JP2002184730A - Semiconductor device processing hard foamed resin grooved pad and pad groove cutting tool - Google Patents

Semiconductor device processing hard foamed resin grooved pad and pad groove cutting tool

Info

Publication number
JP2002184730A
JP2002184730A JP2001337328A JP2001337328A JP2002184730A JP 2002184730 A JP2002184730 A JP 2002184730A JP 2001337328 A JP2001337328 A JP 2001337328A JP 2001337328 A JP2001337328 A JP 2001337328A JP 2002184730 A JP2002184730 A JP 2002184730A
Authority
JP
Japan
Prior art keywords
groove
pad
turning
blade
tool
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001337328A
Other languages
Japanese (ja)
Other versions
JP3497492B2 (en
Inventor
Tatsutoshi Suzuki
辰俊 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toho Engineering Co Ltd
Original Assignee
Toho Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toho Engineering Co Ltd filed Critical Toho Engineering Co Ltd
Priority to JP2001337328A priority Critical patent/JP3497492B2/en
Publication of JP2002184730A publication Critical patent/JP2002184730A/en
Application granted granted Critical
Publication of JP3497492B2 publication Critical patent/JP3497492B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Cutting Tools, Boring Holders, And Turrets (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a hard foamed resin grooved pad of high working efficiency and a pad groove cutting tool so as to solve a problem of preventing a hard foamed resin base pad used in a CMP method from deteriorating in working efficiency due to the fact that the opening corners of fine grooves provided on the surface of the above pad are apt to get dull and become hard to control a flow of slurry when the fine grooves provided to the surface of the pad are provided by forming with a die. SOLUTION: A cutting edge is so shaped as to have a tool angle of 15 deg. to 35 deg. and a back clearance angle of 65 deg. to 45 deg., and furthermore it has a side clearance angle of 1 deg. to 3 deg. because its side bears against the peripheral wall of the groove, the back clearance angle of the cutting edge is made wide so as to prevent the cutting edge from interfering with the wall of a small groove, by which various grooves, from small to large ones, of the same shape having a rectangular edge at the corner can be easily cut in a hard urethane foam pad.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は半導体ウエハ若しく
はデバイス表面のCMP法(Chemical Mechanical Plol
ishing)の加工に用いるポリッシングパッド及びパッド
の溝加工用工具に関するもので、詳しくは硬質発泡樹脂
パッドに同心状の細密なリング溝を旋削により能率良く
加工する際に使用する工具の形状及び小径域から大径域
まで均整な断面形状の溝が旋削された硬質発泡樹脂製パ
ッドに関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a CMP (Chemical Mechanical
The present invention relates to a polishing pad used for ishing) and a tool for processing a groove of a pad. More specifically, the shape and small diameter area of a tool used when a concentric fine ring groove is efficiently processed by turning on a hard foam resin pad. The present invention relates to a hard foamed resin pad in which grooves having a uniform cross-sectional shape are turned from to a large diameter region.

【0002】[0002]

【従来の技術】半導体製造工程において、例えばシリコ
ンウエハ表面の各種薄膜層を化学的に鏡面加工する場合
のCMP法に各種のポリッシングパッドが使用されてい
る。これらのパッドの中には結合の緩い砥粒と樹脂の複
合体構造をとっているものがある。加工の際にウエハ表
面とポリッシングパッドとの摩擦によりデイスクから遊
離した砥粒がウエハ表面に作用して鏡面とするものであ
る。この場合加工能率は離脱する砥粒の程度に依存して
いる。
2. Description of the Related Art In a semiconductor manufacturing process, for example, various polishing pads are used in a CMP method in which various thin film layers on a silicon wafer surface are chemically mirror-finished. Some of these pads have a composite structure of loosely bonded abrasive grains and resin. During processing, abrasive grains released from the disk due to friction between the wafer surface and the polishing pad act on the wafer surface to form a mirror surface. In this case, the processing efficiency depends on the degree of the abrasive grains to be detached.

【0003】またスラリの砥粒移動を制御しやすい状態
にするという観点からパッドを作るのに表面が多孔質の
硬質発泡樹脂で形成することが行われている。砥粒に代
表される加工用の微粒子はウエハの物性,目標の仕上が
り表面の形状精度や粗さによって適宜選択されるがウエ
ハと固定した微粒子との接触とするか、浮遊した微粒子
との接触とするかが選択されている。平坦化処理した表
面の鏡面仕上げの程度を向上させるために、CMP法で
は後者の手法が採用されフロートポリッシングの一種で
あり、微粒子と液体からなるスラリーをウエハとパッド
間に一定量を定常的に供給して作業するものである。
In order to easily control the movement of the abrasive grains of the slurry, a pad is made of a hard foam resin having a porous surface in order to produce a pad. The fine particles for processing typified by abrasive grains are appropriately selected depending on the physical properties of the wafer, the shape accuracy and the roughness of the target finished surface, and may be in contact with the wafer and fixed fine particles or in contact with floating fine particles. Is selected. In order to improve the degree of mirror finish of the flattened surface, the latter method is adopted in the CMP method, which is a type of float polishing, and a slurry consisting of fine particles and liquid is constantly supplied between a wafer and a pad in a constant amount. Supply and work.

【0004】またウエハによっては脆性破壊性が強く、
割れ及び欠けが発生しやすいという機械的な弱点を有す
るためウエハの薄化工程をラッピング又はポリッシング
のみで行わねばならない場合もあり、ポリッシング工程
は重要な工程となっている。ラップ研削盤の機能を有す
る鏡面研磨機においてテーブル上にウエハを固定し砥石
軸下端のフランジ端面にパッドを固定し砥粒微粒子を含
む液体を、テーブルと砥石軸が回転中に常時供給し鏡面
仕上げの作業能率を計っている。半導体デバイスの平坦
化処理の場合にはパッドを円テーブル上に載置して行わ
れている。
Some wafers have strong brittle fracture,
Since the wafer has a mechanical weakness that cracks and chips are likely to occur, the wafer thinning step may have to be performed only by lapping or polishing, and the polishing step is an important step. In a mirror polishing machine with the function of a lap grinder, a wafer is fixed on a table and a pad is fixed on the flange end surface at the lower end of the grinding wheel shaft, and a liquid containing abrasive particles is constantly supplied while the table and the grinding wheel shaft are rotating, and mirror finishing is performed. The work efficiency is measured. In the case of a semiconductor device flattening process, a pad is mounted on a circular table.

【0005】定常的に供給されるスラリがウエハの上面
に均一に供給され、かつウエハの表面の一定個所に滞留
することがないように、また新たに供給される液体に更
新されるようにする必要がある。従来使用されているパ
ッドはその表面にウエハとパッド間に流入する液体の流
動性や均一性を図るために小さな穴を多数設けたり、直
線状の溝を基本として直交又は斜交する溝群を設けたり
して作業能率の向上を計ってきた。溝の形状と共にパッ
ドの材質についても改良が加えられている。
The slurry supplied constantly is uniformly supplied to the upper surface of the wafer, and does not stay at a certain position on the surface of the wafer, and is renewed with a newly supplied liquid. There is a need. Conventionally used pads are provided with a number of small holes on the surface to ensure the fluidity and uniformity of the liquid flowing between the wafer and the pad, or a group of grooves that are orthogonal or oblique based on straight grooves. And to improve work efficiency. Improvements have been made to the material of the pad as well as the shape of the groove.

【0006】多層配線技術において各層の配線金属層の
平坦化処理にCMP法が多用されている。配線金属層は
軟質であるためフロートポリッシングが不可欠であり特
にスラリによる平坦化処理を効率的に行い、更に処理能
率を向上させるためにパッドに刻設される溝の形状と研
磨布の寸法・機械的性質が重要である。従来技術として
生産能率の点から金型で多数の溝を一挙に形成する方法
があるが形成するパッド外径が大きくなり溝数が増加し
更に溝形状が細密になるに従い溝の形状を均整にするこ
とが困難となっている。また成型に伴う一般的な欠点で
ある樹脂の流動性のばらつきが溝形状の不均整さをもた
らしている。
In the multilayer wiring technology, the CMP method is often used for flattening each wiring metal layer. Float polishing is indispensable because the wiring metal layer is soft. In particular, the shape of the groove formed in the pad and the size and machine of the polishing cloth are used to efficiently perform the flattening process with slurry and further improve the processing efficiency. Property is important. As a conventional technique, there is a method of forming a large number of grooves at once with a mold from the point of production efficiency.However, the outer diameter of the pad to be formed increases, the number of grooves increases, and the groove shape becomes more uniform as the groove shape becomes finer. It is difficult to do. Fluctuations in the fluidity of the resin, which is a common drawback associated with molding, cause irregularities in the groove shape.

【0007】特にウエハ若しくはデバイスの表面層が軟
質材でありこれを鏡面仕上げ若しくは平坦化するのは従
来のパッドの表面形状では所定の鏡面品質を達成するこ
とが困難となっている。またパッド上の溝の形状等によ
るパッド表面と被加工表面との間のハイドロプレーン現
象の発生を抑制するための試行が必要であり、そのため
にも溝形状の策定にも切削によるパッドの試作及び製造
が不可欠である。
In particular, the surface layer of a wafer or device is made of a soft material, and it is difficult to mirror-finish or flatten the surface layer with a conventional pad surface shape to achieve a predetermined mirror surface quality. In addition, it is necessary to carry out trials to suppress the occurrence of the hydroplane phenomenon between the pad surface and the surface to be processed due to the shape of the groove on the pad, etc. Manufacturing is essential.

【0008】[0008]

【発明が解決しようとする課題】本発明は従来技術のこ
のような問題に鑑みなされたものであり、その目的とす
るところは、半導体ウエハ若しくはデバイス表面の鏡面
仕上げを能率良く行うのにスラリの流動性と被削金属の
特性に配慮してポリッシングすべき面に過大な加工圧を
付加せず、かつスラリの円滑な流動を保証することがで
きる同心状の細密溝を有する半導体ウエハ加工用硬質発
泡樹脂溝付パッド及び旋削溝加工用工具を提供しようと
するものである。
SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems of the prior art, and has as its object to provide a slurry for efficiently mirror-finishing a semiconductor wafer or a device surface. Hardness for semiconductor wafer processing that has concentric fine grooves that can ensure smooth flow of slurry without applying excessive processing pressure to the surface to be polished in consideration of fluidity and characteristics of the metal to be machined An object of the present invention is to provide a foamed resin grooved pad and a tool for turning grooves.

【0009】[0009]

【課題を解決するための手段】本発明の請求項1の発明
は、半導体デバイス加工用のパッドであって、このパッ
ドの基材を硬質発泡樹脂材とし、このパッドに溝幅0.
1mm乃至0.3mm,溝深さが0.1mm乃至1.0
mmの溝を、溝ピッチが0.2mm乃至2.0mmで、
少なくとも直径20mmから200mmの間に多数条を
同心に形成してなり、コーナ部分に直角なエッジを有す
る溝をパッド中心の小径溝から最外径に近い溝までを同
一形状に旋削で形成したものである。
According to a first aspect of the present invention, there is provided a pad for processing a semiconductor device, wherein the base material of the pad is a hard foamed resin material, and the pad has a groove width of 0.1 mm.
1 mm to 0.3 mm, groove depth 0.1 mm to 1.0
mm groove, the groove pitch is 0.2 mm to 2.0 mm,
At least 20mm to 200mm in diameter with a large number of strips formed concentrically, and a groove having an edge perpendicular to the corner portion is formed by turning from the small diameter groove at the center of the pad to the groove closest to the outermost diameter in the same shape. It is.

【0010】この発明によれば、硬質発泡樹脂パッドの
表面溝を旋削することによりパッド上面に対し溝の壁が
直角に形成でき、かつ均整な溝を形成することができる
のでスラリが同心状に刻設された溝とパッドとデバイス
との隙間で適宜移動しスラリが常に更新され加工能率の
向上が計れる。パッドの溝を微細な溝幅に形成すること
によりパッド表面へのスラリの流動時の作用力が調整さ
れハイドロプレーン現象の抑制と平坦化に効果がある。
According to the present invention, by turning the surface groove of the hard foamed resin pad, the wall of the groove can be formed at right angles to the upper surface of the pad, and the groove can be formed uniformly, so that the slurry is concentric. It moves appropriately in the gap between the groove and the pad and the device, and the slurry is constantly updated, so that the processing efficiency can be improved. By forming the groove of the pad with a fine groove width, the acting force at the time of slurry flowing to the pad surface is adjusted, which is effective in suppressing the hydroplane phenomenon and flattening.

【0011】本発明の請求項2の発明は、切刃の形状を
刃物角15度乃至35度、前逃げ角65度乃至45度、
溝の外周側壁に当接する切刃の横逃げ角を1度乃至3度
の範囲に形成してなり、小径溝において溝壁との干渉を
避けるために前逃げ角を大にしてコーナ部分に直角なエ
ッジを有する溝をパッドの小径溝から最外径に近い溝ま
でを同一形状に旋削で硬質発泡ウレタンパッドに形成す
る溝加工を容易にしたものである。
According to a second aspect of the present invention, the shape of the cutting edge is set at a blade angle of 15 to 35 degrees, a front clearance angle of 65 to 45 degrees,
The lateral relief angle of the cutting blade abutting on the outer peripheral side wall of the groove is formed in the range of 1 to 3 degrees, and in order to avoid interference with the groove wall in the small diameter groove, the front relief angle is made large and a right angle to the corner portion. A groove having a sharp edge from a small-diameter groove of the pad to a groove close to the outermost diameter of the pad is easily formed into a hard urethane foam pad by turning into the same shape.

【0012】請求項2の発明によれば、半導体デバイス
加工用パッドに少なくとも直径が20mmから200m
mの間に同心円の細密幅の多数条の溝を旋削によって形
成するために、切刃の形状を刃物角15度乃至35度に
対応して、前逃げ角65度乃至45度、横逃げ角を1度
乃至3度に形成し、前逃げ角を65度乃至45度に特定
することにより小径溝において外径側の溝壁との干渉を
さけ、溝コーナのエッジを直角に保持できるようにした
ものであり、壁面のだれやむしれの発生を防いでいる。
According to the second aspect of the present invention, the semiconductor device processing pad has a diameter of at least 20 mm to 200 m.
In order to form a large number of grooves of concentric circle width by turning, the cutting edge shape is set to a front relief angle of 65 to 45 degrees, a side clearance angle corresponding to a tool angle of 15 to 35 degrees. Is formed at 1 ° to 3 ° and the front clearance angle is specified at 65 ° to 45 ° so as to avoid interference with the outer-diameter-side groove wall in the small-diameter groove so that the edge of the groove corner can be held at a right angle. It prevents the occurrence of drooling and scorching on the wall.

【0013】請求項3の発明は、単一切刃を板状工具の
同一側面上に整列突設して多刃ユニットにし、更にこの
多刃ユニットをユニットホルダに取り換え可能に固装し
て多刃ユニット工具とし、この多刃ユニット工具の一個
以上を溝ピッチが整列するように配列して取換可能に構
成して同心の多条の溝を同時に旋削により形成するもの
である。
According to a third aspect of the present invention, a single cutting blade is arranged and projected on the same side surface of a plate-like tool to form a multi-blade unit, and the multi-blade unit is fixed to a unit holder so as to be replaceable. One or more of the multi-blade unit tools are arranged so that the groove pitches are aligned and are replaceable, and concentric multiple grooves are simultaneously formed by turning.

【0014】請求項3の発明によれば、微細な溝幅の溝
を旋削でパッドに効率的に付与する多刃工具である。
According to the third aspect of the present invention, there is provided a multi-blade tool for efficiently providing a groove having a fine groove width to a pad by turning.

【0015】[0015]

【発明の実施の形態】本発明の実施の形態を本願発明に
係る旋削工具を用いて製造したCMP法加工用パッドを
図面にもとづき説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described with reference to the drawings, a CMP processing pad manufactured using a turning tool according to the present invention.

【0016】CMP法加工に用いられるパッドの基材
は、コスト・物性の安定性等から硬質発泡樹脂が多用さ
れている。とりわけ弾性変形特性・熱伝導率・耐久性・
生産性・経済性等を総合的に判断して現在硬質発泡ウレ
タンシートを基材とするパッドが使用されることが多
い。しかしながら硬質発泡ウレタンシートは、その機械
的性質から一般に切削加工には不向きとされており、パ
ッドとして使用する場合に必要なシート表面上の溝は、
溝を刻設した金型で成型時に同時に形成する方法が能率
的な生産法であるため模索されてきた。
As the base material of the pad used in the CMP process, hard foamed resin is frequently used from the viewpoint of cost and stability of physical properties. Especially elastic deformation characteristics, thermal conductivity, durability,
Pads based on rigid urethane foam sheets are often used at present, judging comprehensively from the viewpoints of productivity and economic efficiency. However, rigid urethane foam sheets are generally unsuitable for cutting because of their mechanical properties, and the grooves on the sheet surface required when used as pads are:
A method of forming the grooves at the same time as molding with a mold having a groove has been sought because it is an efficient production method.

【0017】パッドの外径と溝数が大になり、更に繊細
な溝幅のパッドが近時CMP法加工上要請されつつあ
る。金型による成型では、溝入口のコーナ部分がだれや
すくスラリの流動性を制御しにくい。そのため切削加工
によりコーナ部分に直角なエッジを有する溝を形成する
必要が生じてきた。本願発明は、硬質発泡樹脂材の旋削
に適合した切刃を特定し、溝の壁面にむしれ若しくは膨
れまたは壁面の傾き等が少ない溝を旋削により付与した
CMP法加工用パッドの提供を可能とするものである。
The outer diameter of the pad and the number of grooves have been increased, and pads having finer groove widths have recently been demanded in the CMP method. In molding with a mold, the corner portion at the groove entrance is easily dripped, and it is difficult to control the fluidity of the slurry. Therefore, it has been necessary to form a groove having an edge perpendicular to the corner portion by cutting. The invention of the present application makes it possible to specify a cutting edge suitable for turning of a hard foamed resin material, and to provide a pad for CMP processing in which a groove with little peeling or swelling or inclination of the wall is provided by turning on the wall surface of the groove. Is what you do.

【0018】図1は、単一切刃1でパッド基材2に溝3
を旋削した状態を示す。ここで溝壁面3aは均整に旋削
されることが要求されている。図2は、金型でパッドの
外形と溝とを同時に形成した場合に、壁面の傾き2aや
膨れ2bが生じることを示している。次にCMP法加工
に使用されるパッドには、可能な限り中心部分から外径
に最も近いところまで一様な溝を設ける必要がある。実
際の最小径は20mm前後であるが最大径は250mm
から500mmへと増加し近い将来1000mm位のパ
ッドが要請される可能性がある。直径の大きいリング溝
を旋削する場合は加工した溝と切刃との干渉量は小さい
が、溝径が小さいほど干渉量は大きい。
FIG. 1 shows a groove 3 formed in a pad substrate 2 with a single cutting blade 1.
Shows a state in which is turned. Here, it is required that the groove wall surface 3a be uniformly turned. FIG. 2 shows that when the outer shape and the groove of the pad are simultaneously formed by the mold, the inclination 2a and the swelling 2b of the wall surface occur. Next, it is necessary to provide a uniform groove as far as possible from the center portion to the position closest to the outer diameter of the pad used for the CMP process. Actual minimum diameter is around 20mm but maximum diameter is 250mm
There is a possibility that a pad of about 1000 mm will be required in the near future, increasing from 500 mm to 500 mm. When turning a ring groove having a large diameter, the amount of interference between the processed groove and the cutting edge is small, but the smaller the groove diameter, the greater the amount of interference.

【0019】しかし、現在若しくは近い将来においては
パッドの最大径は500mmから800mmの範囲が必
要とされ、この場合に最小径域から最大径域までの溝を
生産性良く同一工具で如何に旋削により均整な溝をパッ
ドに付与できるかの点にある。本願発明では、後述の本
願発明に係る多刃旋削用工具を用いてこの課題を解決し
CMP法加工用に使用できる溝付パッドを提供するもの
である。
However, at present or in the near future, the maximum diameter of the pad is required to be in the range of 500 mm to 800 mm. In this case, the grooves from the minimum diameter area to the maximum diameter area are formed by turning with the same tool with high productivity. The point is that a uniform groove can be provided to the pad. The present invention solves this problem by using a multi-edge turning tool according to the present invention described later and provides a grooved pad that can be used for CMP processing.

【0020】図3は溝付パッドの部分図であり溝3が中
心部分の一部を除き一様に多数の溝が形成されているこ
とを示している。図4は図3のA−A断面図で、形成さ
れた一様の溝を表している。溝はパッド表面に一様に加
工される他スラリの流動性を制御してスラリによるハイ
ドロプレーン現象を抑制するために、スラリの粘性を考
慮して溝ピッチを一定周期で変化させたり溝ピッチを不
規則にする場合もある。
FIG. 3 is a partial view of the grooved pad, and shows that the groove 3 is formed with a large number of grooves uniformly except for a part of the central portion. FIG. 4 is a sectional view taken along the line AA of FIG. 3 and shows a uniform groove formed. The grooves are uniformly processed on the pad surface.In addition, to control the fluidity of the slurry and to suppress the hydroplane phenomenon caused by the slurry, the groove pitch is changed at a fixed cycle or the groove pitch is adjusted in consideration of the viscosity of the slurry. It may be irregular.

【0021】図5,図6,図7にパッド基材を硬質発泡
ウレタンシートとしたCMP法加工用パッドを示す。図
5または図6に示す溝形状と溝ピッチを有する溝群を最
小径20mmから基材の最外径の近くまで一様に溝を旋
削で形成したパッドを示している。
FIG. 5, FIG. 6, and FIG. 7 show a pad for CMP processing using a hard urethane foam sheet as the pad base material. 7 shows a pad in which a groove group having the groove shape and the groove pitch shown in FIG. 5 or 6 is uniformly formed by turning from a minimum diameter of 20 mm to a position close to the outermost diameter of the base material.

【0022】パッド上に旋削される溝の形状は以下の通
りである。溝幅は0.1mm乃至1.0mmの範囲で特
定される。スラリの流動性を制御し、発泡体表面の凹凸
と溝幅の大きさにより砥粒の供給と加工屑若しくは反応
生成物の排出が左右されるからである。溝幅が0.1m
mより小さくなるとスラリの制御性と溝の旋削による被
削性が低下するので限界があり溝幅は1mm以上では旋
削性は良いがスラリの制御性が低下し平坦化処理面の鏡
面仕上げ程度が悪くなるので限界が認められる。
The shape of the groove to be turned on the pad is as follows. The groove width is specified in a range of 0.1 mm to 1.0 mm. This is because the fluidity of the slurry is controlled, and the supply of the abrasive grains and the discharge of the processing chips or the reaction products are influenced by the unevenness of the foam surface and the size of the groove width. Groove width is 0.1m
When the groove width is smaller than m, the controllability of the slurry and the machinability due to the turning of the groove are reduced, so there is a limit. As it gets worse, there are limits.

【0023】溝幅の選定の要因としてパッド材質の硬度
がある。硬度の低い材質にあっては溝幅×溝深さを0.
2mm×0.2mmに比較的硬度の高いパッド基材の場
合は0.4mm×0.8mmに選定できる溝ピッチは
0.2mm乃至2.0mmの範囲で特定される。溝ピッ
チの特定は半導体デバイスの銅・金等の軟質配線部材の
平坦化処理の鏡面仕上げの程度と処理能率によって選択
される。通常溝ピッチは1mm乃至2mmの範囲で特定
されることが多い。溝ピッチを必要以上に小さくすると
スラリの粘度との関係でハイドロプレーン現象を抑制し
にくくなるので慎重に特定する必要がある。具体値とし
て溝幅×溝深さ×溝ピッチが0.3mm×0.4mm×
2mmがある。パッドの旋削溝の径が小さくなるほど旋
削切刃の刃先と溝外径との干渉問題及び切削速度が低下
するので溝の被削性が悪くなる。特に径が20mmから
200mmの範囲の溝旋削には切刃形状の特定が必要と
なる。
A factor in selecting the groove width is the hardness of the pad material. For materials with low hardness, the groove width x groove depth is set to 0.
In the case of a pad base material having a relatively high hardness of 2 mm × 0.2 mm, a groove pitch that can be selected to be 0.4 mm × 0.8 mm is specified in a range of 0.2 mm to 2.0 mm. The specification of the groove pitch is selected according to the degree of mirror finish and the processing efficiency of the flattening process of a soft wiring member such as copper or gold of a semiconductor device. Usually, the groove pitch is often specified in the range of 1 mm to 2 mm. If the groove pitch is made smaller than necessary, it is difficult to suppress the hydroplane phenomenon in relation to the viscosity of the slurry, so it is necessary to specify it carefully. As specific values, groove width x groove depth x groove pitch is 0.3 mm x 0.4 mm x
There is 2 mm. As the diameter of the turning groove of the pad becomes smaller, the problem of interference between the cutting edge of the turning cutting edge and the outer diameter of the groove and the cutting speed decrease, so that the machinability of the groove deteriorates. In particular, for groove turning with a diameter in the range of 20 mm to 200 mm, it is necessary to specify the cutting edge shape.

【0024】実施例1において記載した硬質発泡ウレタ
ンを基材とするCMP法に用いるパッド上の旋削溝加工
には刃物角15度,20度,25度を特定し対応する前
逃げ角は45度,横逃げ角は3度と特定している。刃物
角の選択は被削性の物性や被削材等による切粉の排除性
等を考慮して選択される。切刃の刃幅は旋削後の溝形状
が所定寸法になるように決定される。刃幅と溝ピッチの
具体例として刃幅×溝ピッチを0.25mm×1.1m
m若しくは0.3mm×2.0mmと特定して旋削して
パッド表面を形成している。
For turning grooves on the pad used in the CMP method using hard foamed urethane as a base material described in Example 1, the blade angles of 15, 20 and 25 degrees are specified and the corresponding clearance angle is 45 degrees. , The lateral clearance angle is specified as 3 degrees. The selection of the blade angle is made in consideration of the physical properties of the machinability and the exclusion of cutting chips due to the work material and the like. The blade width of the cutting blade is determined so that the groove shape after turning has a predetermined dimension. As a specific example of the blade width and the groove pitch, the blade width × the groove pitch is 0.25 mm × 1.1 m
The pad surface is formed by turning with a specific size of m or 0.3 mm × 2.0 mm.

【0025】本発明で特定した旋削溝工具でパッドを加
工する場合の工具の刃先形状が溝の加工品質に及ぼす作
用について次に説明する。図8に刃先部分の用語説明を
示している。樹脂の中でもとりわけ気孔を含む発泡樹脂
材は刃物による切削加工の対象とはされないことが多
い。そのためCMP法加工用パッドの基材である硬質発
泡樹脂である硬質発泡ウレタン製のパッドの成型品が生
産性の高い方法として発想された。しかし、最近のCM
P法加工上の要請から細密な溝幅が必要となり、かつパ
ッド形状の大型化に対応して従来のパッドの製造手法で
は限界があり、これを打開するためあえて生産性が低い
と考えられる切削加工による方法を選択せざるを得ない
状況下にあり検討され始めている。
The effect of the cutting edge shape of the tool on the machining quality of the groove when machining the pad with the turning groove tool specified in the present invention will be described below. FIG. 8 shows an explanation of the terms of the cutting edge portion. In particular, among the resins, foamed resin materials containing pores are often not subjected to cutting with a cutting tool. Therefore, a molded product of a hard urethane foam pad, which is a hard foam resin that is a base material of the pad for the CMP process, has been conceived as a method with high productivity. However, recent CM
Due to the demands on the P method processing, a fine groove width is required, and the conventional pad manufacturing method has limitations in response to the increase in pad shape, and cutting is considered to be dauntingly low in productivity to overcome this. It is under consideration that a method by processing must be selected, and studies have begun.

【0026】成型による製造法に比し生産性の点で殆ど
匹敵できる程度の生産性のある手段として考えられるの
は旋削による多刃工具による加工が最も可能性が大き
い。そこで硬質発泡ウレタンシートに均整な溝を加工す
るための単一切刃の形状特定が第1の課題となる。第2
の課題として、CMP法加工用パッドはパッド中心の小
径溝から最外径に近い溝まで同一形状の溝を一様に旋削
する必要があり特に小径部では溝の外径部の壁面とこれ
と接する切刃の側面との干渉が特に顕著であり壁面のむ
しりやだれの原因となっている。従って内径部分から外
径部分の溝加工に至るまで同一形状の工具で加工するた
めに刃先形状に特定の配慮をする必要がある。
Turning to a multi-blade tool is most likely to be considered as a means of productivity that is almost comparable in terms of productivity as compared with the manufacturing method by molding. Therefore, the first problem is to specify the shape of a single cutting edge for processing a uniform groove in a rigid urethane foam sheet. Second
As a problem of the CMP processing pad, it is necessary to uniformly turn a groove of the same shape from the small diameter groove at the center of the pad to the groove closest to the outermost diameter. The interference with the side surface of the cutting blade in contact is particularly remarkable, causing the wall to be cut off or drooped. Therefore, it is necessary to give special consideration to the shape of the cutting edge in order to machine the groove from the inner diameter portion to the outer diameter portion with a tool having the same shape.

【0027】そこで第1の課題である単一切刃の形状を
刃物角を15度乃至35度、それに対応して前逃げ角を
45度乃至65度と特定する。角度範囲は被削材との関
係で定まる。被削材が軟質材であるほど刃物角は15度
に近く、前逃げ角を45度に近くとる。また刃物角を一
定にして前逃げ角を45度から増加させて被削性を判定
し単一切刃の形状が最終的に決定される。なお単一切刃
の刃幅は最終的に形成するパッド上溝幅0.1mm乃至
1.0mmを旋削するのに適合する幅を0.1mm乃至
1.5mmの範囲から選定する。
Therefore, the shape of a single cutting edge, which is the first problem, is specified as a blade angle of 15 to 35 degrees, and correspondingly, a front clearance angle of 45 to 65 degrees. The angle range is determined by the relationship with the work material. As the work material is softer, the blade angle is closer to 15 degrees and the front clearance angle is closer to 45 degrees. In addition, the shape of the single cutting edge is finally determined by determining the machinability by keeping the blade angle constant and increasing the front clearance angle from 45 degrees. The width of the single cutting blade is selected from a range of 0.1 mm to 1.5 mm, which is suitable for turning the groove on the pad to be finally formed in a width of 0.1 mm to 1.0 mm.

【0028】硬質発泡ウレタンは木材の切削に類似する
点があり切刃の刃先は鋭利にし切刃の刃先は刃先両側か
ら被削材に当接し切削が開始する形状にすることが望ま
しい。例えば工具研磨の際に刃先中央部分が凹みとなり
刃先の両端を突出するように円弧で刃先を形成するよう
に刃先を研磨することにより溝加工時の切粉の流出もよ
くなる。また刃先を直線にせず刃先先端にのみ研削目を
残して微小なノコギリ目を残しすくい面・前逃げ面・刃
側面は切粉等が流れやすい研磨目とするか、極めて滑ら
かな平面にすることが必要である。
Hard urethane foam is similar to wood cutting, and it is desirable that the cutting edge is sharp and the cutting edge is shaped to abut on the workpiece from both sides to start cutting. For example, when the tool is polished, the cutting edge is polished so that the center portion of the cutting edge becomes concave and the cutting edge is formed in an arc so that both ends of the cutting edge protrude. Also, instead of making the cutting edge straight, leave a grinding mark only at the tip of the cutting edge and leave a minute sawtooth.The rake face, front flank face and blade side face should be polished so that chips etc. can flow, or should be extremely smooth. is necessary.

【0029】次に第2の課題について説明する。同一形
状の単一切刃で溝の最小径から最大径まで加工する場合
に満たすべき条件を検討する。小径溝において溝壁との
干渉を避けるためには前逃げ角を大にすれば良い。そこ
で小径部の直径を20mm,溝深さ1.0mmを仮定し
て前逃げ角10度,45度,80度で試算したものを表
1に示している。
Next, the second problem will be described. Consider the conditions that must be met when machining from the minimum diameter to the maximum diameter of a groove with a single cutting edge of the same shape. In order to avoid interference with the groove wall in the small diameter groove, the front clearance angle may be increased. Thus, Table 1 shows the results of trial calculations at front clearance angles of 10, 45, and 80 degrees assuming that the diameter of the small diameter portion is 20 mm and the groove depth is 1.0 mm.

【0030】[0030]

【表1】 [Table 1]

【0031】表示する数値の計算式は次の通りである。
前逃げ角10度、溝径20mm、溝深さ1mmとする
と、前逃げ面の外側のエッジがパッドの表面と接する位
置は次式で求められる。
The calculation formula of the numerical value to be displayed is as follows.
Assuming that the front clearance angle is 10 degrees, the groove diameter is 20 mm, and the groove depth is 1 mm, the position where the outer edge of the front clearance surface contacts the surface of the pad can be obtained by the following equation.

【数1】 従って干渉量は11.496−10=1.496。(Equation 1) Therefore, the amount of interference is 11.496-10 = 1.496.

【0032】前逃げ角に45度を採用すると干渉量は
0.05mmとなり更に横逃げ角を3度程度に採れば干
渉は全く生じないことがわかる。この点から前逃げ角を
45度程度とし刃物角を小の方向、すくい角を大きい方
向で単一切刃を選択する。図9は干渉量の計算手順の説
明図である。なお工具の材質は炭素鋼・合金鋼・高速度
鋼・超硬合金・サーメット・ステライト・超高圧焼結体
も使用することもできる。パッドのクリーン度を高める
ためには錆の混入を防止するためセラミックを使用する
こともできる。平均的切削条件は周速200m/mi
n、送り0.05以下とする。切削速度を一定に管理す
ることもできるが、仕上がりに差は殆どない。なお硬質
発泡樹脂旋削時の切刃の刃幅は材質により旋削後の溝形
状が所定寸法になるように材質の物性を考慮して工具幅
を決定する。
When the front clearance angle is set to 45 degrees, the interference amount becomes 0.05 mm, and it is understood that no interference occurs when the lateral clearance angle is set to about 3 degrees. From this point, a single cutting edge is selected with a front clearance angle of about 45 degrees and a small blade angle and a large rake angle. FIG. 9 is an explanatory diagram of the procedure for calculating the amount of interference. The material of the tool may be carbon steel, alloy steel, high-speed steel, cemented carbide, cermet, stellite, or ultra-high pressure sintered body. In order to increase the cleanliness of the pad, ceramic can be used to prevent rust from entering. Average cutting condition is 200m / mi peripheral speed
n, the feed is set to 0.05 or less. Although the cutting speed can be controlled to be constant, there is almost no difference in finish. The blade width of the cutting edge during hard foam resin turning is determined in consideration of the physical properties of the material so that the groove shape after the turning has a predetermined dimension depending on the material.

【0033】本願発明では多刃工具を用いて多数の同一
形状の切刃をパッド上に切り込み送りを行い所定の切刃
の数だけの溝を同時に旋削するものである。従って一定
数の切刃を一つのチップ上に形成してユニット化して溝
の加工能率の向上、工具の製造と保全管理の容易化をで
きるようにしたものである。
In the present invention, a plurality of cutting blades having the same shape are cut into the pad using a multi-blade tool, and the grooves are simultaneously turned by a predetermined number of cutting blades. Therefore, a fixed number of cutting blades are formed on one chip to form a unit, thereby improving the machining efficiency of the groove and facilitating the production and maintenance management of the tool.

【0034】多刃工具の第1の実施例を図10,図11
に示す。単一切刃1を板状の工具チップの同一側面上に
所定のピッチで形成して多刃ユニット4とし、ユニット
ホルダ5に固装した位置決めピン6に嵌着して位置決め
し、押さえ板7で挟持してボルト8で固定して多刃ユニ
ット工具を構成する。この多刃ユニット工具の1個以上
を溝ピッチが同一となるよう配列して工具台に固定し2
軸NC制御して多数の溝を効率良く加工することが可能
である〔図12〕。図13はマルチユニットホルダ9の
例であり一つのホルダ上に多数の多刃ユニットを組み付
けたもので図10に示すように多刃ユニット4の両側端
に切刃1が設けられているので切刃間ピッチの確保が容
易であり作業上の便宜が計られたものである。
FIGS. 10 and 11 show a first embodiment of a multi-blade tool.
Shown in A single cutting blade 1 is formed at a predetermined pitch on the same side surface of a plate-like tool tip to form a multi-blade unit 4, which is fitted to a positioning pin 6 fixedly mounted on a unit holder 5 and positioned, and a holding plate 7. The multi-blade unit tool is clamped and fixed with bolts 8. One or more of the multi-blade unit tools are arranged so that the groove pitch is the same, and are fixed to a tool base.
It is possible to efficiently process a large number of grooves by controlling the axis NC (FIG. 12). FIG. 13 shows an example of the multi-unit holder 9 in which a number of multi-blade units are assembled on one holder. As shown in FIG. It is easy to secure the pitch between the blades, and the convenience in operation is obtained.

【0035】[0035]

【発明の効果】請求項1の発明は、旋削でCMP法加工
用パッドを製造することにより繊細な溝幅でも溝の壁と
上面とが直角性を保持できるのでデバイス加工面とパッ
ド上面間でスラリの流れが制御しやすく両者間のハイド
ロプレーン現象の発生を抑制することができデバイスの
軟質金属面のCMP法加工による平坦化処理が効率よく
遂行できる。
According to the first aspect of the present invention, by manufacturing a pad for CMP processing by turning, even if the groove width is delicate, the wall and the upper surface of the groove can maintain the perpendicularity, so that the gap between the device processing surface and the pad upper surface can be maintained. The flow of the slurry can be easily controlled, and the occurrence of the hydroplane phenomenon between the two can be suppressed, so that the soft metal surface of the device can be efficiently planarized by CMP.

【0036】請求項2の発明は、切刃形状を特定するこ
とにより小径溝の外側の溝コーナのエッジを直角にし、
壁面のだれ,むしれを生じないようにし、旋削溝を加工
することができるものである。
According to the second aspect of the present invention, by specifying the shape of the cutting edge, the edge of the groove corner outside the small diameter groove is made a right angle,
The turning groove can be machined to prevent the wall from drooling and peeling.

【0037】請求項3の発明は、単一切刃を構成素子と
する旋削用多刃工具をモジュール化して構成し、高能率
に多数の旋削溝を加工することができるものである。
According to a third aspect of the present invention, a turning multi-blade tool having a single cutting edge as a constituent element is modularized and configured so that a large number of turning grooves can be processed with high efficiency.

【図面の簡単な説明】[Brief description of the drawings]

【図1】単一切刃による溝加工図を示し好ましい溝壁面
を示している。
FIG. 1 shows a groove processing diagram with a single cutting edge, showing a preferable groove wall surface.

【図2】型使用で成形した溝形状図を示し溝壁面の傾き
や膨れが生じている。
FIG. 2 is a diagram showing a groove shape formed by using a mold, in which a wall surface of the groove is inclined or swollen.

【図3】溝付パッドの表面,溝の拡大図である。図は一
様な溝を示しているが不規則ピッチにすることもでき
る。
FIG. 3 is an enlarged view of a surface and a groove of a grooved pad. Although the figures show uniform grooves, irregular pitches can be used.

【図4】図3の溝の断面図である。FIG. 4 is a sectional view of the groove in FIG. 3;

【図5】CMP法加工用硬質発泡ウレタンパッドの断面
図である。
FIG. 5 is a cross-sectional view of a rigid urethane foam pad for CMP processing.

【図6】図5のパッドより更に繊細な溝幅を有するパッ
ドの断面図である。
6 is a cross-sectional view of a pad having a finer groove width than the pad of FIG.

【図7】図5又は図6に示す溝をパッド表面に一様に旋
削で設けた状態図である。
FIG. 7 is a view showing a state in which the grooves shown in FIG. 5 or FIG.

【図8】刃先部分の用語説明図である。FIG. 8 is an explanatory diagram of terms of a cutting edge portion.

【図9】前逃げ面と被削面との干渉量の計算手順の説明
図である。
FIG. 9 is an explanatory diagram of a calculation procedure of an interference amount between a front flank and a work surface.

【図10】溝ピッチの倍ピッチで切刃を形成した多刃ユ
ニットで多条溝を加工する説明図である。
FIG. 10 is an explanatory view of processing a multi-slot groove by a multi-blade unit having cutting edges formed at a pitch twice the groove pitch.

【図11】多刃ユニット工具の全体図である。FIG. 11 is an overall view of a multi-blade unit tool.

【図12】多刃ユニット工具を並設して多数の溝を同時
加工する説明図である。
FIG. 12 is an explanatory view showing that a multi-blade unit tool is juxtaposed to simultaneously machine a large number of grooves.

【図13】マルチユニットホルダに多刃ユニットを並設
した外形図である。
FIG. 13 is an external view in which a multi-blade unit is arranged in a multi-unit holder.

【符号の説明】[Explanation of symbols]

1 切刃 2 パッド基材 3 溝 4 多刃ユニット 5 ユニットホルダ 6 位置決めピン 7 押さえ板 8 ボルト 9 溝切り工具 10 工具ホルダ Reference Signs List 1 cutting blade 2 pad base material 3 groove 4 multi-blade unit 5 unit holder 6 positioning pin 7 holding plate 8 bolt 9 groove cutting tool 10 tool holder

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 半導体デバイス加工用のパッドであっ
て、このパッドの基材を硬質発泡樹脂材とし、このパッ
ドに溝幅0.1mm乃至0.3mm,溝深さが0.1m
m乃至1.0mmの溝を、溝ピッチが0.2mm乃至
2.0mmで、少なくとも直径20mmから200mm
の間に多数条を同心に形成してなり、コーナ部分に直角
なエッジを有する溝をパッド中心の小径溝から最外径に
近い溝までを同一形状に旋削で形成したことを特徴とす
る硬質発泡樹脂溝付パッド。
1. A pad for processing a semiconductor device, wherein a base material of the pad is a hard foamed resin material, and the pad has a groove width of 0.1 mm to 0.3 mm and a groove depth of 0.1 m.
m to 1.0 mm grooves, the groove pitch is 0.2 mm to 2.0 mm, at least 20 mm to 200 mm in diameter
Between the small diameter groove at the center of the pad and the groove closest to the outermost diameter are formed by turning the grooves having edges perpendicular to the corners in the same shape. Pad with foam resin groove.
【請求項2】 切刃の形状を刃物角15度乃至35度、
前逃げ角65度乃至45度、溝の外周側壁に当接する切
刃の横逃げ角を1度乃至3度の範囲に形成してなり、小
径溝において溝壁との干渉を避けるために前逃げ角を大
にしてコーナ部分に直角なエッジを有する溝をパッドの
小径溝から最外径に近い溝までを同一形状に旋削で硬質
発泡ウレタンパッドに形成する溝加工を容易にしたこと
を特徴とする旋削溝加工用工具。
2. The shape of the cutting blade is set at a blade angle of 15 to 35 degrees,
The front relief angle is 65 ° to 45 °, and the lateral relief angle of the cutting blade abutting on the outer peripheral side wall of the groove is in the range of 1 ° to 3 °. In order to avoid interference with the groove wall in the small diameter groove, the front relief angle is set. The groove has a large angle and a groove with a right-angled edge at the corner part.The groove from the small-diameter groove of the pad to the groove closest to the outermost diameter is turned into the same shape by turning, making it easy to form the groove on the hard urethane foam pad. Turning groove machining tool.
【請求項3】 単一切刃を板状工具の同一側面上に整列
突設して多刃ユニットにし、更にこの多刃ユニットをユ
ニットホルダに取り換え可能に固装して多刃ユニット工
具とし、この多刃ユニット工具の一個以上を溝ピッチが
整列するように配列して取換可能に構成して同心の多条
の溝を同時に旋削により形成することを特徴とする硬質
発泡樹脂パッドの旋削溝加工用工具。
3. A multi-blade unit tool, wherein a single cutting blade is aligned and protruded on the same side surface of the plate-shaped tool to form a multi-blade unit, and the multi-blade unit is replaceably fixed to a unit holder to form a multi-blade unit tool. Turning grooves for hard foam resin pads, characterized in that one or more multi-blade unit tools are arranged so that the groove pitch is aligned and are replaceable, and concentric multi-slots are formed simultaneously by turning. Tools.
JP2001337328A 2001-11-02 2001-11-02 Hard foam resin grooved pad for semiconductor device processing and pad turning groove processing tool Expired - Fee Related JP3497492B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001337328A JP3497492B2 (en) 2001-11-02 2001-11-02 Hard foam resin grooved pad for semiconductor device processing and pad turning groove processing tool

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001337328A JP3497492B2 (en) 2001-11-02 2001-11-02 Hard foam resin grooved pad for semiconductor device processing and pad turning groove processing tool

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP19464699A Division JP3299523B2 (en) 1999-07-08 1999-07-08 Tool for turning groove of hard foam resin pad

Publications (2)

Publication Number Publication Date
JP2002184730A true JP2002184730A (en) 2002-06-28
JP3497492B2 JP3497492B2 (en) 2004-02-16

Family

ID=19151987

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Country Status (1)

Country Link
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Cited By (6)

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WO2004015751A1 (en) * 2002-08-08 2004-02-19 Jsr Corporation Method of machining semiconductor wafer-use polishing pad and semiconductor wafer-use polishing pad
EP1539463A1 (en) * 2002-09-10 2005-06-15 3M Innovative Properties Company Multi-diamond cutting tool assembly for creating microreplication tools
WO2006129752A1 (en) * 2005-06-02 2006-12-07 Sharp Kabushiki Kaisha Cutter and device for cutting and peeling film
CN100466188C (en) * 2002-08-02 2009-03-04 应用材料有限公司 Conductive polishing component for electrochemical mechanical polishing process
US7516536B2 (en) * 1999-07-08 2009-04-14 Toho Engineering Kabushiki Kaisha Method of producing polishing pad
US8517798B2 (en) 2005-05-18 2013-08-27 Toyo Tire & Rubber Co., Ltd. Polishing pad, method of producing the same and method of producing semiconductor device by using the same

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Publication number Priority date Publication date Assignee Title
CN106077724B (en) * 2016-07-01 2018-08-21 江苏大学 A kind of metal cutting tool and its processing method of solid lubrication

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7516536B2 (en) * 1999-07-08 2009-04-14 Toho Engineering Kabushiki Kaisha Method of producing polishing pad
CN100466188C (en) * 2002-08-02 2009-03-04 应用材料有限公司 Conductive polishing component for electrochemical mechanical polishing process
WO2004015751A1 (en) * 2002-08-08 2004-02-19 Jsr Corporation Method of machining semiconductor wafer-use polishing pad and semiconductor wafer-use polishing pad
EP1539463A1 (en) * 2002-09-10 2005-06-15 3M Innovative Properties Company Multi-diamond cutting tool assembly for creating microreplication tools
JP2005537944A (en) * 2002-09-10 2005-12-15 スリーエム イノベイティブ プロパティズ カンパニー Multi-diamond cutting tool assembly for making microreplicated tools
US8517798B2 (en) 2005-05-18 2013-08-27 Toyo Tire & Rubber Co., Ltd. Polishing pad, method of producing the same and method of producing semiconductor device by using the same
WO2006129752A1 (en) * 2005-06-02 2006-12-07 Sharp Kabushiki Kaisha Cutter and device for cutting and peeling film
JPWO2006129752A1 (en) * 2005-06-02 2009-01-08 シャープ株式会社 Blade for film cutting and peeling and film cutting and peeling device
JP4744517B2 (en) * 2005-06-02 2011-08-10 シャープ株式会社 Blade for film cutting and peeling and film cutting and peeling device

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