JP2003063858A - Porcelain composition which has low dielectric constant and method for manufacturing it - Google Patents

Porcelain composition which has low dielectric constant and method for manufacturing it

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Publication number
JP2003063858A
JP2003063858A JP2001256178A JP2001256178A JP2003063858A JP 2003063858 A JP2003063858 A JP 2003063858A JP 2001256178 A JP2001256178 A JP 2001256178A JP 2001256178 A JP2001256178 A JP 2001256178A JP 2003063858 A JP2003063858 A JP 2003063858A
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JP
Japan
Prior art keywords
porcelain composition
temperature
composition
dielectric constant
low dielectric
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001256178A
Other languages
Japanese (ja)
Other versions
JP3909367B2 (en
Inventor
Hisafumi Yamamoto
寿文 山元
Yoshio Tsukiyama
良男 築山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Metal SMI Electronics Device Inc
Original Assignee
Sumitomo Metal SMI Electronics Device Inc
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Priority to JP2001256178A priority Critical patent/JP3909367B2/en
Publication of JP2003063858A publication Critical patent/JP2003063858A/en
Application granted granted Critical
Publication of JP3909367B2 publication Critical patent/JP3909367B2/en
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Abstract

PROBLEM TO BE SOLVED: To provide a porcelain composition which can be sintered at a low temperature, which has a low dielectric constant and small loss in the high frequency wave zone, and whose temperature dependency is small, and which has neither diffusion nor migration when Ag is used as an internal electrode, and a method for manufacturing the composition. SOLUTION: The porcelain composition which has a low dielectric constant contains, in terms of oxides in mass %, SiO2 of 26.0-38.0%, ZnO of 34.0-49.0%, Bi2 O3 of 1.0-5.7%, MgO of 1.0-6.0%, TiO2 of 3.5-15.1%, Li2 O of 2.0-6.0%, K2 O of 2.0-9.0% and B2 O3 of 0.5-3.0%. The method for manufacturing the porcelain composition comprises carrying out the wet blending with a ball mill of powder raw materials consisting of prescribed quantities of the oxides, drying and calcining at 700-900 deg.C the blended raw materials, and thereafter pulverizing and sizing the calcined materials, and then kneading on adding a binder and forming the sized materials into a predetermined shape, and printing electric conductors or the like and carrying out the lamination or the like, and finally carrying out the sintering at 800-925 deg.C.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明が属する技術分野】本発明は、数GHzから数十GHz
の高周波領域を対象とする電子部品やモジュールに用い
られる誘電体の磁器組成物に関する。
TECHNICAL FIELD The present invention relates to several GHz to several tens GHz.
The present invention relates to a dielectric porcelain composition used in electronic parts and modules targeted for high frequency regions.

【0002】[0002]

【従来の技術】近年、情報の高速大量伝達通信および移
動体通信の発達にともない、集積回路においては、小型
化、高密度化ばかりでなく、取り扱われる信号に数GHz
さらにはそれ以上の帯域の周波数の利用が検討されてお
り、部品や基板に用いられる誘電体の磁器組成物に対し
ても、このような高周波帯域に適合した材料が要望され
ている。この磁器組成物に要求される性能は、高周波帯
域において比誘電率が低いこと、誘電損失tanδが小さ
いことすなわちQ値が高いことである。
2. Description of the Related Art In recent years, with the development of high-speed mass communication of information and mobile communication, in integrated circuits, not only downsizing and densification but also several GHz are used for handled signals.
Furthermore, utilization of frequencies in a band higher than that is being studied, and a material suitable for such a high frequency band is also required for a dielectric ceramic composition used for a component or a substrate. The performance required for this porcelain composition is that the relative permittivity is low in the high frequency band and that the dielectric loss tan δ is small, that is, the Q value is high.

【0003】一般に、比誘電率が低いほど誘電体中の信
号伝搬速度は速くなるので、高周波帯域の用途には比誘
電率εは低いことが望ましい。そして信号伝達の上で
損失は少なければ少ないほどよく、Q値はできるだけ高
くする必要がある。また、誘電体としての機能を例えば
フィルタや共振器などに利用することがあるが、この場
合温度変化に対して安定な作動をさせるために、共振周
波数の温度係数τの絶対値はできるだけ小さいこと、
すなわち温度依存性の少ないことが重要になる。
In general, the lower the relative permittivity, the faster the signal propagation speed in the dielectric, so it is desirable that the relative permittivity ε r be low for high frequency band applications. In terms of signal transmission, the smaller the loss, the better, and the Q value needs to be as high as possible. In addition, the function as a dielectric may be used for, for example, a filter or a resonator, but in this case, the absolute value of the temperature coefficient τ f of the resonance frequency is as small as possible in order to operate stably with respect to temperature changes. thing,
That is, it is important that the temperature dependence is small.

【0004】実装基板に内部導体や内部電極として利用
される導電材料は、小型化、高密度化から細線化が要求
されることもあって、比抵抗値が高ければそれだけ損失
が増し、さらには発熱の原因となるので、できるだけ低
抵抗であることが望ましい。このような低抵抗材料は、
Ag、CuまたはAuなどであるが、これらの金属はい
ずれも融点が1000℃前後と低い。
The conductive material used as an internal conductor or an internal electrode on the mounting substrate is required to be thin due to miniaturization and high density. Therefore, the higher the specific resistance value is, the more loss is caused. Since it causes heat generation, it is desirable that the resistance be as low as possible. Such low resistance materials are
Although Ag, Cu, Au, or the like, all of these metals have a low melting point of around 1000 ° C.

【0005】磁器組成物を基板とする集積回路は、グリ
ーンシートにペースト状の導電体素材を用いて回路パタ
ーンを印刷し、これらのシートを積層して一体化焼成に
より、導電材料と磁器組成物とが同時に焼結され形成さ
れる。しかし、焼成温度が導体金属の融点近くさらには
融点以上になると拡散や流動化が生じ、導体が細くなっ
たり消失したりするおそれがある。
In an integrated circuit using a porcelain composition as a substrate, a circuit pattern is printed on a green sheet by using a paste-like conductor material, and these sheets are laminated and integrally fired to form a conductive material and a porcelain composition. And are simultaneously sintered and formed. However, if the firing temperature is close to or higher than the melting point of the conductor metal, diffusion or fluidization may occur, and the conductor may become thin or disappear.

【0006】このような低温での焼成が可能な磁器組成
物として、いわゆるガラスセラミックスがある。これ
は、セラミックスの骨材をガラスに混在させたもので、
ガラスの軟化により低温での焼成を可能にしており、骨
材とガラスとの組み合わせで様々な改良が行われてい
る。たとえば特開平10-297960号公報に開示された発明
は、骨材としてオルト珪酸亜鉛(ZnSiO)およ
びクリストバライト(SiO)、ガラスとしてSiO
−LiO−ZnOを用い、焼成温度は800〜1000℃
で損失が小さく比誘電率の低いセラミックスが得られる
としている。
As a porcelain composition which can be fired at such a low temperature, there is so-called glass ceramics. This is a mixture of ceramic aggregate and glass.
The softening of glass enables firing at low temperatures, and various improvements have been made by combining aggregate and glass. For example, the invention disclosed in Japanese Patent Laid-Open No. 10-297960 discloses zinc orthosilicate (Zn 2 SiO 4 ) and cristobalite (SiO 2 ) as an aggregate and SiO as a glass.
2- Li 2 O-ZnO is used, and the firing temperature is 800 to 1000 ° C.
It states that ceramics with low loss and low relative permittivity can be obtained.

【0007】しかしながらガラスセラミックスはガラス
組成が多く含まれるので、一般に比誘電率は低いがQ値
も低く、したがって高周波帯域における損失が大きい。
その上共振周波数の温度係数τが大きいため、周波数
帯域が高くなるとこれらによる性能低下が問題化してく
る。また多くの場合、ガラス組成とセラミックス組成と
を別々に作製し、これらを混合してグリ−ンシートとす
るので製造工程が繁雑である。
However, since glass ceramics contain a large amount of glass composition, the dielectric constant is generally low, but the Q value is also low, and therefore the loss in the high frequency band is large.
In addition, since the temperature coefficient τ f of the resonance frequency is large, the performance deterioration due to these becomes a problem when the frequency band becomes high. In many cases, the glass composition and the ceramic composition are separately prepared and mixed to form a green sheet, which complicates the manufacturing process.

【0008】[0008]

【発明が解決しようとする課題】本発明の目的は、低温
焼結が可能で、とくにAgを内部電極に用いることに適
し、比誘電率が低く高周波帯域での損失が小さく、かつ
温度依存性の小さい誘電体の磁器組成物とその製造方法
の提供にある。
The object of the present invention is that low temperature sintering is possible, it is particularly suitable for using Ag for the internal electrode, the dielectric constant is low, the loss in the high frequency band is small, and the temperature dependence is high. To provide a porcelain composition having a small dielectric constant and a method for producing the same.

【0009】[0009]

【課題を解決するための手段】本発明者らは、2GHzない
しはそれ以上の高周波帯域で使用される磁器組成物の性
能を改善すべく種々検討をおこなった。その際に目標と
した性能は次のとおりである。
The present inventors have made various studies to improve the performance of porcelain compositions used in a high frequency band of 2 GHz or higher. The target performance at that time is as follows.

【0010】内部電極または内部導体にはAgを用い
る。AgはCuやAuよりも比抵抗は小さいが、融点が
これらより低いので、焼成時の拡散などにより導体損耗
が生じやすい。また、Agは金属イオンの移動、すなわ
ちマイグレーションによる使用中の絶縁破壊が発生しや
すい。これらAgの拡散、あるいはマイグレーションに
が、できるだけ少ない、磁器組成物でなければならな
い。
Ag is used for the internal electrodes or internal conductors. Although Ag has a smaller specific resistance than Cu or Au, it has a melting point lower than these, so that conductor wear is likely to occur due to diffusion during firing. Further, Ag is apt to cause the movement of metal ions, that is, dielectric breakdown during use due to migration. The porcelain composition should have as little diffusion or migration of these Ag as possible.

【0011】拡散状態の調査から、焼成温度としては92
5℃以下とすればAgの拡散は大きく抑制されることが
わかった。そこで、磁器組成物の具備すべき特性目標と
しては、誘電率εは10以下で、Q(誘電正接tanδの
逆数)と周波数f(GHzで表示)との積が3500以上、共
振周波数の温度係数が−30〜+30ppm/℃であることと
し、この特性が925℃以下の焼成温度で得られる組成を
検討した。ここで比誘電率ε、誘電損失tanδおよび
温度係数τは、いずれも両端短絡形誘電体共振器法
(ハッキ・コールマン法)を用いて測定する。
From the investigation of the diffusion state, the firing temperature was 92
It was found that if the temperature is 5 ° C. or less, Ag diffusion is greatly suppressed. Therefore, as the characteristic target that the porcelain composition should have, the permittivity ε r is 10 or less, the product of Q (reciprocal of dielectric loss tangent tan δ) and frequency f ( expressed in GHz) is 3500 or more, and the temperature of the resonance frequency is The coefficient was set to -30 to +30 ppm / ° C, and the composition obtained with this characteristic at a firing temperature of 925 ° C or lower was examined. Here, the relative permittivity ε r , the dielectric loss tan δ, and the temperature coefficient τ f are measured by using the both-end short-circuited dielectric resonator method (Hacke-Coleman method).

【0012】Q値には周波数依存性があり周波数が高く
なると低下の傾向を示すので、材料によりほぼ一定の値
を示すとされるfQ値(fとQとの積の値)の大小で、
損失の優劣を比較した。種々の磁器組成物にてその性能
を比較検討した結果、在来材よりすぐれていると判断さ
れたのは、上記のようにfQが3500以上の材料である。
Since the Q value has a frequency dependency and tends to decrease as the frequency increases, the fQ value (the value of the product of f and Q), which is assumed to exhibit a substantially constant value depending on the material,
We compared the superiority and inferiority of the loss. As a result of comparatively examining the performances of various porcelain compositions, the materials judged to be superior to the conventional materials are the materials having fQ of 3500 or more as described above.

【0013】共振周波数の温度依存性は、両端短絡形誘
電体共振器法にて共振周波数の温度係数τとして計測
される。このτが−30〜+30ppm/℃、すなわちその
絶対値が30ppm/℃以下であれば、在来材より改善でき
ていると考えられる。
The temperature dependence of the resonance frequency is measured as a temperature coefficient τ f of the resonance frequency by the both ends short-circuit type dielectric resonator method. If this τ f is −30 to +30 ppm / ° C., that is, if its absolute value is 30 ppm / ° C. or less, it is considered that the improvement can be made compared with the conventional material.

【0014】ガラスまたはガラスセラミックスは、この
ような925℃以下の低温での焼結が可能である。しか
し、前述のようにQ値が小さいため損失が大きく、温度
依存性も大きい。また、ガラスセラミックスの場合、ガ
ラス組成とセラミックス組成とを別々に作製しこれを混
合焼成するため工程が多くなる。そこで、セラミックス
の磁器組成物にて、上記の目標性能を実現する可能性を
追求することとした。
Glass or glass ceramics can be sintered at such a low temperature of 925 ° C. or lower. However, since the Q value is small as described above, the loss is large and the temperature dependence is large. Further, in the case of glass ceramics, a glass composition and a ceramics composition are separately prepared and mixed and fired, so that the number of steps is increased. Therefore, we decided to pursue the possibility of achieving the above target performance with a ceramic porcelain composition.

【0015】セラミックスを構成する主成分としてSi
とZnOを用いた。これらは、比誘電率が低く高い
Q値の高周波用誘電体を得るために、必須の含有成分で
あると考えられる。
Si as a main constituent of ceramics
O 2 and ZnO were used. These are considered to be essential components for obtaining a high frequency dielectric having a low relative permittivity and a high Q value.

【0016】これら2成分に対し、焼結温度が低下で
き、Agの拡散が抑止され、そして上記各性能を確保で
きることを目標に、種々の成分とその含有量を検討し
た。その結果、Bi、LiO、KOおよびB
の4成分の複合添加が、Q値を劣化させることな
く焼結温度の低下に有効であることが見出された。これ
らの各成分は、単独の添加で焼結温度を低下させようと
すると多量の含有が必要になり、その結果Q値を大きく
低下させてしまう。ところが、複合して添加すると、Q
値の低下を少なくして焼結温度を低下させることができ
たのである。
With respect to these two components, various components and their contents were examined with the aim of lowering the sintering temperature, suppressing the diffusion of Ag, and ensuring the above-mentioned respective performances. As a result, Bi 2 O 3 , Li 2 O, K 2 O and B 2
It has been found that the composite addition of 4 components of 2 O 3 is effective in lowering the sintering temperature without deteriorating the Q value. If each component is added alone to reduce the sintering temperature, a large amount of each component must be contained, resulting in a large decrease in Q value. However, when added in combination, Q
It was possible to reduce the sintering temperature by reducing the decrease in the value.

【0017】SiOとZnOにこれら4成分を複合添
加した組成物に、さらにTiOとMgOとを併せて含
有させることにより、Q値の低下や比誘電率の増大を少
なくして共振周波数の温度係数τを小さくすることが
できた。TiOを含有させるとτが小さくなる。と
ころが、それとともに比誘電率が高くなり、加えてQ値
が大幅に低下する。これに対し、MgOを併せて含有さ
せると、Q値の大幅低下なしにτを小さくできること
がわかった。MgOのみの添加ではτを小さくする効
果はなく、Q値が多少改善されるだけであった。TiO
に併せて添加することによりこのような効果が得られ
るが、その理由は明らかでない。
By additionally including TiO 2 and MgO in a composition obtained by adding these four components to SiO 2 and ZnO in combination, a decrease in Q value and an increase in relative permittivity can be suppressed to reduce the resonance frequency. It was possible to reduce the temperature coefficient τ f . Inclusion of TiO 2 reduces τ f . However, along with this, the relative dielectric constant increases, and in addition, the Q value decreases significantly. On the other hand, it has been found that when MgO is also included, τ f can be reduced without significantly decreasing the Q value. The addition of only MgO had no effect of reducing τ f , but only slightly improved the Q value. TiO
Such effects can be obtained by adding together with 2 , but the reason is not clear.

【0018】このようにして得られた磁器組成物につい
て、Agを内部電極とし同時焼成して作製し調査した結
果、925℃までの焼成温度ではAgの拡散は認められな
かった。多くの場合、Bなどの低融点成分の含有
はAgの拡散を生じさせる傾向があるが、温度を925℃
以下に抑えたこと、およびBi、LiOなどを
複合含有させることにより単独に添加した場合より少な
くできたことが、このような拡散を抑止したものと思わ
れる。またこれらの磁器組成物の、湿潤雰囲気中使用を
調査した結果、マイグレーションが生じないことも確認
された。
The porcelain composition thus obtained was co-fired by using Ag as an internal electrode and was investigated. As a result, Ag diffusion was not observed at firing temperatures up to 925.degree. In many cases, the inclusion of a low melting point component such as B 2 O 3 tends to cause Ag diffusion, but the temperature is 925 ° C.
It is considered that such diffusion is suppressed because the suppression to the following and the reduction of the amount by adding Bi 2 O 3 , Li 2 O, and the like in comparison to the case of adding them alone can suppress such diffusion. Further, as a result of investigating the use of these porcelain compositions in a wet atmosphere, it was confirmed that migration did not occur.

【0019】以上のような検討結果から、さらにそれぞ
れの成分含有の効果を有効に発揮できる限界を確認して
本発明を完成させた。本発明の要旨は次のとおりであ
る。 (1) 酸化物組成比として質量%で、SiO:26.0〜3
8.0%、ZnO:34.0〜49.0%、Bi:1.0〜5.7
%、MgO:1.0〜6.0%、TiO:3.5〜15.0%、L
O:2.0〜6.0%、KO:2.0〜9.0%およびB
:0.5〜3.0%を含有することを特徴とする低誘電率磁
器組成物。 (2) 各酸化物の粉末原料を所要量配合しボールミルにて
湿式混合して、乾燥後700〜900℃にて仮焼後粉砕整粒し
た後、バインダを添加して混練し、成形後、導電体等の
印刷および積層をおこなってから、800〜925℃にて焼結
することを特徴とする上記(1)の低誘電率磁器組成物の
製造方法。
From the above examination results, the present invention was completed by further confirming the limits at which the effects of the respective components can be effectively exhibited. The gist of the present invention is as follows. (1) Oxide composition ratio in mass% is SiO 2 : 26.0 to 3
8.0%, ZnO: 34.0~49.0%, Bi 2 O 3: 1.0~5.7
%, MgO: 1.0 to 6.0%, TiO 2 : 3.5 to 15.0%, L
i 2 O: 2.0 to 6.0%, K 2 O: 2.0 to 9.0% and B 2 O
3 : A low dielectric constant porcelain composition characterized by containing 0.5 to 3.0%. (2) A powder raw material of each oxide is blended in a required amount, wet-mixed in a ball mill, dried, calcined at 700 to 900 ° C., pulverized and sized, and then a binder is added and kneaded. The method for producing a low dielectric constant porcelain composition according to the above (1), which comprises printing and laminating an electric conductor and the like and then sintering at 800 to 925 ° C.

【0020】[0020]

【発明の実施の形態】本発明の磁器組成物は、成分組成
範囲を以下のとおりに限定する。ここで含有組成は酸化
物の形で表した質量%である。
BEST MODE FOR CARRYING OUT THE INVENTION The composition range of the porcelain composition of the present invention is limited as follows. Here, the contained composition is mass% expressed in the form of oxide.

【0021】SiOの含有範囲は26.0〜38.0%とす
る。これは含有量が26.0%未満では共振周波数の温度係
数τが−30ppm/℃より低、すなわち温度係数の絶対
値が30ppm/℃を超え、温度依存性が大きくなってしま
うからである。一方、38.0%を超える量含まれると、高
周波域でのQ値が低下する。望ましいのは31.1〜34.1%
の範囲である。
The content range of SiO 2 is 26.0 to 38.0%. This is because if the content is less than 26.0%, the temperature coefficient τ f of the resonance frequency is lower than −30 ppm / ° C., that is, the absolute value of the temperature coefficient exceeds 30 ppm / ° C., and the temperature dependence becomes large. On the other hand, when the content exceeds 38.0%, the Q value in the high frequency range decreases. Desirable 31.1 to 34.1%
Is the range.

【0022】ZnOは34.0〜49.0%とする。ZnOはS
iOと共に本発明の磁器組成物の基本成分であるが、
34.0%を下回るかまたは49.0%を超えるいずれの場合
も、τ が−30〜+30ppm/℃の範囲を超えてしまい、
温度依存性が大きくなる。好ましいのは42.0〜45.6%の
含有範囲とすることである。
ZnO is 34.0 to 49.0%. ZnO is S
iOTwoTogether with the basic component of the porcelain composition of the present invention,
Either below 34.0% or above 49.0%
Also τ fExceeds the range of -30 to + 30ppm / ℃,
The temperature dependence becomes large. 42.0 to 45.6% preferred
It is to be included range.

【0023】Biは1.0〜5.7%、KOは2.0〜
9.0%、LiOは2.0〜6.0%、Bは0.5〜3.0%
をそれぞれ含有させる。これらの成分を同時に含有させ
た組成とすることにより、焼成温度は925℃以下で緻密
な磁器組成物に焼結することができる。それぞれの成分
はいずれも上記の下限量を下回ると焼結温度低下の効果
が十分でなくなり、緻密な磁器組成物が得られない。し
かしいずれも上記の上限値を超えて含有させると、Q値
が低下し損失が増加する。とくにBiは多くしす
ぎると焼成時にAgの拡散を生じてしまう。より好まし
い含有範囲は、それぞれBiは2.4〜2.6%、K
Oは2.2〜8.8%、LiOは3.3〜4.1%、そしてB
は0.6〜2.7%である。
Bi 2 O 3 is 1.0 to 5.7% and K 2 O is 2.0 to
9.0%, Li 2 O 2.0-6.0%, B 2 O 3 0.5-3.0%
Is contained in each. By making the composition containing these components at the same time, it is possible to sinter into a dense porcelain composition at a firing temperature of 925 ° C. or lower. When the content of each component is less than the above lower limit, the effect of lowering the sintering temperature becomes insufficient, and a dense porcelain composition cannot be obtained. However, in any case, when the content exceeds the above upper limit, the Q value decreases and the loss increases. In particular, if Bi 2 O 3 is too much, Ag will be diffused during firing. More preferable content ranges are 2.4 to 2.6% for Bi 2 O 3 and K 2 respectively.
O is 2.2-8.8%, Li 2 O is 3.3-4.1%, and B 2 O
3 is 0.6 to 2.7%.

【0024】TiOは3.5〜15.0%、MgOは1.0〜6.
0%を併せて含有させる。TiOは共振周波数の温度
係数を小さくするために含有させるが、この効果を得る
には3.5%以上の含有が必要である。しかし比誘電率が
高くなり、Q値が低下してくるのでTiOの含有量は
15.0%以下にしなければならない。MgOはこのTiO
含有による比誘電率の増大およびQ値の低下を抑止す
る作用があり、その効果を得るために少なくとも1.0%
以上含有させる。ただしMgOは焼結性を悪くするの
で、多くても6.0%までとする。好ましい含有範囲はT
iOが7.2〜8.9%、MgOが1.9〜2.3%である。
TiO 2 is 3.5 to 15.0%, MgO is 1.0 to 6.
0% is also included. TiO 2 is contained in order to reduce the temperature coefficient of resonance frequency, but it is necessary to contain TiO 2 in an amount of 3.5% or more to obtain this effect. However, the relative permittivity increases and the Q value decreases, so the content of TiO 2 is
Must be below 15.0%. MgO is this TiO
It has the effect of suppressing the increase of the relative dielectric constant and the decrease of the Q value due to the inclusion of 2 and at least 1.0% to obtain the effect.
The above is contained. However, since MgO deteriorates the sinterability, the maximum content is 6.0%. The preferred content range is T
iO 2 is 7.2 to 8.9% and MgO is 1.9 to 2.3%.

【0025】上記以外の成分としては、原料に混入して
くる種々の不純物があるが、得られた磁器組成物の特性
に悪影響をおよぼさない範囲のものであれば、とくには
限定しない。
As the components other than the above, there are various impurities mixed in the raw materials, but they are not particularly limited as long as they do not adversely affect the characteristics of the obtained ceramic composition.

【0026】本発明の磁器組成物の製造は、通常のセラ
ミック系のものを焼成する方法に準じておこなう。まず
原料となる各成分のそれぞれの酸化物粉末を所要量用意
し、ボールミルにて十分に混合する。酸化物粉末は、K
Oのように酸化物そのものが吸湿性のある不安定な材
料では、炭酸塩や炭酸水素塩など他の形のものを用いて
もよく、その場合は焼結後の酸化物量に相当するモル分
量の粉末を配合する。混合後仮焼して、セラミックの形
成反応がおこなわれていることを確認してから粉砕整粒
する。仮焼は最終焼成にて十分に焼結させるためには高
くない温度でおこなうことが望ましいが、低すぎるとセ
ラミックの形成反応が生じないので、700〜900℃とする
のがよい。
The porcelain composition of the present invention is manufactured according to the usual method of firing a ceramic material. First, a required amount of each oxide powder of each component serving as a raw material is prepared and sufficiently mixed with a ball mill. Oxide powder is K
In the case of an unstable material such as 2 O in which the oxide itself is hygroscopic, other forms such as carbonate and hydrogen carbonate may be used. In that case, the molar amount corresponding to the amount of oxide after sintering is used. Add a quantity of powder. After mixing, calcination is carried out, and after confirming that the formation reaction of the ceramic is carried out, pulverization and sizing is performed. The calcination is preferably performed at a temperature that is not high in order to sufficiently sinter in the final firing, but if it is too low, a reaction for forming a ceramic does not occur, so it is preferable to set the temperature to 700 to 900 ° C.

【0027】整粒粉にバインダ等を添加して混練し成形
して、必要により導電回路の印刷、積層、最終形状への
加工等をおこなって、800〜925℃で焼成し磁器組成物と
する。焼成温度は800℃未満では焼結が十分おこなわれ
ず、緻密性に欠け所要特性が十分得られないことがあ
る。また、Agの内部導体の拡散あるいはそれによるマ
イグレーションを引き起こすことがあるので、焼成温度
は925℃までとするのがよい。
A binder or the like is added to the sized powder, and the mixture is kneaded and molded, and if necessary, printing of conductive circuits, lamination, processing into a final shape, etc., and firing at 800 to 925 ° C. to obtain a porcelain composition. . If the firing temperature is less than 800 ° C, the sintering may not be sufficiently performed and the desired properties may not be obtained due to lack of denseness. Further, since the internal conductor of Ag may diffuse or migrate due to it, the firing temperature is preferably set to 925 ° C.

【0028】[0028]

【実施例】〔実施例1〕95%以上の高純度のSiO
ZnO、Bi、MgO、TiO、と純度90%以
上のKO(KHCOとして)およびLiO(Li
COとして)の粉末原料にて表1の組成の配合と
し、磁器組成物を作製した。
[Example] [Example 1] 95% or more high-purity SiO 2 ,
ZnO, Bi 2 O 3 , MgO, TiO 2 , and K 2 O (as KHCO 3 ) having a purity of 90% or more and Li 2 O (Li
2 CO 3 ) and the composition of the composition shown in Table 1 was used to prepare a porcelain composition.

【0029】[0029]

【表1】 [Table 1]

【0030】所定の組成に配合した原料粉末を、ジルコ
ニア製ボールを用いたボールミルにて純水を加えて24時
間湿式混合し、乾燥後ライカイ機にて攪拌した後、約75
0℃で2時間仮焼した。仮焼後X線回折により、焼結反応
がおこなわれたことを確認し、さらにジルコニア製ボー
ルのボールミルにて純水を加えて24時間粉砕して、乾燥
後粒径1〜4μmの粉末とした。10%PVA水溶液のバイ
ンダーを加えて造粒し、金型を用い1t/cmの圧力にて
直径15mm、高さ8mmの円柱状試片に成形後、大気中で焼
成をおこなった。
Pure water was added to a raw material powder having a predetermined composition in a ball mill using zirconia balls, and the mixture was wet-mixed for 24 hours.
It was calcined at 0 ° C for 2 hours. After the calcination, it was confirmed by X-ray diffraction that the sintering reaction had occurred. Further, pure water was added in a ball mill made of zirconia balls and crushed for 24 hours, and after drying, a powder having a particle size of 1 to 4 μm was obtained. . A binder of a 10% PVA aqueous solution was added, and the mixture was granulated, molded into a cylindrical test piece having a diameter of 15 mm and a height of 8 mm at a pressure of 1 t / cm 2 using a mold, and then fired in the atmosphere.

【0031】その場合、各試料は一部の試片を用いてあ
らかじめ840〜980℃の温度で試験的に焼成して、十分な
緻密化に必要な温度を見出し、その温度を焼成温度とし
て該当試料全試片の焼成をおこなった。焼成時間はいず
れも2時間である。
In this case, each sample is preliminarily tested and calcined at a temperature of 840 to 980 ° C. using a part of the test piece to find the temperature required for sufficient densification, and the temperature is regarded as the calcining temperature. All sample specimens were fired. The firing time is 2 hours in each case.

【0032】焼成後の焼結磁器組成物試片は、底面を研
磨し平滑にしてから両端短絡形誘電体共振器法により比
誘電率εおよび誘電損失tanδ(またはQ=1/tan
δ)を求めた。誘電損失は測定共振周波数fにより変化
するので、周波数に影響されず被測定材で一定の値にな
るとされるfとQとの積のfQ値で損失の大小を評価し
た。共振周波数の温度係数τは、25℃から85℃までの
温度範囲で共振周波数を測定し、25℃における共振周波
数fを基準としてその変化率から求めた。これらの測
定結果を併せて表2に示す。
The sintered porcelain composition test piece after firing was polished at its bottom surface to be smoothed, and then the relative dielectric constant ε r and the dielectric loss tan δ (or Q = 1 / tan) were measured by the both ends short-circuit type dielectric resonator method.
δ) was determined. Since the dielectric loss changes depending on the measured resonance frequency f, the magnitude of the loss was evaluated by the fQ value of the product of f and Q, which is assumed to be a constant value in the measured material without being influenced by the frequency. The temperature coefficient τ f of the resonance frequency was obtained by measuring the resonance frequency in the temperature range of 25 ° C. to 85 ° C. and calculating the rate of change based on the resonance frequency f 0 at 25 ° C. The results of these measurements are also shown in Table 2.

【0033】[0033]

【表2】 [Table 2]

【0034】Agの拡散およびマイグレーションの評価
については、以下のようにしておこなった。上記の仮焼
後の粉末に、バインダとして粉末量の約10質量%のPV
Bと少量の可塑剤を添加したキシレン、トルエンおよび
ブタノールからなる溶剤を加え、十分に混合してスラリ
ーとし、このスラリーによりテープ成型機を用いて、焼
成後の厚さ目標100μmのグリーンシートとした。グリー
ンシート上に厚さ20μmの内層電極用Agペーストをス
クリーン印刷し、120℃に予熱し150kgf/cmで加圧圧着
後切断して、誘電率やQ値を測定した試片と同じ温度に
て同様に2時間の焼成をおこない、4225サイズの電極層
数9層のコンデンサ用積層体を作製した。
The Ag diffusion and migration were evaluated as follows. Approximately 10% by mass of PV of the powder amount as a binder is added to the powder after the above calcination.
A solvent consisting of xylene, toluene and butanol to which B and a small amount of a plasticizer was added was thoroughly mixed to form a slurry. Using this slurry, a tape forming machine was used to form a green sheet having a target thickness of 100 μm after firing. . Screen-print 20 μm thick Ag paste for inner layer electrodes on the green sheet, preheat to 120 ° C, press-press at 150 kgf / cm 2 and then cut to the same temperature as the sample whose dielectric constant and Q value were measured. In the same manner, firing was performed for 2 hours to produce a 4225 size capacitor laminate having 9 electrode layers.

【0035】なお、誘電率やQ値の測定の際に、必要な
焼成温度が940℃以上であった試番16、22、24、29およ
び36については,Ag電極使用には不適当であるので、
コンデンサ用積層体の作製はおこなわなかった。
Note that the trial numbers 16, 22, 24, 29, and 36, which required a firing temperature of 940 ° C. or higher when measuring the dielectric constant and the Q value, are not suitable for using Ag electrodes. So
No capacitor laminate was prepared.

【0036】Ag拡散の有無の調査は、積層方向に垂直
な断面を研磨して内部電極が観察できるようにし、磁器
組成物部分のSEM観察およびEDS分析をおこなっ
た。マイグレーションについては、上記焼成後のコンデ
ンサ用積層体の電極端面部にAgペーストを塗布して70
0℃にて焼き付け、Ni/Snのバレルめっきをおこな
って外部端子として、130℃、90%RH、DC25V、9時間の
PCT(Pressure CookerTest)を施した後、絶縁抵抗を
測定した。結果を表2に併記する。
In order to investigate the presence or absence of Ag diffusion, a cross section perpendicular to the stacking direction was polished so that the internal electrodes could be observed, and SEM observation and EDS analysis of the porcelain composition portion were carried out. For migration, apply Ag paste to the electrode end surface of the capacitor laminate after firing and apply 70
After baking at 0 ° C., barrel plating of Ni / Sn was performed, PCT (Pressure Cooker Test) at 130 ° C., 90% RH, DC25V, 9 hours was performed as an external terminal, and then the insulation resistance was measured. The results are also shown in Table 2.

【0037】Agの拡散はBiを多く含む試番26
以外は、いずれも認められなかった。またPCT後の絶
縁抵抗は、測定した試料のいずれもが10Ω超の値を示
しており、マイグレーションは生じていないと判断され
た。
The diffusion of Ag is trial No. 26 containing a large amount of Bi 2 O 3.
Other than that, none was observed. In addition, the insulation resistance after PCT was higher than 10 9 Ω in all the measured samples, and it was determined that migration did not occur.

【0038】高周波特性については、表2の結果からわ
かるように、各酸化物成分の含有量が本発明にて定める
範囲内である場合は、いずれも当初目標とした比誘電率
εが10以下で、Qf値が3500以上、共振周波数の温度
係数τが−30〜+30ppm/℃で、しかも基板作製のた
めの焼成温度すなわち焼結可能温度は、Ag導体の適用
可能限界である925℃またはそれ以下のものが得られて
いる。
Regarding the high-frequency characteristics, as can be seen from the results in Table 2, when the content of each oxide component is within the range specified by the present invention, the initial target relative permittivity ε r is 10 in both cases. In the following, the Qf value is 3500 or more, the temperature coefficient τ f of the resonance frequency is −30 to +30 ppm / ° C., and the firing temperature for producing the substrate, that is, the sinterable temperature is 925 ° C. which is the applicable limit of the Ag conductor. Or less is obtained.

【0039】これに対し、組成が本発明で規定した範囲
を外れると、必要な焼成温度が高すぎたり、低fQ値や
温度依存性が多きいなど、目標特性が満足できていない
結果となっている。
On the other hand, when the composition is out of the range specified in the present invention, the required characteristics are not satisfied because the required firing temperature is too high, the low fQ value and the temperature dependency are large. ing.

【0040】このように、本発明の磁器組成物は、比誘
電率が低く高周波帯域における損失が低く、温度依存性
が小さいもので、電極とするAgの拡散およびマイグレ
ーションもなく、しかも低い焼成温度でそのすぐれた特
性を得ることができる。
As described above, the porcelain composition of the present invention has a low relative permittivity, a low loss in a high frequency band, and a small temperature dependence, does not diffuse or migrate Ag used as an electrode, and has a low firing temperature. You can get its excellent characteristics with.

【0041】[0041]

【発明の効果】本発明の誘電体磁器組成物は、比誘電率
が低く高周波帯域における損失が低く、温度依存性が小
さいものであり、しかも低い焼成温度でその特性を得る
ことができる。したがって、内部導体や電極として比抵
抗の低いAgを使用することができ、すぐれた高周波性
能と相俟って、電子回路の高周波化、小型化、高密度化
のための基板用等の用途に好適である。
The dielectric porcelain composition of the present invention has a low relative permittivity, a low loss in a high frequency band, and a small temperature dependency, and its characteristics can be obtained at a low firing temperature. Therefore, Ag having a low specific resistance can be used as an internal conductor or an electrode, and in combination with excellent high frequency performance, it can be used as a substrate for high frequency, miniaturization and high density of electronic circuits. It is suitable.

───────────────────────────────────────────────────── フロントページの続き Fターム(参考) 4G030 AA02 AA04 AA07 AA16 AA32 AA35 AA37 AA43 BA12 GA08 GA14 GA22 GA27 5G303 AA07 AB06 AB10 AB11 AB15 AB20 BA12 CA01 CB02 CB05 CB14 CB16 CB17 CB30 CB35 CB38 DA04 DA05    ─────────────────────────────────────────────────── ─── Continued front page    F-term (reference) 4G030 AA02 AA04 AA07 AA16 AA32                       AA35 AA37 AA43 BA12 GA08                       GA14 GA22 GA27                 5G303 AA07 AB06 AB10 AB11 AB15                       AB20 BA12 CA01 CB02 CB05                       CB14 CB16 CB17 CB30 CB35                       CB38 DA04 DA05

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】酸化物組成比として質量%で、SiO
26.0〜38.0%、ZnO:34.0〜49.0%、Bi:1.
0〜5.7%、MgO:1.0〜6.0%、TiO:3.5〜15.0
%、LiO:2.0〜6.0%、KO:2.0〜9.0%および
:0.5〜3.0%を含有することを特徴とする低誘
電率磁器組成物。
1. An oxide composition ratio of mass% is SiO 2 :
26.0~38.0%, ZnO: 34.0~49.0%, Bi 2 O 3: 1.
0~5.7%, MgO: 1.0~6.0%, TiO 2: 3.5~15.0
%, Li 2 O: 2.0~6.0% , K 2 O: 2.0~9.0% and B 2 O 3: 0.5~3.0% low dielectric ceramic composition characterized by containing a.
【請求項2】各酸化物の粉末原料を配合しボールミルに
て湿式混合して、乾燥後700〜900℃にて仮焼後粉砕整粒
した後、バインダを添加して混練し、成形後、導電体の
印刷および積層をおこなってから、800〜925℃にて焼結
することを特徴とする請求項1に記載の低誘電率磁器組
成物の製造方法。
2. A powder raw material of each oxide is blended, wet-mixed in a ball mill, dried, calcined at 700 to 900 ° C., pulverized and sized, and then a binder is added and kneaded. The method for producing a low dielectric constant porcelain composition according to claim 1, wherein the conductor is printed and laminated, and then sintered at 800 to 925 ° C.
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