JP2002228681A - Interposing piece for measurement and contact structure of probe for electronic measurement with measured body - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an interposing piece for measurement and a contact structure of a probe for electronic measurement with a body to be measured which can obtain a stable measured value by making the contact resistance small. SOLUTION: This contact structure is composed of the probe 11 for electric measurement which is equipped with a contact 12 arranged freely movably forward and backward with a pressing force and the interposing piece 21 for measurement which is interposed between the contact 12 and the body 31 to be measured, and the probe 11 is equipped with a magnet part 14 attached in the forward/backward movement direction of the contact 12, which is arranged so as to surely obtain an electric contact having a small contact resistance with the body 31 to be measured across the interposing piece 21 for measurement magnetized through an open end surface 15 of the magnet part 14.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a technique relating to a contact structure of an electric measurement probe with a measurement piece and an object to be measured.

[0002]

2. Description of the Related Art FIG. 3 is an explanatory view showing the state of contact of an electric measurement probe with an object to be measured as a conventional example. The electric measurement probe 1 is pressed by a compression coil spring 3 interposed. Contact 2 arranged to be able to move forward and backward by being biased
And a cylindrical magnet portion 4 surrounding the contact 2 in the reciprocating direction, and an insulating cover portion 6 for integrally holding the magnet portion 4 and the contact 2.

[0005] The object to be measured 31 is made of a magnetic material that can be magnetized by the magnet portion 4 through the open end face 5.
The contact 2 can be brought into contact with the measured object 31 in a state where it is magnetically attached to 1, whereby electrical measurement can be performed.

[0004]

The object to be measured 3
In many cases, the contact surface 32 with the contact 2 in 1 is usually a macroscopically flat surface but a microscopically continuous surface. When the measurement object 31 is formed of a rust-prone material such as iron, rust is easily generated in the concave portion, and such rust cannot be removed merely by polishing.

[0005] When the contact 2 is brought into contact with the object 31 under such an environment, poor contact is caused by the rust intervening, and the contact resistance is increased accordingly, and an error is likely to occur in the measured value. There was an inconvenience.

The present invention has been made in view of the above-mentioned problems encountered in the prior art, and has been developed in consideration of the above-mentioned problems. The purpose is to provide.

[0007]

Means for Solving the Problems The present invention has been made to achieve the above object, and a first invention (measurement interposition piece) of the present invention is a method for making contact with a contact provided in an electric measurement probe. It consists of a conductive magnetic base with a flat surface on both the side and the contact side of the object to be measured. There is a structural feature in the formation.

In this case, the flat surface can be formed on each top end surface of a protruding portion protruding from a substantially central portion of each of the conductive magnetic substrates. Further, the protruding portion located on the contact side with the contact may be formed so that the electric measurement probe can be freely introduced to the side facing the contact.

Further, among the flat surfaces of the conductive magnetic substrate, a flat surface located on a contact surface side with the object to be measured is formed on a top end surface of a protruding portion projecting from the conductive magnetic substrate. In this case, the flat surface may be formed by the entire top surface of a plurality of small protrusions having the same top surface height.

[0010] On the other hand, a second invention (structure) is an electric measurement probe including a contact that is arranged to be able to move forward and backward by being urged by a pressing force, and an interposition between the contact and the object to be measured. The electrical measurement probe is formed with a magnet part provided in the direction of movement of the contact, and the contact is formed by the magnet part. There is a structural feature in that electrical contact with a small contact resistance to the object to be measured is freely arranged via the measuring piece interposed magnetically via the open end surface of the above.

[0011]

FIG. 1 is an explanatory view showing an example of a contact structure of an electric measurement probe to an object to be measured according to a second invention. It is composed of a probe 11 and a measurement interposition piece 21 interposed between the contact 12 and the measured object 31.

The electric measurement probe 11 is provided with a contact 12, which is urged by a compression coil spring 13 interposed therebetween so as to be capable of moving forward and backward, and is attached to the contact 21 in the moving direction of the contact 21. And at least a magnet unit 14 provided. In this case, the electrical measurement probe 11 may be, for example, an insulative resin material or the like that is covered so as to integrally hold the magnet portion 14 and the contact 12 with the hem portion 14a side of the magnet portion 14 exposed. It is preferable to provide the insulating cover part 16 made of and form the whole. FIG. 1 illustrates a cylindrical magnet portion 14 having, for example, an outer diameter of about 15 mm and surrounding the contact 12 in a cylindrical shape along the reciprocating direction.
The specific shape is not limited to the illustrated example. The magnet section 14 is, for example, substantially U
In other words, the measurement piece 21 is stably magnetized, for example, by forming the contact piece 12 in the middle, arranging two independent magnet members with the contact 12 in the middle, or by forming the section into a substantially semicircular section. What is necessary is just to have the structure which can be performed.

As the object 31 to be measured, various appropriate members such as a steel frame of a building made of an appropriate magnetic material such as iron to which the magnet portion 14 can be magnetically attached are assumed.

FIGS. 2A and 2B are explanatory diagrams showing examples of the measurement interposition piece according to the first invention as (a), (b), and (c) for each pattern. In any case, for example, gold plating is applied to iron having flat surfaces 23 and 26 on both the contact side with the contact 12 and the contact side with the measured object 31, and chrome plating is applied to nickel. It is formed of a conductive magnetic base 22 formed in the above-described manner, and is formed with an appropriate thickness so as to have a shape-retaining property between the electric measurement probe 11 and the measured object 31 at the time of measurement and to be freely disposed. Have been.

Among them, the measuring piece 21 shown in FIG. 2A is composed of a conductive magnetic base 22 having a circular shape with a diameter of, for example, 15 mm and a thickness of about 1 mm or more.
2a has a flat surface 23 in contact with the contact 12 and another side surface 2a.
2b, a flat surface 26 that is in contact with the contact surface 32 side of the measured object 31 is formed.

Further, the measuring piece 21 shown in FIG.
The measurement interposition piece 21 shown in FIG. 2B formed with the same size as that of FIG.
3 and 26, the flat surface 26 located on the contact surface 32 side of the measured object 31 has, for example, a diameter of about 6 mm and a height of about 0.5 mm at substantially the center of the other side surface 22 b of the conductive magnetic base 22. It is formed to be provided on the top end surface 28 of the protrusion 27 projecting in size.

Further, the measuring piece 2 shown in FIG.
1, a plurality of small projections 27a projecting from substantially the center of the other side surface 22b of the conductive magnetic base 22 with the same top surface height form a projection 27, and these small projections 27a A top end surface 28 is formed by the entire top surface 28a.

Further, as another preferred embodiment of the first invention, as shown in FIG. 1, for example, a diameter is set at a substantially central portion of both one side 22a and the other side 22b of the conductive magnetic base 22. The protrusions 24 and 28 each having a size of about 6 mm and a height of about 0.5 mm are separately provided, and the top end face 25 of the protrusion 24 on one side 22 a is formed as one flat surface 23 and the other side 22 b is formed. The top end surface 28 of the projection 27 of the
By doing so, the measurement interposition piece 21 can also be formed.

Moreover, in this case, the protruding portion 24 on the side surface 22a of the conductive magnetic base 22 which is in contact with the contact 12 is provided.
For example, when the magnet portion 14 is formed in a cylindrical shape as shown in FIG.
It is preferable that the diameter of the hollow part 17 is slightly smaller than the diameter of the hollow part 17.

As a result, the measurement interposition piece 21 is placed in the magnet portion 1 with the protruding portion 24 being introduced into the hollow portion 17.
4 is magnetically attached to the open end surface 15 of the contact 4 and the contact 12 and the object 3 to be measured in a stable state where no displacement occurs.
1 can be interposed.

Next, the second invention (structure) of the present invention
1 will be described with reference to the example of FIG. 1. The measuring piece 21 is attached to the open end face 15 of the magnet portion 14 while pushing up the contact 12 against the pressing force of the compression coil spring 13. Magnetize. When the magnet portion 14 is formed in a cylindrical shape, and the outer diameter of the magnet portion 14 and the diameter of the measurement interposition piece 21 substantially match, the measurement interposition is performed so as to cover the open end surface 15. The piece 21 can be magnetically attached.

In particular, when the measuring piece 21 is provided with the protruding portions 24 and 28 protruding from the substantially central portions of both surfaces,
As shown in FIG.
The cylindrical magnet portion 14 is placed in a stable state where no misalignment occurs by being introduced into the inside.
The measurement interposition piece 21 can be magnetically attached to the open end face 15.

Further, in this state, the contact element 12 is pressed by the pressing force of the compression coil spring 13 and the top end face 25 of the protruding portion 24 on the side surface 22a side of the measurement interposition piece 21.
And comes into intimate contact with the flat surface 23 formed on the substrate.

Thereafter, the other side surface 22 of the measuring piece 21
By bringing the flat surface 26 formed on the top end surface 28 of the b-side protruding portion 27 into surface contact with the contact surface 32 of the measured object 31, the contact 12 of the electric measurement probe 11 is brought into contact with the measured object 31. It becomes electrically conductive.

At this time, the electric probe 11, the measuring piece 21, and the measured object 31 are integrally magnetically attached to each other by the magnetic force generated by the magnet portion 14, and as a result, the contact 12 is also formed. The object 3 to be measured via the measuring piece 21
1 and is electrically connected.

In addition, at this time, the contact 12 is
3 on the side of the measurement piece 21, the measurement piece 2
1 can surely make contact with the contact surface 32 of the measured object 31 via the flat surface 26, respectively.

For this reason, the contact 12 can be brought into contact with the flat surface 23 of the measuring piece 21 with sufficiently small contact resistance even with the pressing force generated by the compression coil spring 13. .

The measuring piece 21 has a flat surface 2
By passing through 6, the contact surface 32 of the measured object 31 can be brought into surface contact with a small contact resistance. In particular, when the measurement piece 21 has the protruding portion 27 on the other side surface 22b, the flat surface 2 formed on the top end surface 28 is formed.
6, the contact surface 32 of the measured object 31 can be brought into intensive contact with the load from the electrical measurement probe 11 and the magnetic force, so that the contact resistance can be reduced accordingly.

Therefore, for example, by applying the second invention to the four-terminal method, common mode noise can be removed and stable resistance measurement can be performed. Stable electrical measurement with small contact resistance is ensured by securing a large contact area.

[0030]

As described above, according to the first aspect,
With one side of the conductive magnetic substrate magnetically attached to the probe for electrical measurement, the other side can be brought into surface contact with the contact surface of the object to be measured by reducing the contact resistance. This can assist in performing the measurement.

In particular, when the measuring piece has projections on both sides, the projecting portion located on the contact side with the contactor is introduced into the electrical measurement probe, thereby causing a displacement. It can be magnetized in a state that is not under stable condition. In addition, when the measurement interposition piece has a protruding portion on the other side surface, it can be brought into intensive surface contact with the contact surface of the object to be measured via the flat surface formed on the top end surface. .

On the other hand, according to the second aspect of the present invention, one side surface of the measurement interposition piece is magnetically attached to the electrical measurement probe side so that the contact is in close contact with the measurement interposition piece. In this way, the other side of the measurement interposer can be brought into close contact with the contact surface of the object under measurement in a magnetically attached state. Stable electrical measurement with small contact resistance is ensured by securing a large contact area.

[Brief description of the drawings]

FIG. 1 is an explanatory view showing an example of a contact structure of an electric measurement probe to an object to be measured according to a second invention of the present invention.

FIGS. 2A and 2B are explanatory views showing examples of a measurement interposition piece according to the first invention as patterns (a), (b), and (c) according to patterns.

FIG. 3 is an explanatory diagram showing an example of a contact state of a probe for electric measurement on an object to be measured by a conventional method.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1,11 Electric measurement probe 2,12 Contact 3,13 Compression coil spring 4,14 Magnet part 14a Hem part 5,15 Open end face 6,16 Insulation cover part 17 Hollow part 21 Measurement piece 22 Conductive magnetism Base 22a One side 22b Other side 23,26 Flat surface 24,27 Projection 27a Small projection 25,28 Top end surface 28a Top surface 31 Measurement object 32 Contact surface

Claims (6)

[Claims] 1. An electric measurement probe comprising a conductive magnetic substrate having a flat surface on both a contact side of a contact provided with an electric measurement probe and a contact surface with an object to be measured. An interposition piece for measurement, wherein an interposition arrangement is formed freely with a small contact resistance with an object. 2. The measuring piece according to claim 1, wherein the flat surface is formed on each top end surface of a projecting portion projecting from a substantially central portion of each of the conductive magnetic substrates. . 3. The device according to claim 2, wherein the protruding portion positioned on the contact side with the contact is formed so as to be able to freely introduce the electric measurement probe to the side facing the contact. Measurement piece. 4. A method according to claim 1, wherein, among the flat surfaces of the conductive magnetic substrate, a flat surface located on a contact surface side with the object to be measured is formed on a top end surface of a protruding portion projecting from the conductive magnetic substrate. The measurement interposition piece according to claim 1, wherein: 5. The flat surface provided on the contact surface side of the conductive magnetic substrate with an object to be measured is formed on the entire top surface of a plurality of small projections having the same top surface height. The measurement piece according to claim 4. 6. An electric measurement probe including a contact which is disposed so as to be able to move forward and backward by being urged by a pressing force, and is interposed between the contact and the object to be measured. The electric measurement probe is formed with a magnet part provided in the direction of movement of the contact, and the contact is an open end face of the magnet part. Contacting the electric measurement probe to the object to be measured, wherein the electric contact having a small contact resistance to the object to be measured is freely arranged through the interposition piece for measurement magnetically attached via Construction.