JP2002532845A5 - - Google Patents

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Publication number
JP2002532845A5
JP2002532845A5 JP2000588791A JP2000588791A JP2002532845A5 JP 2002532845 A5 JP2002532845 A5 JP 2002532845A5 JP 2000588791 A JP2000588791 A JP 2000588791A JP 2000588791 A JP2000588791 A JP 2000588791A JP 2002532845 A5 JP2002532845 A5 JP 2002532845A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000588791A
Other languages
Japanese (ja)
Other versions
JP2002532845A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US1999/030269 external-priority patent/WO2000036633A1/fr
Publication of JP2002532845A publication Critical patent/JP2002532845A/ja
Publication of JP2002532845A5 publication Critical patent/JP2002532845A5/ja
Pending legal-status Critical Current

Links

JP2000588791A 1998-12-17 1999-12-17 衝突誘導解離を使用する分子構造分析用のインライン反射飛翔時間型質量分析計 Pending JP2002532845A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11261598P 1998-12-17 1998-12-17
US60/112,615 1998-12-17
PCT/US1999/030269 WO2000036633A1 (fr) 1998-12-17 1999-12-17 Spectrometre de masse a temps de vol a reflechissement lineaire destine a l'analyse moleculaire structurelle au moyen de dissociation induite par collision

Publications (2)

Publication Number Publication Date
JP2002532845A JP2002532845A (ja) 2002-10-02
JP2002532845A5 true JP2002532845A5 (fr) 2005-11-17

Family

ID=22344907

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000588791A Pending JP2002532845A (ja) 1998-12-17 1999-12-17 衝突誘導解離を使用する分子構造分析用のインライン反射飛翔時間型質量分析計

Country Status (3)

Country Link
EP (1) EP1153414A1 (fr)
JP (1) JP2002532845A (fr)
WO (1) WO2000036633A1 (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0219072D0 (en) * 2002-08-16 2002-09-25 Scient Analysis Instr Ltd Charged particle buncher
JP4688504B2 (ja) * 2005-01-11 2011-05-25 日本電子株式会社 タンデム飛行時間型質量分析装置
JP5482905B2 (ja) * 2010-09-08 2014-05-07 株式会社島津製作所 飛行時間型質量分析装置
JP2014102990A (ja) * 2012-11-20 2014-06-05 Sumitomo Heavy Ind Ltd サイクロトロン
JP6897870B2 (ja) * 2018-04-26 2021-07-07 株式会社島津製作所 飛行時間型質量分析装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4106796A1 (de) * 1991-03-04 1991-11-07 Wollnik Hermann Ein flugzeit-massenspektrometer als sekundaerstufe eines ms-ms systems
US5689111A (en) * 1995-08-10 1997-11-18 Analytica Of Branford, Inc. Ion storage time-of-flight mass spectrometer

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