JP2002368082A - Method and device for filling metal into fine space - Google Patents

Method and device for filling metal into fine space

Info

Publication number
JP2002368082A
JP2002368082A JP2001174016A JP2001174016A JP2002368082A JP 2002368082 A JP2002368082 A JP 2002368082A JP 2001174016 A JP2001174016 A JP 2001174016A JP 2001174016 A JP2001174016 A JP 2001174016A JP 2002368082 A JP2002368082 A JP 2002368082A
Authority
JP
Japan
Prior art keywords
metal
filling
sample
vacuum chamber
fine space
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001174016A
Other languages
Japanese (ja)
Inventor
Kazuhisa Itoi
和久 糸井
Tatsuo Suemasu
龍夫 末益
Isao Takizawa
功 滝沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujikura Ltd
Original Assignee
Fujikura Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujikura Ltd filed Critical Fujikura Ltd
Priority to JP2001174016A priority Critical patent/JP2002368082A/en
Publication of JP2002368082A publication Critical patent/JP2002368082A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To enable filling of metal into a fine hole made in a silicon substrate or the like and having a high aspect ratio without a space and to prevent generation of warpage or cracking in a specimen. SOLUTION: A silicon substrate 14 having a fine hole formed therein and a metallic sheet 15 are fixed by means of a specimen fixing jig 12 and positioned within a vacuum chamber 11. Thereafter, the vacuum chamber 11 is evacuated until the internal pressure of the chamber 11 reaches a predetermined vacuum level. At this time, the metallic sheet 15 is melted by a heating means 16 and then the chamber 11 is compressed with an inert gas up to an atmospheric pressure or higher. Thereby the melted metal is vacuum sucked into the fine hole. Next, the vacuum chamber is made open, the melted metal remaining on the specimen is removed, and thereafter the chamber is cooled down to the room temperature. Metal can be filled into the fine hole having a high aspect ratio without generating of a cavity or the like. Since the melted metal has a smaller heat capacity than that when compared with a method for immersing the metal into a melted metal bath or the like, no warpage or cracking takes place in the specimen. Excessive metal can be suppressed to a minimum level and its cost can be reduced.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明に属する技術分野】この発明は、試料に形成され
た微細孔や微細隙間等の微細空間への金属充填方法およ
び装置に関し、特にシリコン基板等にあけた高アスペク
ト比の微細孔に金属を充填する場合に好適な微細空間へ
の金属充填方法および装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and an apparatus for filling metal into a fine space such as a fine hole or a fine gap formed in a sample, and more particularly to a method for filling a fine hole with a high aspect ratio in a silicon substrate or the like with a metal. The present invention relates to a method and an apparatus for filling a metal into a fine space suitable for filling.

【0002】[0002]

【従来の技術】従来、被加工物(以下、試料という)に
形成された微細空間、例えば微細孔へ金属充填する場合
として、例えばシリコンICチップ等の製造工程でシリ
コン基板に貫通電極(ビアホール電極)を形成する場
合、シリコン基板に貫通電極用の貫通孔をあけ、このシ
リコン基板を、導体用の金属を溶融させた溶融金属(メ
ッキ液)に挿入して、貫通孔内に溶融金属を充填するメ
ッキ法が一般的である。
2. Description of the Related Art Conventionally, when metal is filled in a fine space, for example, a fine hole formed in a workpiece (hereinafter, referred to as a sample), a through electrode (via hole electrode) is formed in a silicon substrate in a manufacturing process of, for example, a silicon IC chip. )), A through hole for a through electrode is formed in a silicon substrate, and this silicon substrate is inserted into a molten metal (plating solution) obtained by melting a metal for a conductor, and the molten metal is filled in the through hole. A common plating method is used.

【0003】[0003]

【発明が解決しようとする課題】しかし、貫通孔が高い
アスペクト比(孔深さ/開口部直径)の微細孔である場
合、溶融金属が微細孔の奥深くまで進入できないため
に、例えば、図6に示すようにシリコン基板1の微細孔
2の入口付近に溶融金属3が集中して成長して内部に空
隙が生じたり、図7に示すように微細孔2内の溶融金属
3に鬆(す)4が出来たりする等、空隙のない均一な金
属充填を行なうことが出来ないため、良好な貫通電極を
作成することは困難であった。
However, when the through hole is a fine hole having a high aspect ratio (hole depth / opening diameter), the molten metal cannot enter deep into the fine hole. As shown in FIG. 7, the molten metal 3 grows in a concentrated manner near the entrance of the fine hole 2 in the silicon substrate 1 to form a void inside, or the molten metal 3 in the fine hole 2 as shown in FIG. 4) It is difficult to perform uniform metal filling without voids, for example, it is difficult to form a good through electrode.

【0004】ところで、例えば、シリコンICチップを
積層する高密度3次元実装を行なおうとすると、一枚の
シリコン基板の表裏に形成された配線パターンを繋ぐた
めの貫通電極を形成する必要が生じる場合があるが、こ
の貫通電極を上記従来の方法で形成しようとすると、シ
リコン基板にあける貫通孔が深く高アスペクト比の微細
孔となるので、上述の通り、この微細孔にメッキ法で金
属を充填して貫通電極を形成することは困難である。
By the way, for example, when performing high-density three-dimensional mounting in which silicon IC chips are stacked, it is necessary to form through electrodes for connecting wiring patterns formed on the front and back of one silicon substrate. However, if it is attempted to form this through-electrode by the above-mentioned conventional method, the through-hole formed in the silicon substrate becomes a deep hole having a high aspect ratio. As described above, the fine hole is filled with a metal by plating. It is difficult to form a through electrode.

【0005】ところで、上記の問題を解決するために、
本出願人のもとで、真空中で溶融した金属槽内に試料を
挿入し、その後雰囲気を大気圧にもどすことで、雰囲気
と微細孔内(真空)とに圧力差を生じさせ、その圧力差
により溶融金属を微細孔に充填し、充填完了後、試料を
引き上げるという金属充填方法を開発し特許出願をした
(特願2000−355725号参照)。
By the way, in order to solve the above problem,
Under the present applicant, a sample is inserted into a metal bath melted in a vacuum, and then the atmosphere is returned to the atmospheric pressure, so that a pressure difference is generated between the atmosphere and the inside of the micropore (vacuum). Based on the difference, the molten metal was filled into the micropores, and after the filling was completed, the sample was pulled up.

【0006】しかしながら、上記の雰囲気と微細孔内の
圧力差を利用する金属充填方法の場合、溶融金属槽に試
料を浸漬するディッピング方式を採用しているので、金
属と試料間の熱膨張係数の違いのため試料に反りが生じ
るという問題があり、極端な場合には割れることもあっ
た。さらに、この圧力差とともにディッピング方式を採
用した金属充填方法では、試料を十分に浸漬できるだけ
の容量を持った溶融金属が必要であるため、また、前述
の試料引き上げ後に試料表面に固着している、微細孔内
充填金属以外の多量の余剰金属は、要求される純度維持
のために再生に回すしかないため、金等の高価な貴金属
元素を充填する場合にはコスト的に効率が悪いという問
題があった。
However, in the metal filling method utilizing the pressure difference between the atmosphere and the micropores, a dipping method in which the sample is immersed in a molten metal bath is employed, so that the coefficient of thermal expansion between the metal and the sample is reduced. There is a problem that the sample is warped due to the difference, and in an extreme case, the sample may be broken. Furthermore, in the metal filling method employing the dipping method together with this pressure difference, a molten metal having a capacity sufficient to immerse the sample is required, and the metal is fixed to the sample surface after the above-described sample lifting. A large amount of surplus metal other than the metal filled in the micropores can only be recycled for maintaining the required purity. there were.

【0007】本発明は上記事情に鑑みてなされたもの
で、シリコン基板等の試料中に形成された微細空間に金
属を空隙なしに充填することを可能にし、また、試料に
反りや割れが生じたりせず、さらに、容量の大きな溶融
金属糟等を必要とせず、また、微細空間内充填金属以外
の余剰金属を最小限に抑制することが可能で、高価な貴
金属元素を用いる場合でも低コストで金属充填を行なう
ことが可能な金属充填方法および装置を提供することを
目的とする。
The present invention has been made in view of the above circumstances, and enables a metal to be filled in a minute space formed in a sample, such as a silicon substrate, without voids. It does not require a large-capacity molten metal bath and the like, and minimizes excess metal other than the metal filled in the minute space.Low cost even when expensive precious metal elements are used It is an object of the present invention to provide a metal filling method and apparatus capable of performing metal filling by using a method.

【0008】[0008]

【課題を解決するための手段】上記課題を解決する請求
項1の微細空間への金属充填方法は、減圧した真空チャ
ンバー内で、金属を充填すべき微細空間が形成された試
料の一面に、前記微細空間を覆うように充填用金属体を
配置し、この充填用金属体を加熱溶融させた後、真空チ
ャンバー内を不活性ガスで大気圧以上に加圧して、溶融
した金属を微細空間に真空吸入させることを特徴とす
る。
According to a first aspect of the present invention, there is provided a method of filling a fine space with a metal, the method comprising the steps of: A metal body for filling is arranged so as to cover the fine space, and after heating and melting the metal body for filling, the inside of the vacuum chamber is pressurized to above atmospheric pressure with an inert gas, and the molten metal is filled into the fine space. It is characterized by vacuum suction.

【0009】請求項2の微細空間への金属充填方法は、
金属を充填すべき微細空間が形成された試料と充填用金
属体とを試料固定用治具に固定し、これらを真空チャン
バー内に配置した後、真空チャンバー内を減圧し、真空
チャンバー内が所定の真空度に達した後、前記充填用金
属体を加熱手段により溶融させ次いで真空チャンバー内
を不活性ガスで大気圧以上に加圧することにより、溶融
した金属を微細空間に真空吸入させ、次いで真空チャン
バーを開放して、試料表面に残った溶融状態の金属を取
り除き、その後室温冷却することを特徴とする。
[0009] The method for filling metal into a fine space according to claim 2 is as follows.
A sample in which a fine space to be filled with metal is formed and a metal body for filling are fixed to a jig for fixing a sample, and after these are arranged in a vacuum chamber, the inside of the vacuum chamber is depressurized. After reaching the degree of vacuum, the filling metal body is melted by heating means, and then the inside of the vacuum chamber is pressurized to above atmospheric pressure with an inert gas, whereby the melted metal is vacuum sucked into a fine space, and then vacuum The method is characterized in that the chamber is opened to remove the metal in the molten state remaining on the sample surface, and then cooled to room temperature.

【0010】請求項3は、請求項1または2記載の微細
空間への金属充填方法において、充填用金属体として金
属シートを用いることを特徴とする。
According to a third aspect of the present invention, in the method for filling a metal into a fine space according to the first or second aspect, a metal sheet is used as the metal body for filling.

【0011】請求項4は、請求項1または2記載の微細
空間への金属充填方法を実施する微細空間への金属充填
装置であって、内部を減圧する減圧手段と内部を不活性
ガスで大気圧以上に加圧する加圧手段とを備えた真空チ
ャンバーと、金属を充填すべき微細空間が形成された試
料をその上に充填用金属体を重ねた状態で固定する試料
固定用治具と、真空チャンバー内で前記試料固定用治具
に固定された試料上の充填用金属体に面するように設け
た主たる加熱装置と試料固定用治具の試料載置面に設け
た補助加熱装置とからなる加熱手段とを備えたことを特
徴とする。
A fourth aspect of the present invention is an apparatus for filling a fine space with a metal, which implements the method for filling a fine space with a metal according to the first or second aspect. A vacuum chamber having a pressurizing means for pressurizing to a pressure higher than the atmospheric pressure, and a sample fixing jig for fixing a sample in which a fine space to be filled with metal is formed in a state where a metal body for filling is stacked thereon, In the vacuum chamber, a main heating device provided so as to face the filling metal body on the sample fixed to the sample fixing jig and an auxiliary heating device provided on the sample mounting surface of the sample fixing jig And a heating means.

【0012】[0012]

【発明の実施の形態】以下、本発明の実施の形態を図1
〜図5を参照して説明する。図1は本発明の一実施形態
の金属充填装置10の模式的な斜視図で、内部を減圧す
る減圧手段と内部を不活性ガスで大気圧以上に加圧する
加圧手段とを備えた真空チャンバー11と、金属を充填
すべき微細孔が形成された試料をその上に充填用金属体
とを重ねた状態で固定する試料固定用治具12と、真空
チャンバー11内で前記試料固定用治具12に固定され
た試料上の充填用金属体を加熱する加熱手段13とを備
えている。
FIG. 1 is a block diagram showing an embodiment of the present invention.
This will be described with reference to FIGS. FIG. 1 is a schematic perspective view of a metal filling apparatus 10 according to one embodiment of the present invention, and a vacuum chamber provided with a depressurizing means for depressurizing the inside and a pressurizing means for pressurizing the inside with an inert gas to a pressure higher than the atmospheric pressure. 11, a sample fixing jig 12 for fixing a sample in which fine holes to be filled with metal are formed and a metal body for filling on the sample, and the sample fixing jig in the vacuum chamber 11 Heating means 13 for heating the filling metal body on the sample fixed to 12.

【0013】この実施形態は、図2に示すように、複数
の微細孔14aが形成された概ね円板状のシリコン基板
14を試料とする場合である。また、微細孔14aに金
属を充填するための充填用金属体として、図3に示す円
板状の金属シート15を用いる場合である。但し、使用
する充填用金属体は、円形に限らず、適宜の形の金属シ
ートを使用することができ、さらに、シート状のものに
限らず、多数の粒状あるいは塊状のものでもよい。要す
るに、後述するように、溶解した時に微細孔に真空吸引
される態様で微細孔に面して配置できる金属体であれば
よい。また、この実施形態では、金属シート15を加熱
する加熱手段13が、真空チャンバー11内で前記金属
シート15に面するように設けた赤外線ヒータ等の主た
る加熱装置16と、前記試料固定用治具12の試料載置
面12aに設けた電熱ヒータ等の補助加熱装置17とか
らなっている。
In this embodiment, as shown in FIG. 2, a substantially disk-shaped silicon substrate 14 having a plurality of fine holes 14a is used as a sample. In addition, a disk-shaped metal sheet 15 shown in FIG. 3 is used as a filling metal body for filling the fine holes 14a with metal. However, the metal body to be used is not limited to a circular shape, and a metal sheet of an appropriate shape can be used. Further, the metal body is not limited to a sheet shape and may be a large number of granular or massive shapes. In short, any metal body that can be arranged so as to face the micropores in such a manner as to be vacuum-sucked into the micropores when melted, as described later, may be used. In this embodiment, the heating means 13 for heating the metal sheet 15 includes a main heating device 16 such as an infrared heater provided in the vacuum chamber 11 so as to face the metal sheet 15 and the jig for fixing the sample. And an auxiliary heating device 17 such as an electric heater provided on the twelve sample mounting surfaces 12a.

【0014】なお、前述の通り図1は模式的に示したも
のであり、試料固定用治具12および加熱装置16は真
空チャンバー11の内部で適宜の手段で取り付けられて
いる。なお、真空チャンバー11には、図示は省略した
が、内部を真空圧に減圧するための真空ポンプを吸引管
を介して接続している。また、内部を例えば窒素ガス
(N)等の不活性ガスのパージにより大気圧以上に加
圧するためのボンベ等をガス導入管(図4(ハ)の1
8)を介して接続している。
As described above, FIG. 1 is a schematic view, and the sample fixing jig 12 and the heating device 16 are mounted inside the vacuum chamber 11 by appropriate means. Although not shown, a vacuum pump for reducing the pressure inside the vacuum chamber 11 to a vacuum pressure is connected to the vacuum chamber 11 via a suction pipe. In addition, a cylinder or the like for pressurizing the inside to an atmospheric pressure or more by purging with an inert gas such as nitrogen gas (N 2 ) is provided in a gas introduction pipe (1 in FIG. 4C).
8).

【0015】上記の金属充填装置10により、シリコン
基板14に形成した微細孔14aに金属を充填する手順
を、図4(イ)〜(ホ)および図5(イ)〜(ホ)を参
照して説明する。まず、微細孔14aが形成されたシリ
コン基板14の上面に金属シート15をハンダボール等
で取り付けて、これを試料固定用治具12に固定し、真
空チャンバー11の内部にセットする(図4(イ)、図
5(イ))。微細孔14aに充填する金属としては、例
えばインジウム、錫、あるいは金−錫の共晶半田など、
比較的蒸気圧の低い金属が好ましく、金属シートはこれ
らの材質のものを用いる。但し、特にこれらに限定され
ない。次いで、真空チャンバー11内を例えば10−2
〜10−3Pa(パスカル)等の真空圧に減圧する。な
お、真空圧に減圧する際、微細孔14a内に空気が残ら
ないように、微細孔14aの上に障害物のない状態とす
る必要があるが、金属シート15であれば、図4(イ)
および図5(イ)のように、シリコン基板14との間に
若干の隙間を持たせることで、複数の微細孔14aの上
に障害とならなように配置することが容易である。
The procedure for filling the metal into the fine holes 14a formed in the silicon substrate 14 by the metal filling apparatus 10 will be described with reference to FIGS. Will be explained. First, a metal sheet 15 is attached with a solder ball or the like to the upper surface of the silicon substrate 14 in which the fine holes 14a are formed, and the metal sheet 15 is fixed to the sample fixing jig 12 and set inside the vacuum chamber 11 (FIG. A), FIG. 5 (a)). Examples of the metal filling the fine holes 14a include indium, tin, and gold-tin eutectic solder.
A metal having a relatively low vapor pressure is preferable, and a metal sheet made of these materials is used. However, it is not particularly limited to these. Next, the inside of the vacuum chamber 11 is, for example, 10 −2.
The pressure is reduced to a vacuum pressure such as 〜1010 −3 Pa (Pascal). When the pressure is reduced to the vacuum pressure, it is necessary to keep the obstacles on the fine holes 14a so that no air remains in the fine holes 14a. )
Also, as shown in FIG. 5A, by providing a slight gap between the silicon substrate 14 and the silicon substrate 14, it is easy to dispose them on the plurality of micro holes 14a so as not to be an obstacle.

【0016】真空チャンバー11内が所定の真空度に達
したら、金属シート15を、主たる加熱装置16および
試料固定用治具12内蔵の補助加熱装置17で加熱して
溶融する(図4(ロ)、図5(ロ))。図5で溶融金属
を15'で示す。金属シート15が溶融した後、真空チ
ャンバー11内を不活性ガス、例えば窒素ガス(N
のパージにより、大気圧以上例えば約1〜5×10Pa
(1〜5kgf/cm2)程度に加圧する。こうして雰囲気(大
気圧以上)と微細孔14a内(真空圧)とに圧力差を発
生させることにより、シリコン基板14の微細孔14a
に溶融金属15'が真空吸入される(図4(ハ)、図5
(ハ))。その後、真空チャンバー11を開放し、溶融
金属15'が固まらないうちに、試料固定用治具12上
で、シリコン基板14の表面に残った金属15'を取り
除く(図4(ニ)、図5(ニ))。最後に、そのまま放
置して室温冷却すると、微細孔14aの溶融金属が固化
する(図4(ホ)、図5(ホ))。微細孔14aで固化
した充填金属を15”で示す。これにより、シリコン基
板14の微細孔14aへの金属充填作業が終了する。
When the inside of the vacuum chamber 11 reaches a predetermined degree of vacuum, the metal sheet 15 is heated and melted by the main heating device 16 and the auxiliary heating device 17 built in the sample fixing jig 12 (FIG. 4B). 5 (b)). In FIG. 5, the molten metal is indicated by 15 '. After the metal sheet 15 is melted, the inside of the vacuum chamber 11 is inert gas, for example, nitrogen gas (N 2 ).
Above atmospheric pressure, for example, about 1-5 × 10 5 Pa
(1-5 kgf / cm 2 ). By generating a pressure difference between the atmosphere (atmospheric pressure or higher) and the inside of the fine holes 14a (vacuum pressure), the fine holes 14a of the silicon substrate 14 are formed.
Molten metal 15 'is sucked in vacuum (FIG. 4 (c), FIG. 5).
(C)). Thereafter, the vacuum chamber 11 is opened, and the metal 15 ′ remaining on the surface of the silicon substrate 14 is removed on the sample fixing jig 12 before the molten metal 15 ′ is hardened (FIG. 4 (d), FIG. 5). (D)). Finally, when left to cool as it is at room temperature, the molten metal in the micropores 14a solidifies (FIG. 4 (e), FIG. 5 (e)). The filling metal solidified by the fine holes 14a is indicated by 15 ". This completes the work of filling the fine holes 14a of the silicon substrate 14 with the metal.

【0017】上記のように、本発明によって高アスペク
ト比の微細孔に対しても金属充填が可能であり、鬆
(す)などの空隙の生じない金属充填が可能である。し
たがって、シリコン基板等に貫通電極を形成する際に、
空隙のない貫通電極を製作することが出来る。なお、真
空圧の微細孔に圧力差で溶融金属を吸入するものである
から、貫通していない微細孔への金属充填も可能であ
る。
As described above, according to the present invention, it is possible to fill a metal into fine pores having a high aspect ratio, and to fill a metal without generating voids such as voids. Therefore, when forming a through electrode on a silicon substrate or the like,
A through electrode having no void can be manufactured. Since the molten metal is sucked into the fine pores of the vacuum pressure with a pressure difference, it is possible to fill the fine pores that do not penetrate the metal.

【0018】なお、シリコン基板の微細孔のサイズは、
特に限定されないが、例えば直径15μm、深さ360
μm(アスペクト比24)、あるいは、直径40μm、
深さ100μm(アスペクト比2.5)等である。ま
た、微細孔は、例えば光電解研磨法、あるいはICP−
RIE(Inductively Coupled Plasma-Ractive Ion Etc
hing)等により形成することができる。
The size of the fine holes in the silicon substrate is as follows:
Although not particularly limited, for example, a diameter of 15 μm and a depth of 360
μm (aspect ratio 24) or 40 μm in diameter,
The depth is 100 μm (aspect ratio 2.5) or the like. The micropores are formed, for example, by photoelectropolishing or ICP-
RIE (Inductively Coupled Plasma-Ractive Ion Etc
hing) or the like.

【0019】また、その他の試料材料として、ガラス、
セラミック、テフロン(登録商標)(フッ素樹脂)、ポ
リイミド等の比較的耐熱性に優れ金属溶融温度では溶け
ない樹脂等が採用できる。因みに、錫の溶融温度は約2
30℃、インジウムの溶融温度は約157℃、金―錫の
溶融温度は金属の比率に比率により異なるが、このよう
に金属の溶融温度で容易に溶けることのない材質であれ
ば、本発明における試料として使用可能となる。さら
に、本発明では、真空圧で金属を溶融させた後大気圧以
上に加圧して金属を充填するので、圧力差の存在が必要
であるが、前後雰囲気圧の絶対値は実施例に限定されな
い。また、本発明における、試料に形成された微細孔と
は、断面で見て一方向へ真っ直ぐに延びるシリコン中の
微細孔には限定されない。例えば、孔が途中で屈曲して
いる場合にも適用できる。例えば、板状試料としてシリ
コン基板を2枚以上積層した多層基板において、孔が試
料の内部表面に沿って途中で屈曲(断面から見て)する
パターンもあるが、このような場合でも本発明によれば
屈曲孔への金属充填が可能となる。またさらに、孔の断
面輪郭が樹枝状に枝分かれしている場合にも、樹枝状先
端部への金属充填が可能である。またさらに、本発明に
よれば、隙間への金属充填も可能となる。例えば、複合
材あるいは単一部材の組み合わせよる構造体よりなる試
料において、これら試料中に形成された微細な隙間(ギ
ャップ)に金属充填をする場合に適用可能である。
Further, as other sample materials, glass,
Resins that have relatively high heat resistance and do not melt at the metal melting temperature, such as ceramic, Teflon (registered trademark) (fluororesin), and polyimide, can be employed. Incidentally, the melting temperature of tin is about 2
The melting temperature of 30 ° C., the melting temperature of indium is about 157 ° C., and the melting temperature of gold-tin varies depending on the ratio of the metal. However, if the material does not easily melt at the melting temperature of the metal, the present invention It can be used as a sample. Further, in the present invention, since the metal is filled by pressing the metal to a pressure higher than the atmospheric pressure after melting the metal with a vacuum pressure, the presence of a pressure difference is necessary, but the absolute value of the ambient pressure before and after is not limited to the examples. . Further, in the present invention, the fine holes formed in the sample are not limited to the fine holes in silicon that extend straight in one direction when viewed in cross section. For example, the present invention can be applied to a case where a hole is bent in the middle. For example, in a multilayer substrate in which two or more silicon substrates are stacked as a plate-like sample, there is a pattern in which holes are bent (as viewed from a cross section) along the inner surface of the sample in some cases. According to this, it becomes possible to fill the bent hole with metal. Furthermore, even when the cross-sectional profile of the hole is branched in a dendritic manner, metal filling at the dendritic tip is possible. Further, according to the present invention, it is possible to fill the gap with metal. For example, the present invention can be applied to a case where a minute gap formed in a sample is filled with metal in a sample composed of a composite material or a structure formed by combining single members.

【0020】[0020]

【発明の効果】本発明によれば、減圧した真空チャンバ
ー内で、微細空間が形成されたシリコン基板やガラス材
等の試料の一面に、前記微細空間を覆うように充填用金
属体を配置し、この充填用金属体を加熱溶融させた後、
真空チャンバー内を大気圧以上に加圧して、溶融した金
属を微細空間に真空吸入させるものであるから、各種試
料内の様々な断面の微細孔等の微細空間に金属を充填す
ることができる。また、高アスペクト比の微細孔に対し
ても、かつ、貫通している微細孔は勿論、貫通していな
い微細孔へも金属充填が可能であり、鬆(す)などの空
隙の生じない金属充填を行なうことができる。貫通した
微細孔に金属を充填して貫通電極を形成する場合には、
空隙のない良好な貫通電極を作成することが出来る。
According to the present invention, a filling metal body is disposed on a surface of a sample such as a silicon substrate or a glass material having a fine space formed therein in a vacuum chamber reduced in pressure so as to cover the fine space. After heating and melting the metal body for filling,
Since the inside of the vacuum chamber is pressurized to a pressure higher than the atmospheric pressure and the molten metal is sucked into the minute space by vacuum, the metal can be filled into minute spaces such as minute holes having various cross sections in various samples. In addition, metal can be filled not only into the fine holes having a high aspect ratio, but also into the fine holes not penetrating as well as the fine holes penetrating therethrough, and the metal without voids such as voids can be formed. Filling can be performed. When filling a penetrating microhole with metal to form a through electrode,
A good through electrode without voids can be formed.

【0021】また、試料を溶融金属糟に浸漬する方式と
比べて、金属シート等を溶融させた少量の溶融金属が試
料に触れるだけで済むので、熱応力により試料に反りや
割れが発生する恐れは少ない。また、溶融金属糟方式の
ように多量の金属を溶融させておく必要がないので、金
等の貴金属元素を用いる場合でも、金属充填のコストを
低減できる。
[0021] Also, compared with a method in which a sample is immersed in a molten metal bath, a small amount of molten metal obtained by melting a metal sheet or the like only needs to touch the sample, so that the sample may be warped or cracked due to thermal stress. Is less. Further, since it is not necessary to melt a large amount of metal as in the molten metal bath method, even when a noble metal element such as gold is used, the cost of metal filling can be reduced.

【0022】また、請求項2のように、金属が固化する
前に、試料表面の溶融状態の余剰金属を取り除くことが
できるので、余剰金属が試料に固着することがない。こ
の点でも、熱応力あるいは固着することで生じる応力に
よるダメージを最小限に抑制することができる。また、
余剰金属が試料に付着しないから、余剰金属を最小限に
抑えることができ、この点でも、金属充填のコストを低
減できる。
Further, since the molten metal on the surface of the sample can be removed before the metal is solidified, the metal does not adhere to the sample. Also in this regard, it is possible to minimize damage due to thermal stress or stress caused by fixing. Also,
Since the surplus metal does not adhere to the sample, the surplus metal can be minimized, and in this respect also, the cost of metal filling can be reduced.

【0023】請求項3のように、充填用金属体として金
属シートを用いると、減圧時に微細孔内に空気が残らな
いように、充填用金属体を複数の微細孔の上に障害物の
ない状態で配置することが容易であり、適切である。
When a metal sheet is used as the filling metal body, the filling metal body is placed on the plurality of fine holes without any obstacle so that no air remains in the fine holes when the pressure is reduced. It is easy and appropriate to place it in a state.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施形態の微細空間への金属充填方
法を実施する金属充填装置の模式的な斜視図である。
FIG. 1 is a schematic perspective view of a metal filling apparatus for carrying out a method for filling a fine space with a metal according to an embodiment of the present invention.

【図2】図1の装置で金属充填をしようとする微細孔が
形成されたシリコン基板の平面図である。
FIG. 2 is a plan view of a silicon substrate in which fine holes to be filled with metal are formed by the apparatus of FIG. 1;

【図3】図2のシリコン基板の微細孔への金属充填に用
いる金属シートの平面図である。
3 is a plan view of a metal sheet used for filling metal into fine holes of the silicon substrate in FIG. 2.

【図4】図1の金属充填装置でシリコン基板の微細孔へ
の金属充填を行なう工程を説明する図であり、(イ)
〜、(ホ)の順で行なわれる。
FIG. 4 is a view for explaining a step of performing metal filling into fine holes in a silicon substrate by the metal filling apparatus of FIG. 1;
To (e).

【図5】(イ)〜(ホ)は図4の工程における微細孔へ
の金属充填作用を模式的に説明する図であり、図4
(イ)〜(ホ)の各工程にそれぞれ対応する。
5 (a) to 5 (e) are diagrams for schematically explaining the metal filling action to the fine holes in the step of FIG.
These correspond to the respective steps (a) to (e).

【図6】従来の金属充填方法で微細孔に金属を充填した
時の充填不良状態を説明する図であり、シリコン基板の
金属を充填した微細孔部分の模式的な断面図である。
FIG. 6 is a view for explaining a poor filling state when a fine hole is filled with metal by a conventional metal filling method, and is a schematic cross-sectional view of a fine hole portion of a silicon substrate filled with metal.

【図7】従来の金属充填方法で微細孔に金属を充填した
時の、鬆が生じた充填不良状態を説明する図であり、シ
リコン基板の金属を充填した微細孔部分の模式的な断面
図である。
FIG. 7 is a view for explaining a defective filling state in which pores are generated when a fine hole is filled with metal by a conventional metal filling method, and is a schematic cross-sectional view of a metal-filled fine hole portion of a silicon substrate. It is.

【符号の説明】[Explanation of symbols]

10 金属充填装置 11 真空チャンバー 12 試料固定用治具 13 加熱手段 14 シリコン基板(試料) 14a 微細孔(微細空間) 15 金属シート(充填用金属体) 16 主たる加熱装置 17 補助加熱装置 Reference Signs List 10 metal filling device 11 vacuum chamber 12 sample fixing jig 13 heating means 14 silicon substrate (sample) 14a fine hole (micro space) 15 metal sheet (metal body for filling) 16 main heating device 17 auxiliary heating device

───────────────────────────────────────────────────── フロントページの続き (72)発明者 滝沢 功 東京都江東区木場1−5−1 株式会社フ ジクラ内 Fターム(参考) 4M104 CC01 DD06 DD78 HH13 HH14 5F033 JJ00 KK01 QQ37 QQ73 QQ86 XX02 XX04 XX19 XX34  ──────────────────────────────────────────────────続 き Continuing on the front page (72) Inventor Isao Takizawa 1-5-1 Kiba, Koto-ku, Tokyo Fujikura Co., Ltd. F-term (reference) 4M104 CC01 DD06 DD78 HH13 HH14 5F033 JJ00 KK01 QQ37 QQ73 QQ86 XX02 XX04 XX19 XX34

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 減圧した真空チャンバー内で、金属を充
填すべき微細空間が形成された試料の一面に、前記微細
空間を覆うように充填用金属体を配置し、この充填用金
属体を加熱溶融させた後、真空チャンバー内を不活性ガ
スで大気圧以上に加圧して、溶融した金属を微細空間に
真空吸入させることを特徴とする微細空間への金属充填
方法。
1. A metal body for filling is arranged on a surface of a sample in which a fine space to be filled with metal is formed in a vacuum chamber under reduced pressure so as to cover the fine space, and the metal body for filling is heated. A method for filling a fine space with a metal, characterized in that after melting, the inside of the vacuum chamber is pressurized to above atmospheric pressure with an inert gas, and the molten metal is sucked into the fine space by vacuum.
【請求項2】 金属を充填すべき微細空間が形成された
試料と充填用金属体とを試料固定用治具に固定し、これ
らを真空チャンバー内に配置した後、真空チャンバー内
を減圧し、真空チャンバー内が所定の真空度に達した
後、前記充填用金属体を加熱手段により溶融させ次いで
真空チャンバー内を不活性ガスで大気圧以上に加圧する
ことにより、溶融した金属を微細空間に真空吸入させ、
次いで真空チャンバーを開放して、試料表面に残った溶
融状態の金属を取り除き、その後室温冷却することを特
徴とする微細空間への金属充填方法。
2. A sample in which a fine space to be filled with metal is formed and a metal body for filling are fixed to a jig for fixing a sample, and these are arranged in a vacuum chamber. After the inside of the vacuum chamber reaches a predetermined degree of vacuum, the filling metal body is melted by heating means, and then the inside of the vacuum chamber is pressurized to above atmospheric pressure with an inert gas, so that the molten metal is evacuated to a fine space. Inhaled,
Then, the vacuum chamber is opened, the molten metal remaining on the surface of the sample is removed, and then cooling is performed at room temperature.
【請求項3】 前記充填用金属体として金属シートを用
いることを特徴とする請求項1または2記載の微細空間
への金属充填方法。
3. The method for filling a fine space with a metal according to claim 1, wherein a metal sheet is used as the metal body for filling.
【請求項4】 請求項1または2記載の微細空間への金
属充填方法を実施する微細空間への金属充填装置であっ
て、内部を減圧する減圧手段と内部を不活性ガスで大気
圧以上に加圧する加圧手段とを備えた真空チャンバー
と、金属を充填すべき微細空間が形成された試料をその
上に充填用金属体を重ねた状態で固定する試料固定用治
具と、真空チャンバー内で前記試料固定用治具に固定さ
れた試料上の充填用金属体に面するように設けた主たる
加熱装置と試料固定用治具の試料載置面に設けた補助加
熱装置とからなる加熱手段とを備えたことを特徴とする
微細空間への金属充填装置。
4. An apparatus for filling a fine space with a metal, wherein the method for filling a fine space with a metal according to claim 1 or 2 is performed. A vacuum chamber having a pressurizing means for pressurizing, a sample fixing jig for fixing a sample in which a fine space to be filled with metal is formed and a metal body for filling over the sample, and a vacuum chamber inside the vacuum chamber. A heating means comprising a main heating device provided so as to face the filling metal body on the sample fixed to the sample fixing jig and an auxiliary heating device provided on the sample mounting surface of the sample fixing jig A device for filling a metal into a fine space, comprising:
JP2001174016A 2001-06-08 2001-06-08 Method and device for filling metal into fine space Pending JP2002368082A (en)

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Country Link
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EP2253397A2 (en) 2008-11-26 2010-11-24 Napra co.,Ltd Method for filling metal into fine space
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US7055756B2 (en) * 2004-10-25 2006-06-06 Lexmark International, Inc. Deposition fabrication using inkjet technology
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US8415784B2 (en) 2009-06-02 2013-04-09 Napra Co., Ltd. Electronic device, conductive composition, metal filling apparatus, and electronic device manufacturing method
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US8377565B2 (en) 2010-04-22 2013-02-19 Napra Co., Ltd. Filling material and filling method using the same
JP2011228571A (en) * 2010-04-22 2011-11-10 Napura:Kk Base material for filling and filling method employing the same
JP2012238752A (en) * 2011-05-12 2012-12-06 Internatl Business Mach Corp <Ibm> Formation of through-silicon via (tsv) in silicon substrate
US9385039B2 (en) 2011-05-12 2016-07-05 International Business Machines Corporation Formation of through-silicon via (TSV) in silicon substrate
US9184062B2 (en) 2011-09-21 2015-11-10 Sumitomo Precision Products Co., Ltd. Metal filling device
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WO2013187541A1 (en) * 2012-06-15 2013-12-19 인텔렉추얼 디스커버리 주식회사 Substrate having at least one partially or entirely flat surface, and use thereof
US10384947B2 (en) 2012-06-15 2019-08-20 Intellectual Discovery Co., Ltd. Substrate having at least one partially or entirely flat surface and use thereof
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