JP2002246452A - Electrostatic chuck - Google Patents

Electrostatic chuck

Info

Publication number
JP2002246452A
JP2002246452A JP2001038132A JP2001038132A JP2002246452A JP 2002246452 A JP2002246452 A JP 2002246452A JP 2001038132 A JP2001038132 A JP 2001038132A JP 2001038132 A JP2001038132 A JP 2001038132A JP 2002246452 A JP2002246452 A JP 2002246452A
Authority
JP
Japan
Prior art keywords
electrostatic chuck
sintered body
powder
dielectric layer
spinel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001038132A
Other languages
Japanese (ja)
Other versions
JP4585129B2 (en
Inventor
Motohiro Umetsu
基宏 梅津
Tatsuya Shiogai
達也 塩貝
Tomoyuki Ogura
知之 小倉
Mamoru Ishii
守 石井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Taiheiyo Cement Corp
Original Assignee
Taiheiyo Cement Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiheiyo Cement Corp filed Critical Taiheiyo Cement Corp
Priority to JP2001038132A priority Critical patent/JP4585129B2/en
Publication of JP2002246452A publication Critical patent/JP2002246452A/en
Application granted granted Critical
Publication of JP4585129B2 publication Critical patent/JP4585129B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Jigs For Machine Tools (AREA)
  • Manipulator (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide an electrostatic chuck which has an attracting dielectric layer regardless of its thickness. SOLUTION: In the electrostatic chuck having a dielectric layer provided on an electrode, the dielectric layer contains MgO and Al2O3 as its main components, the weight ratio of MgO to Al2O3 is in the range of 0.67 to 2.33. The dielectric layer is made of a spinel sintered body which contains, in addition to the above main components, 3-30 weight % of TiO2-x or Cr2O3-x and has electrical conductivity of 10-8 to 10-14 S/cm.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、半導体製造装置等
において、シリコンウェハ等の被吸着物を固定、搬送、
矯正するために用いられる静電チャックに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for fixing and transporting an object to be suctioned such as a silicon wafer in a semiconductor manufacturing apparatus or the like.
The present invention relates to an electrostatic chuck used for straightening.

【0002】[0002]

【従来の技術】電極とその上面に誘電体層が設けられて
いる静電チャックにおいて、その誘電体層としては、従
来、アルミナ、サファイア等の絶縁性のセラミックスが
用いられている。
2. Description of the Related Art In an electrostatic chuck in which an electrode and a dielectric layer are provided on the upper surface thereof, insulating ceramics such as alumina and sapphire are conventionally used as the dielectric layer.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、これら
絶縁性のセラミックスでは、電極に誘起される電荷と静
電チャックに吸着すべき被吸着体に誘起される電荷との
間に発生する静電吸着力(クーロン力)で吸着すること
から、高い吸着力を得るためには、誘電体層の厚さを
0.1mm以下と薄くしなければならないという問題が
あった。
However, in these insulating ceramics, the electrostatic attraction force generated between the charge induced in the electrode and the charge induced in the object to be attracted to the electrostatic chuck is generated. (Coulomb force), there is a problem that the thickness of the dielectric layer must be reduced to 0.1 mm or less in order to obtain a high suction force.

【0004】本発明は、上述した静電チャックが有する
課題に鑑みなされたものであって、その目的は、誘電体
層の厚さに関係なく吸着できる誘電体層を有する静電チ
ャックを提供することにある。
The present invention has been made in view of the above-mentioned problems of the electrostatic chuck, and has as its object to provide an electrostatic chuck having a dielectric layer that can be attracted regardless of the thickness of the dielectric layer. It is in.

【0005】[0005]

【課題を解決するための手段】本発明者等は、上記目的
を達成するため鋭意研究した結果、誘電体層の材質をT
iO2-xまたはCr23-xを含むスピネル質焼結体とす
れば、誘電体層の厚さに関係なく吸着できる誘電体層を
有する静電チャックが得られるとの知見を得て本発明を
完成するに至った。
Means for Solving the Problems The inventors of the present invention have made intensive studies to achieve the above object, and as a result, have set the material of the dielectric layer to T.
It has been found that an electrostatic chuck having a dielectric layer that can be adsorbed regardless of the thickness of the dielectric layer can be obtained if a spinel-based sintered body containing iO 2-x or Cr 2 O 3-x is obtained. The present invention has been completed.

【0006】即ち本発明は、(1)電極の上面に誘電体
層が設けられた静電チャックにおいて、該誘電体層が、
主成分がMgOとAl23からなり、その組成比がMg
O/Al23の重量比で0.67〜2.33の範囲にあ
り、その主成分にTiO2-xを3〜30重量%含むスピ
ネル質焼結体からなり、かつその電気伝導率が、10-8
〜10-14S/cmであることを特徴とする静電チャッ
ク(請求項1)とし、(2)電極の上面に誘電体層が設
けられた静電チャックにおいて、該誘電体層が、主成分
がMgOとAl23からなり、その組成比がMgO/A
23の重量比で0.67〜2.33の範囲にあり、そ
の主成分にCr23-xを3〜30重量%含むスピネル質
焼結体からなり、かつその電気伝導率が、10-8〜10
-14S/cmであることを特徴とする静電チャック(請
求項2)とし、(3)前記スピネル質焼結体の腐食ガス
に対する耐食性が、ハロゲン系プラズマガス対するエッ
チングレートで、5μm/hr以下であることを特徴と
する請求項1または2記載の静電チャック(請求項3)
とし、(4)前記スピネル質焼結体が、MgO粉末、A
23粉末、TiO2粉末とを請求項1記載の組成とな
るよう配合し、それを混合し、成形し、その成形した成
形体を還元雰囲気中で焼結することにより作製された焼
結体であることを特徴とする請求項1または3記載の静
電チャック(請求項4)とし、(5)前記スピネル質焼
結体が、MgO粉末、Al23粉末、Cr23粉末とを
請求項2記載の組成となるよう配合し、それを混合し、
成形し、その成形した成形体を還元雰囲気中で焼結する
ことにより作製されと焼結体であることを特徴とする請
求項2または3記載の静電チャック(請求項5)とし、
(6)前記スピネル質焼結体が、MgO粉末、Al23
粉末、TiO2粉末とを請求項1記載の組成となるよう
配合し、それを混合し、成形し、その成形した成形体を
空気中で焼結した後、それをさらに還元雰囲気中で加熱
処理することにより作製された焼結体であることを特徴
とする請求項1または3記載の静電チャック(請求項
6)とし、(7)前記スピネル質焼結体が、MgO粉
末、Al23粉末、Cr23粉末とを請求項2記載の組
成となるよう配合し、それを混合し、成形し、その成形
した成形体を空気中で焼結した後、それをさらに還元雰
囲気中で加熱処理することにより作製された焼結体であ
ることを特徴とする請求項2または3記載の静電チャッ
ク(請求項7)とすることを要旨とする。以下さらに詳
細に説明する。
That is, the present invention provides (1) an electrostatic chuck in which a dielectric layer is provided on the upper surface of an electrode, wherein the dielectric layer is
The main components are MgO and Al 2 O 3 , and the composition ratio is Mg
In a weight ratio of O / Al 2 O 3 in the range of 0.67 to 2.33, consists spinel sintered body containing TiO 2-x 3 to 30 wt% to the main components, and the electrical conductivity But 10 -8
(2) In an electrostatic chuck in which a dielectric layer is provided on an upper surface of an electrode, the dielectric layer mainly has a thickness of 10 to 14 S / cm. The components consist of MgO and Al 2 O 3 , and the composition ratio is MgO / A
The weight ratio of l 2 O 3 is in the range of 0.67 to 2.33, and is made of a spinel sintered body containing 3 to 30% by weight of Cr 2 O 3-x as its main component, and its electric conductivity. But 10 -8 to 10
-14 S / cm, and (3) the spinel sintered body has a corrosion resistance to a corrosive gas of 5 μm / hr at an etching rate with respect to a halogen-based plasma gas. The electrostatic chuck according to claim 1 or 2, wherein:
(4) The spinel-based sintered body is made of MgO powder, A
The l 2 O 3 powder and the TiO 2 powder are blended so as to have the composition described in claim 1, mixed, molded, and sintered by sintering the molded body in a reducing atmosphere. 4. The electrostatic chuck according to claim 1, wherein the spinel-based sintered body is made of MgO powder, Al 2 O 3 powder, Cr 2 O 3. And the powder are blended so as to have a composition according to claim 2, and then mixed,
The electrostatic chuck according to claim 2 or 3, wherein the molded body is formed by sintering the molded body in a reducing atmosphere.
(6) The spinel sintered body, MgO powder, Al 2 O 3
The powder and the TiO 2 powder are blended so as to have the composition according to claim 1, mixed, molded, and the molded body is sintered in the air, and further heated in a reducing atmosphere. The electrostatic chuck according to claim 1 or 3, wherein the spinel sintered body is made of MgO powder, Al 2 O. 3 powder and Cr 2 O 3 powder are blended so as to have the composition described in claim 2, mixed, molded, and the molded product is sintered in air, and then further reduced in a reducing atmosphere. A gist is a sintered body produced by heat treatment in (2) or (3). This will be described in more detail below.

【0007】上記で述べたように、本発明の静電チャッ
クとしては、ウェハを吸着する誘電体層を主成分がMg
OとAl23からなり、そのMgO/Al23比が重量
比で0.67〜2.33の範囲にあり、その主成分にT
iO2-xまたはCr23-xを3〜30重量%含むスピネ
ル質焼結体からなり、かつその電気伝導率が、10-8
10-14S/cmであることとする静電チャックとした
(請求項1、2)
As described above, the electrostatic chuck of the present invention comprises a dielectric layer for adsorbing a wafer and a main component comprising Mg.
O and Al 2 O 3 , and its MgO / Al 2 O 3 ratio is in the range of 0.67 to 2.33 by weight, and its main component is T
It is made of a spinel sintered body containing 3 to 30% by weight of iO 2-x or Cr 2 O 3-x and has an electric conductivity of 10 -8 to
An electrostatic chuck having a pressure of 10 -14 S / cm was set (claims 1 and 2).

【0008】静電チャックとして、その誘電体層の材質
をTiO2-xまたはCr23-xを含むスピネル質焼結体
としたのは、導電性のあるTiO2-xまたはCr23-x
を含ませることにより、誘電体層に導電性を持たせ、そ
の導電性によりジョンセン・ラーベック力を発現させ、
誘電体層の厚さに関係なく吸着できる誘電体層となり、
加えてスピネルを母体とすることにより、ハロゲン系プ
ラズマガスに優れた耐食性を有する誘電体層となること
による。
In the electrostatic chuck, the dielectric layer is made of a spinel sintered body containing TiO 2-x or Cr 2 O 3-x because it is made of conductive TiO 2-x or Cr 2 O. 3-x
By making the dielectric layer have conductivity, the Johnsen-Rahbek force is expressed by the conductivity,
It becomes a dielectric layer that can be adsorbed regardless of the thickness of the dielectric layer,
In addition, by using spinel as a matrix, a dielectric layer having excellent corrosion resistance to halogen-based plasma gas can be obtained.

【0009】そのスピネル質焼結体のMgO/Al23
の比としては、0.67〜2、33が好ましく、その比
が0.67より小さいと焼結体の強度が大きく低下して
好ましくなく、2.33より高くてもやはり焼結体の強
度が大きく低下して好ましくない。
The spinel sintered body MgO / Al 2 O 3
Is preferably 0.67 to 2, 33. If the ratio is smaller than 0.67, the strength of the sintered body is greatly reduced. Is undesirably greatly reduced.

【0010】そのスピネル質焼結体のTiO2-xまたは
Cr23-xの含有率としては、3〜30重量%が好まし
く、3重量%より少ないと電気伝導率が10-14S/c
m以上とならないので好ましくなく、30重量%より多
いと10-8S/cm以下とならないので好ましくない。
The content of TiO 2-x or Cr 2 O 3-x in the spinel-based sintered body is preferably 3 to 30% by weight, and if it is less than 3% by weight, the electrical conductivity is 10 -14 S / c
it is not preferable because not a higher m, unfavorably not when it is more than 30 wt% 10 -8 S / cm or less and.

【0011】そして、そのスピネル質焼結体の電気伝導
率としては、10-8〜10-14S/cmの範囲の電気伝
導率がジョンセン・ラーベック力が有効に働くため好ま
しく、電気伝導率が10-8S/cmより高いと吸着した
ウェハにリーク電流が流れてウェハに形成されている回
路が破壊される恐れがあり、10-14S/cmより低い
とジョンセン・ラーベック力が有効に働かず高い吸着力
が得られない。このような範囲の電気伝導率は、少なく
とも−50〜200℃の範囲で得られていればよい。
The electric conductivity of the spinel sintered body is preferably in the range of 10 -8 to 10 -14 S / cm because the Johnsen-Rahbek force works effectively. If it is higher than 10 -8 S / cm, a leak current may flow into the attracted wafer and a circuit formed on the wafer may be destroyed. If it is lower than 10 -14 S / cm, the Johnsen-Rahbek force works effectively. High adsorption power cannot be obtained. The electrical conductivity in such a range only needs to be obtained at least in the range of -50 to 200C.

【0012】一方、そのスピネル質焼結体の耐食性の度
合いとしては、ハロゲン系プラズマガスに対するエッチ
ングレートで、5μm/hr以下になるとした(請求項
3)。このスピネル質焼結体がTiO2-xまたはCr2
3-xを含んでもこのような優れた耐食性を有するのは、
恐らくTiO2-xまたはCr23-xがスピネル結晶格子
中に固溶するためか、あるいはMgTiO3-x、MgT
25-x、MgCr2 4-xなどの複合酸化物を生成する
ためではないかと思われる。これにより極めて耐食性に
強い誘電体層となる。
On the other hand, the degree of corrosion resistance of the spinel sintered body
As a match, etch against halogen-based plasma gas
In terms of the rate, it is assumed to be 5 μm / hr or less.
3). This spinel sintered body is made of TiO2-xOr CrTwoO
3-xEven having such excellent corrosion resistance,
Probably TiO2-xOr CrTwoO3-xIs the spinel crystal lattice
Because of solid solution inside or MgTiO3-x, MgT
iTwoO5-x, MgCrTwoO 4-xProduces complex oxides such as
It seems to be because. This makes it extremely corrosion resistant
It becomes a strong dielectric layer.

【0013】そのスピネル質焼結体の作製方法として
は、所定の組成となるよう配合し、それを混合し、成形
し、その成形した成形体を還元雰囲気中で焼結すること
により作製されることとした(請求項4、5)。TiO
2またはCr23は、酸素欠損が生じないと導電性を有
しないので、それを還元雰囲気中で焼結することによ
り、酸素欠損を生じさせるものである。
The spinel sintered body is manufactured by blending it into a predetermined composition, mixing and molding, and sintering the formed body in a reducing atmosphere. (Claims 4 and 5). TiO
Since 2 or Cr 2 O 3 has no conductivity unless oxygen deficiency occurs, sintering it in a reducing atmosphere causes oxygen deficiency.

【0014】また、別の作製方法としては、所定の組成
となるよう配合し、それを混合し、成形し、その成形し
た成形体を空気中で焼結した後、さらに還元雰囲気中で
加熱処理することにより作製されることとした(請求項
6、7)。これは、一旦、酸素欠損のない焼結体を作製
し、その焼結体を還元雰囲気中で加熱処理するものであ
り、この方法でも同じように酸素欠損を生じさせるもの
である。
As another manufacturing method, a compound having a predetermined composition is blended, mixed, molded, sintered in air, and then heat-treated in a reducing atmosphere. (Claims 6 and 7). In this method, a sintered body having no oxygen deficiency is once prepared, and the sintered body is subjected to a heat treatment in a reducing atmosphere. In this method, oxygen deficiency is similarly generated.

【0015】[0015]

【発明の実施の形態】静電チャックの作製について述べ
ると、先ずスピネル質焼結体を作製するためにMgO粉
末、Al23粉末、TiO2粉末を、またはMgO粉
末、Al23粉末、Cr23粉末を所定の配合に調合す
る。前記した粉末の代わりに例えばMgOとAl23
含むMAl24などの複合酸化物を用いてもよい。これ
ら粉末の調合は、従来法に準じて調製すればよい。例え
ば先に述べた粉末を所定の割合で配合し、その配合粉末
にアルコール等の有機溶媒または水を加え、ボールミル
で混合後、乾燥する方法、あるいは所定の配合の塩類、
アルコキシド等の溶液から共沈物を分離し乾燥する方法
等がある。
BEST MODE FOR CARRYING OUT THE INVENTION The preparation of an electrostatic chuck will be described. First, MgO powder, Al 2 O 3 powder, TiO 2 powder, or MgO powder, Al 2 O 3 powder are used to prepare a spinel sintered body. , Cr 2 O 3 powder is blended to a predetermined composition. Instead of the powder described above, a composite oxide such as MAl 2 O 4 containing MgO and Al 2 O 3 may be used. These powders may be prepared according to a conventional method. For example, the powder described above is blended at a predetermined ratio, an organic solvent such as alcohol or water is added to the blended powder, mixed by a ball mill, and dried, or a salt of a predetermined blend,
There is a method of separating a coprecipitate from a solution such as an alkoxide and drying the coprecipitate.

【0016】得られた混合粉末を一軸プレスまたは冷間
静水圧プレス(CIP)等によって所定形状に成形す
る。得られた成形体を還元雰囲気中で所定の温度で焼結
することにより、あるいは得られた成形体を大気中で所
定の温度で焼結し、これをさらに還元雰囲気中で所定の
温度で加熱処理することにより、導電性を有するスピネ
ル質焼結体が作製される。酸素を欠損させる度合いは、
還元雰囲気中の還元力によって異なるが、通常使用され
るカーボン雰囲気程度の還元力では、TiO2またはC
23の酸素のみが欠損されるだけで、スピネル中の酸
素をも欠損させることはない。
The obtained mixed powder is formed into a predetermined shape by a uniaxial press or a cold isostatic press (CIP). The obtained molded body is sintered at a predetermined temperature in a reducing atmosphere, or the obtained molded body is sintered at a predetermined temperature in the air and further heated at a predetermined temperature in a reducing atmosphere. By performing the treatment, a spinel-based sintered body having conductivity is produced. The degree of oxygen deficiency is
Although it depends on the reducing power in the reducing atmosphere, TiO 2 or C
Only oxygen of r 2 O 3 is lost, and oxygen in spinel is not lost.

【0017】その焼結体を焼結する温度としては、15
00〜1650℃が好ましく、1500℃より低いと緻
密化が不十分となり、1650℃より高いと焼結体が分
解する恐れがある。その焼結した焼結体をさらに加熱処
理する温度としては、焼結する温度と同じでよいが、熱
間静水圧処理(HIP処理)する場合には、1400〜
1650℃が好ましく、1400℃より低い、または1
650℃より高いとHIP処理の効果が少なく、その時
の圧力としては1800kg/cm2より低いとこれも
HIP処理の効果が少ない。
The temperature for sintering the sintered body is 15
If the temperature is lower than 1500 ° C., the densification becomes insufficient. If the temperature is higher than 1650 ° C., the sintered body may be decomposed. The temperature at which the sintered body is further heated may be the same as the temperature at which it is sintered, but when hot isostatic pressure treatment (HIP treatment) is performed, 1400
1650 ° C. is preferred, lower than 1400 ° C. or 1
If the temperature is higher than 650 ° C., the effect of the HIP treatment is small, and if the pressure at that time is lower than 1800 kg / cm 2 , the effect of the HIP treatment is also small.

【0018】得られたスピネル質焼結体に含まれるSi
2、CaO、Na2O、Fe23等の不純物成分として
は、3重量%以下が好ましく、3重量%より多いと、例
えば、半導体製造装置の装置内で絶縁不良を起こすなど
の問題が生じるので好ましくない。また、得られたスピ
ネル質焼結体の気孔率としては、1%以下が好ましく、
気孔率が1%を越えると焼結体中に気孔が多く存在する
ため、表面を加工するとその気孔が表面に現れ、その気
孔の部分でハロゲン系プラズマガスの腐食反応が激しく
起こり、表面が著しく腐食されるため好ましくない。
Si contained in the obtained spinel sintered body
The impurity component such as O 2 , CaO, Na 2 O, and Fe 2 O 3 is preferably 3% by weight or less, and if it is more than 3% by weight, for example, there is a problem that insulation failure occurs in a semiconductor manufacturing apparatus. Is not preferred. The porosity of the obtained spinel-based sintered body is preferably 1% or less,
If the porosity exceeds 1%, there are many pores in the sintered body. Therefore, when the surface is processed, the pores appear on the surface, and the corrosion reaction of the halogen-based plasma gas occurs violently at the pores, and the surface is markedly remarkable. It is not preferable because it is corroded.

【0019】次いで、得られたスピネル質焼結体を加工
などして誘電体層を作製し、その誘電体層を電極を形成
したセラミックス基体の上面に接着して、あるいは得ら
れた誘電体層を電極の上面に接着して、もしくは誘電体
層の下面に電極を形成して単極型または双極型の静電チ
ャックを作製する。なお、上記は誘電体層を焼結で作製
しているが、このほかセラミックス、金属などの基体表
面に溶射やスパッタ等により成膜し、それを還元雰囲気
中で還元処理したものであってもよい。
Next, a dielectric layer is formed by processing the obtained spinel-based sintered body, and the dielectric layer is bonded to the upper surface of the ceramic substrate on which the electrodes are formed, or the obtained dielectric layer is Is adhered to the upper surface of the electrode, or an electrode is formed on the lower surface of the dielectric layer to produce a monopolar or bipolar electrostatic chuck. In the above description, the dielectric layer is manufactured by sintering. In addition, even when the dielectric layer is formed by spraying or sputtering on the surface of a substrate such as ceramics and metal, and then reduced in a reducing atmosphere, Good.

【0020】以上述べた方法で静電チャックを作製すれ
ば、導電性を有し、かつ耐食性を有する誘電体層が形成
された静電チャックが得られる。
When an electrostatic chuck is manufactured by the method described above, an electrostatic chuck having a conductive and corrosion-resistant dielectric layer formed thereon can be obtained.

【0021】[0021]

【実施例】以下、本発明の実施例を比較例と共に具体的
に挙げ、本発明をより詳細に説明する。
EXAMPLES Hereinafter, the present invention will be described in more detail with reference to Examples of the present invention and Comparative Examples.

【0022】(実施例1〜7) (1)静電チャックの作製 純度99%のMgAl24粉末と純度99.9%のMg
O粉末をMgO/Al 23の比が重量比で表1となるよ
うに調合し、それにTiO2またはCr23粉末をその
添加率が表1となるよう添加し、それにエタノールを加
え、それをボールミルで72時間混合粉砕した。
(Examples 1 to 7) (1) Preparation of electrostatic chuck 99% pure MgAlTwoOFourPowder and 99.9% pure Mg
O powder is MgO / Al TwoOThreeTable 1 shows the ratio by weight.
And TiO2TwoOr CrTwoOThreeThe powder
Add so that the addition ratio is as shown in Table 1, and add ethanol to it.
Then, it was mixed and pulverized with a ball mill for 72 hours.

【0023】それを乾燥した混合粉末をCIP処理して
φ250×6mmtに成形し、その成形体を還元雰囲気
中で1500〜1650℃の温度で焼結し(実施例1〜
4)、あるいは成形体を大気中で1500〜1650℃
の温度で焼結し、それにさらに還元雰囲気中で1400
〜1650℃の温度で1800kg/cm2の圧力でH
IP処理して(実施例5〜7)スピネル質焼結体を作製
した。それら焼結体をφ200×2mmtに加工して誘
電体層を作製した。
The dried mixed powder was subjected to CIP treatment and formed into φ250 × 6 mmt, and the formed body was sintered at a temperature of 1500 to 1650 ° C. in a reducing atmosphere (Examples 1 to 5).
4) Alternatively, the molded body is 1500 to 1650 ° C. in the atmosphere.
Sintering at a temperature of 1400 ° C.
H at a temperature of 161650 ° C. and a pressure of 1800 kg / cm 2
IP treatment (Examples 5 to 7) produced a spinel-based sintered body. These sintered bodies were processed into φ200 × 2 mmt to produce a dielectric layer.

【0024】得られた誘電体層の一方の面にAgペース
トを印刷・焼き付けして電極を形成し、他方の面を表面
粗さがRaで0.34μmとなるよう研磨し、その研磨
面を表面をアノーダイジング(陽極酸化)したAl台座
に接着剤で貼り付け静電チャックを作製した。
An electrode is formed by printing and baking an Ag paste on one surface of the obtained dielectric layer, and the other surface is polished to have a surface roughness Ra of 0.34 μm. An electrostatic chuck was prepared by attaching the adhesive to an Al pedestal whose surface was anodized (anodized).

【0025】(2)評価 得られたスピネル質焼結体の曲げ強度を3点曲げ試験法
で測定した。また、得られた静電チャックの誘電体層の
電気伝導率を直流3端子法で測定した。さらに、得られ
た静電チャックを平行平板電極型プラズマエッチング装
置に組み込み、1kVの電荷を印加してシリコンウェハ
が吸着されるか否かを、シリコンウェハ上に形成されて
いる回路が破壊されるか否かを調べた。さらにまた、周
波数が2.45GHzで、出力が800Wで、CF4
2の体積比が4:1のプラズマガスを吸着面に40分
間エッチングし、そのエッチング後の誘電体層のエッチ
ングレートを誘電体層の減少した重量で算出した。それ
らの結果を表1に示す。
(2) Evaluation The bending strength of the obtained spinel sintered body was measured by a three-point bending test method. Further, the electric conductivity of the dielectric layer of the obtained electrostatic chuck was measured by a DC three-terminal method. Further, the obtained electrostatic chuck is incorporated in a parallel plate electrode type plasma etching apparatus, and a circuit formed on the silicon wafer is destroyed by applying a charge of 1 kV to determine whether or not the silicon wafer is attracted. I checked whether or not. Further, a plasma gas having a frequency of 2.45 GHz, an output of 800 W, and a volume ratio of CF 4 to O 2 of 4: 1 is etched on the adsorption surface for 40 minutes, and the etching rate of the dielectric layer after the etching is reduced. It was calculated from the reduced weight of the dielectric layer. Table 1 shows the results.

【0026】(比較例1〜7)比較のために比較例1、
2、5、6では、誘電体層のMgO/Al23の比を本
発明の範囲外にした他は、比較例3、4では、TiO2
の添加率を本発明の範囲外にした他は、また、比較例7
では、誘電体層をアルミナとした他は実施例と同様に静
電チャックを作製し、評価した。それらの結果も表1に
示す。
Comparative Examples 1 to 7 For comparison, Comparative Example 1
In Comparative Examples 3 and 4, TiO 2 was used except that the ratio of MgO / Al 2 O 3 of the dielectric layer was out of the range of the present invention in 2, 5, and 6.
Comparative Example 7 except that the addition ratio of
Then, an electrostatic chuck was manufactured and evaluated in the same manner as in the example except that alumina was used as the dielectric layer. The results are also shown in Table 1.

【0027】[0027]

【表1】 [Table 1]

【0028】表1から明らかなように、誘電体層の電気
伝導率は、実施例全てが本発明の範囲内にあった。その
ため、シリコンウェハの吸着性が全て良好であった。ま
た、ハロゲン系プラズマガスに対するエッチングレート
が全て5μm/hr以下にあり、従前の比較例7のアル
ミナに比べてはるかによく、しかもTiO2の添加率が
多くてもその添加率が少ない比較例3に比べて遜色なか
った。このことは、本発明の静電チャックとすれば、誘
電体層の厚さに関係なく吸着でき、しかも耐食性を有す
る誘電体層が形成された静電チャックとすることができ
ることを示している。
As is apparent from Table 1, the electric conductivity of the dielectric layer was within the scope of the present invention in all the examples. Therefore, all of the silicon wafers had good adsorption properties. Further, the etching rates for the halogen-based plasma gas are all 5 μm / hr or less, which is much better than the alumina of Comparative Example 7 in the past, and the addition rate of TiO 2 is small even when the addition rate of TiO 2 is high. Was comparable to. This indicates that the electrostatic chuck of the present invention can be attracted irrespective of the thickness of the dielectric layer and can be formed with a corrosion-resistant dielectric layer.

【0029】これに対して、比較例1、2、5、6で
は、MgO/Al23の比が本発明の範囲外にあるの
で、誘電体層の強度が低く、以後の評価を行わなかっ
た。また、比較例3では、TiO2の添加率が低すぎた
ため、電気伝導率が低く、シリコンウェハを吸着でき
ず、吸着性が悪かった。さらに、比較例4では、TiO
2の添加率が多すぎたため、吸着性は良好なものの、電
気伝導率が高すぎて回路がショートし回路破壊が生じて
しまっており、しかもTiO2-xの単味のものが残存し
てしまったためか耐食性も悪かった。なお、比較例7で
は、耐食性が悪いばかりでなく、誘電体層が厚いため、
吸着性が不良であった。
On the other hand, in Comparative Examples 1, 2, 5, and 6, since the ratio of MgO / Al 2 O 3 was out of the range of the present invention, the strength of the dielectric layer was low. Did not. In Comparative Example 3, since the addition rate of TiO 2 was too low, the electric conductivity was low, the silicon wafer could not be adsorbed, and the adsorbability was poor. Further, in Comparative Example 4, TiO
Since the addition ratio of 2 was too large, the adsorptivity was good, but the electrical conductivity was too high, and the circuit was short-circuited and the circuit was broken, and the simple TiO 2-x remained. Corrosion resistance was also bad probably because it had been. In Comparative Example 7, not only corrosion resistance was poor, but also the dielectric layer was thick,
Adsorption was poor.

【0030】[0030]

【発明の効果】以上の通り、本発明にかかる静電チャッ
クであれば、導電性を有し、しかも耐食性の良好な誘電
体層を有する静電チャックとすることができるようにな
った。このことにより、誘電体層の厚さに関係なく吸着
できる静電チャックとなり、しかもTiO2-xまたはC
23-xの含有率を調整することにより、必要とする電
気伝導率に変えることのできる静電チャックともなるよ
うになった。
As described above, with the electrostatic chuck according to the present invention, an electrostatic chuck having a dielectric layer having conductivity and good corrosion resistance can be obtained. Thus, it is an electrostatic chuck capable of adsorbing regardless the thickness of the dielectric layer, moreover TiO 2-x or C
By adjusting the content of r 2 O 3-x, an electrostatic chuck that can be changed to a required electric conductivity has come to be obtained.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 石井 守 千葉県佐倉市大作2−4−2 太平洋セメ ント株式会 社 中央研究所 Fターム(参考) 3C007 DS01 FS10 HS10 3C016 CE05 GA10 5F031 CA02 HA02 HA03 HA16  ────────────────────────────────────────────────── ─── Continuing on the front page (72) Inventor Mamoru Ishii 2-4-2 Daisaku, Sakura City, Chiba Pref. Central Research Institute of Pacific Cement Co., Ltd.

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】 電極の上面に誘電体層が設けられている
静電チャックにおいて、該誘電体層が、主成分がMgO
とAl23からなり、そのMgO/Al23の比が重量
比で0.67〜2.33の範囲にあり、その主成分にT
iO2-xを3〜30重量%含むスピネル質焼結体からな
り、かつその電気伝導率が、10-8〜10-14S/cm
であることを特徴とする静電チャック。
1. An electrostatic chuck in which a dielectric layer is provided on an upper surface of an electrode, wherein the dielectric layer has a main component of MgO.
And Al 2 O 3 , and the ratio of MgO / Al 2 O 3 is in the range of 0.67 to 2.33 by weight.
It is made of a spinel sintered body containing 3 to 30% by weight of iO 2-x and has an electric conductivity of 10 -8 to 10 -14 S / cm.
An electrostatic chuck characterized by the following.
【請求項2】 電極の上面に誘電体層が設けられている
静電チャックにおいて、該誘電体層が、主成分がMgO
とAl23からなり、そのMgO/Al23の比が重量
比で0.67〜2.33の範囲にあり、その主成分にC
23-xを3〜30重量%含むスピネル質焼結体からな
り、かつその電気伝導率が、10-8〜10-14S/cm
であることを特徴とする静電チャック。
2. An electrostatic chuck in which a dielectric layer is provided on an upper surface of an electrode, wherein the dielectric layer has a main component of MgO.
And Al 2 O 3 , and the ratio of MgO / Al 2 O 3 is in the range of 0.67 to 2.33 by weight.
r 2 O 3-x to be a spinel sintered body comprising 3 to 30 wt%, and its electrical conductivity, 10 -8 ~10 -14 S / cm
An electrostatic chuck characterized by the following.
【請求項3】 前記スピネル質焼結体の腐食ガスに対す
る耐食性が、ハロゲン系プラズマガスに対するエッチン
グレートで、5μm/hr以下であることを特徴とする
請求項1または2記載の静電チャック。
3. The electrostatic chuck according to claim 1, wherein the corrosion resistance of the spinel sintered body to a corrosive gas is 5 μm / hr or less as an etching rate with respect to a halogen-based plasma gas.
【請求項4】 前記スピネル質焼結体が、MgO粉末、
Al23粉末、TiO2粉末とを請求項1記載の組成と
なるよう配合し、それを混合し、成形し、その成形した
成形体を還元雰囲気中で焼結することにより作製された
焼結体であることを特徴とする請求項1または3記載の
静電チャック。
4. The method according to claim 1, wherein the spinel-based sintered body comprises MgO powder,
An Al 2 O 3 powder and a TiO 2 powder are blended so as to have the composition described in claim 1, mixed, molded, and sintered by sintering the molded body in a reducing atmosphere. The electrostatic chuck according to claim 1, wherein the electrostatic chuck is a union.
【請求項5】 前記スピネル質焼結体が、MgO粉末、
Al23粉末、Cr 23粉末とを請求項2記載の組成と
なるよう配合し、それを混合し、成形し、その成形した
成形体を還元雰囲気中で焼結することにより作製された
焼結体であることを特徴とする請求項2または3記載の
静電チャック。
5. The method according to claim 1, wherein the spinel-based sintered body comprises MgO powder,
AlTwoOThreePowder, Cr TwoOThreePowder and the composition according to claim 2;
Blended, mixed, molded, and molded
Manufactured by sintering compacts in a reducing atmosphere
4. A sintered body according to claim 2, wherein the sintered body is a sintered body.
Electrostatic chuck.
【請求項6】 前記スピネル質焼結体が、MgO粉末、
Al23粉末、TiO2粉末とを請求項1記載の組成と
なるよう配合し、それを混合し、成形し、その成形した
成形体を空気中で焼結した後、それをさらに還元雰囲気
中で加熱処理することにより作製された焼結体であるこ
とを特徴とする請求項1または3記載の静電チャック。
6. The method according to claim 1, wherein the spinel-based sintered body comprises MgO powder,
An Al 2 O 3 powder and a TiO 2 powder are blended so as to have the composition according to claim 1, mixed, molded, and the molded body is sintered in air, and then further reduced in a reducing atmosphere. The electrostatic chuck according to claim 1, wherein the electrostatic chuck is a sintered body produced by performing a heat treatment in the inside.
【請求項7】 前記スピネル質焼結体が、MgO粉末、
Al23粉末、Cr 23粉末とを請求項2記載の組成と
なるよう配合し、それを混合し、成形し、その成形した
成形体を空気中で焼結した後、それをさらに還元雰囲気
中で加熱処理することにより作製された焼結体であるこ
とを特徴とする請求項2または3記載の静電チャック。
7. The method according to claim 1, wherein the spinel sintered body comprises MgO powder,
AlTwoOThreePowder, Cr TwoOThreePowder and the composition according to claim 2;
Blended, mixed, molded, and molded
After sintering the compact in air, it is further reduced
This is a sintered body produced by heat treatment in
4. The electrostatic chuck according to claim 2, wherein:
JP2001038132A 2001-02-15 2001-02-15 Electrostatic chuck Expired - Fee Related JP4585129B2 (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009132584A (en) * 2007-11-30 2009-06-18 Taiheiyo Cement Corp Ceramic sintered compact and electrostatic chuck using the same
JP2010018853A (en) * 2008-07-11 2010-01-28 Taiheiyo Cement Corp Thermally sprayed ceramic film and corrosion-resistant member using the same

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH058140A (en) * 1990-12-28 1993-01-19 Ngk Insulators Ltd Electrostatic chuck
JPH08337467A (en) * 1995-04-27 1996-12-24 Abb Patent Gmbh Ceramic material and its production
JPH10330150A (en) * 1997-05-30 1998-12-15 Kyocera Corp Corrosion resistant member
JPH11214365A (en) * 1998-01-28 1999-08-06 Kyocera Corp Member for semiconductor element manufacturing device
JP2000299372A (en) * 1999-04-13 2000-10-24 Taiheiyo Cement Corp Electrostatic chuck
JP2001199762A (en) * 2000-01-18 2001-07-24 Taiheiyo Cement Corp Corrosion-resisting ceramic material

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH058140A (en) * 1990-12-28 1993-01-19 Ngk Insulators Ltd Electrostatic chuck
JPH08337467A (en) * 1995-04-27 1996-12-24 Abb Patent Gmbh Ceramic material and its production
JPH10330150A (en) * 1997-05-30 1998-12-15 Kyocera Corp Corrosion resistant member
JPH11214365A (en) * 1998-01-28 1999-08-06 Kyocera Corp Member for semiconductor element manufacturing device
JP2000299372A (en) * 1999-04-13 2000-10-24 Taiheiyo Cement Corp Electrostatic chuck
JP2001199762A (en) * 2000-01-18 2001-07-24 Taiheiyo Cement Corp Corrosion-resisting ceramic material

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009132584A (en) * 2007-11-30 2009-06-18 Taiheiyo Cement Corp Ceramic sintered compact and electrostatic chuck using the same
JP2010018853A (en) * 2008-07-11 2010-01-28 Taiheiyo Cement Corp Thermally sprayed ceramic film and corrosion-resistant member using the same

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