JP2002196008A - Autosampler - Google Patents

Autosampler

Info

Publication number
JP2002196008A
JP2002196008A JP2000393967A JP2000393967A JP2002196008A JP 2002196008 A JP2002196008 A JP 2002196008A JP 2000393967 A JP2000393967 A JP 2000393967A JP 2000393967 A JP2000393967 A JP 2000393967A JP 2002196008 A JP2002196008 A JP 2002196008A
Authority
JP
Japan
Prior art keywords
sample cell
finger
sample
autosampler
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000393967A
Other languages
Japanese (ja)
Other versions
JP4547801B2 (en
Inventor
Mitsumasa Uchiike
光正 内池
Shinichi Mihashi
新一 三橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2000393967A priority Critical patent/JP4547801B2/en
Publication of JP2002196008A publication Critical patent/JP2002196008A/en
Application granted granted Critical
Publication of JP4547801B2 publication Critical patent/JP4547801B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide an autosampler preventing detection error of a sample cell detecting sensor due to reflected light from fingers gripping a sample cell. SOLUTION: A low reflectivity substance 3c comprising black matt coating is applied to a lower end part of a pair of fingers 3a gripping the sample cell 1. By this, since an infrared ray from a light emitting device 5a of the sample cell detecting sensor 5 is absorbed by the low reflectivity substance 3c and its reflected light is reduced, the detection error due to the reflected light from the fingers 3a can be eliminated.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、主として熱分析装
置において用いられる自動試料搬送用オートサンプラに
関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an automatic sample transfer autosampler mainly used in a thermal analyzer.

【0002】[0002]

【従来の技術】従来のオートサンプラでは、搬送用アー
ムに取り付けられた板状や棒状形状のフィンガーが、試
料トレイに並んだ試料セルを把持してディテクタ位置ま
で搬送している。その際、フィンガーの移送路近傍に光
センサを配置して、移送中の試料セルの下面に光を当て
て、その反射光を検知することにより試料セルの有無を
確認している。
2. Description of the Related Art In a conventional autosampler, a plate-shaped or rod-shaped finger attached to a transfer arm grips a sample cell arranged in a sample tray and transfers it to a detector position. At this time, an optical sensor is arranged near the transfer path of the finger, light is applied to the lower surface of the sample cell being transferred, and the presence or absence of the sample cell is confirmed by detecting the reflected light.

【0003】[0003]

【発明が解決しようとする課題】従来のオートサンプラ
では上記のようにフィンガーにより把持された試料セル
の存在を光センサによって検知しているが、試料セルの
存在を確実に検知するには光センサを試料セルに近づけ
る必要がある。しかしながら、光センサをフィンガーに
あまり近づけ過ぎるとフィンガー下端面からも光センサ
方向に光が反射し、フィンガーが試料セルを把持してい
ないのに試料セルがあるかのように光センサが反応して
しまうという問題がある。本発明は、このような事情に
鑑みてなされたものであって、移送過程の試料セルの有
無を確実に検知できるオートサンプラを提供することを
目的とする。
In the conventional autosampler, the presence of the sample cell gripped by the finger is detected by the optical sensor as described above. However, in order to reliably detect the presence of the sample cell, the optical sensor is used. Must be close to the sample cell. However, if the optical sensor is too close to the finger, light will also be reflected from the lower end surface of the finger in the direction of the optical sensor, and the optical sensor will react as if there is a sample cell even though the finger is not holding the sample cell. There is a problem that it will. The present invention has been made in view of such circumstances, and has as its object to provide an autosampler that can reliably detect the presence or absence of a sample cell in a transfer process.

【0004】[0004]

【課題を解決するための手段】上記の目的を達成するた
め、本発明のオートサンプラは、被分析試料を収容する
試料セルを保持する保持部と、該保持部を駆動するアー
ムとを備え、複数の試料セルを順次自動的にディテクタ
上に移送すると共に、移送中の保持部における試料セル
の有無を検知する光センサを備えたオートサンプラにお
いて、試料セル保持部の下端面に光センサからの入射光
が反射しないような低反射物質を塗布、あるいは試料セ
ル保持部の下端面を鋭角度に傾斜させて反射光が光セン
サに入射しないようにしたことを特徴とするものであ
る。本発明のオートサンプラは上記の構成を用いること
により、確実に移送中の試料セルの有無を確認すること
ができる。
In order to achieve the above object, an autosampler according to the present invention comprises: a holding section for holding a sample cell containing a sample to be analyzed; and an arm for driving the holding section. In an autosampler equipped with an optical sensor that automatically transfers a plurality of sample cells onto a detector sequentially and detects the presence or absence of a sample cell in a holding unit during transfer, the lower end surface of the sample cell holding unit receives light from the optical sensor. The present invention is characterized in that a low-reflection material that does not reflect incident light is applied, or the lower end surface of the sample cell holding portion is inclined at an acute angle so that reflected light does not enter the optical sensor. By using the above configuration, the autosampler of the present invention can surely confirm the presence or absence of the sample cell being transferred.

【0005】[0005]

【発明の実施の形態】以下、本発明の実施例によるオー
トサンプラを図面を参照しながら説明する。図1は本発
明のオートサンプラを熱分析装置に用いた場合の構成を
示す斜視図である。本オートサンプラは、試料セル1を
搭載するための複数の凹み又は通し孔2aと回転軸2b
を有する試料トレイ2と、試料セル1を把持するフィン
ガー3aとその試料セル1をディテクタ4の位置まで移
送する搬送アーム3bを連結してなる試料搬送機構3
と、移送中のフィンガー3aに試料セル1が把持されて
いるかどうかを検知する試料セル検知センサ5と、これ
らの構成要素を搭載すると共に、該構成要素の動作を制
御するための制御装置6を収容する筐体7から構成され
ている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, an autosampler according to an embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a perspective view showing a configuration when the autosampler of the present invention is used in a thermal analyzer. This autosampler has a plurality of recesses or through holes 2a for mounting the sample cell 1 and a rotating shaft 2b.
Sample transport mechanism 3 comprising a sample tray 2 having the following structure, a finger 3a for gripping the sample cell 1, and a transport arm 3b for transporting the sample cell 1 to the position of the detector 4.
A sample cell detection sensor 5 for detecting whether or not the sample cell 1 is gripped by the finger 3a being transferred; and a control device 6 for mounting these components and controlling the operation of the components. It is composed of a housing 7 for housing.

【0006】前記試料搬送機構3には、図2に示すよう
な搬送アーム3bを水平方向に回転移動させるためのモ
ータM1、搬送アーム3bを介してフィンガー3aを上
下に移動するためのモータM2、同じくフィンガー3a
を左右に開閉するためのモータM3、また、試料トレイ
2にはこれを回転又は停止させるためのモータM4がそ
れぞれ組み込まれている。そして、前記試料セル検知セ
ンサ5は移送中の試料セル1に向けて光線を発射する発
光素子5aとその反射光を検知する受光素子5bから構
成されている。
A motor M1 for rotating the transfer arm 3b in the horizontal direction as shown in FIG. 2, a motor M2 for moving the finger 3a up and down via the transfer arm 3b, Finger 3a
A motor M3 for opening and closing left and right, and a motor M4 for rotating or stopping the sample tray 2 are incorporated in the sample tray 2, respectively. The sample cell detection sensor 5 includes a light emitting element 5a that emits a light beam toward the sample cell 1 being transferred, and a light receiving element 5b that detects the reflected light.

【0007】前記制御装置6は、図2に示すように、本
オートサンプラによる試料セル1の搬送を実行する制御
プログラムを記憶しておくROM62、データの出し入
れを行うRAM63と、その制御プログラムにおける演
算制御を実行するCPU61と、このCPU61からの
制御信号に基づき前記試料トレイ2や試料搬送機構3を
制御するための駆動信号を出力したり、試料セル検知セ
ンサ5からの検知信号を取り込むためのI/Oインター
フェース64と、自動分析開始等の指令信号を入力する
入力装置66や試料セル検知センサ5からの情報を出力
する出力装置67用のI/Oインターフェース65から
構成されている。
As shown in FIG. 2, the control device 6 includes a ROM 62 for storing a control program for executing the transfer of the sample cell 1 by the present autosampler, a RAM 63 for transferring data in and out, and an arithmetic operation in the control program. A CPU 61 for executing control, and an I / O for outputting a drive signal for controlling the sample tray 2 and the sample transport mechanism 3 based on a control signal from the CPU 61 and for taking in a detection signal from the sample cell detection sensor 5. It comprises an I / O interface 64, an input device 66 for inputting a command signal for starting automatic analysis and the like, and an I / O interface 65 for an output device 67 for outputting information from the sample cell detection sensor 5.

【0008】また、図3は本発明に係わるフィンガー3
aの実施例による側面図(a)とその正面図(b)を示
したものである。図に示すように、このフィンガー3a
の下端面には試料セル検知センサ5の発光素子5aから
の入射光を反射させない低反射率物質3cが塗布されて
いる。前記発光素子5aと受光素子5bには発光ダイオ
ードとフォトダイオードを個々に配置して構成すること
もできるが、これらを一体にした汎用の光電センサを用
いることもできる。例えば、発光素子5aとして赤外線
を発光するGaAsのような半導体発光素子を用いる場
合は、低反射率物質3cとして黒色ツヤけし塗料、受光
素子5aとして量子型のフォトダイオードや熱型の焦電
性赤外線センサを用いることができる。
FIG. 3 shows a finger 3 according to the present invention.
FIG. 2A shows a side view (a) and a front view (b) thereof according to the embodiment of FIG. As shown in FIG.
A low-reflectance substance 3c that does not reflect incident light from the light emitting element 5a of the sample cell detection sensor 5 is applied to the lower end surface of the sample cell detection sensor 5. The light emitting element 5a and the light receiving element 5b can be configured by individually arranging a light emitting diode and a photodiode, but a general-purpose photoelectric sensor in which these are integrated can also be used. For example, when a semiconductor light emitting element such as GaAs that emits infrared light is used as the light emitting element 5a, black luster paint is used as the low reflectance material 3c, and a quantum photodiode or a thermal pyroelectric infrared light is used as the light receiving element 5a. Sensors can be used.

【0009】次に、上記構成によるオートサンプラを使
用した熱分析装置の自動分析動作を図1、図2を参照し
ながら説明する。自動分析開始指令を入力装置66に入
力すると、フィンガー3aは搬送アーム3bと共にモー
タM1により試料トレイ2上の規定位置に移動し、モー
タM3により左右方向に開いた後、モータM2により試
料セル1の位置まで下降する。そして、フィンガー3a
はモータM3により試料セル1を把持した後、モータM
2により一定の高さまで上昇し、続いてモータM1によ
り試料セル1をディテクタ4まで移送する。
Next, the automatic analysis operation of the thermal analyzer using the above-configured autosampler will be described with reference to FIGS. When an automatic analysis start command is input to the input device 66, the finger 3a is moved together with the transfer arm 3b to a specified position on the sample tray 2 by the motor M1 and is opened left and right by the motor M3. Descend to the position. And finger 3a
Indicates that after holding the sample cell 1 by the motor M3,
2, the sample cell 1 is moved to a certain height by the motor M1 and then transferred to the detector 4 by the motor M1.

【0010】前記フィンガー3aにより把持された試料
セル1を試料トレイ2から、ディテクタ4方向(図4
(a)における矢印方向)に移送中、試料セル検知セン
サ5により、試料セル1の有無が検知される。図4は試
料セル1がある場合(a)と無い場合(b)の試料セル
検知センサ5の動作を説明する図である。すなわち、フ
ィンガー3aに試料セル1が把持されている場合は、図
4(a)に示すように発光素子5aからの赤外線は試料
セル1の下端面で反射されて受光素子5bに入射し、試
料セル1の把持が確認される。
The sample cell 1 held by the finger 3a is moved from the sample tray 2 to the detector 4 (FIG. 4).
During the transfer in the direction of the arrow (a), the sample cell detection sensor 5 detects the presence or absence of the sample cell 1. FIG. 4 is a diagram for explaining the operation of the sample cell detection sensor 5 when there is the sample cell 1 (a) and when there is no sample cell 1 (b). That is, when the sample cell 1 is gripped by the finger 3a, the infrared light from the light emitting element 5a is reflected by the lower end surface of the sample cell 1 and enters the light receiving element 5b as shown in FIG. The holding of the cell 1 is confirmed.

【0011】一方、フィンガー3aに試料セル1を把持
していない場合は、図4(b)に示すように発光素子5
aからの赤外線はフィンガー3aの下端面に当たっても
黒色ツヤけし塗装面で吸収されるので、受光素子5bへ
の赤外線の入射光がなくなり、フィンガー3aで試料セ
ル1が把持されていないことが確実に確認される。
On the other hand, when the sample cell 1 is not gripped by the finger 3a, as shown in FIG.
Even if the infrared ray from a strikes the lower end surface of the finger 3a, it is absorbed by the black matte painted surface, so that the incident light of the infrared ray on the light receiving element 5b disappears, and it is ensured that the sample cell 1 is not gripped by the finger 3a. It is confirmed.

【0012】前記フィンガー3aはディテクタ4上で停
止し、モータM2により試料セル1をディテクタ4に設
置した後、モータM1〜M3を駆動して試料トレイ2に
戻る。そして、加熱炉8がディテクタ4上に降下し、デ
ィテクタ上4の試料セル1を加熱炉8内に収容して加熱
を行い、熱分析のための熱重量測定を行う。試料が所定
の設定温度に達した時点で熱重量測定を終了すると共
に、加熱炉8の加熱運転を停止する。炉内温度があらか
じめ設定された温度にまで低下した後、加熱炉8が上昇
しフィンガー3aの動作によって測定を終了した試料セ
ル1をディテクタ4から元の位置に移送して1つのサイ
クルを終了し、次のサイクルへ移行する。次のサイクル
において、先ず試料トレイ2を1ピッチ回動させ、フィ
ンガー3aの下の位置に次の試料セル1を移動させる。
そして、上記サイクルと同様にフィンガー3aで試料セ
ル1を把持して、ディテクタ4上に移送し、加熱して熱
重量測定を行う。
The finger 3a stops on the detector 4, and after the sample cell 1 is mounted on the detector 4 by the motor M2, the motors M1 to M3 are driven to return to the sample tray 2. Then, the heating furnace 8 is lowered onto the detector 4, the sample cell 1 on the detector 4 is accommodated in the heating furnace 8 and heated, and thermogravimetry for thermal analysis is performed. When the sample reaches a predetermined set temperature, the thermogravimetry is ended, and the heating operation of the heating furnace 8 is stopped. After the temperature in the furnace has decreased to a preset temperature, the heating furnace 8 rises, and the sample cell 1 whose measurement has been completed by the operation of the finger 3a is transferred from the detector 4 to the original position to complete one cycle. Then, shift to the next cycle. In the next cycle, first, the sample tray 2 is rotated by one pitch, and the next sample cell 1 is moved to a position below the finger 3a.
Then, similarly to the above cycle, the sample cell 1 is gripped by the finger 3a, transferred onto the detector 4, and heated to perform thermogravimetry.

【0013】図5は、フィンガー3aの他の実施例によ
る断面図と試料セル検知センサ5とを示したものであ
る。このフィンガー3dの下端部分は、図に示されるよ
うに、その側面に傾斜をつけ下端面に平坦部を無くすよ
うに仕上げられている。これにより、発光素子5aから
フィンガー3dの下端部分に入射した光線は、受光素子
5bの方向から外れた矢印方向Aに反射するので、試料
セル1が把持されていないことが確実に検知できる。
FIG. 5 shows a cross-sectional view and a sample cell detection sensor 5 according to another embodiment of the finger 3a. As shown in the drawing, the lower end of the finger 3d is finished so that its side surface is inclined and the lower end surface has no flat portion. Thereby, the light beam incident on the lower end portion of the finger 3d from the light emitting element 5a is reflected in the arrow direction A deviating from the direction of the light receiving element 5b, so that it is possible to reliably detect that the sample cell 1 is not gripped.

【0014】本発明は、フィンガーが移動中、その下端
面からの反射光によって試料セルがない場合でも試料セ
ル検知センサが有りと判定することを防止するため、下
端面に低反射率物質を塗布して反射光を無くすこと、あ
るいは反射面に傾斜をつけて光の反射方向を変えるよう
にしたことを特徴するもので、試料セル検出センサの光
線、低反射率物質およびフィンガーの形状の種類は実施
例にのみ限定されるものではない。
According to the present invention, a low-reflectance material is applied to the lower end surface of the finger to prevent the sample cell detection sensor from being determined to be present even when there is no sample cell due to the reflected light from the lower end surface while the finger is moving. It is characterized by eliminating reflected light by changing the direction of light reflection by inclining the reflection surface.The types of light, low-reflectance substance and finger shape of the sample cell detection sensor are The invention is not limited only to the embodiments.

【0015】[0015]

【発明の効果】本発明のオートサンプラは、試料セル検
知センサをフィンガーに十分近づけて試料セルの有無の
判定が行えるので、試料セルの有無による判別は当然の
こと、セルを少々斜めに掴んでいてもセルの有無が確実
に判別できる。
According to the autosampler of the present invention, the presence / absence of the sample cell can be determined by bringing the sample cell detection sensor sufficiently close to the finger. The presence or absence of a cell can be reliably determined.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施例のオートサンプラの概略構成図
である。
FIG. 1 is a schematic configuration diagram of an autosampler according to an embodiment of the present invention.

【図2】実施例に係わる制御装置の構成図である。FIG. 2 is a configuration diagram of a control device according to an embodiment.

【図3】実施例のフィンガーの側面図(a)と正面図
(b)である。
FIG. 3 is a side view (a) and a front view (b) of the finger of the embodiment.

【図4】実施例のフィンガーによる試料セルあり(a)
となし(b)の場合の動作説明図である。
FIG. 4 shows a sample cell using a finger according to the embodiment (a).
It is operation | movement explanatory drawing in the case of (b).

【図5】実施例の他のフィンガーの動作説明図である。FIG. 5 is an operation explanatory view of another finger of the embodiment.

【符号の説明】[Explanation of symbols]

1…試料セル 2…試料トレイ 3…試料搬送機構 3a、3d…フィンガー 3b…搬送アーム 3c…低反射率物質 4…ディテクタ 5…試料セル検知センサ 5a…発光素子 5b…受光素子 6…制御装置 66…入力装置 67…出力装置 7…筐体 8…加熱炉 9…加熱炉移動機構 DESCRIPTION OF SYMBOLS 1 ... Sample cell 2 ... Sample tray 3 ... Sample transfer mechanism 3a, 3d ... Finger 3b ... Transfer arm 3c ... Low reflectivity substance 4 ... Detector 5 ... Sample cell detection sensor 5a ... Light emitting element 5b ... Light receiving element 6 ... Control device 66 ... input device 67 ... output device 7 ... housing 8 ... heating furnace 9 ... heating furnace moving mechanism

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】被分析試料を収容する試料セルを保持する
保持部と、該保持部を駆動するアームとを備え、複数の
試料セルを順次自動的にディテクタ上に移送すると共
に、移送中の保持部における試料セルの有無を検知する
光センサを備えたオートサンプラにおいて、試料セル保
持部の下端面に光センサからの入射光が反射しないよう
な低反射物質を塗布、あるいは試料セル保持部の下端面
を鋭角度に傾斜させて反射光が光センサに入射しないよ
うにしたことを特徴とするオートサンプラ。
An arm for driving the holding unit; a plurality of sample cells automatically and sequentially transferred to a detector; In an autosampler equipped with an optical sensor that detects the presence or absence of a sample cell in the holding unit, apply a low-reflection material that does not reflect incident light from the optical sensor to the lower end surface of the sample cell holding unit, or An autosampler wherein a lower end surface is inclined at an acute angle so that reflected light does not enter the optical sensor.
JP2000393967A 2000-12-26 2000-12-26 Autosampler Expired - Lifetime JP4547801B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000393967A JP4547801B2 (en) 2000-12-26 2000-12-26 Autosampler

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000393967A JP4547801B2 (en) 2000-12-26 2000-12-26 Autosampler

Publications (2)

Publication Number Publication Date
JP2002196008A true JP2002196008A (en) 2002-07-10
JP4547801B2 JP4547801B2 (en) 2010-09-22

Family

ID=18859672

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000393967A Expired - Lifetime JP4547801B2 (en) 2000-12-26 2000-12-26 Autosampler

Country Status (1)

Country Link
JP (1) JP4547801B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8018048B2 (en) 2007-03-29 2011-09-13 Sharp Kabushiki Kaisha Semiconductor device
JP2012207945A (en) * 2011-03-29 2012-10-25 Shimadzu Corp Drive unit

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH063364A (en) * 1992-06-17 1994-01-11 Olympus Optical Co Ltd Liquid dispensing device for analysis
JPH07505710A (en) * 1991-12-20 1995-06-22 メルク エンド カンパニー インコーポレーテッド Automated analytical equipment for detecting cell surface proteins and/or cytoplasmic receptor functions and analytical methods using the same
JPH07248281A (en) * 1994-03-11 1995-09-26 Fuji Photo Film Co Ltd Judgment of presence of analyzing film piece
JPH0894523A (en) * 1994-09-21 1996-04-12 Japan Energy Corp Total reflection type refraction factor sensor
JPH0954096A (en) * 1995-08-16 1997-02-25 A & T:Kk Conveyor for use in specimen conveying system
JPH0989902A (en) * 1995-09-21 1997-04-04 Kdk Corp Automatic hemanalysis device
JPH09325095A (en) * 1996-06-05 1997-12-16 Shimadzu Corp Auto-sampler
JPH1062343A (en) * 1996-05-17 1998-03-06 Pfizer Inc Spectrometric analyzer
JPH10282114A (en) * 1997-04-10 1998-10-23 Hitachi Ltd Specimen rack transporting method and automatic analyzer
JP2000321284A (en) * 1999-05-10 2000-11-24 Shimadzu Corp Blood coagulation analysis apparatus

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07505710A (en) * 1991-12-20 1995-06-22 メルク エンド カンパニー インコーポレーテッド Automated analytical equipment for detecting cell surface proteins and/or cytoplasmic receptor functions and analytical methods using the same
JPH063364A (en) * 1992-06-17 1994-01-11 Olympus Optical Co Ltd Liquid dispensing device for analysis
JPH07248281A (en) * 1994-03-11 1995-09-26 Fuji Photo Film Co Ltd Judgment of presence of analyzing film piece
JPH0894523A (en) * 1994-09-21 1996-04-12 Japan Energy Corp Total reflection type refraction factor sensor
JPH0954096A (en) * 1995-08-16 1997-02-25 A & T:Kk Conveyor for use in specimen conveying system
JPH0989902A (en) * 1995-09-21 1997-04-04 Kdk Corp Automatic hemanalysis device
JPH1062343A (en) * 1996-05-17 1998-03-06 Pfizer Inc Spectrometric analyzer
JPH09325095A (en) * 1996-06-05 1997-12-16 Shimadzu Corp Auto-sampler
JPH10282114A (en) * 1997-04-10 1998-10-23 Hitachi Ltd Specimen rack transporting method and automatic analyzer
JP2000321284A (en) * 1999-05-10 2000-11-24 Shimadzu Corp Blood coagulation analysis apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8018048B2 (en) 2007-03-29 2011-09-13 Sharp Kabushiki Kaisha Semiconductor device
JP2012207945A (en) * 2011-03-29 2012-10-25 Shimadzu Corp Drive unit

Also Published As

Publication number Publication date
JP4547801B2 (en) 2010-09-22

Similar Documents

Publication Publication Date Title
EP1562027B1 (en) Liquid dispensing apparatus and automatic analyser using the same
US4451197A (en) Object detection apparatus and method
JP2007322289A (en) Conveyer
CA1069340A (en) Loading and unloading mechanism for continuously rotating container
JP4324583B2 (en) Sample processing system
US20160216285A1 (en) Test strip pickup mechanism, test strip moving apparatus, liquid sample analyzer, and test strip pickup method
JP2002196008A (en) Autosampler
JP3733087B2 (en) Sample analyzer
JP3733123B2 (en) Container detection device
US5378630A (en) Test strip automatic supply device and analytical instrument using the same
JP3780229B2 (en) Sample analyzer
JP3688657B2 (en) Sample analyzer
US6260001B1 (en) Process and apparatus for measuring the volume of an object by means of a laser scanner
JPH0644656A (en) Cassette loading device with integral type transmission lever
JP4156822B2 (en) Handling device
JP2000232145A (en) Operation inspection system and jig used therefor
US7045803B2 (en) Missing die detection
JPH04340245A (en) Wafer transfer apparatus
JP2008224427A (en) Flaw inspection device of filling container
JP4134060B2 (en) Connecting rod front / back discriminator
JPH10308438A (en) Method of detecting carrier and wafer in carrier
JPH06298489A (en) Work position detecting device for use with crane
JP3733086B2 (en) Sample analyzer and method for estimating serum amount
JPH0691152B2 (en) Semiconductor wafer counter
JPH08201934A (en) Original operating device

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20070320

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20090709

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090929

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20100615

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20100628

R151 Written notification of patent or utility model registration

Ref document number: 4547801

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R151

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130716

Year of fee payment: 3

EXPY Cancellation because of completion of term