JP2003229433A - 半導体装置の作製方法 - Google Patents
半導体装置の作製方法Info
- Publication number
- JP2003229433A JP2003229433A JP2002347455A JP2002347455A JP2003229433A JP 2003229433 A JP2003229433 A JP 2003229433A JP 2002347455 A JP2002347455 A JP 2002347455A JP 2002347455 A JP2002347455 A JP 2002347455A JP 2003229433 A JP2003229433 A JP 2003229433A
- Authority
- JP
- Japan
- Prior art keywords
- tft
- film
- region
- gate electrode
- manufacturing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 310
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 165
- 239000012535 impurity Substances 0.000 claims abstract description 305
- 238000000034 method Methods 0.000 claims description 302
- 238000005530 etching Methods 0.000 claims description 101
- 230000008569 process Effects 0.000 claims description 101
- 230000009467 reduction Effects 0.000 claims description 11
- 239000000758 substrate Substances 0.000 abstract description 93
- 229910052751 metal Inorganic materials 0.000 abstract description 85
- 239000002184 metal Substances 0.000 abstract description 85
- 239000010408 film Substances 0.000 description 633
- 239000010410 layer Substances 0.000 description 351
- 239000011229 interlayer Substances 0.000 description 88
- 239000000463 material Substances 0.000 description 63
- 229910052710 silicon Inorganic materials 0.000 description 46
- 239000010703 silicon Substances 0.000 description 46
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 45
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 43
- 238000010438 heat treatment Methods 0.000 description 42
- 229910052814 silicon oxide Inorganic materials 0.000 description 41
- 239000013078 crystal Substances 0.000 description 40
- 229910052581 Si3N4 Inorganic materials 0.000 description 35
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 35
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 33
- 150000002500 ions Chemical class 0.000 description 29
- 150000002894 organic compounds Chemical class 0.000 description 29
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 25
- 238000002425 crystallisation Methods 0.000 description 25
- 239000004973 liquid crystal related substance Substances 0.000 description 25
- 230000003287 optical effect Effects 0.000 description 25
- 229910052698 phosphorus Inorganic materials 0.000 description 25
- 239000011574 phosphorus Substances 0.000 description 25
- 230000001133 acceleration Effects 0.000 description 24
- 229910021417 amorphous silicon Inorganic materials 0.000 description 24
- 238000000137 annealing Methods 0.000 description 24
- 238000010586 diagram Methods 0.000 description 24
- 238000004544 sputter deposition Methods 0.000 description 24
- 125000004429 atom Chemical group 0.000 description 23
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 22
- 239000007789 gas Substances 0.000 description 22
- 230000006870 function Effects 0.000 description 21
- 230000015572 biosynthetic process Effects 0.000 description 18
- 239000011521 glass Substances 0.000 description 18
- 238000002347 injection Methods 0.000 description 17
- 239000007924 injection Substances 0.000 description 17
- 238000005984 hydrogenation reaction Methods 0.000 description 16
- 238000005224 laser annealing Methods 0.000 description 16
- 238000012545 processing Methods 0.000 description 16
- 229910052739 hydrogen Inorganic materials 0.000 description 15
- 238000000059 patterning Methods 0.000 description 15
- 239000002356 single layer Substances 0.000 description 15
- 229910052782 aluminium Inorganic materials 0.000 description 14
- 230000008025 crystallization Effects 0.000 description 13
- 238000005468 ion implantation Methods 0.000 description 13
- 239000001257 hydrogen Substances 0.000 description 12
- 230000010355 oscillation Effects 0.000 description 12
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 11
- 239000000460 chlorine Substances 0.000 description 10
- 229910052760 oxygen Inorganic materials 0.000 description 10
- 238000001994 activation Methods 0.000 description 9
- 239000012298 atmosphere Substances 0.000 description 9
- 238000005229 chemical vapour deposition Methods 0.000 description 9
- 239000012299 nitrogen atmosphere Substances 0.000 description 9
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 8
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 8
- 229910052785 arsenic Inorganic materials 0.000 description 8
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 8
- 229910052799 carbon Inorganic materials 0.000 description 8
- 238000000576 coating method Methods 0.000 description 8
- 150000001875 compounds Chemical class 0.000 description 8
- 229910021419 crystalline silicon Inorganic materials 0.000 description 8
- 230000005525 hole transport Effects 0.000 description 8
- 238000005499 laser crystallization Methods 0.000 description 8
- 239000000956 alloy Substances 0.000 description 7
- 239000011159 matrix material Substances 0.000 description 7
- 238000001069 Raman spectroscopy Methods 0.000 description 6
- 230000004913 activation Effects 0.000 description 6
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 6
- UMIVXZPTRXBADB-UHFFFAOYSA-N benzocyclobutene Chemical compound C1=CC=C2CCC2=C1 UMIVXZPTRXBADB-UHFFFAOYSA-N 0.000 description 6
- 238000004040 coloring Methods 0.000 description 6
- 239000010949 copper Substances 0.000 description 6
- ZOCHARZZJNPSEU-UHFFFAOYSA-N diboron Chemical compound B#B ZOCHARZZJNPSEU-UHFFFAOYSA-N 0.000 description 6
- 229910003437 indium oxide Inorganic materials 0.000 description 6
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 6
- 230000001678 irradiating effect Effects 0.000 description 6
- 239000001301 oxygen Substances 0.000 description 6
- 230000001681 protective effect Effects 0.000 description 6
- 239000003566 sealing material Substances 0.000 description 6
- 238000001039 wet etching Methods 0.000 description 6
- 229910045601 alloy Inorganic materials 0.000 description 5
- 239000000969 carrier Substances 0.000 description 5
- 229910052802 copper Inorganic materials 0.000 description 5
- 230000009977 dual effect Effects 0.000 description 5
- 230000005669 field effect Effects 0.000 description 5
- 229910052757 nitrogen Inorganic materials 0.000 description 5
- 238000002161 passivation Methods 0.000 description 5
- 125000006850 spacer group Chemical group 0.000 description 5
- 239000010409 thin film Substances 0.000 description 5
- 239000004925 Acrylic resin Substances 0.000 description 4
- 229920000178 Acrylic resin Polymers 0.000 description 4
- 229910052779 Neodymium Inorganic materials 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- QVQLCTNNEUAWMS-UHFFFAOYSA-N barium oxide Chemical compound [Ba]=O QVQLCTNNEUAWMS-UHFFFAOYSA-N 0.000 description 4
- 230000008859 change Effects 0.000 description 4
- 230000006866 deterioration Effects 0.000 description 4
- 238000001312 dry etching Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 239000002923 metal particle Substances 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 238000004806 packaging method and process Methods 0.000 description 4
- 239000002245 particle Substances 0.000 description 4
- 239000012495 reaction gas Substances 0.000 description 4
- 238000003860 storage Methods 0.000 description 4
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 4
- 229910001887 tin oxide Inorganic materials 0.000 description 4
- 239000011787 zinc oxide Substances 0.000 description 4
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 3
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 3
- 239000004952 Polyamide Substances 0.000 description 3
- 239000004642 Polyimide Substances 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 239000007850 fluorescent dye Substances 0.000 description 3
- 238000000206 photolithography Methods 0.000 description 3
- 239000004033 plastic Substances 0.000 description 3
- 229920002647 polyamide Polymers 0.000 description 3
- 229920001721 polyimide Polymers 0.000 description 3
- 229920000123 polythiophene Polymers 0.000 description 3
- 239000000047 product Substances 0.000 description 3
- 238000004151 rapid thermal annealing Methods 0.000 description 3
- 238000002310 reflectometry Methods 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 239000000243 solution Substances 0.000 description 3
- 238000004528 spin coating Methods 0.000 description 3
- 238000002834 transmittance Methods 0.000 description 3
- 229910052721 tungsten Inorganic materials 0.000 description 3
- YLYPIBBGWLKELC-RMKNXTFCSA-N 2-[2-[(e)-2-[4-(dimethylamino)phenyl]ethenyl]-6-methylpyran-4-ylidene]propanedinitrile Chemical compound C1=CC(N(C)C)=CC=C1\C=C\C1=CC(=C(C#N)C#N)C=C(C)O1 YLYPIBBGWLKELC-RMKNXTFCSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 2
- 229910052684 Cerium Inorganic materials 0.000 description 2
- 229910000881 Cu alloy Inorganic materials 0.000 description 2
- 229910052691 Erbium Inorganic materials 0.000 description 2
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 2
- 229910052689 Holmium Inorganic materials 0.000 description 2
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 2
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 2
- NRCMAYZCPIVABH-UHFFFAOYSA-N Quinacridone Chemical compound N1C2=CC=CC=C2C(=O)C2=C1C=C1C(=O)C3=CC=CC=C3NC1=C2 NRCMAYZCPIVABH-UHFFFAOYSA-N 0.000 description 2
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 2
- 229910052775 Thulium Inorganic materials 0.000 description 2
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical compound [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 description 2
- MQRWBMAEBQOWAF-UHFFFAOYSA-N acetic acid;nickel Chemical compound [Ni].CC(O)=O.CC(O)=O MQRWBMAEBQOWAF-UHFFFAOYSA-N 0.000 description 2
- 239000005407 aluminoborosilicate glass Substances 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 2
- 229910052788 barium Inorganic materials 0.000 description 2
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 229910052796 boron Inorganic materials 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 239000010406 cathode material Substances 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 229920000547 conjugated polymer Polymers 0.000 description 2
- XCJYREBRNVKWGJ-UHFFFAOYSA-N copper(II) phthalocyanine Chemical compound [Cu+2].C12=CC=CC=C2C(N=C2[N-]C(C3=CC=CC=C32)=N2)=NC1=NC([C]1C=CC=CC1=1)=NC=1N=C1[C]3C=CC=CC3=C2[N-]1 XCJYREBRNVKWGJ-UHFFFAOYSA-N 0.000 description 2
- 238000007872 degassing Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 238000007599 discharging Methods 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000005538 encapsulation Methods 0.000 description 2
- 230000002349 favourable effect Effects 0.000 description 2
- 239000000945 filler Substances 0.000 description 2
- 229910052731 fluorine Inorganic materials 0.000 description 2
- 229910052733 gallium Inorganic materials 0.000 description 2
- RBTKNAXYKSUFRK-UHFFFAOYSA-N heliogen blue Chemical compound [Cu].[N-]1C2=C(C=CC=C3)C3=C1N=C([N-]1)C3=CC=CC=C3C1=NC([N-]1)=C(C=CC=C3)C3=C1N=C([N-]1)C3=CC=CC=C3C1=N2 RBTKNAXYKSUFRK-UHFFFAOYSA-N 0.000 description 2
- 238000009616 inductively coupled plasma Methods 0.000 description 2
- 229910010272 inorganic material Inorganic materials 0.000 description 2
- 239000011147 inorganic material Substances 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 239000005001 laminate film Substances 0.000 description 2
- 229910052744 lithium Inorganic materials 0.000 description 2
- 238000004518 low pressure chemical vapour deposition Methods 0.000 description 2
- 229910052749 magnesium Inorganic materials 0.000 description 2
- 239000011777 magnesium Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 229940078494 nickel acetate Drugs 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 125000002080 perylenyl group Chemical group C1(=CC=C2C=CC=C3C4=CC=CC5=CC=CC(C1=C23)=C45)* 0.000 description 2
- CSHWQDPOILHKBI-UHFFFAOYSA-N peryrene Natural products C1=CC(C2=CC=CC=3C2=C2C=CC=3)=C3C2=CC=CC3=C1 CSHWQDPOILHKBI-UHFFFAOYSA-N 0.000 description 2
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- 238000002294 plasma sputter deposition Methods 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 238000006116 polymerization reaction Methods 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- 150000003254 radicals Chemical class 0.000 description 2
- 239000010979 ruby Substances 0.000 description 2
- 229910001750 ruby Inorganic materials 0.000 description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 238000000859 sublimation Methods 0.000 description 2
- 230000008022 sublimation Effects 0.000 description 2
- 229910052715 tantalum Inorganic materials 0.000 description 2
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 2
- NXHILIPIEUBEPD-UHFFFAOYSA-H tungsten hexafluoride Chemical compound F[W](F)(F)(F)(F)F NXHILIPIEUBEPD-UHFFFAOYSA-H 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- 229910018125 Al-Si Inorganic materials 0.000 description 1
- 229910018520 Al—Si Inorganic materials 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 1
- 101100214491 Solanum lycopersicum TFT3 gene Proteins 0.000 description 1
- 229910004529 TaF 5 Inorganic materials 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 201000009310 astigmatism Diseases 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 239000005388 borosilicate glass Substances 0.000 description 1
- 229910002091 carbon monoxide Inorganic materials 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000013256 coordination polymer Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- 229910052696 pnictogen Inorganic materials 0.000 description 1
- 230000004043 responsiveness Effects 0.000 description 1
- 239000000565 sealant Substances 0.000 description 1
- 238000009751 slip forming Methods 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
Landscapes
- Liquid Crystal (AREA)
- Thin Film Transistor (AREA)
- Recrystallisation Techniques (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002347455A JP2003229433A (ja) | 2001-11-30 | 2002-11-29 | 半導体装置の作製方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001-365699 | 2001-11-30 | ||
| JP2001365699 | 2001-11-30 | ||
| JP2002347455A JP2003229433A (ja) | 2001-11-30 | 2002-11-29 | 半導体装置の作製方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002348393A Division JP2004186215A (ja) | 2002-11-29 | 2002-11-29 | 半導体装置の作製方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2003229433A true JP2003229433A (ja) | 2003-08-15 |
| JP2003229433A5 JP2003229433A5 (enrdf_load_stackoverflow) | 2006-01-05 |
Family
ID=27759511
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002347455A Withdrawn JP2003229433A (ja) | 2001-11-30 | 2002-11-29 | 半導体装置の作製方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2003229433A (enrdf_load_stackoverflow) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005109073A (ja) * | 2003-09-30 | 2005-04-21 | Fujitsu Display Technologies Corp | 薄膜トランジスタ装置及びその製造方法、並びにそれを備えた薄膜トランジスタ基板及び表示装置 |
| WO2006064606A1 (ja) * | 2004-12-14 | 2006-06-22 | Sharp Kabushiki Kaisha | 半導体装置及びその製造方法 |
| JP2006210890A (ja) * | 2004-12-27 | 2006-08-10 | Semiconductor Energy Lab Co Ltd | 半導体装置の作製方法 |
| JP2008015454A (ja) * | 2006-06-30 | 2008-01-24 | Lg Phillips Lcd Co Ltd | 液晶表示装置及びその製造方法 |
| US8212247B2 (en) | 2009-07-15 | 2012-07-03 | Samsung Mobile Display Co., Ltd. | Organic light emitting display device and fabricating method thereof |
| JP2012147001A (ja) * | 2012-03-13 | 2012-08-02 | Renesas Electronics Corp | 半導体集積回路の製造方法 |
-
2002
- 2002-11-29 JP JP2002347455A patent/JP2003229433A/ja not_active Withdrawn
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005109073A (ja) * | 2003-09-30 | 2005-04-21 | Fujitsu Display Technologies Corp | 薄膜トランジスタ装置及びその製造方法、並びにそれを備えた薄膜トランジスタ基板及び表示装置 |
| WO2006064606A1 (ja) * | 2004-12-14 | 2006-06-22 | Sharp Kabushiki Kaisha | 半導体装置及びその製造方法 |
| JP4707677B2 (ja) * | 2004-12-14 | 2011-06-22 | シャープ株式会社 | 半導体装置及びその製造方法 |
| US8008718B2 (en) | 2004-12-14 | 2011-08-30 | Sharp Kabushiki Kaisha | Semiconductor device and production method thereof |
| JP2006210890A (ja) * | 2004-12-27 | 2006-08-10 | Semiconductor Energy Lab Co Ltd | 半導体装置の作製方法 |
| JP2008015454A (ja) * | 2006-06-30 | 2008-01-24 | Lg Phillips Lcd Co Ltd | 液晶表示装置及びその製造方法 |
| US8269907B2 (en) | 2006-06-30 | 2012-09-18 | Lg Display Co., Ltd. | Liquid crystal display device and method for fabricating the same |
| US8665386B2 (en) | 2006-06-30 | 2014-03-04 | Lg Display Co., Ltd. | Liquid crystal display device and method for fabricating the same |
| US8212247B2 (en) | 2009-07-15 | 2012-07-03 | Samsung Mobile Display Co., Ltd. | Organic light emitting display device and fabricating method thereof |
| JP2012147001A (ja) * | 2012-03-13 | 2012-08-02 | Renesas Electronics Corp | 半導体集積回路の製造方法 |
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