JP2003066067A5 - - Google Patents

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Publication number
JP2003066067A5
JP2003066067A5 JP2001254844A JP2001254844A JP2003066067A5 JP 2003066067 A5 JP2003066067 A5 JP 2003066067A5 JP 2001254844 A JP2001254844 A JP 2001254844A JP 2001254844 A JP2001254844 A JP 2001254844A JP 2003066067 A5 JP2003066067 A5 JP 2003066067A5
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JP
Japan
Prior art keywords
probe
substrate
conductor
elastic member
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2001254844A
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English (en)
Japanese (ja)
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JP2003066067A (ja
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Publication date
Application filed filed Critical
Priority to JP2001254844A priority Critical patent/JP2003066067A/ja
Priority claimed from JP2001254844A external-priority patent/JP2003066067A/ja
Publication of JP2003066067A publication Critical patent/JP2003066067A/ja
Publication of JP2003066067A5 publication Critical patent/JP2003066067A5/ja
Withdrawn legal-status Critical Current

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JP2001254844A 2001-08-24 2001-08-24 プローブユニット、検査装置、電気光学パネル基板の検査方法および電気光学装置の製造方法 Withdrawn JP2003066067A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001254844A JP2003066067A (ja) 2001-08-24 2001-08-24 プローブユニット、検査装置、電気光学パネル基板の検査方法および電気光学装置の製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001254844A JP2003066067A (ja) 2001-08-24 2001-08-24 プローブユニット、検査装置、電気光学パネル基板の検査方法および電気光学装置の製造方法

Publications (2)

Publication Number Publication Date
JP2003066067A JP2003066067A (ja) 2003-03-05
JP2003066067A5 true JP2003066067A5 (https=) 2005-02-24

Family

ID=19082940

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001254844A Withdrawn JP2003066067A (ja) 2001-08-24 2001-08-24 プローブユニット、検査装置、電気光学パネル基板の検査方法および電気光学装置の製造方法

Country Status (1)

Country Link
JP (1) JP2003066067A (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4513674B2 (ja) * 2005-07-05 2010-07-28 エプソンイメージングデバイス株式会社 電気光学装置、及び電子機器
KR100766296B1 (ko) * 2006-02-23 2007-10-11 주식회사 파이컴 프로브 블록 및 그것을 갖는 프로브 어셈블리
JP2009192419A (ja) * 2008-02-15 2009-08-27 Micronics Japan Co Ltd プローブユニット及び検査装置

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