JP2002281484A - Device for detecting periodical defect - Google Patents
Device for detecting periodical defectInfo
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- JP2002281484A JP2002281484A JP2001073555A JP2001073555A JP2002281484A JP 2002281484 A JP2002281484 A JP 2002281484A JP 2001073555 A JP2001073555 A JP 2001073555A JP 2001073555 A JP2001073555 A JP 2001073555A JP 2002281484 A JP2002281484 A JP 2002281484A
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- image
- periodic defect
- correlation
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Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は、圧延工程にある鋼
板、アルミ板など走行する帯状物の表面欠陥を検出する
装置に係り、特に周期的に発生する周期性欠陥を検出す
る周期性欠陥検出装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a device for detecting a surface defect of a traveling strip such as a steel plate or an aluminum plate in a rolling process, and more particularly to a periodic defect detection for detecting a periodically generated periodic defect. Related to the device.
【０００２】[0002]
【従来の技術】圧延工程にある鋼板、アルミ板などの表
面には圧延ロールの圧接等によって一定間隔で疵等が生
じることがある。このような走行する帯状物表面の周期
性欠陥を検出する装置として、特公平３−30813号公報
に、表面欠陥画像を記憶するメモリと、相関値を求める
ための積算器と、周期性に起因する相関値の中のピーク
を検出する手段とを備えたロール疵検出装置が記載され
ている。2. Description of the Related Art A surface of a steel plate, an aluminum plate or the like in a rolling process may have flaws or the like at regular intervals due to pressing of a rolling roll or the like. As an apparatus for detecting a periodic defect on the surface of a traveling strip, Japanese Patent Publication No. 3-30813 discloses a memory for storing a surface defect image, an integrator for obtaining a correlation value, And a means for detecting a peak in the correlation value.
【０００３】[0003]
【発明が解決しようとする課題】上記従来技術において
は、相関長に対する相関値のグラフの中から周期性に起
因するピークを検出するのが困難であり、そのために、
特殊な信号処理が必要となる。更に、この信号処理で自
動的に検出することができない場合には、ＣＲТなどに
特殊な画像を出力し、目視で検出するなどの対策を要す
る。In the above prior art, it is difficult to detect a peak due to periodicity from a graph of a correlation value with respect to a correlation length.
Special signal processing is required. Further, if the signal cannot be automatically detected by this signal processing, a measure such as outputting a special image to CR # or the like and visually detecting the image is required.
【０００４】また、検出精度を上げるために表面欠陥画
像の画素の大きさを小さくすると、膨大なハードウェア
が必要となり、ソフトウェア処理によると時間がかか
り、いづれにしても実用性がなくなる。Further, if the size of the pixel of the surface defect image is reduced in order to increase the detection accuracy, an enormous amount of hardware is required, and it takes time according to software processing.
【０００５】そこで本発明は、走行する帯状物表面の周
期性欠陥を、膨大なハードウェアを要することなく高速
かつ正確に検出することのできる周期性欠陥検出装置を
提供することを目的とする。SUMMARY OF THE INVENTION It is an object of the present invention to provide a periodic defect detecting device capable of detecting a periodic defect on the surface of a running strip at high speed and accurately without requiring a huge amount of hardware.
【０００６】[0006]
【課題を解決するための手段】上記目的を達成するため
に請求項１の発明の周期性欠陥検出装置は、走行する帯
状物の表面画像を撮像する検出ヘッドと、前記撮像され
た表面画像を２値画像に変換する２値化回路と、前記２
値画像を記憶する２値画像メモリと、前記帯状物の長手
方向に前記２値画像の自己相関をとる自己相関回路と、
前記帯状物の幅方向に適当に分割した帯域内の自己相関
値を相関長毎に加算する加算回路と、この加算結果から
周期性の欠陥を検知する判定回路とを備えた構成とす
る。In order to achieve the above object, a periodic defect detecting apparatus according to the present invention comprises: a detecting head for capturing a surface image of a traveling strip; A binarizing circuit for converting the image into a binary image;
A binary image memory for storing a value image, an autocorrelation circuit for taking an autocorrelation of the binary image in a longitudinal direction of the strip,
An adder circuit for adding an autocorrelation value within a band appropriately divided in the width direction of the strip for each correlation length, and a determination circuit for detecting a periodic defect from the addition result are provided.
【０００７】請求項１の発明の周期性欠陥検出装置にお
いては、まず表面画像の画素を充分小さく、例えば対象
周期性欠陥内に複数個の画素を含むようにする。これに
より画像において非周期性欠陥が周期性欠陥と分離され
るので、自己相関をとったとき、両者の値に大きな差が
生じ検出効率が上がる。In the periodic defect detection apparatus according to the first aspect of the present invention, first, pixels of the surface image are made sufficiently small, for example, a plurality of pixels are included in the target periodic defect. As a result, the non-periodic defect is separated from the periodic defect in the image, so that when the autocorrelation is obtained, a large difference occurs between the two values, and the detection efficiency increases.
【０００８】第２に、画素を小さくすることによる、ハ
ードウェアの増大あるいは処理時間の増大を防ぐため
に、表面画像を２値化し、この２値画像に対し相関をと
る。これにより、多値画像の場合乗算が必要なところを
加算ですみ、欠陥だけに対して相関を計算すればよいの
で、処理が高速化され、且つソフトウェア処理でも充分
な高速処理が可能となる。Second, in order to prevent an increase in hardware or an increase in processing time due to a reduction in the size of a pixel, the surface image is binarized and a correlation is obtained with respect to the binary image. Thus, in the case of a multi-valued image, only the addition where the multiplication is required is sufficient and the correlation can be calculated only for the defect, so that the processing can be sped up and the software processing can be performed at a sufficiently high speed.
【０００９】第３に、欠陥形状の凹凸が明瞭になるため
に生ずる欠陥の部分によって相関がとれるというところ
が生ずるのに対しては、帯状物の幅方向に適当に分割し
た帯域内の自己相関値を相関長毎に加え合わせることに
より周期性欠陥による相関値を大きくでき、よって検出
効率を向上することができる。Third, the fact that the correlation can be obtained depending on the portion of the defect caused by the clarity of the irregularities of the defect shape occurs. Is added for each correlation length, the correlation value due to the periodic defect can be increased, and the detection efficiency can be improved.
【００１０】請求項２の発明の周期性欠陥検出装置は、
請求項１の発明の周期性欠陥検出装置において、加算回
路は、加算する帯域を帯状物の幅方向に所定幅ずらす制
御を行う加算範囲制御回路と、前記加算する帯域内の自
己相関値を相関長毎に加算する加算器とを備えた構成と
する。[0010] The periodic defect detecting apparatus according to the second aspect of the present invention comprises:
2. The periodic defect detection device according to claim 1, wherein the addition circuit correlates an autocorrelation value within the band to be added with an addition range control circuit that performs control to shift a band to be added by a predetermined width in the width direction of the band. An adder for adding each length is provided.
【００１１】請求項２の発明の周期性欠陥検出装置にお
いては、上記分割帯域の境界にまたがって周期性欠陥が
存在するとき、相関長毎の相関値の加算による効果が少
なくなるのを防ぐために、この分割帯域を固定したもの
とせず、少しずつ、例えば画素の幅ずつずらして設定し
てゆく、すなわち、加算を移動加算的に行うことにより
検出効率の向上を図ることができる。In the periodic defect detecting apparatus according to the second aspect of the present invention, when a periodic defect exists over the boundary of the divided band, the effect of adding the correlation value for each correlation length is prevented from being reduced. Instead, the divisional band is not fixed, but is set slightly differently, for example, by the pixel width, that is, by performing addition in a moving addition manner, the detection efficiency can be improved.
【００１２】請求項３の発明の周期性欠陥検出装置は、
請求項１の発明の周期性欠陥検出装置において、検出ヘ
ッドによって撮像された表面画像を多値画像として記憶
する多値画像メモリを備え、自己相関回路は２値化され
た領域について前記多値画像の相関をとる構成とする。According to a third aspect of the present invention, there is provided a periodic defect detection apparatus, comprising:
2. The periodic defect detection device according to claim 1, further comprising a multi-valued image memory for storing a surface image picked up by a detection head as a multi-valued image, wherein an auto-correlation circuit is provided for the binarized region. And a configuration that takes the correlation of
【００１３】小さな周期性欠陥の場合、２値化画像の相
関値は充分大きくならない可能性がある。特に相関をと
る範囲、すなわち帯状物の長手方向の長さが小さい場合
にこのようなことが起こる。これに対し、請求項３の発
明の周期性欠陥検出装置においては、２値化された領域
について多値画像の相関値を計算することで、小さな周
期性欠陥でも信号レベルが大きければ大きな相関値が得
られ、検出効率を上げることができる。In the case of a small periodic defect, the correlation value of the binarized image may not be sufficiently large. This occurs particularly in the range where the correlation is obtained, that is, when the length of the strip in the longitudinal direction is small. On the other hand, in the periodic defect detection device according to the third aspect of the present invention, the correlation value of the multi-valued image is calculated for the binarized area, so that the larger the signal level of the smaller periodic defect, the larger the correlation value. And the detection efficiency can be increased.
【００１４】[0014]
【発明の実施の形態】本発明の第１の実施の形態を図１
を参照して説明する。本実施の形態の周期性欠陥検出装
置は、検出ヘッド１と、２値化回路２と、２値画像メモ
リ３と、自己相関回路４と、加算回路５と、判定回路６
とを備え、それぞれの間は信号線で接続されている。FIG. 1 shows a first embodiment of the present invention.
This will be described with reference to FIG. The periodic defect detection device according to the present embodiment includes a detection head 1, a binarization circuit 2, a binary image memory 3, an autocorrelation circuit 4, an addition circuit 5, and a determination circuit 6.
And each is connected by a signal line.
【００１５】帯状物７の表面画像は検出ヘッド１でとら
えられ、その画像信号は２値化回路２に送られ、ここで
周期性欠陥８などの異常部のみが抽出されたいわゆる２
値画像に変換され、２値画像メモリ３に記憶される。A surface image of the band-like object 7 is captured by the detection head 1 and an image signal thereof is sent to a binarization circuit 2, where a so-called 2D image in which only an abnormal portion such as a periodic defect 8 is extracted is extracted.
It is converted to a value image and stored in the binary image memory 3.
【００１６】自己相関回路４は、上記２値画像について
帯状物７の長手方向に自己相関を取る。加算回路５で
は、帯状物７の幅方向に適当に分割した帯域内の自己相
関値を各相関長に対して加え合わせる。周期性欠陥の周
期長に対応する相関長の自己相関値の加算値は、加え合
わされて大きくなる。判定回路６は、前記加算結果を相
関長に対してとったもののピーク値を取り出して周期性
の欠陥を検知する。The autocorrelation circuit 4 takes an autocorrelation of the binary image in the longitudinal direction of the strip 7. The adder circuit 5 adds the autocorrelation value in the band appropriately divided in the width direction of the band-like object 7 to each correlation length. The sum of the autocorrelation values of the correlation lengths corresponding to the period length of the periodic defect increases when added. The determination circuit 6 extracts the peak value of the result of the addition with respect to the correlation length to detect a periodic defect.
【００１７】このような各部の動作において、自己相関
回路４における２値画像の自己相関は高速に行うことが
でき、加算回路５における一定帯域毎の加算は周期性欠
陥の効率の良い検知を可能にする。In such an operation of each unit, the autocorrelation of the binary image in the autocorrelation circuit 4 can be performed at high speed, and the addition for each fixed band in the addition circuit 5 enables efficient detection of a periodic defect. To
【００１８】図４に欠陥分布例と、自己相関値および加
算結果を示す。このように、各行の相関値のピークは低
くとも、加算することで大きなピークが得られ、周期性
欠陥の効率の良い検知が可能となる。FIG. 4 shows an example of a defect distribution, an autocorrelation value and an addition result. As described above, even if the peak of the correlation value of each row is low, a large peak is obtained by adding the peaks, and efficient detection of a periodic defect can be performed.
【００１９】次に本発明の第２の実施の形態を説明す
る。本実施の形態の構成と作用の基本は前記第１の実施
の形態のものと同じであるが、加算回路５は、図２にそ
の構成を示すようになっている。すなわち、加算回路５
は加算器５ａと加算範囲制御回路５ｂから構成される。Next, a second embodiment of the present invention will be described. The basic structure and operation of this embodiment are the same as those of the first embodiment, but the adder circuit 5 is shown in FIG. That is, the addition circuit 5
Is composed of an adder 5a and an addition range control circuit 5b.
【００２０】図５は相関値の加算を行う帯域を説明する
図である。（ａ）は前記第１の実施の形態の場合であ
り、帯状物７の幅方向を一定幅で分割し、各加算帯域５
−１〜５−４毎に加算を行う。この場合、周期性欠陥８
−１〜８−５については欠陥が加算帯域に含まれるの
で、加算効果が上がるが、周期性欠陥９−１〜９−４に
ついては、欠陥が２つの帯域にまたがり、加算効果が上
がらない。FIG. 5 is a diagram for explaining a band in which a correlation value is added. (A) shows the case of the first embodiment, in which the width direction of the strip 7 is divided by a fixed width, and
Addition is performed every -1 to 5-4. In this case, the periodic defect 8
For -1 to 8-5, the defect is included in the addition band, so that the addition effect increases. However, for the periodic defects 9-1 to 9-4, the defect extends over two bands and the addition effect does not increase.
【００２１】図５（ｂ）は第２の実施の形態の場合であ
り、加算帯域10−１〜10−３は、自己相関計算行４−１
〜４−16の１行ずつシフトしているので、周期性欠陥９
−１〜９−４についても、加算帯域10−３に含まれ、こ
のとき加算効果が出て、効率良く検出できる。図２に示
した加算範囲制御回路５ｂは、図５（ｂ）に示した加算
帯域10−１〜10−３の幅の制御を行うものである。FIG. 5B shows the case of the second embodiment, in which the addition bands 10-1 to 10-3 correspond to the autocorrelation calculation line 4-1.
４−4-16 are shifted by one row, so that the periodic defect 9
-1 to 9-4 are also included in the addition band 10-3. At this time, an addition effect is obtained, and the detection can be performed efficiently. The addition range control circuit 5b shown in FIG. 2 controls the width of the addition bands 10-1 to 10-3 shown in FIG.
【００２２】次に本発明の第３の実施の形態を図３を参
照して説明する。本実施の形態においては、２値化回路
２および２値画像メモリ３と並列に多値画像メモリ11を
設ける。Next, a third embodiment of the present invention will be described with reference to FIG. In the present embodiment, a multi-valued image memory 11 is provided in parallel with the binarization circuit 2 and the binary image memory 3.
【００２３】このような構成によって、自己相関回路４
で行う自己相関計算を多値画像について行い、且つ、そ
の計算を２値画像の範囲についてのみ行う。これによ
り、小さな周期性欠陥でも、信号レベルが大きければ、
大きな相関値が得られ、検出可能となる。With such a configuration, the autocorrelation circuit 4
Is performed on the multi-valued image, and the calculation is performed only on the range of the binary image. Thus, even with a small periodic defect, if the signal level is large,
A large correlation value is obtained and can be detected.
【００２４】[0024]
【発明の効果】本発明の周期性欠陥検出装置によれば、
走行する帯状物の周期性欠陥を高速且つ効率良く検出す
ることができる。According to the periodic defect detection apparatus of the present invention,
The periodic defect of the traveling strip can be detected at high speed and efficiently.
【図１】本発明の第１の実施の形態の周期性欠陥検出装
置の構成を示すブロック図。FIG. 1 is a block diagram showing a configuration of a periodic defect detection device according to a first embodiment of the present invention.
【図２】本発明の第２の実施の形態の周期性欠陥検出装
置の要部の構成を示すブロック図。FIG. 2 is a block diagram showing a configuration of a main part of a periodic defect detection device according to a second embodiment of the present invention.
【図３】本発明の第３の実施の形態の周期性欠陥検出装
置の構成を示すブロック図。FIG. 3 is a block diagram showing a configuration of a periodic defect detection device according to a third embodiment of the present invention.
【図４】本発明の第１の実施の形態の周期性欠陥検出装
置の作用を説明する図。FIG. 4 is a view for explaining the operation of the periodic defect detection device according to the first embodiment of the present invention.
【図５】本発明の第２の実施の形態の周期性欠陥検出装
置の作用（ｂ）を第１の実施の形態の周期性欠陥検出装
置の作用（ａ）と比較して説明する図。FIG. 5 is a diagram for explaining the operation (b) of the periodic defect detection device according to the second embodiment of the present invention in comparison with the operation (a) of the periodic defect detection device according to the first embodiment;
１…検出ヘッド、２…２値化回路、３…２値画像メモ
リ、４…自己相関回路、５…加算回路、５ａ…加算器、
５ｂ…加算範囲制御回路、５−１〜５−３…加算帯域、
６…判定回路、７…帯状物、８…周期性欠陥、８−１〜
８−５…周期性欠陥、９−１〜９−４…周期性欠陥、10
−１〜10−13…加算帯域、11…多値画像メモリ。DESCRIPTION OF SYMBOLS 1 ... Detection head, 2 ... Binarization circuit, 3 ... Binary image memory, 4 ... Autocorrelation circuit, 5 ... Addition circuit, 5a ... Adder,
5b ... addition range control circuit, 5-1 to 5-3 ... addition band,
6: judgment circuit, 7: band, 8: periodic defect, 8-1
8-5: periodic defect, 9-1 to 9-4: periodic defect, 10
-1 to 10-13: addition band, 11: multi-valued image memory.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 海野 哲生 東京都府中市東芝町１番地 株式会社東芝 府中事業所内 Ｆターム(参考） 2F065 AA49 BB01 CC06 DD06 FF01 FF04 JJ03 JJ26 MM03 PP16 QQ00 QQ04 QQ24 QQ27 UU05 2G051 AA37 AB02 CA04 EA11 EA30 EC02 EC06 5C054 AA01 CC02 CH01 FC05 HA03 HA05 ──────────────────────────────────────────────────の Continuing on the front page (72) Inventor Tetsuo Umino 1 Toshiba-cho, Fuchu-shi, Tokyo F-term in Fuchu Plant, Toshiba Corporation 2F065 AA49 BB01 CC06 DD06 FF01 FF04 JJ03 JJ26 MM03 PP16 QQ00 QQ04 QQ24 QQ27 UU05 2G051 AA37 AB02 CA04 EA11 EA30 EC02 EC06 5C054 AA01 CC02 CH01 FC05 HA03 HA05
Claims (3)
出ヘッドと、前記撮像された表面画像を２値画像に変換
する２値化回路と、前記２値画像を記憶する２値画像メ
モリと、前記帯状物の長手方向に前記２値画像の自己相
関をとる自己相関回路と、前記帯状物の幅方向に適当に
分割した帯域内の自己相関値を相関長毎に加算する加算
回路と、この加算結果から周期性の欠陥を検知する判定
回路とを備えたことを特徴とする周期性欠陥検出装置。1. A detection head that captures a surface image of a traveling strip, a binarization circuit that converts the captured surface image into a binary image, and a binary image memory that stores the binary image. An autocorrelation circuit for taking the autocorrelation of the binary image in the longitudinal direction of the band, and an adding circuit for adding an autocorrelation value in a band appropriately divided in the width direction of the band for each correlation length, A periodic defect detection device comprising: a determination circuit for detecting a periodic defect from the addition result.
方向に所定幅ずらす制御を行う加算範囲制御回路と、前
記加算する帯域内の自己相関値を相関長毎に加算する加
算器とを備えたことを特徴とする請求項１記載の周期性
欠陥検出装置。2. An addition circuit, comprising: an addition range control circuit for performing control for shifting a band to be added by a predetermined width in the width direction of the band-shaped object; and an adder for adding an autocorrelation value in the band to be added for each correlation length. The periodic defect detection device according to claim 1, further comprising:
を多値画像として記憶する多値画像メモリを備え、自己
相関回路は２値化された領域について前記多値画像の相
関をとることを特徴とする請求項１記載の周期性欠陥検
出装置。3. A multi-valued image memory for storing a surface image picked up by a detection head as a multi-valued image, and an auto-correlation circuit correlates the multi-valued image with respect to a binarized region. The periodic defect detection device according to claim 1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001073555A JP4351810B2 (en) | 2001-03-15 | 2001-03-15 | Periodic defect detector |
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| JP2001073555A JP4351810B2 (en) | 2001-03-15 | 2001-03-15 | Periodic defect detector |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005077180A (en) * | 2003-08-29 | 2005-03-24 | Kobe Steel Ltd | Cause estimation device and cause estimation program and cause estimation method of surface defect of metal plate |
| KR101372787B1 (en) * | 2012-07-06 | 2014-03-10 | 주식회사 포스코 | Apparatus for detecting periodic defect of thick steel plate |
| KR20150137497A (en) * | 2014-05-29 | 2015-12-09 | 주식회사 포스코 | Apparatus and Method for detecting defect of thick steel plate |
| CN112165996A (en) * | 2018-05-22 | 2021-01-01 | 东芝三菱电机产业系统株式会社 | Image analysis device for industrial plant and industrial plant monitoring control system |
-
2001
- 2001-03-15 JP JP2001073555A patent/JP4351810B2/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005077180A (en) * | 2003-08-29 | 2005-03-24 | Kobe Steel Ltd | Cause estimation device and cause estimation program and cause estimation method of surface defect of metal plate |
| KR101372787B1 (en) * | 2012-07-06 | 2014-03-10 | 주식회사 포스코 | Apparatus for detecting periodic defect of thick steel plate |
| KR20150137497A (en) * | 2014-05-29 | 2015-12-09 | 주식회사 포스코 | Apparatus and Method for detecting defect of thick steel plate |
| KR101675532B1 (en) | 2014-05-29 | 2016-11-22 | 주식회사 포스코 | Apparatus and Method for detecting defect of thick steel plate |
| CN112165996A (en) * | 2018-05-22 | 2021-01-01 | 东芝三菱电机产业系统株式会社 | Image analysis device for industrial plant and industrial plant monitoring control system |
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| Publication number | Publication date |
|---|---|
| JP4351810B2 (en) | 2009-10-28 |
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