JP2002125959A5 - - Google Patents

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Publication number
JP2002125959A5
JP2002125959A5 JP2000325207A JP2000325207A JP2002125959A5 JP 2002125959 A5 JP2002125959 A5 JP 2002125959A5 JP 2000325207 A JP2000325207 A JP 2000325207A JP 2000325207 A JP2000325207 A JP 2000325207A JP 2002125959 A5 JP2002125959 A5 JP 2002125959A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000325207A
Other languages
Japanese (ja)
Other versions
JP4437609B2 (ja
JP2002125959A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2000325207A priority Critical patent/JP4437609B2/ja
Priority claimed from JP2000325207A external-priority patent/JP4437609B2/ja
Priority to US10/399,752 priority patent/US6885725B2/en
Priority to PCT/JP2001/009405 priority patent/WO2002034135A1/ja
Publication of JP2002125959A publication Critical patent/JP2002125959A/ja
Publication of JP2002125959A5 publication Critical patent/JP2002125959A5/ja
Application granted granted Critical
Publication of JP4437609B2 publication Critical patent/JP4437609B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2000325207A 2000-10-25 2000-10-25 X線画像診断装置 Expired - Fee Related JP4437609B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2000325207A JP4437609B2 (ja) 2000-10-25 2000-10-25 X線画像診断装置
US10/399,752 US6885725B2 (en) 2000-10-25 2001-10-25 X-ray image diagnosis apparatus
PCT/JP2001/009405 WO2002034135A1 (en) 2000-10-25 2001-10-25 X-ray image diagnosis apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000325207A JP4437609B2 (ja) 2000-10-25 2000-10-25 X線画像診断装置

Publications (3)

Publication Number Publication Date
JP2002125959A JP2002125959A (ja) 2002-05-08
JP2002125959A5 true JP2002125959A5 (enExample) 2007-02-15
JP4437609B2 JP4437609B2 (ja) 2010-03-24

Family

ID=18802607

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000325207A Expired - Fee Related JP4437609B2 (ja) 2000-10-25 2000-10-25 X線画像診断装置

Country Status (3)

Country Link
US (1) US6885725B2 (enExample)
JP (1) JP4437609B2 (enExample)
WO (1) WO2002034135A1 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2412706C (en) * 2001-11-23 2009-12-29 Imaging Dynamics Company Ltd. Correcting geometric distortion in a digitally captured image
DE10220293A1 (de) * 2002-05-07 2003-11-27 Philips Intellectual Property Gerät und Verfahren zur Reduktion von Bildartefakten
JP4211435B2 (ja) * 2002-08-30 2009-01-21 株式会社島津製作所 放射線検出器
DE102004003881B4 (de) * 2004-01-26 2013-06-06 Siemens Aktiengesellschaft Bildaufnahmevorrichtung
WO2006046384A1 (ja) * 2004-10-29 2006-05-04 Shimadzu Corporation 放射線検出器
EP1828810B1 (en) * 2004-12-17 2012-06-06 Koninklijke Philips Electronics N.V. Pulsed x-ray for continuous detector correction
JP5148061B2 (ja) * 2005-08-24 2013-02-20 出光興産株式会社 照明装置用ハウジング構造体、およびその製造方法、該構造体を用いたバックライト装置
EP1948020B1 (en) * 2005-11-09 2017-05-31 Koninklijke Philips N.V. Method for reducing 3d ghost artefacts in an x-ray detector
US7822173B2 (en) * 2006-01-16 2010-10-26 Koninklijke Philips Electronics N.V. Smart radiation detector module
JP4839122B2 (ja) * 2006-04-11 2011-12-21 株式会社日立メディコ X線画像診断装置
US8118240B2 (en) * 2006-04-20 2012-02-21 Masco Corporation Of Indiana Pull-out wand
JP5455312B2 (ja) * 2007-03-13 2014-03-26 キヤノン株式会社 放射線撮像装置、その制御方法、及びプログラム
FR2914463B1 (fr) * 2007-03-27 2010-12-24 Gen Electric Procede de correction de charges remanentes dans un detecteur a panneau plat a rayons x.
JP5714894B2 (ja) * 2007-04-12 2015-05-07 コーニンクレッカ フィリップス エヌ ヴェ 画像検出デバイス、イメージング方法及びそれに用いられるコンピュータプログラム
JP5247221B2 (ja) * 2008-04-21 2013-07-24 キヤノン株式会社 放射線画像撮像システム及びその駆動方法
JP5377081B2 (ja) * 2009-06-01 2013-12-25 キヤノン株式会社 放射線撮影装置及びその制御方法
GB201505732D0 (en) * 2015-04-02 2015-05-20 Kromek Ltd Detector and method of operation

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0619441B2 (ja) 1989-06-21 1994-03-16 株式会社東芝 X線検出器およびx線ctスキャナ装置
WO1998001992A2 (en) 1996-07-08 1998-01-15 Philips Electronics N.V. X-ray examination apparatus with a semiconductor x-ray detector
JP3684010B2 (ja) * 1996-12-26 2005-08-17 キヤノン株式会社 放射線検出装置

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