JP2003045573A - Terminal plug for testing relay - Google Patents

Terminal plug for testing relay

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Publication number
JP2003045573A
JP2003045573A JP2001229091A JP2001229091A JP2003045573A JP 2003045573 A JP2003045573 A JP 2003045573A JP 2001229091 A JP2001229091 A JP 2001229091A JP 2001229091 A JP2001229091 A JP 2001229091A JP 2003045573 A JP2003045573 A JP 2003045573A
Authority
JP
Japan
Prior art keywords
plug
contacts
terminal
contact
test terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001229091A
Other languages
Japanese (ja)
Inventor
Koichi Ide
浩一 井手
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meidensha Corp
Meidensha Electric Manufacturing Co Ltd
Original Assignee
Meidensha Corp
Meidensha Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meidensha Corp, Meidensha Electric Manufacturing Co Ltd filed Critical Meidensha Corp
Priority to JP2001229091A priority Critical patent/JP2003045573A/en
Publication of JP2003045573A publication Critical patent/JP2003045573A/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To prevent unnecessary operations for a relay which may be generated at plug insertion time. SOLUTION: A testing terminal 1 has first an second contacts 5 and 6. A plug 11 is provided with first and second conductive parts 13 and 14 different in the length. When inserting the plug 11 into the terminal 1, the longer conductive part 14 contacts with the first contact 6, and then the first conductive part 13 contacts with a contact piece 5. Since a conventional plug is of the same in the length of the first and second conductive parts, when inserting the plug, contact of the first and second conductive parts and the first and second contacts 5 and 6 is made simultaneous or either one contacts first. Since a short circuit line and a crossover are connected to the plug, a ratio operation relay may perform unnecessary operations, when using the plug 11 having the first and second conductive parts 13 and 14 different in the length, the relay will not perform unnecessary operation.

Description

【発明の詳細な説明】 【0001】 【発明の属する技術分野】本発明は、例えば、保護継電
器特性試験において、比率差動試験を行う場合などに使
用する試験用端子プラグに関するものである。 【0002】 【従来の技術】図4において、試験用端子プラグAは、
試験用端子1と該端子1に差し込むプラグ11で構成さ
れている。試験用端子1は、絶縁材からなる基台2に固
定された端子ねじ取付部3a、4aを有する端子板3、
4と、この端子板3、4に取り付けられた第1、第2の接
触子5、6と、この第1、第2の接触子5、6を覆うプラ
グ差し込み孔9aを有する絶縁材からなるカバー9とに
より構成されている。第1、第2の接触子5及び6は、
それぞれ断面逆J字状をなし長さを異にする2つの接触
片5aと5b及び6aと6bからなり、第1、第2の接
触子5及び6の基端部はそれぞれ端子板3及び4に取付
ねじ7及び8で固定され、2枚刃構成の接触子となって
いる。第1、第2の接触子5、6は常時接触しており、
プラグ11が第1、第2の接触子5、6の間に差し込ま
れると、第1、第2の接触子5、6の接触は離されるよ
うになっている。 【0003】上記プラグ11は、把手部12aと差し込
み部12bを有する絶縁部材からなる断面略T字状をし
たプラグ本体12と、このプラグ本体12の差込み部1
2bの両面に設けられた導電部13、14と、この導電
部13、14とそれぞれ一体に形成され把手部12aの
内部を通り把手部12aの裏側に突出した端子部13
a、14aとにより構成されている。 【0004】試験用端子1は、上記第1、第2の接触子
5、6からなる2枚刃構成の接触子を3個(3P)又は6
個(6P)備えており、該試験用端子1に差し込むプラ
グ11もこれと同数の導電部13、14を備えている。 【0005】上記プラグ11を試験用端子1に差し込む
と、、第1、第2の接触子5、6の接触片5a、6a及
び5b、6b間の接触は差込み部12bにより切り離さ
れ、接触片5a、5bはプラグ11の導電部13aと接
触し、接触片6a、6bはプラグ11の導電部14と接
触する。 【0006】したがって、例えば、図6に示すように、
CTと保護継電器Ryの間に、試験用端子1を接続して
おき、試験時に、プラグ11の導電部13の端子部13
aに短絡線15が接続され、該プラグ11の導電部14
の端子部14aに試験器TSの接続線16が接続され
た、プラグ11を試験用端子1に差し込むことで、CT
2次側と保護継電器Ryの切り離しとCT2次側短絡を
同時に行うことが可能となり、CT2次側をオープンさ
せることなく、試験器TSを保護継電器Ryに接続する
ことが可能となる。 【0007】 【発明が解決しようとする課題】現在の変電所の設備と
しては、保護継電器を2重に設けて信頼性を向上させて
いる。また、保守員の削減等にて昼間帯加電圧状態での
試験が多くなってきている。図5に示すように保護継電
器RyA、RyBを2重に設けた回路では、継電器の前
後に、上記2枚刃構成の接触子が6個ある試験用端子1
a〜1dを接続しておき、いつでも試験可能にしてあ
る。試験対象のA系保護継電器RyAを試験する場合、
B系保護継電器RyBの比率差動継電器が動作しないよ
うに、試験用端子1a、1cにプラグ11a、11cを
差し込んで保護継電器RyAに流れている電流をバイパ
スさせて電流回路から切り離す。 【0008】試験用端子1cに渡り線17を接続したプ
ラグ11cを差し込むと、保護継電器RyAに流れてい
た変圧器TR側電流I2r,I2s,I2tはプラグ1
1cに接続されている渡り線17によりバイパスされる
ため、B系の保護継電器RyBに流れるCT1からの負
荷電流I1r,I1s,I1tとCT2からの変圧器T
R側電流I2r,I2s,I2tはバランスしているの
で、B系比率差動継電器RyBは動作しない。 【0009】しかし、プラグ11a、11cは渡り線1
7、短絡線18を接続した状態で試験用端子1a、1c
に差し込むため、プラグ11cを差し込む時、試験用端
子1cの渡り線17が接続されている第2の接触子6に
プラグの導電部14が接触する前に、プラグ11cの短
絡線18が接続されている導電部13に第1の接触子5
にプラグの導電部13が接触すると、図5に示すよう
に、試験用端子1cの端子7、9、11間が短絡されて
電流I2r,I2s,I2tがB系継電器RyBに流れ
なくなることがあり、B系比率差動継電器RyBが不要
動作する恐れがある。 【0010】本発明は、このような課題に鑑みてなされ
たものであり、試験用端子にプラグを差し込んだ時に発
生する比率差動継電器などの不要動作を防止することを
目的とする。 【0011】 【課題を解決するための手段】本発明に係る試験用端子
プラグは、それぞれ対向接触している第1、第2の接触
子を備えた試験用端子と、前記試験用端子に差し込んだ
とき前記第1、第2の接触子の接触を切り離すと共に前
記第1の接触子に接触する第1の導電部と、第2の接触子
に接触する第2の導電部と、該第1、第2の導電部にそれ
ぞれ接続された第1、第2の端子を有するプラグと、から
なる試験用端子プラグにおいて、前記プラグの第1、第
2の導電部を、その先端位置が異なるように設け、前記
試験用端子に差し込んだとき第1、第2の導電部が同時
に試験用端子の第1、第2の接触子に接触しないように
したことを特徴とする。 【0012】 【発明の実施の形態】図1に本発明の実施形態に係る試
験用端子プラグの概略断面構成を示す。図1について、
試験用端子プラグAは、試験用端子1とプラグ11で構
成されている。この試験用端子プラグAは、プラグ11
の導電部13、14長さが相違する点を除き、従来図4
に示したものと同様に構成されている。即ち、試験用端
子1は、基台2と、基台2に取り付けらた端子ねじ取付
部3aを有する端子板3及び端子ねじ取付部4aを有す
る端子板4と、断面逆J字状をした接触片5aと5b及
び6aと6bからなる第1、第2の接触子5及び6と、
プラグ挿入用孔9aを有するカバー9とからなり、第
1、第2の接触子5及び6は常時接触するように、それ
ぞれ基端部が端子金具3及び4にねじ7、8で固定さ
れ、2枚刃構成の接触子を構成している。 【0013】また、プラグ11は、把手部12aと差込
み部12bを有する絶縁部材からなる断面T字状のプラ
グ本体12と、この差込み部12bの両面に設けられた
長さを異にする第1、第2の導電部13、14と、この
導電部13、14と一体に形成され、把手部12aの内
部を通り把手部12aの反差込み部側に突出した端子1
3a、14aで構成されている。 【0014】上記プラグ11の第1の導電部13は、第
2の導電部14より図示のように長さaだけ短く形成さ
れており、その先端位置が第2の導電部14の先端位置
よりその長さaだけ後退した位置となるように設けられ
ている。すなわち、このプラグ11は、試験用端子1に
差込む際、第2の導電部14が試験用端子1の第2の接
触子6に接触した後、遅れて導電部13が第1の接触子
5に接触するようになっている。 【0015】試験用端子1には上記第1、第2の接触子
5、6からなる2枚刃構成の接触子が3個(3P)又は6
個(6P)設けられており、また、上記プラグ11にも
上記導電部13、14が3個(6P)又は6個(6P)設
けられている。 【0016】上記第1の導電部13の長さが第2の導電部
14の長さより短く形成されたプラグ11を、図2に示
すように、保護継電器RyA、RyBを2重に設けられ
た保護継電器RyA、RyBにそれぞれ接続されている
試験用端子1a〜1dに適用する場合を考える。試験用
端子1a〜1dおよびプラグ11a〜11dは、それぞ
れ対をなす第1、第2の接触子5、6および対をなす第
1、第2の導電部13、14の数が6個(6P)のものを
使用する。 【0017】A系試験対象保護継電器Aの試験は、試験
用端子1a、1cにそれぞれプラグ11a、11cを挿
入して行う。試験用端子1cにプラグ11cを挿入する
と、プラグ11cの先端部分で試験用端子1cの第1接
触子5の接触片5a、5bの接触が切り離されると同時
に長い方の第2の導電部14が第2の接触子6に接触す
るので、流れていた電流I2r,I2s,I2tは第2
の導電部14の端子部14aに接続されている渡り線1
7によりA系保護継電器AをバイパスしてB系保護継電
器Bに流れる。その直後にプラグ11cの短い方の第1
の導電部13が第1の接触子5に接触し、第一の導電部
13の端子部13aに接続されている短絡線18で図3
のように、試験用端子1cの端子7、9、11が短絡さ
れる。したがって、従来図5のように、試験用端子1c
にプラグ11を挿入した時に試験用端子1cの端子7、
9、11が短絡線18により短絡され、B系保護継電器
に電流I2r,I2s,I2tが流れなくなり、B系保
護継電器Bの比率作動継電器が誤動作する、ということ
はなくなる。 【0018】上記A系保護継電器Aの試験用端子1aに
プラグ11aを挿入すると、上記試験用端子1cにプラ
グ11cを挿入した場合と同様に、流れていた電流I1
r、I1s、I1tを短絡させることなくA系保護継電
器Aを渡り線でバイパスさせB系保護継電器Bに流こと
ができる。したがって、図3に示すように、B系保護継
電器Bの比率差動継電器を作動させることなくA系保護
継電器Aを電流回路から切り離すことができる。 【0019】上記のように、本発明の試験用端子プラグ
Aは、そのプラグ11の第1の導電部13の先端位置が
第2導電部14の先端位置より後退した位置となるよう
に設けられているいるので、試験用端子1にプラグ11
を差し込んだ時、必ず導電部14、13の順序で試験用
端子1の接触子6、5に接触するので、従来の導電部1
3、14の先端位置が揃っているプラグ11のように、
比率差動継電器などをを誤作動させるというようなこと
はなくなる。 【0020】 【発明の効果】本発明によれば、プラグの第1、第2導
電部の先端位置が異なっているので、プラグの差し込み
時におけるプラグ第1、第2導電部の試験用端子第1、
第2接触子順序が規定され、差し込み方などによって変
わることがない。このため昼間帯での加圧中の継電器試
験などを安全に行うことができる。プラグの導電部の長
さを異なるようにしただけであるので、従来試験用端子
プラグと同コストで作成できる。
Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test terminal plug used for performing a differential ratio test in a protective relay characteristic test, for example. 2. Description of the Related Art In FIG. 4, a test terminal plug A is
It comprises a test terminal 1 and a plug 11 inserted into the terminal 1. The test terminal 1 includes a terminal plate 3 having terminal screw mounting portions 3a and 4a fixed to a base 2 made of an insulating material.
4, an insulating material having first and second contacts 5 and 6 attached to the terminal plates 3 and 4 and a plug insertion hole 9a covering the first and second contacts 5 and 6, respectively. And a cover 9. The first and second contacts 5 and 6
It comprises two contact pieces 5a and 5b and 6a and 6b each having an inverted J-shaped cross section and different lengths, and the base ends of the first and second contacts 5 and 6 are terminal plates 3 and 4, respectively. Are fixed by mounting screws 7 and 8 to form a two-blade contact. The first and second contacts 5, 6 are always in contact,
When the plug 11 is inserted between the first and second contacts 5, 6, the contact between the first and second contacts 5, 6 is released. The plug 11 includes a plug body 12 having an approximately T-shaped cross-section made of an insulating member having a handle portion 12a and an insertion portion 12b, and an insertion portion 1 of the plug body 12.
2b, and terminal portions 13 formed integrally with the conductive portions 13 and 14 and passing through the inside of the handle portion 12a and protruding to the back side of the handle portion 12a.
a and 14a. The test terminal 1 includes three (3P) or six contacts having a two-blade configuration including the first and second contacts 5 and 6.
(6P), and the plug 11 to be inserted into the test terminal 1 also has the same number of conductive portions 13 and 14. When the plug 11 is inserted into the test terminal 1, the contact between the contact pieces 5a, 6a and 5b, 6b of the first and second contacts 5, 6 is cut off by the insertion portion 12b, 5a and 5b are in contact with the conductive portion 13a of the plug 11, and the contact pieces 6a and 6b are in contact with the conductive portion 14 of the plug 11. Therefore, for example, as shown in FIG.
The test terminal 1 is connected between the CT and the protective relay Ry, and during the test, the terminal 13 of the conductive portion 13 of the plug 11 is connected.
a, a short-circuit line 15 is connected to the conductive portion 14 of the plug 11.
By inserting the plug 11 into the test terminal 1 with the connection line 16 of the tester TS connected to the terminal portion 14a of the
The disconnection of the secondary side and the protection relay Ry and the short-circuiting of the CT secondary side can be performed at the same time, and the testing device TS can be connected to the protection relay Ry without opening the CT secondary side. [0007] As equipment of a current substation, a double protective relay is provided to improve reliability. In addition, the number of tests in the daytime charged state is increasing due to the reduction of maintenance staff and the like. As shown in FIG. 5, in a circuit in which protective relays RyA and RyB are provided in a double manner, a test terminal 1 having six contacts having the above-mentioned two-blade configuration is provided before and after the relay.
a to 1d are connected to enable testing at any time. When testing the A-system protection relay RyA to be tested,
Plugs 11a and 11c are inserted into the test terminals 1a and 1c so that the current flowing through the protection relay RyA is bypassed and cut off from the current circuit so that the differential relay does not operate. When the plug 11c having the connecting wire 17 connected to the test terminal 1c is inserted, the transformer TR side currents I2r, I2s, I2t flowing through the protection relay RyA are changed to the plug 1c.
1c, the load currents I1r, I1s, I1t from CT1 flowing through the B-system protection relay RyB and the transformer T from CT2.
Since the R-side currents I2r, I2s, and I2t are balanced, the B-system ratio differential relay RyB does not operate. However, the plugs 11a and 11c are
7. Test terminals 1a, 1c with short-circuit line 18 connected
When the plug 11c is inserted, the short-circuit wire 18 of the plug 11c is connected before the conductive portion 14 of the plug contacts the second contact 6 to which the connecting wire 17 of the test terminal 1c is connected. The first contact 5 on the conductive portion 13
When the conductive portion 13 of the plug contacts the terminal 7, the terminals 7, 9, and 11 of the test terminal 1c are short-circuited and the currents I2r, I2s, and I2t may not flow to the B-system relay RyB, as shown in FIG. , B-system ratio differential relay RyB may operate unnecessarily. The present invention has been made in view of such problems, and has as its object to prevent unnecessary operation of a ratio differential relay or the like that occurs when a plug is inserted into a test terminal. A test terminal plug according to the present invention includes a test terminal having first and second contacts that are in opposing contact with each other, and is inserted into the test terminal. The first and second contacts separate the contact between the first and second contacts and contact the first contact; a second conductive portion that contacts the second contact; And a plug having first and second terminals connected to the second conductive portion, respectively. In the test terminal plug, the first and second conductive portions of the plug are different from each other in the tip position. And the first and second conductive portions are prevented from simultaneously contacting the first and second contacts of the test terminal when inserted into the test terminal. FIG. 1 shows a schematic sectional configuration of a test terminal plug according to an embodiment of the present invention. Referring to FIG.
The test terminal plug A includes a test terminal 1 and a plug 11. This test terminal plug A is a plug 11
4 except that the lengths of the conductive portions 13 and 14 of FIG.
The configuration is the same as that shown in FIG. That is, the test terminal 1 had a base 2, a terminal plate 3 having a terminal screw mounting portion 3 a attached to the base 2, and a terminal plate 4 having a terminal screw mounting portion 4 a, and an inverted J-shaped cross section. First and second contacts 5 and 6 comprising contact pieces 5a and 5b and 6a and 6b;
And a cover 9 having a plug insertion hole 9a.
The base ends of the first and second contacts 5 and 6 are fixed to the terminal fittings 3 and 4 with screws 7 and 8 so that they are always in contact with each other, thereby forming a two-blade contact. The plug 11 has a T-shaped cross section made of an insulating member having a handle portion 12a and an insertion portion 12b, and first plugs having different lengths provided on both surfaces of the insertion portion 12b. , A second conductive portion 13, 14, and a terminal 1 formed integrally with the conductive portion 13, 14 and protruding through the inside of the handle portion 12 a to the opposite insertion portion side of the handle portion 12 a.
3a and 14a. The first conductive portion 13 of the plug 11 is formed to be shorter than the second conductive portion 14 by a length a as shown in the figure, and the leading end of the first conductive portion 13 is located farther than the leading end of the second conductive portion 14. It is provided so as to be at a position retracted by the length a. That is, when the plug 11 is inserted into the test terminal 1, after the second conductive portion 14 comes into contact with the second contact 6 of the test terminal 1, the conductive portion 13 is delayed by the first contact 5. The test terminal 1 has three (3P) or six contacts having a two-blade configuration including the first and second contacts 5 and 6.
(6P), and the plug 11 is also provided with three (6P) or six (6P) conductive portions 13 and 14. As shown in FIG. 2, the plug 11 in which the length of the first conductive portion 13 is shorter than the length of the second conductive portion 14 is provided with two protective relays RyA and RyB. Consider a case where the present invention is applied to the test terminals 1a to 1d connected to the protection relays RyA and RyB, respectively. The test terminals 1a to 1d and the plugs 11a to 11d are paired with the first and second contacts 5, 6 and the paired first
1. The number of the second conductive portions 13 and 14 is 6 (6P). The test of the protection relay A for the A system test is performed by inserting the plugs 11a and 11c into the test terminals 1a and 1c, respectively. When the plug 11c is inserted into the test terminal 1c, the contact of the contact pieces 5a and 5b of the first contact 5 of the test terminal 1c is cut off at the tip of the plug 11c, and at the same time, the longer second conductive portion 14 is formed. Since the second contacts 6 are in contact with each other, the currents I2r, I2s,
Connecting wire 1 connected to the terminal portion 14a of the conductive portion 14 of FIG.
7 flows to the B-system protection relay B, bypassing the A-system protection relay A. Immediately after that, the first
3 contacts the first contact 5 and a short-circuit line 18 connected to the terminal portion 13a of the first conductive portion 13 in FIG.
As described above, the terminals 7, 9, 11 of the test terminal 1c are short-circuited. Therefore, as shown in FIG.
When the plug 11 is inserted into the terminal 7, the terminal 7 of the test terminal 1c,
9 and 11 are short-circuited by the short-circuit line 18 so that the currents I2r, I2s and I2t do not flow through the B-system protection relay, and the ratio operation relay of the B-system protection relay B does not malfunction. When the plug 11a is inserted into the test terminal 1a of the A-system protection relay A, the current I1 flowing therethrough is the same as when the plug 11c is inserted into the test terminal 1c.
The A-system protection relay A can be bypassed with a crossover without short-circuiting r, I1s, and I1t, and can flow to the B-system protection relay B. Therefore, as shown in FIG. 3, the A-system protection relay A can be disconnected from the current circuit without activating the ratio differential relay of the B-system protection relay B. As described above, the test terminal plug A of the present invention is provided such that the distal end of the first conductive portion 13 of the plug 11 is located at a position retracted from the distal end of the second conductive portion 14. The plug 11 is connected to the test terminal 1
Is inserted, the contact portions 6 and 5 of the test terminal 1 are always contacted in the order of the conductive portions 14 and 13, so that the conventional conductive portion 1
Like the plug 11 in which the tip positions of 3, 14 are aligned,
It is no longer possible to malfunction the ratio differential relay or the like. According to the present invention, since the tip positions of the first and second conductive portions of the plug are different, the test terminals of the first and second conductive portions of the plug when the plug is inserted. 1,
The order of the second contacts is defined and does not change depending on the insertion method. Therefore, a relay test or the like during pressurization in the daytime zone can be performed safely. Since only the length of the conductive portion of the plug is changed, it can be manufactured at the same cost as the conventional test terminal plug.

【図面の簡単な説明】 【図1】実施の形態にかかる試験用端子及びプラグの概
略側断面図。 【図2】実施形態に係る試験対象保護継電器バイパス時
の電流説明図。 【図3】同試験時の負荷電流と試験電流説明図。 【図4】従来例にかかる試験用端子及びプラグの概略側
断面図。 【図5】従来例に係る運転側保護継電器動作状態の電流
説明図。 【図6】従来試験用端子プラグの使用例を示す説明図 【符号の説明】 Ry…保護継電器 1…試験用端子 5…第1の接触子 6…第2の接触子 11…プラグ 13…第1の導電部 14…第2の導電部 13a,14a…端子 15〜18…渡り線、短絡線
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic side sectional view of a test terminal and a plug according to an embodiment. FIG. 2 is a diagram illustrating a current when a protection relay to be tested according to the embodiment is bypassed. FIG. 3 is an explanatory diagram of a load current and a test current during the test. FIG. 4 is a schematic side sectional view of a test terminal and a plug according to a conventional example. FIG. 5 is a diagram illustrating a current in an operating state of a driving-side protection relay according to a conventional example. FIG. 6 is an explanatory view showing an example of use of a conventional test terminal plug. [Description of References] Ry ... Protective relay 1 ... Test terminal 5 ... First contact 6 ... Second contact 11 ... Plug 13 ... 1 conductive part 14 ... second conductive parts 13a, 14a ... terminals 15 to 18 ... crossover wire, short-circuit wire

Claims (1)

【特許請求の範囲】 【請求項1】 それぞれ対向接触している第1、第2の
接触子を備えた試験用端子と、 前記試験用端子に差し込んだとき前記第1、第2の接触
子の接触を切り離すと共に前記第1の接触子に接触する
第1の導電部と、第2の接触子に接触する第2の導電部
と、該第1、第2の導電部にそれぞれ接続された第1、第2
の端子を有するプラグと、からなる試験用端子プラグに
おいて、 前記プラグの第1、第2の導電部を、その先端位置が異
なるように設け、前記試験用端子に差し込んだとき第
1、第2の導電部が同時に試験用端子の第1、第2の接
触子に接触しないようにしたことを特徴とする試験用端
子プラグ。
Claims: 1. A test terminal having first and second contacts in opposing contact with each other, and the first and second contacts when inserted into the test terminal. And a first conductive portion that contacts the first contact, a second conductive portion that contacts the second contact, and the first and second conductive portions, respectively. 1st, 2nd
And a plug having a first terminal and a second terminal when the plug is inserted into the test terminal. A test terminal plug, wherein the conductive portion of the test terminal does not contact the first and second contacts of the test terminal at the same time.
JP2001229091A 2001-07-30 2001-07-30 Terminal plug for testing relay Pending JP2003045573A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001229091A JP2003045573A (en) 2001-07-30 2001-07-30 Terminal plug for testing relay

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001229091A JP2003045573A (en) 2001-07-30 2001-07-30 Terminal plug for testing relay

Publications (1)

Publication Number Publication Date
JP2003045573A true JP2003045573A (en) 2003-02-14

Family

ID=19061490

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2003045573A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011093224A1 (en) * 2010-01-28 2011-08-04 ソニー株式会社 Connector and power feed system
CN104934749A (en) * 2015-07-05 2015-09-23 西安科技大学 An ammeter series access apparatus
KR102064122B1 (en) * 2019-06-27 2020-01-08 한전케이피에스 주식회사 Insulated connector for relay test switch

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011093224A1 (en) * 2010-01-28 2011-08-04 ソニー株式会社 Connector and power feed system
JP2011154978A (en) * 2010-01-28 2011-08-11 Sony Corp Connector and power feed system
CN102725923A (en) * 2010-01-28 2012-10-10 索尼公司 Connector and power feed system
CN104934749A (en) * 2015-07-05 2015-09-23 西安科技大学 An ammeter series access apparatus
KR102064122B1 (en) * 2019-06-27 2020-01-08 한전케이피에스 주식회사 Insulated connector for relay test switch

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