JP2002148212A - X-ray inspecting apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an X-ray inspecting apparatus which can set a reference parameter quickly and simply. SOLUTION: The X-ray inspecting apparatus 10 inspects objects with the use of X rays while transferring the objects, and is provided with a conveyor for transferring objects, an X-ray irradiator 13, an X-ray line sensor 14 and a control computer 20. The control computer 20 controls to form X-ray images, to judge whether or not objects are good and to automatically set parameters. In the X-ray image formation control, X-ray image data of objects are formed with the use of X-rays. In the object judgment control, whether or not objects are good is judged from X-ray image data. In the automatic parameter-setting control, objects to be inspected are transferred by the conveyor before the apparatus is normally driven, thereby automatically setting an image processing parameter.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an X-ray inspection apparatus, and more particularly to an X-ray inspection apparatus for inspecting an article using X-rays while conveying the article.

[0002]

2. Description of the Related Art In a production line of a product such as food, when a product is mixed with foreign matter or the product is cracked or chipped, the product is inspected by an X-ray inspection apparatus so as not to be shipped. There is. In this X-ray inspection apparatus, X-rays are irradiated to each of the articles to be inspected which are continuously conveyed,
The X-ray transmission state is detected by an X-ray line sensor to determine whether foreign matter has entered the article, whether the article is cracked or chipped, or whether the number of single items in the article is insufficient. Determine. Further, an inspection for counting the number of single items in an article may be performed by the X-ray inspection apparatus.

[0003] An article determined to be defective by the X-ray inspection apparatus is sorted as a defective product by a subsequent sorting apparatus. If a critical defect such as foreign matter being found in an article is found, the production line is stopped and inspection of upstream equipment is performed to determine the cause. On the other hand, in the case of a defect such as cracking or a shortage of quantity, it is often returned to the production line after replacement or quantity adjustment. Further, when counting the number of single items by an X-ray inspection apparatus, a label on which the number is printed is attached in a later step.

[0004]

Some of the above X-ray inspection apparatuses can inspect a plurality of articles to be inspected. Such an apparatus stores a processing procedure of image processing, calculation parameters for performing image processing, and reference parameters such as an inspection mode, in accordance with the type of a target article to be inspected. Then, a type setting operation can be performed, and a corresponding type can be called from registered types.

[0005] Regardless of the X-ray inspection apparatus in which the target type is limited to one or the X-ray inspection apparatus capable of inspecting a plurality of types, before starting the inspection,
It is necessary to set and register the reference parameters in advance. Conventionally, when inspecting for foreign material contamination, an X-ray image of a test product containing foreign material is taken in advance, the image is projected on a monitor, and image processing parameters are manually set so that the foreign material can be reliably extracted. I am adjusting. On the other hand, when inspecting the shape of an article such as a crack or a chip, an X-ray image of a normal article is taken in advance, and a range in which the article is shown is manually selected from the image and set as a reference image. Also, when performing an inspection for counting the number of single items in an article, an X-ray image of a normal article with no missing parts is taken in advance, and the size and arrangement of the single item are manually set as reference parameters from the image. .

However, with the recent diversification of products, there has been a demand for an X-ray inspection apparatus capable of dealing with a plurality of types as described above. , It takes time to manually set the reference parameters of each type. Also,
If the number of types increases and the number of manual reference parameter setting operations increases, an input error or an input that is not the best may occur, and a proper X-ray inspection may not be performed.

An object of the present invention is to provide an X-ray inspection apparatus capable of quickly and easily setting reference parameters and the like.

[0008]

According to a first aspect of the present invention, there is provided an X-ray inspection apparatus for inspecting an article using X-rays while conveying the article. A source, an X-ray line sensor, an image creating unit, a determining unit, and an automatic setting unit. The transport mechanism transports the article. The X-ray source irradiates an X-ray to the article. The X-ray line sensor detects X-rays. The image creating means creates image data of the article based on the detection result by the X-ray line sensor. The judging means judges the inspection based on the image data. The automatic setting unit automatically conveys the article to be inspected by the conveyance mechanism before the normal operation, and automatically sets the intensity of the X-rays or the reference parameter used by the determination unit.

Here, a configuration is employed in which the automatic setting means automatically sets the intensity of X-rays or the reference parameter used by the judgment means while the article is being conveyed. The automatic setting means may be provided in, for example, a computer for controlling the X-ray inspection apparatus or a program incorporated in a sequencer.

Since the automatic setting means capable of automatically setting the reference parameters and the like is provided as described above, the X-ray inspection apparatus according to claim 1 can set the reference parameters and the like quickly and easily.

The X-ray inspection apparatus according to the second aspect is the first aspect.
In the X-ray inspection apparatus according to the item (1), the judging means judges the presence of foreign matter in the article. The automatic setting means determines a reference parameter used by the determination means. The reference parameter is an image processing parameter for determining foreign matter mixing.

[0012] In the X-ray inspection apparatus, it is desirable to adjust image data by performing image processing according to the type of the article and the assumed foreign matter, and to optimize the sharpness of the foreign matter. For this reason, conventionally, as a test, an article mixed with foreign matter is transported in advance, and image processing parameters are manually adjusted. However, the optimal adjustment is not always performed, and the adjustment takes time.

On the other hand, here, the image processing parameters used by the determination means are automatically set by the automatic setting means. Therefore, the time and labor for manual adjustment can be reduced, and the degree of optimal setting of the image processing parameters can be improved.

An X-ray inspection apparatus according to a third aspect is the first aspect of the invention.
Or the X-ray inspection apparatus according to 2, further comprising a display unit and an adjustment unit. The display unit displays an image of the article based on the image data. The adjusting means manually adjusts the intensity of X-rays or the reference parameter used by the determining means.

Here, an adjusting means is provided in addition to the automatic setting means to enable manual adjustment of the intensity of X-rays or the reference parameter. For this reason, it is possible to suppress problems such as setting errors and inability to set reference parameters and the like due to leaving it to the machine. For example, if the method used by the automatic setting means is not perfect, it is conceivable that the setting will be obviously wrong from the human eyes, but here, the display unit displays the image of the article. Since the adjustment means enables manual adjustment, the erroneous setting by the automatic setting means can be manually corrected.

Further, in addition to complementing the automatic setting means before the normal operation as described above, the adjusting means functions effectively even during the normal operation. For example, when the X-ray source or the X-ray line sensor has deteriorated due to wear of parts during operation, the reference value can be checked while viewing the image on the display unit using the manual adjustment function by the adjusting unit even during operation. Parameters and the like can be adjusted manually.

An X-ray inspection apparatus according to a fourth aspect is the first aspect.
Wherein the determining means determines the shape of the article based on the image data. The automatic setting means determines a reference parameter used by the determination means. The reference parameter is image data of an article having a normal shape that serves as a reference at the time of determination.

Here, a configuration is adopted in which image data of a normal article, which is a reference parameter required for performing an inspection for distinguishing an abnormal article from a normal article, is automatically set in advance by an automatic setting means. Conventionally, the image data of a normal article is obtained by manually transporting the article and manually setting a necessary image area, but it takes time and effort to set. On the other hand, since the automatic setting unit is provided here, image data of a normal article can be set quickly and easily.

An X-ray inspection apparatus according to a fifth aspect is the first aspect.
3. The X-ray inspection apparatus according to item 1, wherein the article includes a plurality of single items. The judging means counts the quantity of the single item from the image data, and makes a judgment based on the quantity. The automatic setting means determines a reference parameter used by the determination means. The reference parameter is a parameter serving as a reference when counting the quantity.

[0020] The X-ray inspection apparatus according to claim 6 provides the X-ray inspection apparatus according to claim 5.
The X-ray inspection apparatus according to the above, wherein the reference parameters include:
At least one of the arrangement and size of the single item included in the normal article is included.

When counting the number of single items from the image data, it is desirable that reference parameters such as the arrangement of the single items and the size of the single item have been obtained. Here, such reference parameters are automatically set in advance while the articles are being conveyed by the automatic setting means.

The X-ray inspection apparatus according to the seventh aspect is the first aspect.
7. The X-ray inspection apparatus according to any one of items 1 to 6, further comprising a transport control unit. The transport controller transports the article a plurality of times by operating the transport mechanism in reverse. The automatic setting means determines the intensity of X-rays or the reference parameter used by the determination means based on a plurality of pieces of image data of the article which has been transported a plurality of times.

In this case, since the transport mechanism is operated in the reverse direction, even when a plurality of article transports are necessary for setting the reference parameters, the user is prevented from having to re-place the articles on the transport mechanism many times. Can be In addition, since there is almost no positional deviation of the conveyed articles, the reference parameters are set in a stable state. In addition, since the setting of the reference parameter is based on multiple measurements,
It is possible to prevent the setting of extremely different reference parameters. In addition, since a plurality of measurements are performed automatically, the work of the user can be reduced and speeded up.

[0024] The X-ray inspection apparatus according to the eighth aspect is the first aspect.
8. The X-ray inspection apparatus according to any one of items 1 to 7, wherein the X-ray inspection apparatus can be connected to external devices via the Internet. Also,
In the X-ray inspection apparatus according to the present invention, the reference parameter can be confirmed or set by an external device.

[0025]

[First Embodiment] FIG. 1 shows an external appearance of an X-ray inspection apparatus according to an embodiment of the present invention. This X
The X-ray inspection apparatus 10 is one of apparatuses for performing a quality inspection on a production line of a product such as food, and irradiates X-rays to a continuously conveyed product to transmit X-rays transmitted through the product.
This is a device that determines the defect of a product based on the dose.

As shown in FIG. 4, a commodity G, which is an article to be inspected by the X-ray inspection apparatus 10, is conveyed to the X-ray inspection apparatus 10 by a pre-stage conveyor 60. In the X-ray inspection apparatus 10, the presence or absence of foreign matter is determined for the product G. The result of the determination by the X-ray inspection apparatus 10 is sent to a distribution mechanism 70 disposed downstream of the X-ray inspection apparatus 10. Distributing mechanism 70
Is sent to the regular line conveyor 80 when the product G is determined to be non-defective by the X-ray inspection apparatus 10, and when the product G is determined to be defective by the X-ray inspection apparatus 10 G is distributed to the defective product storage conveyor 90.

<Configuration of X-ray Inspection Apparatus> X-ray inspection apparatus 10
As shown in FIGS. 1 and 2, mainly, a shield box 11, a conveyor 12, an X-ray irradiator 13,
Line sensor 14 and LCD with touch panel function
It comprises a monitor 30 and a control computer 20 (see FIG. 5).

[Shield Box] Shield Box 1
1 has openings 11a on both sides for carrying in and out of a product. In the shield box 11, a conveyor 12, an X-ray irradiator 13, an X-ray line sensor 14, a control computer 20, and the like are accommodated.

Although not shown in FIG. 1, the opening 1
1a is closed by a shielding nozzle for suppressing leakage of X-rays to the outside of the shield box 11. The shielding noren is formed from rubber containing lead, and is pushed away by the product when the product is carried in and out.

On the front upper portion of the shield box 11, in addition to the LCD monitor 30, a key slot and a power switch are arranged. [Conveyor] The conveyor 12 transports the articles to be inspected in the shield box 11, and is driven by a conveyor motor 12a shown in FIG. The transport speed by the conveyor 12 is finely controlled by the inverter control of the conveyor motor 12a by the control computer 20.

The conveyor motor 12a can switch between forward and reverse rotation, and this switching is also controlled by the control computer 20. In particular, this switching function is used in automatic parameter setting control described later.

[X-ray irradiator] The X-ray irradiator 13 is disposed above the conveyor 12 as shown in FIG. 2 and has a fan-shaped X-ray (see FIG. 2) directed toward the lower X-ray line sensor. (See shaded area X).

[X-ray line sensor] X-ray line sensor 1
Numeral 4 is arranged below the conveyor 12 and detects a product G and X-rays transmitted through the conveyor 12. The X-ray line sensor 14, as shown in FIG.
And a large number of pixels 14a arranged in a straight line in a direction perpendicular to the transport direction.

[LCD Monitor] The LCD monitor 30 is a liquid crystal display for full dot display. The LCD monitor 30 displays an X-ray image of the product G, an inspection result, and the like. The LCD monitor 30 also has a touch panel function, and accepts manual input from a user in manual adjustment control or the like described later.

[Control computer] Control computer 2
0 is housed in the upper space in the shield box 11. As shown in FIG. 5, the control computer 20 includes a CPU 21 and a ROM 22, a RAM 23, and an HDD (hard disk) 25 as main storage units controlled by the CPU 21. Also,
The control computer 20 also has an FDD (floppy disk drive) 24 for inputting and outputting data to and from a floppy (registered trademark) disk.

Further, the control computer 20 includes an LCD
A display control circuit for controlling data display on the monitor 30, a key input circuit for taking in key input data from the touch panel of the LCD monitor 30, an I / O port for controlling data printing in a printer (not shown), and the like are provided. .

Then, CPU 21, ROM 22, RAM
23, FDD 24, HDD 25, etc. are an address bus,
They are interconnected via a bus line such as a data bus. In addition, the control computer 20 controls the conveyor motor 1
2a, rotary encoder 12b, photoelectric sensor 15
a, 15b, the X-ray irradiator 13, the X-ray line sensor 14, and the like.

The rotary encoder 12b is mounted on the conveyor motor 12a, detects the transport speed of the conveyor 12, and sends it to the control computer 20. Photoelectric sensor 1
Reference numerals 5a and 15b denote synchronous sensors for detecting the timing at which the product G to be inspected comes to the position of the X-ray line sensor 14, and each of the synchronous sensors is composed of a pair of a light emitter and a light receiver arranged with a conveyor therebetween. Have been. The photoelectric sensor 15a is connected to the front conveyor 6 of the X-ray line sensor 14.
0, and the conveyor 12 moves the product G in the forward direction.
Is transmitted to the control computer 20 when the acquisition of the X-ray fluoroscopic image signal (see FIG. 3) is started. Further, it is also a basis for timing when the product G is sorted by the sorting mechanism 70. The photoelectric sensor 15b is disposed on the side of the distribution mechanism 70 of the X-ray line sensor 14, and serves as a basis for starting acquisition of an X-ray fluoroscopic image signal when the conveyor 12 is transporting the product G in the reverse direction. A signal is sent to the control computer 20.

<Determination of article defect by control computer> [X-ray image creation] The control computer 20 receives a signal from the photoelectric sensor 15a or 15b, and the product G is a fan-shaped X-ray irradiator (see FIG. 2). When passing through the X-ray line sensor 14 (FIG. 3)
) Are acquired at small time intervals, and X-ray image data of the product G is created based on the X-ray fluoroscopic image signals.
Then, X-ray images are obtained by performing image processing on the X-ray image data.

[Article Defect Judgment] Then, the control computer 20 judges good or bad of the product G from the obtained X-ray image by a plurality of judgment methods. The determination method includes, for example, a trace detection method, a binary detection method, a mask binary detection method, and the like. As a result of these determinations, if at least one of them is determined to be defective, the product G
Is determined to be defective.

The trace detection method and the binarization detection method are as follows.
The decision is made on the unmasked area of the image. On the other hand, the mask binarization method makes a determination on a masked area of an image. The mask is set for the container portion of the product G or the like.

In the trace detection method, a reference level (threshold value) is set along a rough thickness of an object to be detected, and when the image becomes darker, a foreign matter has entered the product G. It is a method to judge. In this method, a relatively small foreign substance can be detected.

The binarization detection method and the mask binarization method are as follows.
This is a method in which a reference level is set to a certain brightness, and when the image becomes darker, it is determined that a foreign matter has entered the product G. This binarization detection method is set to detect a relatively large foreign matter.

The reference level and the mask area in each judgment method are set and changed by an input from the user using the touch panel function of the LCD monitor 30.

[Display Control] During a normal inspection, the control computer 20 displays the obtained X-ray image of the product G and information on the judgment by each judgment method on the LCD monitor 30.
To be displayed.

[Distribution instruction] Control computer 20
Determines that the product G is defective if at least one of the products is determined to be defective as a result of the determination in each of the above-described determination methods.
In this case, the control computer 20 sends a distribution instruction to the distribution mechanism 70 at the subsequent stage.

<Automatic Parameter Setting by Control Computer> The X-ray inspection apparatus 10 needs to be initialized before the normal operation for the defect inspection as described above is performed. In the initial setting, setting of the current time, setting of a reference level and a mask area in each determination method for each type, setting of the presence or absence of counting, setting of a password, and the like are performed. this house,
The automatic parameter setting related to the image processing parameters performed for each type will be described below.

Image processing parameters for image processing of image data obtained from the X-ray line sensor 14 are parameters that greatly affect whether or not foreign matter can be recognized in the X-ray image. -Appropriate settings are required to judge defects. The setting of the image processing parameters is necessary for each product type because the appropriate value differs depending on the product type of the product G and the foreign matter assumed in the product G.

The control computer 20 of the device 10 includes:
Automatic parameter setting control for automatically performing initial setting of image processing parameters is incorporated. If this automatic parameter setting control is used, the goods G to be inspected can be transferred to the conveyor 1
Just by placing the image on the image No. 2, the optimal image processing parameters are automatically set. By setting the optimal image processing parameters in this way, the sensitivity in the X-ray image is optimized, and the degree of clarity of the foreign matter increases. The image processing parameters include an image correction coefficient, an image correction constant, and the like.

When the user of the apparatus 10 places the test product G containing the foreign matter on the conveyor 12 and presses the start button, the control computer 20 causes the conveyer 12 to reciprocate the product G, Create a line image. The procedure for creating the X-ray image here is the same as the method described in the above [X-ray image creation] section. Then, the control computer 20 changes the image processing parameter such that the difference in contrast between the foreign matter portion and the non-foreign matter portion becomes the largest in the X-ray image, and gradually changes the image processing parameter for each X-ray image. While searching automatically.

The optimal image processing parameters obtained by these multiple tests are subjected to statistical processing such as averaging.
The reference parameter for the product G is stored in the reference parameter file 25a in the HDD 25.

The test for obtaining the optimal image processing parameters as described above needs to be performed for each type, and the image processing parameters are stored for each type in the reference parameter file 25a.

<Manual Adjustment of Image Processing Parameters by Automatic Parameter Setting> Here, as described above, only by the user placing the test product G on the conveyor 12, the control computer 20 automatically performs optimal image processing. The parameter is searched, but the image processing parameter may be set to an unfavorable one due to a defect in the automatic parameter setting control of the control computer 20 or a condition exceeding the assumption.

Therefore, the present apparatus 10 is provided with manual adjustment control (adjustment means). In this control, first, in response to the setting of the optimal image processing parameters by the automatic parameter setting control, a part 32 of the LCD monitor 30 is controlled.
Then, an X-ray image with the image processing parameters is displayed (see FIG. 6). The X-ray image to be displayed here has the smallest difference in contrast between the foreign matter portion and the non-foreign matter portion among the X-ray images obtained by the plurality of tests. Also, "UP", "DO" is displayed on the other portion 33 of the LCD monitor 30.
WN "and" OK "buttons are displayed. And
When the user presses the "UP" button, the X-ray image with the immediately higher image processing parameter is displayed on a part 32 of the LCD monitor 30, and when the user presses the "DOWN" button, one X-ray image is displayed. An X-ray image with the following image processing parameters is displayed on a part 32 of the LCD monitor 30. When the “enter” button is pressed, the control computer 20 discards the image processing parameters determined by the automatic parameter setting control, and stores the image processing parameters selected by the user in the reference parameter file 25a as set values.

The user can manually display the X-ray image at each image processing parameter on the LCD monitor 3 by manual adjustment control.
0, and when it is determined that the X-ray image in the image processing parameters determined by the automatic parameter setting control is not preferable, a preferable X-ray image is searched for and set as an image processing parameter. Can be determined.

<Main Features of X-ray Inspection Apparatus> (1) In this apparatus 10, image processing parameters, which are reference parameters for creating an optimum X-ray image for each type of product G, are controlled by a control computer. The automatic parameter setting control of 20 is used to determine this. For this reason, the user can complete the initial setting of the image processing parameters only by placing the test product G on the conveyor 12. As described above, here, the work time and labor for setting image processing parameters, which has been conventionally performed, are reduced. Further, it is expected that the optimum degree of setting of the image processing parameters is improved as compared with the conventional manual setting alone.

(2) In the present apparatus 10, the manual adjustment control is executed in addition to the automatic parameter setting control, so that the user can manually adjust the image processing parameters. For this reason, it is possible to eliminate a problem caused by leaving it to the machine, such as an erroneous setting of the image processing parameter or an inability to set the image processing parameter. In other words, the user adjusts the LC by the manual adjustment control.
Since it is now possible to select an image having an optimal image processing parameter while checking and checking the D monitor 30, when the automatic parameter setting control makes an erroneous decision, it can be recovered.

(3) In the present apparatus 10, in the automatic parameter setting control, the X-ray image is created a plurality of times while the product G is reciprocated by operating the conveyor 12 in the forward and reverse directions. For this reason, the trouble of the user placing the product G on the conveyor 12 many times can be suppressed. In addition, since the position of the conveyed test product G is hardly displaced, a plurality of tests are performed in a stable state. Further, the time until the determination of the image processing parameter is shortened.

<Modification of First Embodiment> (A) In the above embodiment, in the automatic parameter setting control, the image processing parameters are determined only by the test product G in which the foreign matter is mixed. It is also possible to determine the image processing parameters by adding a test using a test product G in which is not mixed. In this way, the degree of transmission of the product itself with respect to X-rays can be measured.
Can be prevented from being erroneously determined as a criterion such as a parameter lower than the degree of transmission.

(B) In the above embodiment, the automatic parameter setting control for automatically determining the image processing parameters has been described, but the output of the X-ray irradiator 13 (X-ray intensity)
In the case of an X-ray inspection apparatus capable of adjusting the above, the optimum value of the output of the X-ray irradiator 13 can be easily determined by the same control as the automatic parameter setting control described above.

(C) In the manual adjustment control in the above-described embodiment, among the X-ray images obtained by the multiple tests in the automatic parameter setting control, the one having the smallest contrast difference between the foreign matter portion and the non-foreign matter portion is shown in FIG. Is displayed to urge the user to adjust the image processing parameters. However, the same adjustment can be made for all of the plurality of X-ray images. In that case, the average of the image processing parameters selected by the user in each X-ray image is taken, and the average value is set as a set value.
What is necessary is just to store it in a. Also, during multiple tests,
The average may be averaged except for the one with the largest contrast and the one with the smallest contrast.

(D) In the above embodiment, the manual adjustment control which is started after the image processing parameters are determined by the automatic parameter setting control is described. However, the same manual adjustment control is used during a normal inspection for defective articles. Is also good.

For example, an “adjustment” button is displayed at the end of the LCD monitor 30 during driving, and when the button is pressed, a still image of the product G and “UP”, “DO” as shown in FIG.
WN "and an" Enter "button are displayed. Then, when the initially set image processing parameters are no longer appropriate due to wear of the X-ray irradiator 13 and the X-ray line sensor 14, the user can view the image while watching the LCD monitor 30 even during driving. Processing parameters can be adjusted manually.

[Second Embodiment] In the first embodiment,
Although the case of inspecting for a defect such as foreign matter has been described, the present invention can be applied to a case of inspecting a defect such as a crack.

When determining the crack of a product, it is necessary to compare the X-ray image of the product to be inspected with the reference X-ray image and determine the quality by a method such as so-called pattern matching or area determination. Done. Therefore, in such a case, an X-ray image of a normal product serving as a reference (hereinafter, referred to as a reference X-ray image) is required. When the control computer 20 shown in FIG. 5 automatically performs the acquisition of the reference X-ray image in the initial setting, the initial setting work of the user is reduced.

When the user selects a button (not shown) “acquire reference X-ray image” on the initial setting screen displayed on LCD monitor 30, control computer 20
The display on the LCD monitor 30 is updated to prompt the user to set a normal product at a predetermined position on the conveyor 12. When the user sets a product and presses a “Start” button, the control computer 20 conveys the product on the
The first X-ray fluoroscopic image signal from the X-ray line sensor 14
Step X-ray image data is created. Next, the control computer 20 performs edge processing on the first-stage X-ray image data, and temporarily stores an area including the outline of the product as a reference X-ray image candidate.

The acquisition of the X-ray image data and the storage of the reference X-ray image candidates in the first stage are performed a plurality of times by alternately operating the conveyor 12 in the forward and reverse directions. Then, the control computer 20 registers, from the plurality of candidates for the reference X-ray image, one having a high degree of identity with another candidate as a normal reference X-ray image.

[Third Embodiment] In the first embodiment,
Although the case of inspecting for a defect such as foreign matter has been described, the present invention is also applicable to a case where the number of single items is counted when a plurality of individual items are arranged in a product.

When counting single products in a product, an X-ray image of the product to be inspected is analyzed to determine the quantity of the single product. Therefore, in such a case, data on the position of the single item and the size of the single item in a normal product serving as a reference is required. If the control computer 20 shown in FIG. 5 automatically obtains these data in the initial setting, the initial setting work of the user is reduced.

When the user selects a button (not shown) "initial setting of counting test" on the initial setting screen displayed on the LCD monitor 30, the control computer 20
Updates the display on the LCD monitor 30 and prompts the user to set a normal product at a predetermined position on the conveyor 12. Here, for example, consider a boxed product in which three single products are packed. When the user sets a product and presses a “start” button, the control computer 20 creates X-ray image data based on an X-ray fluoroscopic image signal from the X-ray line sensor 14 while transporting the product on the conveyor 12. . Next, the control computer 20 obtains the outline of the product by edge processing, and determines a portion where pixels having a predetermined darkness or less in the X-ray image are equal to or more than a predetermined area as a portion where a single product is present. Each of the parts (here 3 places)
Calculate the center of gravity for. And the control computer 2
0 stores the position of the center of gravity with respect to the contour of the product as the specified position of each single product, and also obtains the contour of the single product and stores it as the size of the single product.

The registration (storage) of the specified position and the size of the single item in the product may be performed a plurality of times by alternately operating the conveyor 12 in the forward and reverse directions. In this case, the control computer 20 registers, from among a plurality of results of the specified position and size of the single item, a result having a high degree of identity with another result as a regular parameter (specified position and size).

[Fourth Embodiment] The X-ray inspection apparatus 10 of the above-described embodiment is equipped with a WWW server, a server-side program such as CGI, and communication means for connecting to the external Internet, and is provided at a location remote from the X-ray inspection apparatus 10. W on the information terminal of
It is also possible to confirm and set each reference parameter from a WWW browser via a WWW server and CGI. In this way, the information terminal device and the X-ray inspection apparatus 10 can be connected via the Internet without being connected by a dedicated communication line, and the reference parameters for the X-ray inspection apparatus 10 can be confirmed from a remote place. You will be able to make settings.

[0073]

According to the present invention, since the automatic setting means for automatically setting the intensity of X-rays or the reference parameters used by the judgment means is provided, the reference parameters and the like can be set quickly and easily.

[Brief description of the drawings]

FIG. 1 is an external perspective view of an X-ray inspection apparatus according to a first embodiment of the present invention.

FIG. 2 is a simplified configuration diagram of the inside of a shield box of the X-ray inspection apparatus.

FIG. 3 is a schematic diagram showing the principle of X-ray inspection.

FIG. 4 is a diagram showing a configuration before and after the X-ray inspection apparatus.

FIG. 5 is a block diagram of a control computer.

FIG. 6 is a display screen diagram of an LCD monitor.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 10 X-ray inspection apparatus 12 Conveyor (transport mechanism) 12a Conveyor motor (transport mechanism) 13 X-ray irradiator 14 X-ray line sensor 20 Control computer (image creation means; judgment means;
Automatic setting means; adjusting means; transport control section) 25 HDD 25a Reference parameter file 30 LCD monitor (display section) G Product (article)

Continuing from the front page (72) Michio Ota 959, Shimogaku, Ritto-cho, Kurita-gun, Shiga Prefecture Inside the Ishida Shiga Office (72) Inventor Osamu Hirose 1-343-2 Tamagawa, Chofu-shi, Tokyo East Co., Ltd. 2G001 AA01 BA11 CA01 DA08 FA01 FA06 GA01 HA01 HA13 JA09 JA11 JA13 JA16 KA03 LA01 PA11 SA04 SA14

Claims (8)

[Claims] 1. An X-ray inspection apparatus for inspecting an article using X-rays while transporting the article, comprising: a transport mechanism for transporting the article; an X-ray source for irradiating the article with the X-ray; An X-ray line sensor that detects the X-ray, an image creating unit that creates image data of an article based on a detection result by the X-ray line sensor, a determination unit that determines an inspection based on the image data, An automatic setting means for automatically transporting an article to be inspected by the transport mechanism before the operation and automatically setting the intensity of the X-ray or a reference parameter used by the determination means. Inspection equipment. 2. The method according to claim 1, wherein the determining means determines foreign matter in the article, the automatic setting means determines a reference parameter used by the determining means, and the reference parameter determines the foreign matter mixed in the article. The X-ray inspection apparatus according to claim 1, wherein the image processing parameter is an image processing parameter. 3. A display unit for displaying an image of an article based on the image data, and an adjusting means for manually adjusting the intensity of the X-rays or a reference parameter used by the determining means. Item 3. The X-ray inspection apparatus according to item 1 or 2. 4. The determining means determines the shape of the article based on the image data; the automatic setting means determines a reference parameter used by the determining means; The X according to claim 1, wherein the image data is image data of a normal-shaped article serving as a reference.
Line inspection equipment. 5. The article includes a plurality of single items, wherein the determination means counts the number of the single items from the image data and makes a determination based on the quantity. 2. The X-ray inspection apparatus according to claim 1, wherein a reference parameter to be used is determined, and the reference parameter is a parameter serving as a reference when counting the quantity. 6. The X-ray inspection apparatus according to claim 5, wherein the reference parameter includes at least one of an arrangement and a size of the single item included in the normal article. 7. A transport control unit for transporting an article a plurality of times by operating said transport mechanism in a forward / reverse direction, wherein said automatic setting means is configured to output said article based on a plurality of image data of said article by said plurality of transports. The X-ray inspection apparatus according to any one of claims 1 to 6, wherein the X-ray intensity or a reference parameter used by the determination unit is determined. 8. The X-ray inspection apparatus according to claim 1, wherein the X-ray inspection apparatus can be connected to an external device via the Internet, and the external device can confirm or set the reference parameter.