JP2003109925A - Wafer polishing device - Google Patents

Wafer polishing device

Info

Publication number
JP2003109925A
JP2003109925A JP2001302161A JP2001302161A JP2003109925A JP 2003109925 A JP2003109925 A JP 2003109925A JP 2001302161 A JP2001302161 A JP 2001302161A JP 2001302161 A JP2001302161 A JP 2001302161A JP 2003109925 A JP2003109925 A JP 2003109925A
Authority
JP
Japan
Prior art keywords
wafer
synthetic resin
wafer loading
pair
loading hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001302161A
Other languages
Japanese (ja)
Other versions
JP3552108B2 (en
Inventor
Yukinori Kida
行則 木田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KIDA KOGYO KK
Original Assignee
KIDA KOGYO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KIDA KOGYO KK filed Critical KIDA KOGYO KK
Priority to JP2001302161A priority Critical patent/JP3552108B2/en
Publication of JP2003109925A publication Critical patent/JP2003109925A/en
Application granted granted Critical
Publication of JP3552108B2 publication Critical patent/JP3552108B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a wafer polishing device which is capable of surely holding a polished semiconductor wafer in a wafer loading hollow provided to a disk and surely polishing the semiconductor wafer. SOLUTION: In a wafer polishing device, semiconductor wafers 5 are each loaded into a loading hollow 4 provided to a metal disk 2, a polishing disk is made to bear against the surfaces of the semiconductor wafers 5 which are uncovered in the openings of the wafer loading hollows 4 while the metal disk 2 is rotated. A synthetic resin protective ring 7 is internally provided along the inner circumferential edge of each wafer loading hollow 4, outward protruding teeth 8 provided to the outer circumferential edge of the ring 7 are so set as to be engaged with inward protruding teeth 9 provided to the inner circumferential edge of the wafer loading hollow 4, and the outward protruding teeth 8 are engaged with the inward protruding teeth 9 to form a first sloping pair 10 which prevents the ring 7 from coming out upward from the wafer loading hollow 4 and a second sloping pair 11 which prevents the ring 7 from coming out downward from the wafer loading hollow 4.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】この発明は半導体ウエハの研
磨装置、殊に研磨に供する半導体ウエハのウエハ装填穴
に合成樹脂製保護リングを設けた特開2000−155
65号の改善に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor wafer polishing apparatus, and more particularly, to a synthetic resin protective ring provided in a wafer loading hole of a semiconductor wafer to be polished.
Regarding the improvement of No. 65.

【0002】[0002]

【従来の技術】特開2000−15565号及び特開2
000−15566号は、この種半導体ウエハの研磨装
置の代表例を示している。この研磨装置は図1,図2に
示すように、中心部に設けた駆動歯車1に歯車構造の複
数の遊星円盤2を咬合し、更に全円盤2の外接円上に各
円盤2と咬合する環状歯車3を配して駆動歯車1の回転
に伴い各円盤2を自転させつつ公転させるようにし、他
方各円盤2の同心円上に配した複数のウエハ装填穴4内
に半導体ウエハ5を装填し、上記の如く円盤2を回転
(自転と公転)させつつウエハ装填穴4の開口面より露
出する半導体ウエハの上下表面に研磨盤6を当接し表面
研磨を行う構造のものが用いられている。即ち円盤2に
保有された半導体ウエハ5を上下研磨盤6で挟持しつつ
円盤2と半導体ウエハ5を回転させつつ研磨を行ってい
る。
2. Description of the Related Art Japanese Unexamined Patent Publication Nos. 2000-15565 and 2
No. 000-15566 shows a typical example of this type of semiconductor wafer polishing apparatus. As shown in FIGS. 1 and 2, this polishing apparatus engages a plurality of planetary discs 2 having a gear structure with a drive gear 1 provided at the center, and further engages with each disc 2 on the circumscribed circle of the whole disc 2. An annular gear 3 is arranged so that each disk 2 revolves while revolving with the rotation of the drive gear 1, while the semiconductor wafer 5 is loaded into a plurality of wafer loading holes 4 arranged concentrically on each disk 2. As described above, a structure is used in which the disc 2 is rotated (rotated and revolved) and the polishing disc 6 is brought into contact with the upper and lower surfaces of the semiconductor wafer exposed from the opening face of the wafer loading hole 4 to perform surface polishing. That is, the semiconductor wafer 5 held on the disk 2 is sandwiched between the upper and lower polishing disks 6, and the disk 2 and the semiconductor wafer 5 are rotated and polished.

【0003】而して上記2000−15565号は、上
記金属製の円盤2に設けたウエハ装填穴4の内周縁に合
成樹脂製保護リングを内設し、半導体ウエハ5の表面に
金属粉末が転移し鏡面研磨を適正に行い難くする問題を
是正し、更に装填時と研磨時における半導体ウエハ5の
保護を図っている。
In the above 2000-15565, a protective ring made of synthetic resin is provided at the inner peripheral edge of the wafer loading hole 4 formed in the metal disk 2, and the metal powder is transferred to the surface of the semiconductor wafer 5. The problem that makes it difficult to properly perform mirror polishing is corrected, and the semiconductor wafer 5 is protected during loading and polishing.

【0004】[0004]

【発明が解決しようとする課題】然るに上記2000−
15565号においては、ウエハ装填穴4と合成樹脂製
保護リング7とを凹凸により圧入する嵌合構造を採って
いるが、この単なる圧入構造(しまり嵌め構造)では合
成樹脂製保護リングの回転は阻止されるが、合成樹脂製
保護リングの上方向と下方向への脱落と変形を禁じ得な
い。
However, the above 2000-
The No. 15565 has a fitting structure in which the wafer loading hole 4 and the synthetic resin protective ring 7 are press-fitted by concavo-convex. However, this simple press-fitting structure (tight fit structure) prevents the synthetic resin protective ring from rotating. However, it is inevitable that the protective ring made of synthetic resin will fall and deform upward and downward.

【0005】又合成樹脂製保護リングの柔軟性により、
中心方向への撓みによる脱落と変形の恐れを有してい
る。
Moreover, due to the flexibility of the synthetic resin protective ring,
There is a risk of falling and deformation due to bending toward the center.

【0006】上記合成樹脂製保護リングの研磨作業中に
おける上下方向と中心方向への変形は、半導体ウエハ5
の研磨の支障となる。
During the polishing operation of the synthetic resin protective ring, the semiconductor wafer 5 is deformed in the vertical direction and the central direction.
Will hinder the polishing.

【0007】[0007]

【課題を解決するための手段】本発明は上記特開200
0−15565号が有する問題点を適切に解決するウエ
ハ研磨装置を提供するものである。
SUMMARY OF THE INVENTION
The present invention provides a wafer polishing apparatus that appropriately solves the problems of No. 0-15565.

【0008】要述すると本発明は金属製の円盤に設けた
ウエハ装填穴に半導体ウエハ(シリコンウエハ)を装填
し、該円盤を回転させつつウエハ装填穴の開口面より露
出する半導体ウエハの表面に研磨盤を当接し表面研磨を
行う場合に、上記ウエハ装填穴の内周縁に沿い合成樹脂
製保護リングを内設し、該合成樹脂製保護リングの外周
縁に設けた複数の外向き凸歯と上記ウエハ装填穴の内周
縁に設けた複数の内向き凸歯とを咬合構造にする。
In summary, according to the present invention, a semiconductor wafer (silicon wafer) is loaded into a wafer loading hole provided in a metal disk, and the surface of the semiconductor wafer exposed from the opening surface of the wafer loading hole is rotated while the disk is rotated. When a polishing disk is abutted to perform surface polishing, a synthetic resin protective ring is provided inside along the inner peripheral edge of the wafer loading hole, and a plurality of outwardly projecting teeth provided on the outer peripheral edge of the synthetic resin protective ring. The plurality of inwardly projecting teeth provided on the inner peripheral edge of the wafer loading hole are in an occlusal structure.

【0009】そして上記合成樹脂製リングの外向き凸歯
と金属製円盤に設けたウエハ装填穴の内向き凸歯の咬合
面に互いに係合して合成樹脂製保護リングのウエハ装填
穴からの上方への抜け止めを図る第1傾斜面対を形成す
ると共に、同咬合面に互いに係合して合成樹脂製保護リ
ングのウエハ装填穴からの下方への抜け止めを図る第2
傾斜面対を形成し、第1,第2傾斜面対により上下方向
への変形と脱落を有効に防止する。
The outer convex teeth of the synthetic resin ring and the occlusal surfaces of the inner convex teeth of the wafer loading hole provided on the metal disk are engaged with each other to move the synthetic resin protection ring upward from the wafer loading hole. A pair of inclined surfaces is formed to prevent the synthetic resin protective ring from slipping downward from the wafer loading hole by engaging with the same occlusal surface.
A pair of inclined surfaces is formed, and the first and second pairs of inclined surfaces effectively prevent vertical deformation and falling.

【0010】適例として上記第1傾斜面対は上記外向き
凸歯と内向き凸歯の一側咬合面に形成すると共に、上記
第2傾斜面対は同他側咬合面に形成する。
As a suitable example, the first inclined surface pair is formed on one occlusal surface of the outward convex tooth and the inward convex tooth, and the second inclined surface pair is formed on the other occlusal surface thereof.

【0011】他例として上記第1傾斜面対は凸歯間の歯
みぞの底面とこれに嵌合する凸歯の先端面に形成すると
共に、上記第2傾斜面対は他の凸歯間の歯みぞの底面と
これに嵌合する凸歯の先端面に形成する。
As another example, the first inclined surface pair is formed on the bottom surface of the groove between the convex teeth and the tip end surface of the convex tooth fitted thereto, and the second inclined surface pair is formed between the other convex teeth. It is formed on the bottom surface of the tooth groove and the tip surface of the convex tooth fitted to this.

【0012】更に上記内向き凸歯と上記外向き凸歯の歯
厚を歯元側から歯先側へ漸次拡大する形状にして両凸歯
の両側面に、互いに係合し合成樹脂製保護リングの中心
方向(内方)への抜け止めを図る中心方向へ傾斜せる第
3傾斜面対を形成して、上記第1,第2傾斜面対と協働
し合成樹脂製リングの各方向への脱落と変形を有効に防
止する。
Further, the tooth thicknesses of the inwardly convex teeth and the outwardly convex teeth are formed so as to gradually increase from the root side to the tip side, and both side surfaces of both convex teeth are engaged with each other to make a synthetic resin protective ring. The third pair of inclined surfaces is formed so as to incline toward the center (inward) to prevent the synthetic resin ring from colliding with each other in cooperation with the pair of first and second inclined surfaces. Effectively prevent falling and deformation.

【0013】上記合成樹脂製保護リングは予め成形し準
備したものを組み込むか、又は上記内向き凸歯を有する
ウエハ装填穴の内周縁に合成樹脂を型込めし硬化して形
成し、寸法誤差によるガタを解消し上記第1乃至第3傾
斜面対による規制効果を遺憾なく発揮せしめる。
The synthetic resin protective ring may be prepared by molding in advance, or may be formed by molding a synthetic resin into the inner peripheral edge of the wafer loading hole having the inwardly projecting teeth and curing the synthetic resin to prevent dimensional error. The backlash is eliminated and the regulation effect of the first to third inclined surface pairs is fully exhibited.

【0014】[0014]

【発明の実施の形態】前記のように本発明は上記特開2
000−15565号が有する問題点を適切に解決する
ウエハ研磨装置を提供する。
BEST MODE FOR CARRYING OUT THE INVENTION As described above, the present invention is disclosed in
Provided is a wafer polishing apparatus that appropriately solves the problems of 000-15565.

【0015】このウエハ研磨装置は、図1,図2に示
し、且つ図3,図4に示すように、中心部に設けた駆動
歯車1に歯車構造の複数の遊星円盤2を咬合し、更に全
円盤2の外接円上に各円盤2と咬合する環状歯車3を配
して駆動歯車1の回転に伴い各円盤2を自転させつつ公
転させるようにし、他方各円盤2の同心円上に配した複
数のウエハ装填穴4内に半導体ウエハ5を装填し、上記
の如く円盤2を回転(自転と公転)させつつウエハ装填
穴4の開口面より露出する半導体ウエハの上下表面に研
磨盤6を当接し表面研磨を行う構造のものに実施可能で
ある他、半導体ウエハ5を円盤2のウエハ装填穴4内に
保持させてこれを回転(公転又は/及び自転)させて研
磨盤6を当接させ、半導体ウエハ5の片面又は両面の研
磨を行うその他の研磨装置に適用可能である。
In this wafer polishing apparatus, as shown in FIGS. 1 and 2, and as shown in FIGS. 3 and 4, a plurality of planetary disks 2 having a gear structure are engaged with a drive gear 1 provided at the center, and further, On the circumscribed circle of the whole disc 2, an annular gear 3 that meshes with each disc 2 is arranged so that each disc 2 revolves around its own axis as the drive gear 1 rotates, while it is arranged on the concentric circle of each disc 2. The semiconductor wafer 5 is loaded into the plurality of wafer loading holes 4, and the polishing disk 6 is attached to the upper and lower surfaces of the semiconductor wafer exposed from the opening surface of the wafer loading hole 4 while rotating (rotating and revolving) the disk 2 as described above. In addition to the structure of contacting and polishing the surface, the semiconductor wafer 5 is held in the wafer loading hole 4 of the disk 2 and rotated (revolved and / or rotated) to bring the polishing plate 6 into contact. , Other polishing for polishing one or both sides of the semiconductor wafer 5. Device which can be applied to.

【0016】上記例示の金属製の円盤2に設けたウエハ
装填穴4に半導体ウエハ5を装填し、該円盤2を回転さ
せつつウエハ装填穴4の開口面より露出する半導体ウエ
ハ5の表面に研磨盤6を当接し表面研磨を行う場合に、
上記ウエハ装填穴4の内周縁に沿い合成樹脂製保護リン
グ7を内設し、該合成樹脂製保護リング7の外周縁に設
けた複数の外向き凸歯8と上記ウエハ装填穴4の内周縁
に設けた複数の内向き凸歯9とを咬合構造にする。
The semiconductor wafer 5 is loaded into the wafer loading hole 4 provided in the above-described metal disk 2 and the surface of the semiconductor wafer 5 exposed from the opening surface of the wafer loading hole 4 is polished while rotating the disk 2. When the disk 6 is contacted and the surface is polished,
A synthetic resin protective ring 7 is provided along the inner peripheral edge of the wafer loading hole 4, and a plurality of outwardly projecting teeth 8 provided on the outer peripheral edge of the synthetic resin protective ring 7 and the inner peripheral edge of the wafer loading hole 4. And the plurality of inwardly projecting teeth 9 provided on the above are formed into an occlusal structure.

【0017】歯車の咬合構造と同様、外向き凸歯8と内
向き凸歯9は各凸歯8,9間の歯みぞ12,13内に相
互に嵌合し、上記咬合構造を形成している。
Similar to the gear meshing structure, the outwardly projecting teeth 8 and the inwardly projecting teeth 9 are fitted in the tooth grooves 12, 13 between the respective projecting teeth 8, 9 to form the above-mentioned meshing structure. There is.

【0018】そして上記合成樹脂製リング7の外向き凸
歯8と金属製円盤2に設けたウエハ装填穴4の内向き凸
歯9の咬合面に互いに係合して合成樹脂製保護リング7
のウエハ装填穴4からの上方への抜け止めを図る第1傾
斜面対10を形成すると共に、同咬合面に互いに係合し
て合成樹脂製保護リング7のウエハ装填穴4からの下方
への抜け止めを図る第2傾斜面対11を形成し、第1,
第2傾斜面対10,11により上下方向への変形と脱落
を有効に防止する。
Then, the outer convex teeth 8 of the synthetic resin ring 7 and the occlusal surfaces of the inner convex teeth 9 of the wafer loading hole 4 formed in the metal disk 2 are engaged with each other and the synthetic resin protective ring 7 is formed.
Of the first inclined surface pair 10 for preventing the upper side of the wafer loading hole 4 from coming off, and engaging the interlocking surfaces with each other to prevent the synthetic resin protection ring 7 from moving downward from the wafer loading hole 4. The second pair of inclined surfaces 11 for preventing coming off is formed,
The pair of second inclined surfaces 10 and 11 effectively prevent vertical deformation and falling.

【0019】図5乃至図8に示すように、上記咬合面と
は外向き凸歯8と内向き凸歯9の側面14,15(一側
咬合面と他側咬合面)を意味する他、各歯みぞ12,1
3の底面16と各凸歯8,9の先端面17の咬合面を含
む。即ち各凸歯8,9の三辺の側面と先端面と底面14
乃至17の何れかにおいて上記第1,第2傾斜面対1
0,11を形成する場合を含む。
As shown in FIGS. 5 to 8, the occlusal surfaces mean side surfaces 14 and 15 (one side occlusal surface and the other side occlusal surface) of the outward convex tooth 8 and the inward convex tooth 9, respectively. Each tooth groove 12,1
3 and the occlusal surface of the tip surface 17 of each convex tooth 8 and 9. That is, the three side surfaces, the tip surface, and the bottom surface 14 of each convex tooth 8 and 9 are formed.
1 to 17, the first and second inclined surface pairs 1
Including the case of forming 0 and 11.

【0020】再述すると上記第1傾斜面対10は、上記
外向き凸歯8と内向き凸歯9の一側面14,15に形成
すると共に、上記第2傾斜面対11は同他側面14,1
5に形成する。他例として上記第1傾斜面対10は凸歯
8,9間の歯みぞ12,13の底面16と各凸歯8,9
の先端面17とに形成すると共に、上記第2傾斜面対1
1は他の凸歯8,9間の歯みぞ12,13の底面16と
他の凸歯8,9の先端面17に形成する。
To restate, the first inclined surface pair 10 is formed on one side surface 14, 15 of the outward convex tooth 8 and the inward convex tooth 9, and the second inclined surface pair 11 is formed on the other side surface 14 thereof. , 1
5 to form. As another example, the first pair of inclined surfaces 10 includes the bottom surface 16 of the tooth groove 12, 13 between the convex teeth 8 and 9 and the convex teeth 8 and 9 respectively.
And the second inclined surface pair 1
1 is formed on the bottom surfaces 16 of the tooth grooves 12, 13 between the other convex teeth 8 and 9 and the tip surfaces 17 of the other convex teeth 8 and 9.

【0021】上記凸歯8,9は高密度ピッチで環状に形
成し、隣接する凸歯8,9間において上記互いに係合す
る第1,第2傾斜面対10,11を交互に形成すること
が望ましい。
The convex teeth 8 and 9 are formed in a ring shape with a high density pitch, and the adjacent first and second inclined surface pairs 10 and 11 which engage with each other are alternately formed between the adjacent convex teeth 8 and 9. Is desirable.

【0022】一例として図6に示すように、内向き凸歯
9として断面視(ピッチ円上の断面視)台形凸歯と逆台
形凸歯を交互に形成し、該台形凸歯と逆台形凸歯間に嵌
合する外向き凸歯8を交互に正平行四辺形と逆平行四辺
形にする。
As an example, as shown in FIG. 6, as the inward convex teeth 9, trapezoidal convex teeth and inverted trapezoidal convex teeth are alternately formed in a cross-sectional view (cross-sectional view on a pitch circle), and the trapezoidal convex teeth and the inverted trapezoidal convex teeth are formed. The outwardly convex teeth 8 fitted between the teeth are alternately formed into a regular parallelogram and an anti-parallelogram.

【0023】又は図6とは逆に、外向き凸歯8として断
面視(ピッチ円上の断面視)台形凸歯と逆台形凸歯を交
互に形成し、該台形凸歯と逆台形凸歯間に嵌合する内向
き凸歯9を交互に正平行四辺形と逆平行四辺形にする。
Alternatively, conversely to FIG. 6, trapezoidal convex teeth and inverted trapezoidal convex teeth are alternately formed in cross-section (cross-sectional view on a pitch circle) as the outward convex teeth 8, and the trapezoidal convex teeth and the inverted trapezoidal convex teeth are formed. The inwardly projecting teeth 9 fitted between them are alternately formed into a regular parallelogram and an antiparallelogram.

【0024】正平行四辺形と逆平行四辺形とはピッチ円
方向において対向する二辺(凸歯の左右側面)の傾斜方
向が互いに逆方向の平行四辺形を意味する。
The regular parallelogram and the antiparallel parallelogram mean parallelograms in which two sides (left and right side surfaces of the convex tooth) facing each other in the pitch circle direction have opposite inclination directions.

【0025】上記図6に示す構造によって、逆台形の内
向き凸歯9(又は外向き凸歯8)のピッチ円方向におい
て上方から下方へ傾斜せる両側面14(又は15)と、
各側面に隣接する正方向と逆方向の平行四辺形の外向き
凸歯8(又は内向き凸歯9)の同調傾斜せる各側面15
(又は14)とを係合させて上方向への抜け止めを図る
第1傾斜面対10を形成し、更に正台形の内向き凸歯9
(又は外向き凸歯8)のピッチ円方向において上方から
下方へ傾斜せる両側面14(又は15)と、各側面に隣
接する正方向と逆方向の平行四辺形の外向き凸歯8(又
は内向き凸歯9)の同調傾斜せる各側面15(又は1
4)とを係合させて下方向への抜け止めを図る第2傾斜
面対11を形成する。
By the structure shown in FIG. 6, both side surfaces 14 (or 15) inclined from the upper side to the lower side in the pitch circle direction of the inverted trapezoidal inwardly projecting teeth 9 (or outwardly projecting teeth 8),
Adjacent to each side face, each side face 15 of the parallelogram outward convex tooth 8 (or inward convex tooth 9) in the forward and reverse directions, which is tuned and inclined,
(Or 14) is engaged to form a first inclined surface pair 10 for preventing upward disengagement, and further, a trapezoidal inward convex tooth 9 is formed.
(Or outward convex teeth 8) both side surfaces 14 (or 15) inclined from the upper side to the lower side in the pitch circle direction, and the parallelogram outward convex teeth 8 (or 15) adjacent to each side surface in the forward and reverse directions (or Each side surface 15 (or 1) of the inwardly convex tooth 9) which is inclined to be tuned
4) to form a second inclined surface pair 11 which is engaged with and prevents the downward slant.

【0026】他例として図7に示すように、外向き凸歯
8と内向き凸歯9の両側面14,15の全てをピッチ円
方向において上方から下方へ同調して傾斜させ、同各凸
歯8,9の隣接する一側面と他側面14,15に形成さ
れた同調する傾斜面を互いに係合させ、上記ウエハ装填
穴4の上方向(ウエハ装填穴4の上部開口面)と下方向
(ウエハ装填穴4の下部開口面)への抜け止めを図る第
1傾斜面対10と第2傾斜面対11を形成する。
As another example, as shown in FIG. 7, all of both side surfaces 14 and 15 of the outwardly projecting tooth 8 and the inwardly projecting tooth 9 are tilted in synchronization with each other from the upper side to the lower side in the pitch circle direction. The adjacent one side surfaces of the teeth 8 and 9 and the synchronized inclined surfaces formed on the other side surfaces 14 and 15 are engaged with each other, and the upper direction (upper opening surface of the wafer loading hole 4) and the lower direction of the wafer loading hole 4 are engaged with each other. A first inclined surface pair 10 and a second inclined surface pair 11 are formed to prevent the wafer from being removed from the lower opening surface of the wafer loading hole 4.

【0027】他例として図8に示すように、内向き凸歯
9と外向き凸歯8の隣接する一側面14,15のみをピ
ッチ円方向において上方から下方へ同調して傾斜させて
係合させ、上記ウエハ装填穴4の上方向(ウエハ装填穴
4の上部開口面)と下方向(ウエハ装填穴4の下部開口
面)への抜け止めを図る第1傾斜面対10と第2傾斜面
対11を交互に形成する。
As another example, as shown in FIG. 8, only adjacent one side surfaces 14 and 15 of the inwardly projecting tooth 9 and the outwardly projecting tooth 8 are slanted and engaged in a pitch circle direction in synchronization with each other from the upper side to the lower side. Then, the first inclined surface pair 10 and the second inclined surface for preventing the wafer loading hole 4 from coming out upward (upper opening surface of the wafer loading hole 4) and downward (downward opening surface of the wafer loading hole 4). Pairs 11 are formed alternately.

【0028】前記の通り上記図6乃至図8に示す第1傾
斜面対10と第2傾斜面対11の関係は、各凸歯8,9
の先端面17と歯みぞ12,13の底面16においても
同様であり、これを交互に形成する。
As described above, the relationship between the first inclined surface pair 10 and the second inclined surface pair 11 shown in FIGS.
The same applies to the front end surface 17 of the and the bottom surfaces 16 of the tooth grooves 12 and 13, and these are alternately formed.

【0029】更に図9に示すように、上記内向き凸歯9
と上記外向き凸歯8の歯厚(ピッチ円方向の寸法)を歯
元側から歯先側へ漸次拡大する形状にして、両凸歯8,
9の両側面14,15又は片側面に互いに係合し合成樹
脂製保護リング7の中心方向(内方)への抜け止めを図
る第3傾斜面対18を形成する。この第3傾斜面対18
は上記第1,第2傾斜面対10,11と協働し合成樹脂
製リング7の各方向への脱落と変形を防止する。
Further, as shown in FIG. 9, the inwardly projecting teeth 9 are
And the tooth thickness (dimension in the pitch circle direction) of the outward convex tooth 8 is gradually enlarged from the root side to the tip side,
A third pair of inclined surfaces 18 is formed which engages with both side surfaces 14 and 15 or one side surface of 9 to prevent the synthetic resin protective ring 7 from coming off in the central direction (inward). This third inclined surface pair 18
Cooperates with the pair of first and second inclined surfaces 10 and 11 to prevent the synthetic resin ring 7 from dropping and deforming in each direction.

【0030】換言すると、外向き凸歯8と内向き凸歯9
の両側面14,15を先端へ向け互いに離反する方向へ
漸次傾斜させるか、又は片側面を同調方向へ傾斜させ、
各凸歯8,9を平面視台形にする。更に換言すると、上
記各内向き凸歯9間と上記外向き凸歯8間の歯みぞ1
2,13を歯元から歯先へ向け漸次狭小となる形状(平
面視台形)にし、両凸歯8,9の両側面14,15、又
は一方の側面14,15に互いに係合し合成樹脂製保護
リング7の中心方向への抜け止めを図る第3傾斜面対1
8を形成する。
In other words, the outward convex teeth 8 and the inward convex teeth 9
Both side surfaces 14 and 15 of the above are gradually inclined toward the tip end in a direction away from each other, or one side surface is inclined toward the tuning direction,
Each convex tooth 8 and 9 is trapezoidal in plan view. In other words, the tooth groove 1 between the inwardly projecting teeth 9 and the outwardly projecting teeth 8 is different.
2 and 13 are formed into a shape (trapezoidal shape in plan view) which gradually becomes narrower from the root to the tip of the tooth, and both side surfaces 14 and 15 of the biconvex teeth 8 and 9 or one side surface 14 and 15 are engaged with each other to make a synthetic resin Third inclined surface pair 1 for preventing the protective ring 7 from coming off toward the center
8 is formed.

【0031】上記合成樹脂製保護リング7は予め成形し
準備したものをウエハ装填穴4に組組み込んで、該ウエ
ハ装填穴4の内周縁部に形成した凸歯9に咬合せしめ
る。
The protective ring 7 made of synthetic resin, which has been molded and prepared in advance, is assembled into the wafer loading hole 4 and engaged with the convex teeth 9 formed on the inner peripheral edge of the wafer loading hole 4.

【0032】又は適例として図10に示すように、上記
内向き凸歯9を有するウエハ装填穴4の内周縁に流動合
成樹脂を型込めし硬化して形成し、寸法誤差によるガタ
を解消し上記第1乃至第3傾斜面対10,11,18に
よる上方抜け止めと下方抜け止めと内方抜け止めとを図
る。
As a suitable example, as shown in FIG. 10, a flow synthetic resin is molded into the inner peripheral edge of the wafer loading hole 4 having the inwardly projecting teeth 9 and hardened to eliminate play due to dimensional error. The first to third inclined surface pairs 10, 11 and 18 are used to prevent upward disengagement, downward disengagement and inward disengagement.

【0033】例えば円盤2の上面に上型19を密接する
と共に、同下面に下型20を密接しつつ、上型19又は
下型20の一方を円盤2のウエハ装填穴4に遊合せし
め、該遊合部とウエハ装填穴4間に形成された環状間隙
22内へ上型19又は下型20の注入口21から樹脂を
注入し、硬化せしめて上記合成樹脂製保護リング7を成
形する。この合成樹脂製保護リング7は、単に事前に成
形したものを嵌め込み組み立てする場合に比し、各凸歯
8,9との密着性が良好であり、第1乃至第3傾斜面対
10,11,18との整合(係合)が正確に得られ、所
期の目的を達成する上で有効である。
For example, while the upper die 19 is in close contact with the upper surface of the disk 2 and the lower die 20 is in intimate contact with the lower surface thereof, one of the upper die 19 and the lower die 20 is loosely fitted into the wafer loading hole 4 of the disk 2. A resin is injected into the annular gap 22 formed between the loose part and the wafer loading hole 4 from the injection port 21 of the upper mold 19 or the lower mold 20 and cured to mold the synthetic resin protective ring 7. The synthetic resin protective ring 7 has better adhesion to the convex teeth 8 and 9 than in the case where a preformed product is simply fitted and assembled, and the first to third inclined surface pairs 10 and 11 are provided. , 18 can be accurately aligned (engagement), which is effective in achieving the intended purpose.

【図面の簡単な説明】[Brief description of drawings]

【図1】従来のウエハ研磨装置の平面図。FIG. 1 is a plan view of a conventional wafer polishing apparatus.

【図2】同要部断面図。FIG. 2 is a sectional view of the same main part.

【図3】本発明の実施形態例を示すウエハ研磨装置の平
面図。
FIG. 3 is a plan view of a wafer polishing apparatus showing an embodiment of the present invention.

【図4】同要部断面図。FIG. 4 is a sectional view of the same main part.

【図5】上記ウエハ研磨装置におけるウエハ装填穴に合
成樹脂製保護リングを内設し、上方抜け止めを図る第1
傾斜面対と下方抜け止めをを図る第2傾斜面対を説明す
る要部拡大平面図。
FIG. 5 is a first diagram in which a synthetic resin protective ring is provided in a wafer loading hole in the wafer polishing apparatus so as to prevent upward removal.
FIG. 6 is an enlarged plan view of an essential part for explaining a pair of inclined surfaces and a second pair of inclined surfaces for preventing downward slippage.

【図6】上記半導体ウエハの上方抜け止めと下方抜け止
めの形成例を示す凸歯のピッチ円方向における要部拡大
断面図。
FIG. 6 is an enlarged cross-sectional view of an essential part in the pitch circle direction of the convex teeth, showing an example of forming the upper retainer and the lower retainer of the semiconductor wafer.

【図7】更に上記半導体ウエハの上方抜け止めと下方抜
け止めの形成例の他例を示す凸歯のピッチ円方向におけ
る要部拡大断面図。
FIG. 7 is an enlarged cross-sectional view of a main part in the pitch circle direction of the convex teeth showing another example of the formation of the upper retainer and the lower retainer of the semiconductor wafer.

【図8】上記上方抜け止めと下方抜け止めを図る第3傾
斜面対の形成例の更に他例を示す凸歯のピッチ円方向に
おける要部拡大断面図。
FIG. 8 is an enlarged cross-sectional view of a main portion in the pitch circle direction of the convex tooth, showing still another example of the formation of the pair of third inclined surfaces for preventing the above-mentioned removal and the above-mentioned removal.

【図9】上記ウエハ研磨装置における半導体ウエハの内
方抜け止めの形成例を示す凸歯の要部拡大平面図。
FIG. 9 is an enlarged plan view of a main part of a convex tooth showing an example of forming an inner stopper for a semiconductor wafer in the wafer polishing apparatus.

【図10】上型と下型により上記合成樹脂製保護リング
をウエハ装填穴の内周縁に内設する方法と構造を示す要
部拡大断面図。
FIG. 10 is an enlarged cross-sectional view of a main part showing a method and a structure in which the protective ring made of synthetic resin is internally provided on an inner peripheral edge of a wafer loading hole by an upper die and a lower die.

【符号の説明】[Explanation of symbols]

1 駆動歯車 2 円盤 3 環状歯車 4 ウエハ装填穴 5 半導体ウエハ 6 研磨盤 7 合成樹脂製保護リング 8 外向き凸歯 9 内向き凸歯 10 第1傾斜面対 11 第2傾斜面対 12,13 歯みぞ 14 外向き凸歯の側面 15 内向き凸歯の側面 16 底面 17 先端面 18 第3傾斜面対 19 上型 20 下型 21 注入口 22 環状空隙 1 drive gear 2 discs 3 ring gear 4 Wafer loading hole 5 Semiconductor wafer 6 polishing machine 7 Synthetic resin protection ring 8 outward convex teeth 9 Inward convex teeth 10 First inclined surface pair 11 Second inclined surface pair 12 and 13 teeth 14 Sides of outward convex teeth 15 Sides of inward convex teeth 16 Bottom 17 Tip surface 18 3rd inclined surface pair 19 Upper mold 20 Lower mold 21 Inlet 22 annular void

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】金属製の円盤に設けたウエハ装填穴に半導
体ウエハを装填し、該円盤を回転させつつウエハ装填穴
の開口面より露出する半導体ウエハの表面に研磨盤を当
接し表面研磨を行うようにしたウエハ研磨装置におい
て、上記ウエハ装填穴の内周縁に沿い合成樹脂製保護リ
ングを内設し、該合成樹脂製保護リングの外周縁に設け
た複数の外向き凸歯と上記ウエハ装填穴の内周縁に設け
た複数の内向き凸歯とを咬合構造にし、該外向き凸歯と
内向き凸歯の咬合面に互いに係合して合成樹脂製保護リ
ングのウエハ装填穴からの上方への抜け止めを図る第1
傾斜面対を形成すると共に、同咬合面に互いに係合して
合成樹脂製保護リングのウエハ装填穴からの下方への抜
け止めを図る第2傾斜面対を形成したことを特徴とする
ウエハ研磨装置。
1. A semiconductor wafer is loaded into a wafer loading hole provided in a metal disk, and the surface of the semiconductor wafer exposed from the opening surface of the wafer loading hole is brought into contact with a polishing disk while rotating the disk to perform surface polishing. In the wafer polishing apparatus, a protective ring made of synthetic resin is provided along the inner peripheral edge of the wafer loading hole, and a plurality of outwardly projecting teeth provided on the outer peripheral edge of the synthetic resin protective ring and the wafer loading A plurality of inwardly projecting teeth provided on the inner peripheral edge of the hole has an occlusal structure, and is engaged with the occlusal surfaces of the outwardly projecting teeth and the inwardly projecting teeth so that the synthetic resin protection ring is above the wafer loading hole. To prevent slipping out
Wafer polishing characterized by forming a pair of inclined surfaces and forming a second pair of inclined surfaces which engage with each other on the occlusal surface to prevent the synthetic resin protective ring from coming out downward from the wafer loading hole. apparatus.
【請求項2】上記外向き凸歯と内向き凸歯の一側咬合面
に上記第1傾斜面対を形成すると共に、同他側咬合面に
上記第2傾斜面対を形成したことを特徴とする請求項1
記載のウエハ研磨装置。
2. The first inclined surface pair is formed on one occlusal surface of the outward convex tooth and the inward convex tooth, and the second inclined surface pair is formed on the other occlusal surface of the same. Claim 1
The wafer polishing apparatus described.
【請求項3】上記内向き凸歯と上記外向き凸歯の歯厚を
歯元側から歯先側へ漸次拡大する形状にして両凸歯の両
側面に互いに係合し合成樹脂製保護リングの内方への抜
け止めを図る第3傾斜面対を形成したことを特徴とする
請求項1記載のウエハ研磨装置。
3. A protective ring made of synthetic resin, wherein the tooth thicknesses of the inward convex teeth and the outward convex teeth are formed so as to gradually increase from the root side to the tip side and engage with both side surfaces of both convex teeth. 2. The wafer polishing apparatus according to claim 1, wherein a third pair of inclined surfaces is formed to prevent the inner surface of the wafer from coming off.
【請求項4】上記合成樹脂製保護リングが上記内向き凸
歯を有するウエハ装填穴の内周縁に合成樹脂を型込めし
硬化して形成したものであることを特徴とする請求項1
記載のウエハ研磨装置。
4. The synthetic resin protective ring is formed by molding a synthetic resin into the inner peripheral edge of a wafer loading hole having the inwardly projecting teeth and hardening the synthetic resin.
The wafer polishing apparatus described.
JP2001302161A 2001-09-28 2001-09-28 Wafer polishing equipment Expired - Fee Related JP3552108B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001302161A JP3552108B2 (en) 2001-09-28 2001-09-28 Wafer polishing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001302161A JP3552108B2 (en) 2001-09-28 2001-09-28 Wafer polishing equipment

Publications (2)

Publication Number Publication Date
JP2003109925A true JP2003109925A (en) 2003-04-11
JP3552108B2 JP3552108B2 (en) 2004-08-11

Family

ID=19122458

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018015831A (en) * 2016-07-27 2018-02-01 スピードファム株式会社 Work carrier, and manufacturing method of work carrier
KR20200135175A (en) 2019-05-22 2020-12-02 신에쯔 한도타이 가부시키가이샤 Carrier for double-side polishing apparatus and method for manufacturing the same
CN112251736A (en) * 2020-07-31 2021-01-22 苏州雨竹机电有限公司 Vapor deposition wafer bearing device
CN112355887A (en) * 2020-11-10 2021-02-12 蚌埠高华电子股份有限公司 Magnetic attraction positioning type piece-taking-off auxiliary device and using method thereof

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR200484471Y1 (en) * 2017-01-26 2017-09-08 (주)엔티에스엘 Carrier Used in Polishing Wafer for Seimi-Conductor

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002018708A (en) * 2000-07-10 2002-01-22 Sumitomo Bakelite Co Ltd Polished object holding material and its manufacturing method

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002018708A (en) * 2000-07-10 2002-01-22 Sumitomo Bakelite Co Ltd Polished object holding material and its manufacturing method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018015831A (en) * 2016-07-27 2018-02-01 スピードファム株式会社 Work carrier, and manufacturing method of work carrier
TWI706456B (en) * 2016-07-27 2020-10-01 日商創技股份有限公司 Work carrier and work carrier manufacturing method
KR20200135175A (en) 2019-05-22 2020-12-02 신에쯔 한도타이 가부시키가이샤 Carrier for double-side polishing apparatus and method for manufacturing the same
CN112251736A (en) * 2020-07-31 2021-01-22 苏州雨竹机电有限公司 Vapor deposition wafer bearing device
CN112355887A (en) * 2020-11-10 2021-02-12 蚌埠高华电子股份有限公司 Magnetic attraction positioning type piece-taking-off auxiliary device and using method thereof
CN112355887B (en) * 2020-11-10 2021-09-17 蚌埠高华电子股份有限公司 Magnetic attraction positioning type piece-taking-off auxiliary device and using method thereof

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