JP2003203220A5 - - Google Patents

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Publication number
JP2003203220A5
JP2003203220A5 JP2002000927A JP2002000927A JP2003203220A5 JP 2003203220 A5 JP2003203220 A5 JP 2003203220A5 JP 2002000927 A JP2002000927 A JP 2002000927A JP 2002000927 A JP2002000927 A JP 2002000927A JP 2003203220 A5 JP2003203220 A5 JP 2003203220A5
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Japan
Prior art keywords
reflection
image processing
luminance distribution
dimensional image
real object
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JP2002000927A
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Japanese (ja)
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JP3962588B2 (ja
JP2003203220A (ja
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Priority to JP2002000927A priority Critical patent/JP3962588B2/ja
Priority claimed from JP2002000927A external-priority patent/JP3962588B2/ja
Priority to US10/321,461 priority patent/US7200262B2/en
Publication of JP2003203220A publication Critical patent/JP2003203220A/ja
Publication of JP2003203220A5 publication Critical patent/JP2003203220A5/ja
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JP2002000927A 2002-01-07 2002-01-07 三次元画像処理方法、三次元画像処理装置、三次元画像処理システムおよび三次元画像処理プログラム Expired - Lifetime JP3962588B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2002000927A JP3962588B2 (ja) 2002-01-07 2002-01-07 三次元画像処理方法、三次元画像処理装置、三次元画像処理システムおよび三次元画像処理プログラム
US10/321,461 US7200262B2 (en) 2002-01-07 2002-12-18 3-dimensional image processing method, 3-dimensional image processing device, and 3-dimensional image processing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002000927A JP3962588B2 (ja) 2002-01-07 2002-01-07 三次元画像処理方法、三次元画像処理装置、三次元画像処理システムおよび三次元画像処理プログラム

Publications (3)

Publication Number Publication Date
JP2003203220A JP2003203220A (ja) 2003-07-18
JP2003203220A5 true JP2003203220A5 (enExample) 2005-06-23
JP3962588B2 JP3962588B2 (ja) 2007-08-22

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JP2002000927A Expired - Lifetime JP3962588B2 (ja) 2002-01-07 2002-01-07 三次元画像処理方法、三次元画像処理装置、三次元画像処理システムおよび三次元画像処理プログラム

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US (1) US7200262B2 (enExample)
JP (1) JP3962588B2 (enExample)

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JP6812271B2 (ja) 2017-02-27 2021-01-13 キヤノン株式会社 画像処理装置、画像処理方法およびプログラム
CN108537841B (zh) * 2017-03-03 2021-10-08 株式会社理光 一种机器人拾取的实现方法、装置及电子设备
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JP7463697B2 (ja) * 2019-11-01 2024-04-09 Ｔｏｐｐａｎホールディングス株式会社 光沢取得状態算出装置、光沢取得状態算出方法、光沢取得状態算出プログラム、端末及び光沢取得状態表示プログラム
CN114322842B (zh) * 2021-12-09 2023-08-18 中国石油大学(华东) 一种基于改进Phong模型的高反光零件测量方法及系统
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