JP2003149081A - Method of inspecting display device and inspecting apparatus using the same - Google Patents

Method of inspecting display device and inspecting apparatus using the same

Info

Publication number
JP2003149081A
JP2003149081A JP2001342894A JP2001342894A JP2003149081A JP 2003149081 A JP2003149081 A JP 2003149081A JP 2001342894 A JP2001342894 A JP 2001342894A JP 2001342894 A JP2001342894 A JP 2001342894A JP 2003149081 A JP2003149081 A JP 2003149081A
Authority
JP
Japan
Prior art keywords
display device
display
inspecting
dot
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001342894A
Other languages
Japanese (ja)
Inventor
Junta Asano
純太 浅野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP2001342894A priority Critical patent/JP2003149081A/en
Publication of JP2003149081A publication Critical patent/JP2003149081A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To perform highly accurate and detailed inspections on display devices, perform stable inspections by quantitatively evaluating the display devices, and determine the characteristics, etc., of manufacturing lines. SOLUTION: In a display device Zn 100 constituted of a plurality of dots (the minimum unit of a display area), each dot is lighted up and displayed for every dot to detect display characteristics such as luminance for every dot and form data. Analyses such as the comparison of the formed data are performed.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、表示装置の検査方
法およびそれを用いた検査装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a display device inspection method and an inspection device using the same.

【0002】[0002]

【従来の技術】従来の表示装置の検査においては、フリ
ッカー検査等、一部自動的にデータ化される検査項目は
あるものの、目視による感覚的な検査が主であった。
2. Description of the Related Art In the conventional inspection of a display device, although some inspection items are automatically converted into data, such as a flicker inspection, a visual sensory inspection is mainly used.

【0003】[0003]

【発明が解決しようとする課題】従来例のような目視検
査の場合、測定者の技術レベルにより合否基準が異なる
ため検査が安定しないこと、画面全体の表示特性の合否
は判定出来ても、どの画素がどの程度の不良であるか
や、不良画素の分布傾向はどうか等を把握し難いこと、
評価結果を定量的データとして蓄積し難いこと、製造ラ
インの特性の見極めまでは難しいこと、といった問題が
あった。
In the case of the visual inspection as in the conventional example, the inspection is not stable because the pass / fail criterion differs depending on the skill level of the measurer. It is difficult to understand how defective the pixels are, how the defective pixels are distributed, etc.
There are problems that it is difficult to accumulate the evaluation results as quantitative data, and it is difficult to determine the characteristics of the manufacturing line.

【0004】[0004]

【課題を解決するための手段】本願請求項1の発明は、
複数のドット(表示エリアの最小単位)で構成される表
示装置において、各ドットを1ドット毎に点灯表示して
いき、例えば輝度などの表示特性を1ドット毎に検出
し、データ化し、それらを比較する等の解析を行うこと
によって、例えば表示ムラや点欠陥等を検出する検査方
法、であることを特徴とする。
The invention according to claim 1 of the present application is as follows.
In a display device composed of a plurality of dots (minimum unit of display area), each dot is lit up and displayed for each dot, and display characteristics such as brightness are detected for each dot and converted into data, which are displayed. The method is an inspection method for detecting, for example, display unevenness and point defects by performing analysis such as comparison.

【0005】本願請求項2の発明は、複数のピクセル
(白表示を行うことが出来る表示エリアの最小単位で一
般にRGBの3ドットで構成されることが多いがここで
はそれに限らない)で構成される表示装置において、各
ピクセルを1ピクセル毎に点灯表示していき、例えば輝
度などの表示特性を1ピクセル毎に検出し、データ化
し、それらを比較する等の解析を行うことによって、例
えば表示ムラや点欠陥等を検出する検査方法、であるこ
とを特徴とする。
The invention according to claim 2 of the present application is composed of a plurality of pixels (the smallest unit of the display area capable of displaying white is generally composed of 3 dots of RGB, but is not limited thereto). In a display device according to the present invention, each pixel is lit and displayed for each pixel, and display characteristics such as brightness are detected for each pixel, converted into data, and analyzed such as comparing them to obtain display unevenness. And an inspection method for detecting point defects and the like.

【0006】本願請求項3の発明は、請求項1若しくは
請求項2記載の検査方法を自動的に行う検査装置、であ
ることを特徴とする。
The invention of claim 3 of the present application is an inspection apparatus for automatically performing the inspection method according to claim 1 or 2.

【0007】上記の検査方法または検査装置を用いて作
製された表示装置は、表示ムラや点欠陥等が著しく少な
い。
A display device manufactured by using the above-described inspection method or inspection device has extremely few display unevenness and point defects.

【0008】[0008]

【発明の実施の形態】本発明第1における表示装置の検
査方法は、具体的手段が本発明第2における表示装置の
検査方法と同じであると考えられること、との理由によ
り、本発明第2における表示装置の検査方法を、本発明
弟3における表示装置の検査装置を用いて検査する場合
をもって、発明の実施の形態の説明とする。なお説明に
は図1〜図4を用いる。
BEST MODE FOR CARRYING OUT THE INVENTION The method for inspecting a display device according to the first aspect of the present invention is considered to have the same concrete means as the method for inspecting the display device according to the second aspect of the present invention. The case of inspecting the display device inspection method in 2 using the display device inspection device in 3 of the present invention will be an embodiment of the invention. 1 to 4 are used for the description.

【0009】ここでは、ピクセル毎の輝度を測定し、表
示装置の輝度バラツキの分布傾向を求めるまでを例に説
明するが、この発明は輝度バラツキのみではなく、色味
の分布や、黒点数、輝点数など表示装置の様々な特性の
検査に利用することが出来る。 また、特に表示装置の
種類を限定せずに説明をするが、液晶表示装置、プラズ
マ表示装置、有機EL表示装置等、複数のドット若しく
はピクセルで構成されるあらゆる表示装置で利用できる
検査方法である。
Here, description will be made by taking as an example the steps of measuring the luminance of each pixel and obtaining the distribution tendency of the luminance variation of the display device. However, the present invention is not limited to the luminance variation, but also the color tone distribution, the number of black dots, It can be used to inspect various characteristics of display devices such as the number of bright spots. Further, although the description will be made without particularly limiting the type of the display device, it is an inspection method that can be used in any display device including a plurality of dots or pixels such as a liquid crystal display device, a plasma display device, an organic EL display device, and the like. .

【0010】図1には検査全体のイメージ図を示す。信
号発生器300から信号を送り、Zn枚目の表示装置1
00の(Xl、Ym)座標のピクセル101のみを、あ
る階調301で点灯させている。そしてピクセル101
の輝度を測定器200でピックアップし、計算機400
で処理している。また信号発生器300も計算機400
で制御しているので、測定結果は自動的にZ枚目(X、
Y)座標ピクセルの輝度として、データ化される。この
操作をZn枚目の表示装置100の全てのピクセルに対
し順次行い、更に全ての表示装置に対し同じ測定を行っ
ていく。Zn枚目の表示装置100の各ピクセルの輝度
をグラフ化したのが、グラフ500である。
FIG. 1 shows an image diagram of the entire inspection. A signal is sent from the signal generator 300 to display the Zn-th display device 1
Only the pixel 101 having the (X1, Ym) coordinate of 00 is turned on with a certain gradation 301. And pixel 101
The brightness of the light is picked up by the measuring device 200, and the calculator 400
Is being processed in. The signal generator 300 is also a computer 400.
Since it is controlled by, the measurement result is automatically displayed on the Zth sheet (X,
Y) Data is obtained as the luminance of the coordinate pixel. This operation is sequentially performed for all pixels of the Zn-th display device 100, and the same measurement is performed for all display devices. A graph 500 is a graph of the brightness of each pixel of the Zn-th display device 100.

【0011】図2にグラフ500の詳細を示す。ある階
調301であるピクセル(X、Y)を点灯した場合、そ
のピクセルが正常であれば輝度501になるとする。輝
度バラツキの許容範囲を502とすると、一目瞭然で5
03、504、505は不良と判断できる。特に504
は黒点、505は輝点である。
The details of graph 500 are shown in FIG. When a pixel (X, Y) having a certain gradation 301 is turned on, if the pixel is normal, the luminance becomes 501. If the allowable range of brightness variation is 502, it is 5 at a glance.
03, 504, and 505 can be judged to be defective. Especially 504
Is a black dot and 505 is a bright dot.

【0012】図3はZn枚目の表示装置の各ピクセルの
輝度データをピクセルの座標に当てはめた輝度分布図6
00である。輝度分布図600では表示装置の輝度分布
がより正確明瞭にわかる。図4は検査した表示装置全て
の輝度分布図600を重ね合わせた、輝度分布傾向図7
00である。こうすることで表示装置の輝度分布の傾向
が鮮明に浮かび上がってくる。輝度分布傾向図700の
場合は斜めに輝度ムラが存在している。この製造ライン
で流した表示装置には斜めに輝度ムラが出る傾向がある
ことを示唆している。
FIG. 3 is a luminance distribution diagram in which the luminance data of each pixel of the Zn-th display device is applied to the coordinates of the pixel.
00. In the luminance distribution diagram 600, the luminance distribution of the display device can be understood more accurately and clearly. FIG. 4 is a luminance distribution tendency diagram 7 obtained by superimposing the luminance distribution diagrams 600 of all the inspected display devices.
00. By doing so, the tendency of the luminance distribution of the display device becomes clear. In the case of the luminance distribution tendency diagram 700, there is diagonal luminance unevenness. It is suggested that the display device which is made to flow in this manufacturing line tends to have uneven brightness in a diagonal direction.

【0013】[0013]

【発明の効果】本発明によれば、表示装置の検査を精度
良く詳細に行う事が可能であり、表示装置の定量的な評
価を行うことが出来るため、測定者の技術レベルに依存
することなく安定した検査を行うことが可能である。ま
た、データを蓄積することが容易であるため、製造ライ
ンの特性などを見極めることも可能となる。
According to the present invention, the display device can be inspected accurately and in detail, and the display device can be quantitatively evaluated, so that it depends on the skill level of the measurer. It is possible to perform a stable inspection without Moreover, since it is easy to store data, it is possible to determine the characteristics of the manufacturing line.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施の形態1、実施の形態2、実施の
形態3における測定系を示す図
FIG. 1 is a diagram showing a measurement system according to a first embodiment, a second embodiment, and a third embodiment of the present invention.

【図2】本発明の実施の形態1、実施の形態2、実施の
形態3における測定データを示す図
FIG. 2 is a diagram showing measurement data according to the first embodiment, the second embodiment, and the third embodiment of the present invention.

【図3】本発明の実施の形態1、実施の形態2、実施の
形態3における輝度分布図
FIG. 3 is a luminance distribution diagram in the first, second and third embodiments of the present invention.

【図4】本発明の実施の形態1、実施の形態2、実施の
形態3における輝度分布傾向図
FIG. 4 is a luminance distribution tendency chart in the first, second and third embodiments of the present invention.

【符号の説明】[Explanation of symbols]

100 表示装置Zn 101 (Xl、Ym)座標点灯ピクセル 200 輝度計 300 信号発生器 301 輝度測定に使用するある階調 400 計算機 500 表示装置Znの輝度−座標データ 501 階調301で点灯したときの所望の輝度 502 輝度バラツキ許容範囲 503 不良ピクセル 504 不良ピクセル(黒点) 505 不良ピクセル(輝点) 600 表示装置Znの輝度分布図 700 測定した表示装置全ての輝度分布傾向図 100 display device Zn 101 (Xl, Ym) coordinate lighting pixel 200 luminance meter 300 signal generator 301 Some gradation used for luminance measurement 400 calculator 500 Luminance-coordinate data of display device Zn 501 desired brightness when lit with gradation 301 502 Brightness variation allowable range 503 bad pixel 504 defective pixel (black dot) 505 defective pixel (bright spot) 600 Brightness distribution diagram of display device Zn 700 Luminance distribution trend diagram of all measured display devices

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) G09G 3/20 G09G 3/20 670Q 5G435 3/36 3/36 Fターム(参考) 2G020 AA08 DA02 DA03 DA04 DA23 DA31 DA34 DA35 DA42 2G086 EE10 2H088 FA13 FA25 FA30 MA20 5C006 AA11 AA22 AF45 AF51 AF53 AF54 BB11 BF14 BF15 BF39 EB01 EB04 5C080 AA05 AA06 AA10 BB05 CC03 DD15 DD28 JJ01 JJ02 JJ05 5G435 AA17 CC09 CC12 KK05 KK10─────────────────────────────────────────────────── ─── Continuation of front page (51) Int.Cl. 7 Identification code FI theme code (reference) G09G 3/20 G09G 3/20 670Q 5G435 3/36 3/36 F term (reference) 2G020 AA08 DA02 DA03 DA04 DA23 DA31 DA34 DA35 DA42 2G086 EE10 2H088 FA13 FA25 FA30 MA20 5C006 AA11 AA22 AF45 AF51 AF53 AF54 BB11 BF14 BF15 BF39 EB01 EB04 5C080 AA05 AA06 AA10 BB05 CC03 DD15 DD28 JJ01 JJ02 JJ05 CC0910AKK

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 複数のドット(表示エリアの最小単位)
で構成される表示装置の検査方法であって、前記複数の
ドットを1ドット毎に点灯表示していき、輝度、色度、
色味などの表示特性を1ドット毎に検出し、データ化し
て、解析を行うことによって、表示装置の表示ムラや点
欠陥を検出することを特徴とする表示装置の検査方法。
1. A plurality of dots (minimum unit of display area)
A method of inspecting a display device, comprising: illuminating and displaying the plurality of dots for each dot,
A method for inspecting a display device, which comprises detecting display characteristics such as color tone for each dot, converting the data into data, and performing analysis to detect display unevenness and point defects of the display device.
【請求項2】 複数のドットで構成される表示画素(ピ
クセル)を配置した表示装置の検査方法であって、前記
表示画素を1表示画素毎に点灯表示していき、輝度、色
度、色味などの表示特性を1表示画素毎に検出し、デー
タ化して、解析を行うことによって、表示装置の表示ム
ラや点欠陥を検出することを特徴とする表示装置の検査
方法。
2. A method for inspecting a display device in which display pixels (pixels) each including a plurality of dots are arranged, wherein the display pixels are lit and displayed for each display pixel, and the luminance, chromaticity, and color are displayed. A method for inspecting a display device, which comprises detecting display characteristics such as taste for each display pixel, converting the data into data, and performing analysis to detect display unevenness and point defects in the display device.
【請求項3】 請求項1または請求項2のいずれかに記
載の検査方法を有する検査装置。
3. An inspection apparatus having the inspection method according to claim 1.
JP2001342894A 2001-11-08 2001-11-08 Method of inspecting display device and inspecting apparatus using the same Pending JP2003149081A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001342894A JP2003149081A (en) 2001-11-08 2001-11-08 Method of inspecting display device and inspecting apparatus using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001342894A JP2003149081A (en) 2001-11-08 2001-11-08 Method of inspecting display device and inspecting apparatus using the same

Publications (1)

Publication Number Publication Date
JP2003149081A true JP2003149081A (en) 2003-05-21

Family

ID=19156674

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001342894A Pending JP2003149081A (en) 2001-11-08 2001-11-08 Method of inspecting display device and inspecting apparatus using the same

Country Status (1)

Country Link
JP (1) JP2003149081A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007018876A (en) * 2005-07-07 2007-01-25 Eastman Kodak Co Manufacturing method of organic el display device
EP1840864A1 (en) * 2006-03-27 2007-10-03 Funai Electric Co., Ltd. Display apparatus, burn-in correction system and burn-in correction method
JP2009527018A (en) * 2006-02-15 2009-07-23 ドウジン セミケム カンパニー リミテッド Inspection system and inspection method for flat panel display device
JP2014157108A (en) * 2013-02-18 2014-08-28 Oji Holdings Corp Polarization analyzer for evaluating depolarization effect

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007018876A (en) * 2005-07-07 2007-01-25 Eastman Kodak Co Manufacturing method of organic el display device
JP2009527018A (en) * 2006-02-15 2009-07-23 ドウジン セミケム カンパニー リミテッド Inspection system and inspection method for flat panel display device
EP1840864A1 (en) * 2006-03-27 2007-10-03 Funai Electric Co., Ltd. Display apparatus, burn-in correction system and burn-in correction method
JP2007264088A (en) * 2006-03-27 2007-10-11 Funai Electric Co Ltd Display device, image persistence correction system, and image persistence correction method
JP2014157108A (en) * 2013-02-18 2014-08-28 Oji Holdings Corp Polarization analyzer for evaluating depolarization effect

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