JP2002253502A5 - - Google Patents

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Publication number
JP2002253502A5
JP2002253502A5 JP2001057577A JP2001057577A JP2002253502A5 JP 2002253502 A5 JP2002253502 A5 JP 2002253502A5 JP 2001057577 A JP2001057577 A JP 2001057577A JP 2001057577 A JP2001057577 A JP 2001057577A JP 2002253502 A5 JP2002253502 A5 JP 2002253502A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001057577A
Other languages
Japanese (ja)
Other versions
JP4901009B2 (ja
JP2002253502A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2001057577A priority Critical patent/JP4901009B2/ja
Priority claimed from JP2001057577A external-priority patent/JP4901009B2/ja
Priority to EP02251385A priority patent/EP1236432A3/en
Priority to US10/090,063 priority patent/US6685321B2/en
Publication of JP2002253502A publication Critical patent/JP2002253502A/ja
Publication of JP2002253502A5 publication Critical patent/JP2002253502A5/ja
Application granted granted Critical
Publication of JP4901009B2 publication Critical patent/JP4901009B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2001057577A 2001-03-02 2001-03-02 視野計 Expired - Fee Related JP4901009B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2001057577A JP4901009B2 (ja) 2001-03-02 2001-03-02 視野計
EP02251385A EP1236432A3 (en) 2001-03-02 2002-02-27 Perimeter
US10/090,063 US6685321B2 (en) 2001-03-02 2002-03-01 Perimeter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001057577A JP4901009B2 (ja) 2001-03-02 2001-03-02 視野計

Publications (3)

Publication Number Publication Date
JP2002253502A JP2002253502A (ja) 2002-09-10
JP2002253502A5 true JP2002253502A5 (OSRAM) 2008-04-03
JP4901009B2 JP4901009B2 (ja) 2012-03-21

Family

ID=18917425

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001057577A Expired - Fee Related JP4901009B2 (ja) 2001-03-02 2001-03-02 視野計

Country Status (3)

Country Link
US (1) US6685321B2 (OSRAM)
EP (1) EP1236432A3 (OSRAM)
JP (1) JP4901009B2 (OSRAM)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7682021B2 (en) 2002-02-08 2010-03-23 Novavision, Inc. System and methods for the treatment of retinal diseases
AU2002238539B2 (en) 2002-02-08 2008-01-24 Novavision, Inc. Improved process and device for the training of human vision
US7753524B2 (en) 2002-02-08 2010-07-13 Novavision, Inc. Process and device for treating blind regions of the visual field
EP1407710B1 (en) 2002-10-08 2005-08-10 Inami & Co., Ltd. Computer controlled perimetry system
JP2004208705A (ja) * 2002-12-26 2004-07-29 Nidek Co Ltd 検眼装置
WO2006002070A2 (en) 2004-06-15 2006-01-05 Novavision, Inc. Method and device for guiding a user's head during vision training
JP4476050B2 (ja) * 2004-06-30 2010-06-09 株式会社ニデック 視野計
JP4724451B2 (ja) * 2005-04-08 2011-07-13 株式会社トーメーコーポレーション 眼科装置
EP1968427A2 (en) 2005-12-16 2008-09-17 Novavision, Inc. Adjustable device for vision testing and therapy
US7748846B2 (en) 2006-07-25 2010-07-06 Novavision, Inc. Dynamic fixation stimuli for visual field testing and therapy
JP4806602B2 (ja) * 2006-08-09 2011-11-02 興和株式会社 視野計
US7641339B2 (en) 2007-07-31 2010-01-05 Kabushiki Kaisha Topcon Ophthalmologic information processing apparatus and ophthalmologic examination apparatus
JP2009045175A (ja) * 2007-08-17 2009-03-05 Topcon Corp 眼科検査システム
JP5575726B2 (ja) * 2011-11-02 2014-08-20 興和株式会社 視野計
JP6128814B2 (ja) * 2012-11-29 2017-05-17 株式会社ニデック 視機能評価プログラム及び視機能評価装置
DE102015217682A1 (de) 2015-09-16 2017-03-16 Carl Zeiss Ag Vorrichtung zur Augenuntersuchung

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2054894A (en) * 1979-07-13 1981-02-18 Woolf B N Eye testing apparatus
US5108170A (en) * 1989-12-29 1992-04-28 Kabushiki Kaisha Topcon Perimetric instrument
JP2863944B2 (ja) * 1990-03-29 1999-03-03 株式会社トプコン 視野測定装置
JP3032261B2 (ja) * 1990-09-27 2000-04-10 株式会社トプコン 自動視野計
JPH0654804A (ja) * 1992-08-05 1994-03-01 Canon Inc 視野計
JP3317754B2 (ja) * 1993-09-16 2002-08-26 株式会社トプコン 視野測定装置
US5459536A (en) * 1993-12-27 1995-10-17 Alcon Laboratories, Inc. Apparatus and method for automated perimetry
JPH08191794A (ja) * 1995-01-19 1996-07-30 Nikon Corp リモートコントロール装置を有する検眼システム
US5589897A (en) * 1995-05-01 1996-12-31 Stephen H. Sinclair Method and apparatus for central visual field mapping and optimization of image presentation based upon mapped parameters
AU741194B2 (en) * 1998-04-10 2001-11-22 Visual Awareness Research Group, Inc. Method and apparatus for training visual attention capabilities of a subject

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