JP2002196008A - Autosampler - Google Patents
AutosamplerInfo
- Publication number
- JP2002196008A JP2002196008A JP2000393967A JP2000393967A JP2002196008A JP 2002196008 A JP2002196008 A JP 2002196008A JP 2000393967 A JP2000393967 A JP 2000393967A JP 2000393967 A JP2000393967 A JP 2000393967A JP 2002196008 A JP2002196008 A JP 2002196008A
- Authority
- JP
- Japan
- Prior art keywords
- sample cell
- finger
- sample
- autosampler
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Sampling And Sample Adjustment (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、主として熱分析装
置において用いられる自動試料搬送用オートサンプラに
関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an automatic sample transfer autosampler mainly used in a thermal analyzer.
【0002】[0002]
【従来の技術】従来のオートサンプラでは、搬送用アー
ムに取り付けられた板状や棒状形状のフィンガーが、試
料トレイに並んだ試料セルを把持してディテクタ位置ま
で搬送している。その際、フィンガーの移送路近傍に光
センサを配置して、移送中の試料セルの下面に光を当て
て、その反射光を検知することにより試料セルの有無を
確認している。2. Description of the Related Art In a conventional autosampler, a plate-shaped or rod-shaped finger attached to a transfer arm grips a sample cell arranged in a sample tray and transfers it to a detector position. At this time, an optical sensor is arranged near the transfer path of the finger, light is applied to the lower surface of the sample cell being transferred, and the presence or absence of the sample cell is confirmed by detecting the reflected light.
【0003】[0003]
【発明が解決しようとする課題】従来のオートサンプラ
では上記のようにフィンガーにより把持された試料セル
の存在を光センサによって検知しているが、試料セルの
存在を確実に検知するには光センサを試料セルに近づけ
る必要がある。しかしながら、光センサをフィンガーに
あまり近づけ過ぎるとフィンガー下端面からも光センサ
方向に光が反射し、フィンガーが試料セルを把持してい
ないのに試料セルがあるかのように光センサが反応して
しまうという問題がある。本発明は、このような事情に
鑑みてなされたものであって、移送過程の試料セルの有
無を確実に検知できるオートサンプラを提供することを
目的とする。In the conventional autosampler, the presence of the sample cell gripped by the finger is detected by the optical sensor as described above. However, in order to reliably detect the presence of the sample cell, the optical sensor is used. Must be close to the sample cell. However, if the optical sensor is too close to the finger, light will also be reflected from the lower end surface of the finger in the direction of the optical sensor, and the optical sensor will react as if there is a sample cell even though the finger is not holding the sample cell. There is a problem that it will. The present invention has been made in view of such circumstances, and has as its object to provide an autosampler that can reliably detect the presence or absence of a sample cell in a transfer process.
【0004】[0004]
【課題を解決するための手段】上記の目的を達成するた
め、本発明のオートサンプラは、被分析試料を収容する
試料セルを保持する保持部と、該保持部を駆動するアー
ムとを備え、複数の試料セルを順次自動的にディテクタ
上に移送すると共に、移送中の保持部における試料セル
の有無を検知する光センサを備えたオートサンプラにお
いて、試料セル保持部の下端面に光センサからの入射光
が反射しないような低反射物質を塗布、あるいは試料セ
ル保持部の下端面を鋭角度に傾斜させて反射光が光セン
サに入射しないようにしたことを特徴とするものであ
る。本発明のオートサンプラは上記の構成を用いること
により、確実に移送中の試料セルの有無を確認すること
ができる。In order to achieve the above object, an autosampler according to the present invention comprises: a holding section for holding a sample cell containing a sample to be analyzed; and an arm for driving the holding section. In an autosampler equipped with an optical sensor that automatically transfers a plurality of sample cells onto a detector sequentially and detects the presence or absence of a sample cell in a holding unit during transfer, the lower end surface of the sample cell holding unit receives light from the optical sensor. The present invention is characterized in that a low-reflection material that does not reflect incident light is applied, or the lower end surface of the sample cell holding portion is inclined at an acute angle so that reflected light does not enter the optical sensor. By using the above configuration, the autosampler of the present invention can surely confirm the presence or absence of the sample cell being transferred.
【0005】[0005]
【発明の実施の形態】以下、本発明の実施例によるオー
トサンプラを図面を参照しながら説明する。図1は本発
明のオートサンプラを熱分析装置に用いた場合の構成を
示す斜視図である。本オートサンプラは、試料セル1を
搭載するための複数の凹み又は通し孔2aと回転軸2b
を有する試料トレイ2と、試料セル1を把持するフィン
ガー3aとその試料セル1をディテクタ4の位置まで移
送する搬送アーム3bを連結してなる試料搬送機構3
と、移送中のフィンガー3aに試料セル1が把持されて
いるかどうかを検知する試料セル検知センサ5と、これ
らの構成要素を搭載すると共に、該構成要素の動作を制
御するための制御装置6を収容する筐体7から構成され
ている。DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, an autosampler according to an embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a perspective view showing a configuration when the autosampler of the present invention is used in a thermal analyzer. This autosampler has a plurality of recesses or through holes 2a for mounting the sample cell 1 and a rotating shaft 2b.
Sample transport mechanism 3 comprising a sample tray 2 having the following structure, a finger 3a for gripping the sample cell 1, and a transport arm 3b for transporting the sample cell 1 to the position of the detector 4.
A sample cell detection sensor 5 for detecting whether or not the sample cell 1 is gripped by the finger 3a being transferred; and a control device 6 for mounting these components and controlling the operation of the components. It is composed of a housing 7 for housing.
【0006】前記試料搬送機構3には、図2に示すよう
な搬送アーム3bを水平方向に回転移動させるためのモ
ータM1、搬送アーム3bを介してフィンガー3aを上
下に移動するためのモータM2、同じくフィンガー3a
を左右に開閉するためのモータM3、また、試料トレイ
2にはこれを回転又は停止させるためのモータM4がそ
れぞれ組み込まれている。そして、前記試料セル検知セ
ンサ5は移送中の試料セル1に向けて光線を発射する発
光素子5aとその反射光を検知する受光素子5bから構
成されている。A motor M1 for rotating the transfer arm 3b in the horizontal direction as shown in FIG. 2, a motor M2 for moving the finger 3a up and down via the transfer arm 3b, Finger 3a
A motor M3 for opening and closing left and right, and a motor M4 for rotating or stopping the sample tray 2 are incorporated in the sample tray 2, respectively. The sample cell detection sensor 5 includes a light emitting element 5a that emits a light beam toward the sample cell 1 being transferred, and a light receiving element 5b that detects the reflected light.
【0007】前記制御装置6は、図2に示すように、本
オートサンプラによる試料セル1の搬送を実行する制御
プログラムを記憶しておくROM62、データの出し入
れを行うRAM63と、その制御プログラムにおける演
算制御を実行するCPU61と、このCPU61からの
制御信号に基づき前記試料トレイ2や試料搬送機構3を
制御するための駆動信号を出力したり、試料セル検知セ
ンサ5からの検知信号を取り込むためのI/Oインター
フェース64と、自動分析開始等の指令信号を入力する
入力装置66や試料セル検知センサ5からの情報を出力
する出力装置67用のI/Oインターフェース65から
構成されている。As shown in FIG. 2, the control device 6 includes a ROM 62 for storing a control program for executing the transfer of the sample cell 1 by the present autosampler, a RAM 63 for transferring data in and out, and an arithmetic operation in the control program. A CPU 61 for executing control, and an I / O for outputting a drive signal for controlling the sample tray 2 and the sample transport mechanism 3 based on a control signal from the CPU 61 and for taking in a detection signal from the sample cell detection sensor 5. It comprises an I / O interface 64, an input device 66 for inputting a command signal for starting automatic analysis and the like, and an I / O interface 65 for an output device 67 for outputting information from the sample cell detection sensor 5.
【0008】また、図3は本発明に係わるフィンガー3
aの実施例による側面図(a)とその正面図(b)を示
したものである。図に示すように、このフィンガー3a
の下端面には試料セル検知センサ5の発光素子5aから
の入射光を反射させない低反射率物質3cが塗布されて
いる。前記発光素子5aと受光素子5bには発光ダイオ
ードとフォトダイオードを個々に配置して構成すること
もできるが、これらを一体にした汎用の光電センサを用
いることもできる。例えば、発光素子5aとして赤外線
を発光するGaAsのような半導体発光素子を用いる場
合は、低反射率物質3cとして黒色ツヤけし塗料、受光
素子5aとして量子型のフォトダイオードや熱型の焦電
性赤外線センサを用いることができる。FIG. 3 shows a finger 3 according to the present invention.
FIG. 2A shows a side view (a) and a front view (b) thereof according to the embodiment of FIG. As shown in FIG.
A low-reflectance substance 3c that does not reflect incident light from the light emitting element 5a of the sample cell detection sensor 5 is applied to the lower end surface of the sample cell detection sensor 5. The light emitting element 5a and the light receiving element 5b can be configured by individually arranging a light emitting diode and a photodiode, but a general-purpose photoelectric sensor in which these are integrated can also be used. For example, when a semiconductor light emitting element such as GaAs that emits infrared light is used as the light emitting element 5a, black luster paint is used as the low reflectance material 3c, and a quantum photodiode or a thermal pyroelectric infrared light is used as the light receiving element 5a. Sensors can be used.
【0009】次に、上記構成によるオートサンプラを使
用した熱分析装置の自動分析動作を図1、図2を参照し
ながら説明する。自動分析開始指令を入力装置66に入
力すると、フィンガー3aは搬送アーム3bと共にモー
タM1により試料トレイ2上の規定位置に移動し、モー
タM3により左右方向に開いた後、モータM2により試
料セル1の位置まで下降する。そして、フィンガー3a
はモータM3により試料セル1を把持した後、モータM
2により一定の高さまで上昇し、続いてモータM1によ
り試料セル1をディテクタ4まで移送する。Next, the automatic analysis operation of the thermal analyzer using the above-configured autosampler will be described with reference to FIGS. When an automatic analysis start command is input to the input device 66, the finger 3a is moved together with the transfer arm 3b to a specified position on the sample tray 2 by the motor M1 and is opened left and right by the motor M3. Descend to the position. And finger 3a
Indicates that after holding the sample cell 1 by the motor M3,
2, the sample cell 1 is moved to a certain height by the motor M1 and then transferred to the detector 4 by the motor M1.
【0010】前記フィンガー3aにより把持された試料
セル1を試料トレイ2から、ディテクタ4方向(図4
(a)における矢印方向)に移送中、試料セル検知セン
サ5により、試料セル1の有無が検知される。図4は試
料セル1がある場合(a)と無い場合(b)の試料セル
検知センサ5の動作を説明する図である。すなわち、フ
ィンガー3aに試料セル1が把持されている場合は、図
4(a)に示すように発光素子5aからの赤外線は試料
セル1の下端面で反射されて受光素子5bに入射し、試
料セル1の把持が確認される。The sample cell 1 held by the finger 3a is moved from the sample tray 2 to the detector 4 (FIG. 4).
During the transfer in the direction of the arrow (a), the sample cell detection sensor 5 detects the presence or absence of the sample cell 1. FIG. 4 is a diagram for explaining the operation of the sample cell detection sensor 5 when there is the sample cell 1 (a) and when there is no sample cell 1 (b). That is, when the sample cell 1 is gripped by the finger 3a, the infrared light from the light emitting element 5a is reflected by the lower end surface of the sample cell 1 and enters the light receiving element 5b as shown in FIG. The holding of the cell 1 is confirmed.
【0011】一方、フィンガー3aに試料セル1を把持
していない場合は、図4(b)に示すように発光素子5
aからの赤外線はフィンガー3aの下端面に当たっても
黒色ツヤけし塗装面で吸収されるので、受光素子5bへ
の赤外線の入射光がなくなり、フィンガー3aで試料セ
ル1が把持されていないことが確実に確認される。On the other hand, when the sample cell 1 is not gripped by the finger 3a, as shown in FIG.
Even if the infrared ray from a strikes the lower end surface of the finger 3a, it is absorbed by the black matte painted surface, so that the incident light of the infrared ray on the light receiving element 5b disappears, and it is ensured that the sample cell 1 is not gripped by the finger 3a. It is confirmed.
【0012】前記フィンガー3aはディテクタ4上で停
止し、モータM2により試料セル1をディテクタ4に設
置した後、モータM1〜M3を駆動して試料トレイ2に
戻る。そして、加熱炉8がディテクタ4上に降下し、デ
ィテクタ上4の試料セル1を加熱炉8内に収容して加熱
を行い、熱分析のための熱重量測定を行う。試料が所定
の設定温度に達した時点で熱重量測定を終了すると共
に、加熱炉8の加熱運転を停止する。炉内温度があらか
じめ設定された温度にまで低下した後、加熱炉8が上昇
しフィンガー3aの動作によって測定を終了した試料セ
ル1をディテクタ4から元の位置に移送して1つのサイ
クルを終了し、次のサイクルへ移行する。次のサイクル
において、先ず試料トレイ2を1ピッチ回動させ、フィ
ンガー3aの下の位置に次の試料セル1を移動させる。
そして、上記サイクルと同様にフィンガー3aで試料セ
ル1を把持して、ディテクタ4上に移送し、加熱して熱
重量測定を行う。The finger 3a stops on the detector 4, and after the sample cell 1 is mounted on the detector 4 by the motor M2, the motors M1 to M3 are driven to return to the sample tray 2. Then, the heating furnace 8 is lowered onto the detector 4, the sample cell 1 on the detector 4 is accommodated in the heating furnace 8 and heated, and thermogravimetry for thermal analysis is performed. When the sample reaches a predetermined set temperature, the thermogravimetry is ended, and the heating operation of the heating furnace 8 is stopped. After the temperature in the furnace has decreased to a preset temperature, the heating furnace 8 rises, and the sample cell 1 whose measurement has been completed by the operation of the finger 3a is transferred from the detector 4 to the original position to complete one cycle. Then, shift to the next cycle. In the next cycle, first, the sample tray 2 is rotated by one pitch, and the next sample cell 1 is moved to a position below the finger 3a.
Then, similarly to the above cycle, the sample cell 1 is gripped by the finger 3a, transferred onto the detector 4, and heated to perform thermogravimetry.
【0013】図5は、フィンガー3aの他の実施例によ
る断面図と試料セル検知センサ5とを示したものであ
る。このフィンガー3dの下端部分は、図に示されるよ
うに、その側面に傾斜をつけ下端面に平坦部を無くすよ
うに仕上げられている。これにより、発光素子5aから
フィンガー3dの下端部分に入射した光線は、受光素子
5bの方向から外れた矢印方向Aに反射するので、試料
セル1が把持されていないことが確実に検知できる。FIG. 5 shows a cross-sectional view and a sample cell detection sensor 5 according to another embodiment of the finger 3a. As shown in the drawing, the lower end of the finger 3d is finished so that its side surface is inclined and the lower end surface has no flat portion. Thereby, the light beam incident on the lower end portion of the finger 3d from the light emitting element 5a is reflected in the arrow direction A deviating from the direction of the light receiving element 5b, so that it is possible to reliably detect that the sample cell 1 is not gripped.
【0014】本発明は、フィンガーが移動中、その下端
面からの反射光によって試料セルがない場合でも試料セ
ル検知センサが有りと判定することを防止するため、下
端面に低反射率物質を塗布して反射光を無くすこと、あ
るいは反射面に傾斜をつけて光の反射方向を変えるよう
にしたことを特徴するもので、試料セル検出センサの光
線、低反射率物質およびフィンガーの形状の種類は実施
例にのみ限定されるものではない。According to the present invention, a low-reflectance material is applied to the lower end surface of the finger to prevent the sample cell detection sensor from being determined to be present even when there is no sample cell due to the reflected light from the lower end surface while the finger is moving. It is characterized by eliminating reflected light by changing the direction of light reflection by inclining the reflection surface.The types of light, low-reflectance substance and finger shape of the sample cell detection sensor are The invention is not limited only to the embodiments.
【0015】[0015]
【発明の効果】本発明のオートサンプラは、試料セル検
知センサをフィンガーに十分近づけて試料セルの有無の
判定が行えるので、試料セルの有無による判別は当然の
こと、セルを少々斜めに掴んでいてもセルの有無が確実
に判別できる。According to the autosampler of the present invention, the presence / absence of the sample cell can be determined by bringing the sample cell detection sensor sufficiently close to the finger. The presence or absence of a cell can be reliably determined.
【図1】本発明の実施例のオートサンプラの概略構成図
である。FIG. 1 is a schematic configuration diagram of an autosampler according to an embodiment of the present invention.
【図2】実施例に係わる制御装置の構成図である。FIG. 2 is a configuration diagram of a control device according to an embodiment.
【図3】実施例のフィンガーの側面図(a)と正面図
(b)である。FIG. 3 is a side view (a) and a front view (b) of the finger of the embodiment.
【図4】実施例のフィンガーによる試料セルあり(a)
となし(b)の場合の動作説明図である。FIG. 4 shows a sample cell using a finger according to the embodiment (a).
It is operation | movement explanatory drawing in the case of (b).
【図5】実施例の他のフィンガーの動作説明図である。FIG. 5 is an operation explanatory view of another finger of the embodiment.
1…試料セル 2…試料トレイ 3…試料搬送機構 3a、3d…フィンガー 3b…搬送アーム 3c…低反射率物質 4…ディテクタ 5…試料セル検知センサ 5a…発光素子 5b…受光素子 6…制御装置 66…入力装置 67…出力装置 7…筐体 8…加熱炉 9…加熱炉移動機構 DESCRIPTION OF SYMBOLS 1 ... Sample cell 2 ... Sample tray 3 ... Sample transfer mechanism 3a, 3d ... Finger 3b ... Transfer arm 3c ... Low reflectivity substance 4 ... Detector 5 ... Sample cell detection sensor 5a ... Light emitting element 5b ... Light receiving element 6 ... Control device 66 ... input device 67 ... output device 7 ... housing 8 ... heating furnace 9 ... heating furnace moving mechanism
Claims (1)
保持部と、該保持部を駆動するアームとを備え、複数の
試料セルを順次自動的にディテクタ上に移送すると共
に、移送中の保持部における試料セルの有無を検知する
光センサを備えたオートサンプラにおいて、試料セル保
持部の下端面に光センサからの入射光が反射しないよう
な低反射物質を塗布、あるいは試料セル保持部の下端面
を鋭角度に傾斜させて反射光が光センサに入射しないよ
うにしたことを特徴とするオートサンプラ。An arm for driving the holding unit; a plurality of sample cells automatically and sequentially transferred to a detector; In an autosampler equipped with an optical sensor that detects the presence or absence of a sample cell in the holding unit, apply a low-reflection material that does not reflect incident light from the optical sensor to the lower end surface of the sample cell holding unit, or An autosampler wherein a lower end surface is inclined at an acute angle so that reflected light does not enter the optical sensor.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000393967A JP4547801B2 (en) | 2000-12-26 | 2000-12-26 | Autosampler |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000393967A JP4547801B2 (en) | 2000-12-26 | 2000-12-26 | Autosampler |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2002196008A true JP2002196008A (en) | 2002-07-10 |
JP4547801B2 JP4547801B2 (en) | 2010-09-22 |
Family
ID=18859672
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2000393967A Expired - Lifetime JP4547801B2 (en) | 2000-12-26 | 2000-12-26 | Autosampler |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4547801B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8018048B2 (en) | 2007-03-29 | 2011-09-13 | Sharp Kabushiki Kaisha | Semiconductor device |
JP2012207945A (en) * | 2011-03-29 | 2012-10-25 | Shimadzu Corp | Drive unit |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH063364A (en) * | 1992-06-17 | 1994-01-11 | Olympus Optical Co Ltd | Liquid dispensing device for analysis |
JPH07505710A (en) * | 1991-12-20 | 1995-06-22 | メルク エンド カンパニー インコーポレーテッド | Automated analytical equipment for detecting cell surface proteins and/or cytoplasmic receptor functions and analytical methods using the same |
JPH07248281A (en) * | 1994-03-11 | 1995-09-26 | Fuji Photo Film Co Ltd | Judgment of presence of analyzing film piece |
JPH0894523A (en) * | 1994-09-21 | 1996-04-12 | Japan Energy Corp | Total reflection type refraction factor sensor |
JPH0954096A (en) * | 1995-08-16 | 1997-02-25 | A & T:Kk | Conveyor for use in specimen conveying system |
JPH0989902A (en) * | 1995-09-21 | 1997-04-04 | Kdk Corp | Automatic hemanalysis device |
JPH09325095A (en) * | 1996-06-05 | 1997-12-16 | Shimadzu Corp | Auto-sampler |
JPH1062343A (en) * | 1996-05-17 | 1998-03-06 | Pfizer Inc | Spectrometric analyzer |
JPH10282114A (en) * | 1997-04-10 | 1998-10-23 | Hitachi Ltd | Specimen rack transporting method and automatic analyzer |
JP2000321284A (en) * | 1999-05-10 | 2000-11-24 | Shimadzu Corp | Blood coagulation analysis apparatus |
-
2000
- 2000-12-26 JP JP2000393967A patent/JP4547801B2/en not_active Expired - Lifetime
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07505710A (en) * | 1991-12-20 | 1995-06-22 | メルク エンド カンパニー インコーポレーテッド | Automated analytical equipment for detecting cell surface proteins and/or cytoplasmic receptor functions and analytical methods using the same |
JPH063364A (en) * | 1992-06-17 | 1994-01-11 | Olympus Optical Co Ltd | Liquid dispensing device for analysis |
JPH07248281A (en) * | 1994-03-11 | 1995-09-26 | Fuji Photo Film Co Ltd | Judgment of presence of analyzing film piece |
JPH0894523A (en) * | 1994-09-21 | 1996-04-12 | Japan Energy Corp | Total reflection type refraction factor sensor |
JPH0954096A (en) * | 1995-08-16 | 1997-02-25 | A & T:Kk | Conveyor for use in specimen conveying system |
JPH0989902A (en) * | 1995-09-21 | 1997-04-04 | Kdk Corp | Automatic hemanalysis device |
JPH1062343A (en) * | 1996-05-17 | 1998-03-06 | Pfizer Inc | Spectrometric analyzer |
JPH09325095A (en) * | 1996-06-05 | 1997-12-16 | Shimadzu Corp | Auto-sampler |
JPH10282114A (en) * | 1997-04-10 | 1998-10-23 | Hitachi Ltd | Specimen rack transporting method and automatic analyzer |
JP2000321284A (en) * | 1999-05-10 | 2000-11-24 | Shimadzu Corp | Blood coagulation analysis apparatus |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8018048B2 (en) | 2007-03-29 | 2011-09-13 | Sharp Kabushiki Kaisha | Semiconductor device |
JP2012207945A (en) * | 2011-03-29 | 2012-10-25 | Shimadzu Corp | Drive unit |
Also Published As
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