JP2003223478A - 集積回路モデルの圧縮方法 - Google Patents

集積回路モデルの圧縮方法

Info

Publication number
JP2003223478A
JP2003223478A JP2002342700A JP2002342700A JP2003223478A JP 2003223478 A JP2003223478 A JP 2003223478A JP 2002342700 A JP2002342700 A JP 2002342700A JP 2002342700 A JP2002342700 A JP 2002342700A JP 2003223478 A JP2003223478 A JP 2003223478A
Authority
JP
Japan
Prior art keywords
net
nets
current
integrated circuit
model
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2002342700A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003223478A5 (cg-RX-API-DMAC7.html
Inventor
S Brandon Keller
エス・ブランドン・ケラー
Gregory Dennis Rogers
グレゴリー・デニス・ロジャース
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JP2003223478A publication Critical patent/JP2003223478A/ja
Publication of JP2003223478A5 publication Critical patent/JP2003223478A5/ja
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/36—Circuit design at the analogue level
    • G06F30/367—Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
JP2002342700A 2001-12-03 2002-11-26 集積回路モデルの圧縮方法 Withdrawn JP2003223478A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/998,174 2001-12-03
US09/998,174 US20030106030A1 (en) 2001-12-03 2001-12-03 Method and program product for compressing an electronic circuit model

Publications (2)

Publication Number Publication Date
JP2003223478A true JP2003223478A (ja) 2003-08-08
JP2003223478A5 JP2003223478A5 (cg-RX-API-DMAC7.html) 2005-12-22

Family

ID=25544878

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002342700A Withdrawn JP2003223478A (ja) 2001-12-03 2002-11-26 集積回路モデルの圧縮方法

Country Status (2)

Country Link
US (1) US20030106030A1 (cg-RX-API-DMAC7.html)
JP (1) JP2003223478A (cg-RX-API-DMAC7.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100895260B1 (ko) 2007-02-27 2009-04-29 포항공과대학교 산학협력단 회로 모델 축소 해석 방법
US8479131B2 (en) 2011-03-02 2013-07-02 International Business Machines Corporation Method of determining FET source/drain wire, contact, and diffusion resistances in the presence of multiple contacts

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7127688B2 (en) * 2003-10-03 2006-10-24 Cadence Design Systems, Inc. Method and apparatus for determining interactive electromagnetic effects among conductors of a multi-layer circuit
US8312879B2 (en) * 2006-10-16 2012-11-20 General Electric Company Method and apparatus for airway compensation control
US10402532B1 (en) * 2016-04-07 2019-09-03 Cadence Design Systems, Inc. Methods, systems, and computer program products for implementing an electronic design with electrical analyses with compensation circuit components
US10002220B2 (en) * 2016-04-27 2018-06-19 International Business Machines Corporation On the fly netlist compression in power analysis

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2136235B (en) * 1983-02-22 1986-07-09 Philips Electronic Associated Rc active filter device
US4916627A (en) * 1987-12-02 1990-04-10 International Business Machines Corporation Logic path length reduction using boolean minimization
US5696694A (en) * 1994-06-03 1997-12-09 Synopsys, Inc. Method and apparatus for estimating internal power consumption of an electronic circuit represented as netlist
US5568395A (en) * 1994-06-29 1996-10-22 Lsi Logic Corporation Modeling and estimating crosstalk noise and detecting false logic
US5903469A (en) * 1994-11-08 1999-05-11 Synopsys, Inc. Method of extracting layout parasitics for nets of an integrated circuit using a connectivity-based approach
US5896300A (en) * 1996-08-30 1999-04-20 Avant| Corporation Methods, apparatus and computer program products for performing post-layout verification of microelectronic circuits by filtering timing error bounds for layout critical nets
US5878053A (en) * 1997-06-09 1999-03-02 Synopsys, Inc. Hierarchial power network simulation and analysis tool for reliability testing of deep submicron IC designs
JP4153095B2 (ja) * 1998-08-07 2008-09-17 富士通株式会社 レイアウトデータ作成方法、レイアウトデータ作成装置、及び記録媒体
US6405348B1 (en) * 1999-10-27 2002-06-11 Synopsys, Inc. Deep sub-micron static timing analysis in the presence of crosstalk
US6536024B1 (en) * 2000-07-14 2003-03-18 International Business Machines Corporation Method for making integrated circuits having gated clock trees

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100895260B1 (ko) 2007-02-27 2009-04-29 포항공과대학교 산학협력단 회로 모델 축소 해석 방법
US8479131B2 (en) 2011-03-02 2013-07-02 International Business Machines Corporation Method of determining FET source/drain wire, contact, and diffusion resistances in the presence of multiple contacts

Also Published As

Publication number Publication date
US20030106030A1 (en) 2003-06-05

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