層を形成し
た。更に上記の3層印刷乾燥したアルミナ基板をピーク
温度850℃、10分間の条件に設定した連続式電気炉
にて30分間焼成を行なって固定抵抗器を得た。前記抵
抗器を50℃ 5%硫酸溶液中に5時間浸漬し、抵抗値
変化を調べた。その結果を表1に示す。
Example 3 An electrode (Ag electrode prepared by using the bismuth-based glass frit of Example 1) was printed in advance and touch-dried to obtain the space between the electrodes on the alumina substrate obtained in Example 1. The thick film resistor paste is screen-printed on a pattern having a width of 2 mm and a length of 6 mm and dried at 120 ° C. for 15 minutes to form a resistor layer. Then, the surface of the resistor layer is printed in the same pattern with a precoated glass paste-formed using the glass frit used in Example 1,
Drying was performed at 120 ° C. for 15 minutes to form a precoat layer. Further, the above-mentioned three-layer printed and dried alumina substrate was fired for 30 minutes in a continuous electric furnace set at a peak temperature of 850 ° C. for 10 minutes to obtain a fixed resistor. The resistor was immersed in a 5% sulfuric acid solution at 50 ° C. for 5 hours, and the change in resistance value was examined. The results are shown in Table 1.

【0017】[0017]

【比較例1】酸化ルテニウム(RuO)1.26重量
部、ルテニウム酸ビスマス(BiRu)0.8
4重量部、ZnO−B2O3−SiO2系ガラスフリッ
ト4.9重量部、有機質ビヒクル(8%エチルセルロー
スのターピネオール溶液)4.5重量部をセラミック3
本ロールミルを用いてよく混練し、厚膜抵抗体ペースト
を得た。上記ペーストを、予め電極(前記ZnO−B2
O3−SiO2系ガラスフリットを使用して調製したA
g電極)を印刷して指触乾燥しておいたアルミナ基板上
に幅2mm長さ6mmのパターンにスクリーン印刷を行
い、120℃で15分間乾燥後、ピーク温度850℃、
10分間の条件に設定した連続式電気炉にて30分間焼
成を行なった。冷却後、上記により設けた厚膜抵抗体層
表面へ前記ZnO−B2O3−SiO2系ガラスフリッ
トから成るガラス層を設け、850℃で焼成、厚膜抵抗
体層表面へ保護ガラス膜を設け抵抗器を作成した。前記
抵抗器を50℃ 5%硫酸溶液中に5時間浸漬し、抵抗
値変化を調べた。その結果を表1に示す。
Comparative Example 1 1.26 parts by weight of ruthenium oxide (RuO 2 ) and 0.8 of bismuth ruthenate (Bi 2 Ru 2 O 7 ).
4 parts by weight, 4.9 parts by weight of ZnO-B2O3-SiO2 glass frit, and 4.5 parts by weight of an organic vehicle (8% ethylcellulose terpineol solution) were added to ceramic 3
Thorough kneading was performed using this roll mill to obtain a thick film resistor paste. The above paste was applied to the electrode (ZnO-B2
A prepared using O3-SiO2 glass frit
(g electrode) and screen-printed on an alumina substrate which has been dried by touch to give a pattern having a width of 2 mm and a length of 6 mm.
Firing was performed for 30 minutes in a continuous electric furnace set for 10 minutes. After cooling, a glass layer made of the above ZnO-B2O3-SiO2 glass frit is provided on the surface of the thick film resistor layer formed as described above, followed by firing at 850 ° C, and a protective glass film is provided on the surface of the thick film resistor layer to form a resistor. Created. The resistor was immersed in a 5% sulfuric acid solution at 50 ° C. for 5 hours, and the change in resistance value was examined. The results are shown in Table 1.

【0018】[0018]

【比較例2】実施例2のビスマス系ガラスフリットに代
え下記組成の(Bi 5重量%、SiO 35
重量%、BaO 40重量%、ZnO 7重量%、Al
6重量%、)ガラスフリットを使用、その他は
実施例2と同様にして厚膜抵抗体ペーストを得た。上記
ペーストを、予め電極(前記ビスマス系ガラスフリット
を使用して調製したAg電極)を印刷して指触乾燥して
いたアルミナ基板上に幅2mm長さ6mmのパターンに
スクリーン印刷を行い、120℃で15分間乾燥後、ピ
ーク温度850℃、10分間の条件に設定した連続式電
気炉にて30分間焼成を行なった。冷却後、上記により
設けた厚膜抵抗体層表面へ前記ビスマス系ガラスフリッ
トから成るガラス層を設け、850℃で焼成、厚膜抵抗
体層表面へ保護ガラス膜を設け抵抗器を作成した。前記
抵抗器を50℃ 5%硫酸溶液中に5時間浸漬し、抵抗
値変化を調べた。その結果を表1に示す。
Comparative Example 2 Instead of the bismuth-based glass frit of Example 2, 5% by weight of Bi 2 O 3 and SiO 2 35 having the following composition were used.
% By weight, 40% by weight of BaO, 7% by weight of ZnO, Al
2 O 3 6 wt%) using a glass frit and others in the same manner as in Example 2 to obtain a thick-film resistor paste. The paste was screen-printed in a pattern with a width of 2 mm and a length of 6 mm on an alumina substrate which had been dried by touching with an electrode (Ag electrode prepared using the bismuth-based glass frit) in advance, and 120 ° C. After being dried for 15 minutes, it was baked for 30 minutes in a continuous electric furnace set to a peak temperature of 850 ° C. for 10 minutes. After cooling, a glass layer made of the bismuth-based glass frit was provided on the surface of the thick film resistor layer formed as described above, followed by firing at 850 ° C., and a protective glass film was provided on the surface of the thick film resistor layer to form a resistor. The resistor was immersed in a 5% sulfuric acid solution at 50 ° C. for 5 hours, and the change in resistance value was examined. The results are shown in Table 1.

【0019】[0019]

【表1】 [Table 1]

【0020】[0020]

【発明の効果】本発明の厚膜抵抗体ペーストを用いて形
成した抵抗器は、耐酸性試験において抵抗値変化率、T
CR変化率が低く、外観の平滑性にも優れている。ま
た、本発明の厚膜抵抗体ペーストを用いると、電極部、
抵抗体部及びプリコートガラス部を同時焼成で形成でき
るために大幅な工程短縮となり、生産の合理化が計れ
る。そしてまた、PbOを含有しないため、環境保護の
点からも有効である。
The resistor formed by using the thick film resistor paste of the present invention has a resistance value change rate, T
The CR change rate is low and the appearance is smooth. Moreover, when the thick film resistor paste of the present invention is used,
Since the resistor part and the pre-coated glass part can be formed by simultaneous firing, the process is greatly shortened and the production can be rationalized. Further, since it does not contain PbO, it is also effective from the viewpoint of environmental protection.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 岩崎 正雄 埼玉県狭山市柏原337番26 小島化学薬品 株式会社内 Fターム(参考) 5E033 AA18 AA27 BB02 BG02 5G301 DA23 DA34 DA36 DA37 DA38 DA39 DA42 DD01    ─────────────────────────────────────────────────── ─── Continued front page    (72) Inventor Masao Iwasaki             337 26 Kashiwara, Sayama City, Saitama Prefecture Kojima Chemical             Within the corporation F term (reference) 5E033 AA18 AA27 BB02 BG02                 5G301 DA23 DA34 DA36 DA37 DA38                       DA39 DA42 DD01

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】導電性粉末、ガラスフリット及び有機ビヒ
クルを主成分とする厚膜抵抗体ペーストであって、前記
ガラスフリットは重量比率で、アルカリ金属1%以下、
Bi 10〜30%、SiO 25〜40%、
BaO 30〜40%、ZnO 5〜7%、Al
4〜7%、B 0.01〜8%の組成で構成され
PbOを含有しないことを特徴とする厚膜抵抗体ペース
ト。
1. A thick film resistor paste containing conductive powder, glass frit and an organic vehicle as main components, wherein the glass frit is 1% by weight or less of an alkali metal,
Bi 2 O 3 10 to 30%, SiO 2 25 to 40%,
BaO 30~40%, ZnO 5~7%, Al 2 O 3
A thick film resistor paste characterized in that it is composed of 4 to 7% and B 2 O 3 0.01 to 8% and does not contain PbO.
【請求項2】導電性粉末がRuO及びBiRU
7−xである請求項1記載の厚膜抵抗体ペースト。
2. The conductive powder is RuO 2 and Bi 2 RU 2 O.
The thick film resistor paste according to claim 1, which is 7-x .
【請求項3】導電性粉末がRuO、BiRu
7−xの少なくとも1種及びRu(OH)、SrRu
、BaRuO、CaRuO、LiRuO、B
Ir、Bi1.5In0.5Ru、N
dBiRuO7、BiInRuから選ばれた1
種乃至2種以上である請求項1記載の厚膜抵抗体ペース
ト。
3. The conductive powder is RuO 2 , Bi 2 Ru 2 O.
At least one of 7-x and Ru (OH) 4 , SrRu
O 3 , BaRuO 3 , CaRuO 3 , LiRuO 3 , B
i 2 Ir 2 O 7 , Bi 1.5 In 0.5 Ru 2 O 7 , N
dBiRu 2 O7, selected from BiInRu 2 O 7 1
The thick film resistor paste according to claim 1, wherein the thick film resistor paste is one or more kinds.
【請求項4】ガラスフリットの軟化点が700〜900
℃である請求項1記載の厚膜抵抗体ペースト。
4. The softening point of the glass frit is 700 to 900.
The thick film resistor paste according to claim 1, which has a temperature of ° C.
JP2002101904A 2002-02-28 2002-02-28 Thick film resistor paste Expired - Fee Related JP4079669B2 (en)

Priority Applications (5)

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JP2002101904A JP4079669B2 (en) 2002-02-28 2002-02-28 Thick film resistor paste
KR10-2004-7013364A KR20040084940A (en) 2002-02-28 2003-02-28 Resistor
EP03743065A EP1480233A4 (en) 2002-02-28 2003-02-28 Resistor
AU2003211482A AU2003211482A1 (en) 2002-02-28 2003-02-28 Resistor
PCT/JP2003/002322 WO2003073442A1 (en) 2002-02-28 2003-02-28 Resistor

Applications Claiming Priority (1)

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JP2007189040A (en) * 2006-01-13 2007-07-26 Alps Electric Co Ltd Resistive paste, resistance object, and circuit board using the same
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US7884547B2 (en) 2007-02-06 2011-02-08 Noritake Co., Limited Lead-free acid-resistant glass composition and glass paste comprised of the same
WO2008099680A1 (en) * 2007-02-06 2008-08-21 Murata Manufacturing Co., Ltd. Resistive paste and stacked ceramic capacitor
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