JP2003227775A - Striae inspection apparatus for optical part - Google Patents

Striae inspection apparatus for optical part

Info

Publication number
JP2003227775A
JP2003227775A JP2002025525A JP2002025525A JP2003227775A JP 2003227775 A JP2003227775 A JP 2003227775A JP 2002025525 A JP2002025525 A JP 2002025525A JP 2002025525 A JP2002025525 A JP 2002025525A JP 2003227775 A JP2003227775 A JP 2003227775A
Authority
JP
Japan
Prior art keywords
lens
striae
collimator
afocal system
interferometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2002025525A
Other languages
Japanese (ja)
Inventor
Takeshi Kuwayama
武司 桑山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2002025525A priority Critical patent/JP2003227775A/en
Publication of JP2003227775A publication Critical patent/JP2003227775A/en
Withdrawn legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide a method that can easily inspect a striae without using a liquid with an index of refraction close to that of a member, in which the conventional striae inspection immerses the member to inspect with transmission light without the influence of the curvature of the surface of the member. <P>SOLUTION: Parallel optical flux from a Zygo interferometer is divided into with a half-mirror, and one of the flux is entered into an afocal system formed with a collimator and reference lens, and reflected with a total reflection mirror at the back of the system to be returned to a same optical path. The other flux is entered into an afocal system formed with a collimator and a lens to be inspected, and reflected with a total reflection mirror to be interfered with the flux of the reference lens. In these processes, the phase state of an interference fringe is observed with using double-fetching and the repair functions of the Zygo interferometer. <P>COPYRIGHT: (C)2003,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】干渉計による波面収差測定で
脈理を検査する装置。
BACKGROUND OF THE INVENTION 1. Field of the Invention An apparatus for inspecting striae by measuring wavefront aberration by an interferometer.

【0002】[0002]

【従来の技術】図2の如く、被検レンズの曲率による屈
折の影響を取り去るため、被検レンズの屈折率に近い液
体(マッチングオイル)に被検レンズを浸していた。こ
れによりレンズの曲面による屈折の影響が無くなり、脈
理による屈折率の変化が独立に検出できる。しかし被検
レンズの屈折率は数多く、それに対応する液体を用意す
るのは大変である。又被検レンズの屈折率とぴたりと一
致する液体(マッチングオイル)はあまり無く多少の誤
差が発生する。
2. Description of the Related Art As shown in FIG. 2, in order to remove the influence of refraction due to the curvature of a lens under test, the lens under test is immersed in a liquid (matching oil) having a refractive index close to that of the lens under test. This eliminates the influence of refraction due to the curved surface of the lens, and changes in the refractive index due to striae can be independently detected. However, the refractive index of the lens to be inspected is large, and it is difficult to prepare a liquid corresponding thereto. Also, there is not much liquid (matching oil) that exactly matches the refractive index of the lens under test, and some errors occur.

【0003】[0003]

【発明が解決しようとする課題】液に被検物を浸たすこ
となく、容易に脈理の検査し、かつて定量的に検出する
方法。
A method for easily inspecting striae and quantifying them once without infiltrating an object to be inspected with a liquid.

【0004】[0004]

【課題を解決するための手段】脈理の無い基準レンズと
コリメーターレンズで作ったアフォーカル系を用意し、
被検レンズと前記と同じ形状のコリメーターレンズとで
作ったアフォーカル系との各々の波面収差の差を求める
干渉計を利用し、被検レンズの脈理で生ずる波面収差を
検出する。
[Means for solving the problem] Prepare an afocal system made of a striation-free reference lens and a collimator lens,
An interferometer that finds the difference in wavefront aberration between the lens to be inspected and an afocal system made up of a collimator lens having the same shape as described above is used to detect the wavefront aberration caused by the striae of the lens to be inspected.

【0005】[0005]

【発明の実施の形態】ハーフミラー・二つのアフォーカ
ル系レンズ・二つの全反射ミラー・ザイゴ干渉計の有す
るアフォーカル光束を出射する光源と干渉縞位相検出装
置によって干渉縞の位相を検出するトワイマン型干渉計
を構成する。
BEST MODE FOR CARRYING OUT THE INVENTION Halfman mirror, two afocal system lenses, two total reflection mirrors, a light source for emitting an afocal light beam of a Zygo interferometer, and a Twyman for detecting the phase of an interference fringe by an interference fringe phase detector. Type interferometer.

【0006】図1は本発明の第一実施形態で、商品化さ
れたフィゾウ干渉計であるザイゴ干渉計1とハーフミラ
ー2、コリメータ−レンズ3、被検レンズ4、基準レン
ズ5、全反射ミラー6、モニター7、ピエゾ素子12で
構成される。
FIG. 1 shows a first embodiment of the present invention, which is a commercialized Fizeau interferometer, such as a Zygo interferometer 1, a half mirror 2, a collimator lens 3, an inspected lens 4, a reference lens 5, and a total reflection mirror. 6, monitor 7, and piezo element 12.

【0007】ザイゴ干渉計1から平行光束が出射され、
ハーフミラーによって透過光束と反射光束に分けられ
る。透過光束及び反射光束の一方はコリメーターレンズ
3と基準レンズ5からなるアフォーカル系に入射し、全
反射ミラー6により反射され又同じ光路を辿り戻ってく
る。もう一方の光束はコリメーターレンズ3及び被検レ
ンズ4からなるアフォーカル系を通り、全反射ミラー6
に達し反射されて同じ光路を戻ってくる。これらの二つ
の光束をハーフミラー2で重ね合わせて干渉させる。こ
の干渉により、二つのアフォーカル系の波面収差の差が
ザイゴ干渉計の観察系で検出される。この波面収差の差
が被検レンズの脈理によって生じた収差である。このト
ワンマン型干渉計の二つの全反射ミラーのどちらか一方
をピエゾ素子等により、微小振動させることにより干渉
縞の位相をも測定可能となる。
A parallel light beam is emitted from the Zygo interferometer 1,
It is divided into a transmitted light flux and a reflected light flux by the half mirror. One of the transmitted light flux and the reflected light flux enters the afocal system including the collimator lens 3 and the reference lens 5, is reflected by the total reflection mirror 6, and returns along the same optical path. The other light flux passes through an afocal system including a collimator lens 3 and a lens 4 to be inspected, and a total reflection mirror 6
Is reflected, and returns along the same optical path. These two light fluxes are superposed by the half mirror 2 and interfere with each other. Due to this interference, the difference between the wavefront aberrations of the two afocal systems is detected by the observation system of the Zygo interferometer. This difference in wavefront aberration is an aberration caused by the striae of the lens under test. It is also possible to measure the phase of the interference fringes by microvibrating either one of the two total reflection mirrors of this Twanman interferometer with a piezo element or the like.

【0008】[0008]

【発明の効果】コリメータ−レンズを用意し、二つのア
フォーカル系を作り夫々干渉させることにより、脈理の
有無・多少が即時に判明し、従来例の如く屈折率に近い
液体を探し、この液体に被検物を浸し、終われば液体か
ら取り出し乾燥させる方法より手間が省けると共に精度
が向上する。
EFFECTS OF THE INVENTION By preparing a collimator lens, forming two afocal systems and causing them to interfere with each other, the presence / absence of striae can be immediately identified, and a liquid having a refractive index close to that of the conventional example is searched for. It is easier and more accurate than the method of immersing the test object in the liquid and taking it out of the liquid and drying it when finished.

【図面の簡単な説明】[Brief description of drawings]

【図1】本実施形態の図。FIG. 1 is a diagram of the present embodiment.

【図2】従来例の図。FIG. 2 is a diagram of a conventional example.

【符号の説明】[Explanation of symbols]

1 ザイゴ干渉計 2 ハーフミラー 3 コリメーターレンズ 4 被検レンズ 5 基準レンズ 6 全反射ミラー 7 モニター 8 結像レンズ 9 マッチングオイル 10 スクリーン 11 平行光束 12 ピエゾ素子 1 Zygo interferometer 2 half mirror 3 collimator lens 4 Test lens 5 Reference lens 6 Total reflection mirror 7 monitors 8 Imaging lens 9 Matching oil 10 screens 11 parallel light flux 12 Piezo element

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 被検レンズとコリメーターでアフォーカ
ル系を作り、この波面収差と脈理の無い基準レンズとコ
リメーターレンズとで作ったアフォーカル系の波面収差
との差が得られるよう干渉計を構成し、被検レンズの脈
理からくる影響を波面収差として検出する脈理検査装
置。
1. An afocal system is formed by a lens to be inspected and a collimator, and interference is performed so as to obtain a difference between this wavefront aberration and a wavefront aberration of the afocal system made by a collimator lens and a reference lens having no striae. A striae inspection device that constitutes a meter and detects the influence of the striae of the lens under test as wavefront aberration.
【請求項2】 フィゾウ型干渉計(ザイゴ干渉計)と結
合し、該フィゾウ型干渉計からの出射平行光束を二分す
るハーフミラーによりトワイマン型干渉計を形成し、該
基準レンズとコリメーターからなるアフォーカル系と被
検レンズとコリメーターからなるアフォーカル系との波
面収差の差を検出する請求項第一項の脈理検査装置。
2. A Twyman type interferometer is formed by a half mirror which is coupled with a Fizeau type interferometer (Zygo interferometer) and divides a parallel light flux emitted from the Fizeau type interferometer into two parts, which comprises the reference lens and a collimator. The striae inspection apparatus according to claim 1, wherein a difference in wavefront aberration between the afocal system and the afocal system including the lens to be inspected and the collimator is detected.
【請求項3】 基準レンズとコリメーターとからなるア
フォーカル系の背後に置いた全反射ミラーをピエゾ素子
を使って微小に振動させ、フィゾウ型干渉計(ザイゴ干
渉計)の位相読み取り装置(P.M.I.)により、干
渉縞を定量的に読み取る請求項第一項の脈理検査装置。
3. A phase reading device of a Fizeau interferometer (Zygo interferometer) by slightly vibrating a total reflection mirror placed behind an afocal system consisting of a reference lens and a collimator using a piezo element. . MI.) To read the interference fringes quantitatively.
【請求項4】 被検レンズに対し最適な曲率・厚み・屈
折率で設計されたコリメーターレンズとでアフォーカル
系を構成する請求項第一項の脈理検査装置。
4. The striae inspecting apparatus according to claim 1, wherein an afocal system is formed by a collimator lens designed with an optimum curvature, thickness and refractive index for the lens to be inspected.
【請求項5】 被検レンズをx,y,z方向に微調可能
な機構をつけた請求項第一項の脈理検査装置。
5. The striae inspection apparatus according to claim 1, further comprising a mechanism capable of finely adjusting the lens to be inspected in x, y and z directions.
JP2002025525A 2002-02-01 2002-02-01 Striae inspection apparatus for optical part Withdrawn JP2003227775A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002025525A JP2003227775A (en) 2002-02-01 2002-02-01 Striae inspection apparatus for optical part

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002025525A JP2003227775A (en) 2002-02-01 2002-02-01 Striae inspection apparatus for optical part

Publications (1)

Publication Number Publication Date
JP2003227775A true JP2003227775A (en) 2003-08-15

Family

ID=27747656

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002025525A Withdrawn JP2003227775A (en) 2002-02-01 2002-02-01 Striae inspection apparatus for optical part

Country Status (1)

Country Link
JP (1) JP2003227775A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016016407A (en) * 2014-07-04 2016-02-01 株式会社ディスコ Laser processing device
CN111076904A (en) * 2019-12-27 2020-04-28 山东大学 Dynamic wavefront aberration detection device and method for high-power thin-chip laser

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016016407A (en) * 2014-07-04 2016-02-01 株式会社ディスコ Laser processing device
CN111076904A (en) * 2019-12-27 2020-04-28 山东大学 Dynamic wavefront aberration detection device and method for high-power thin-chip laser

Similar Documents

Publication Publication Date Title
JP5122581B2 (en) Interferometry inspection lens, and interferometry inspection system and apparatus
TWI353440B (en) Aspheric lens surface-misalignment measuring metho
JP5087186B1 (en) Iso-optical path interferometer
JPH02170033A (en) Inspection method and apparatus for
WO2012083764A1 (en) Method and device for measuring multiple parameters of differential confocal interference component
JP2009162539A (en) Light wave interferometer apparatus
JP2002071513A (en) Interferometer for immersion microscope objective and evaluation method of the immersion microscope objective
JP3699810B2 (en) Method and apparatus for measuring refractive index distribution
JP2003042731A (en) Apparatus and method for measurement of shape
Broistedt et al. Random-phase-shift Fizeau interferometer
KR20110065365A (en) Method and apparatus for measuring aspherical body
JP2005201703A (en) Interference measuring method and system
JPH10160582A (en) Interferometer for measuring transmitted wave front
JP2003227775A (en) Striae inspection apparatus for optical part
JPH11194011A (en) Interference apparatus
JPH08122210A (en) Method and device for measuring refrative index distribution of optical element
JP2011220903A (en) Refractive-index measurement method and device
JP2002048673A (en) Physical quantity measuring method of optical element or optical system
JP3599921B2 (en) Method and apparatus for measuring refractive index distribution
JP3871183B2 (en) Method and apparatus for measuring three-dimensional shape of optical element
JPH11311600A (en) Method and apparatus for measuring refractive index distribution
KR102057153B1 (en) Curvature of both sides surface and refractive index profile simultaneous measurement method of the lens
JPH116784A (en) Device and method for measuring shape of aspherical surface
US20200182607A1 (en) Dual-sensor arrangment for inspecting slab of material
JP2003106934A (en) Device and method for measuring optical path length, device and method for measuring thickness, and device and method for measuring inclined component of refractive index distribution

Legal Events

Date Code Title Description
A300 Withdrawal of application because of no request for examination

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 20050405