JP2002107763A5 - - Google Patents

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JP2002107763A5
JP2002107763A5 JP2001138821A JP2001138821A JP2002107763A5 JP 2002107763 A5 JP2002107763 A5 JP 2002107763A5 JP 2001138821 A JP2001138821 A JP 2001138821A JP 2001138821 A JP2001138821 A JP 2001138821A JP 2002107763 A5 JP2002107763 A5 JP 2002107763A5
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Japan
Prior art keywords
light
electro
optical device
film transistor
shielding layer
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JP2001138821A
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Japanese (ja)
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JP2002107763A (en
JP3965935B2 (en
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Description

【発明の名称】電気光学装置及び投射型表示装置Patent application title: ELECTRO-OPTICAL DEVICE AND PROJECTION DISPLAY

【0009】
【課題を解決するための手段】
(1)本発明の電気光学装置は上記課題を解決するために、前記一対の基板間に設けられた電気光学物質と、
前記一対の基板の一方に形成された画素電極と、
前記画素電極に対応して設けられた薄膜トランジスタと、
前記画素電極に対応して設けられた蓄積容量と、
前記蓄積容量の容量電極の内の下電極と上電極の少なくとも一方として設けられた光吸収層と、
を備える。
さらに本発明の電気光学装置によれば、前記薄膜トランジスタの少なくともチャネル領域を覆って、前記蓄積容量より上層に設けられた遮光層をさらに備える。
さらに本発明の電気光学装置によれば、前記遮光膜は、前記上電極の直上に設けられている。
[0009]
[Means for Solving the Problems]
(1) In order to solve the above problems, the electro-optical device according to the present invention includes: an electro-optical material provided between the pair of substrates;
A pixel electrode formed on one of the pair of substrates,
A thin film transistor provided corresponding to the pixel electrode;
A storage capacitor provided corresponding to the pixel electrode;
A light absorption layer provided as at least one of a lower electrode and an upper electrode of the capacitance electrodes of the storage capacitor,
Is provided.
Further, according to the electro-optical device of the present invention, the electro-optical device further includes a light-shielding layer provided above the storage capacitor so as to cover at least a channel region of the thin-film transistor.
Further, according to the electro-optical device of the present invention, the light-shielding film is provided immediately above the upper electrode.

【0018】
(3)本発明の電気光学装置の他の態様では、前記光吸収層は、導体化したシリコン膜からなる。
[0018]
(3) In another aspect of the electro-optical device according to the invention, the light absorption layer is made of a conductive silicon film.

【0026】
本発明の電気光学装置は、前記光吸収層の少なくとも一層は、前記蓄積容量における容量線の側の層からなる。
本発明の電気光学装置の他の態様では、前記遮光層は、容量線からなり、前記光吸収層の少なくとも一層は、画素毎に島状に分断された容量電極からなる。
(7)前記遮光膜が上側に配置された態様では、前記遮光層は、データ線と前記薄膜トランジスタとの間に配置された容量線からなり、前記光吸収層は、前記容量線に誘電体膜を介して対向配置され且つ画素毎に島状に分断された容量電極からなってもよい。
[0026]
In the electro-optical device according to the aspect of the invention, at least one of the light absorbing layers may be a layer on the storage capacitor side on a capacitance line side.
In another aspect of the electro-optical device of the present invention, the light-shielding layer is formed of a capacitance line, and at least one of the light absorption layers is formed of a capacitance electrode divided into pixels for each pixel.
(7) In the aspect in which the light-shielding film is disposed on the upper side, the light-shielding layer includes a capacitance line disposed between a data line and the thin film transistor, and the light-absorbing layer includes a dielectric film on the capacitance line. , And may be composed of capacitance electrodes that are arranged to face each other and are divided into islands for each pixel.

Claims (18)

一対の基板と、
前記一対の基板間に設けられた電気光学物質と、
前記一対の基板の一方に形成された画素電極と、
前記画素電極に対応して設けられた薄膜トランジスタと、
前記画素電極に対応して設けられた蓄積容量と、
前記蓄積容量の容量電極の内の下電極と上電極の少なくとも一方として設けられた光吸収層と、
を備えたことを特徴とする電気光学装置。
A pair of substrates,
An electro-optical material provided between the pair of substrates,
A pixel electrode formed on one of the pair of substrates,
A thin film transistor provided corresponding to the pixel electrode;
A storage capacitor provided corresponding to the pixel electrode;
A light absorption layer provided as at least one of a lower electrode and an upper electrode of the capacitance electrodes of the storage capacitor,
An electro-optical device comprising:
前記光吸収層は、前記薄膜トランジスタのチャネル領域を形成する主材料を主材とすることを特徴とする請求項1に記載の電気光学装置。The electro-optical device according to claim 1, wherein the light absorbing layer is mainly made of a main material forming a channel region of the thin film transistor. 前記光吸収層は、導体化したシリコン膜からなることを特徴とする請求項1又は2に記載の電気光学装置。The electro-optical device according to claim 1, wherein the light absorption layer is made of a conductive silicon film. 前記薄膜トランジスタの少なくともチャネル領域を覆って、前記蓄積容量より上層に設けられた遮光層をさらに備えることを特徴とする請求項1乃至3のいずれか一項に記載の電気光学装置。4. The electro-optical device according to claim 1, further comprising a light-shielding layer provided above the storage capacitor so as to cover at least a channel region of the thin-film transistor. 5. 前記遮光層は、前記上電極の直上に設けられていることを特徴とする請求項4に記載の電気光学装置。The electro-optical device according to claim 4, wherein the light-shielding layer is provided immediately above the upper electrode. 前記遮光層は、金属を含む膜からなることを特徴とする請求項4又は5に記載の電気光学装置。The electro-optical device according to claim 4, wherein the light-shielding layer is formed of a film containing a metal. 前記光吸収層の一方は、前記蓄積容量における容量線の側の電極からなることを特徴とする請求項1乃至6のいずれか一項に記載の電気光学装置。The electro-optical device according to claim 1, wherein one of the light absorption layers is formed of an electrode on a side of a capacitance line in the storage capacitor. 前記容量線は、画像表示領域内で前記データ線に交差する方向に伸びるストライプ状に形成されており且つ前記画像表示領域の周辺に位置する周辺領域で定電位源に接続されていることを特徴とする請求項7に記載の電気光学装置。The capacitance line is formed in a stripe shape extending in a direction intersecting the data line in the image display region, and is connected to a constant potential source in a peripheral region located around the image display region. The electro-optical device according to claim 7, wherein 前記容量線は、前記周辺領域で相互に接続されており、前記定電位源に対して一又は複数のコンタクトを介して複数まとめて接続されていることを特徴とする請求項8に記載の電気光学装置。9. The electric device according to claim 8, wherein the plurality of capacitance lines are connected to each other in the peripheral region, and are connected to the constant potential source via a single contact or a plurality of contacts. Optical device. 前記容量線は、前記周辺領域で相互に接続されており、前記定電位源に対して複数のコンタクトを介して冗長的に接続されていることを特徴とする請求項9に記載の電気光学装置。The electro-optical device according to claim 9, wherein the capacitance lines are connected to each other in the peripheral region, and are redundantly connected to the constant potential source via a plurality of contacts. . 前記遮光層は、容量線からなり、
前記光吸収層の他方は、画素毎に島状に分断された容量電極からなることを特徴とする請求項7乃至10のいずれか一項に記載の電気光学装置。
The light shielding layer is made of a capacitance line,
The electro-optical device according to any one of claims 7 to 10, wherein the other of the light absorbing layers includes a capacitor electrode divided into islands for each pixel.
前記遮光層は、
前記薄膜トランジスタに接続されており第1方向に夫々伸びる複数のデータ線と、
前記画素電極に接続されており前記第1方向に交差する第2方向に夫々伸びる複数の容量線と
からなることを特徴とする請求項4乃至6のいずれか一項に記載の電気光学装置。
The light shielding layer,
A plurality of data lines connected to the thin film transistor and each extending in a first direction;
The electro-optical device according to claim 4, further comprising a plurality of capacitance lines connected to the pixel electrode and extending in a second direction that intersects with the first direction.
前記基板上における前記薄膜トランジスタの下側に配置されており前記薄膜トランジスタの少なくともチャネル領域を覆う他の遮光層を備えたことを特徴とする請求項1から12のいずれか一項に記載の電気光学装置。The electro-optical device according to any one of claims 1 to 12, further comprising another light-blocking layer disposed below the thin film transistor on the substrate and covering at least a channel region of the thin film transistor. . 前記他の遮光層と前記薄膜トランジスタとの間に配置されており前記薄膜トランジスタのチャネル領域を形成する主材料を主材とする他の光吸収層を更に備えたことを特徴とする請求項13に記載の電気光学装置。14. The light-emitting device according to claim 13, further comprising another light-absorbing layer disposed between the another light-shielding layer and the thin-film transistor, the light-absorbing layer being mainly composed of a main material forming a channel region of the thin-film transistor. Electro-optical device. 前記遮光層は、前記光吸収層よりも熱伝導率が高いことを特徴とする請求項4から14のいずれか一項に記載の電気光学装置。The electro-optical device according to claim 4, wherein the light-shielding layer has a higher thermal conductivity than the light-absorbing layer. 前記薄膜トランジスタと前記光吸収層との層間距離は、前記光吸収層と前記遮光層との層間距離よりも大きいことを特徴とする請求項15に記載の電気光学装置。The electro-optical device according to claim 15, wherein an interlayer distance between the thin film transistor and the light absorbing layer is larger than an interlayer distance between the light absorbing layer and the light shielding layer. 前記遮光層は、前記光吸収層上に絶縁膜を介して積層され且つ前記光吸収層よりも平面的に見て一回り大きく形成されることを特徴とする請求項4から17のいずれか一項に記載の電気光学装置。18. The light-shielding layer according to claim 4, wherein the light-shielding layer is stacked on the light-absorbing layer via an insulating film and is slightly larger than the light-absorbing layer when viewed two-dimensionally. An electro-optical device according to the item. 光源と、
クレーム1から17のいずれか1つの電気光学装置でなるライトバルブと、
前記光源から発光した光を前記ライトバルブに導光する導光部材と、
前記ライトバルブで変調された光を投射する投射光学部材と
を有することを特徴とする投射型表示装置。
A light source,
A light valve comprising an electro-optical device according to any one of claims 1 to 17,
A light guide member that guides light emitted from the light source to the light valve,
A projection optical member for projecting light modulated by the light valve.
JP2001138821A 2000-07-26 2001-05-09 Electro-optical device and projection display device Expired - Fee Related JP3965935B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001138821A JP3965935B2 (en) 2000-07-26 2001-05-09 Electro-optical device and projection display device

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JP2000225419 2000-07-26
JP2000-225419 2000-07-26
JP2001138821A JP3965935B2 (en) 2000-07-26 2001-05-09 Electro-optical device and projection display device

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JP2002107763A JP2002107763A (en) 2002-04-10
JP2002107763A5 true JP2002107763A5 (en) 2004-12-24
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JP3788387B2 (en) * 2002-05-10 2006-06-21 セイコーエプソン株式会社 Electro-optical device and method of manufacturing electro-optical device
JP4324441B2 (en) * 2003-10-09 2009-09-02 シャープ株式会社 Element substrate, display device
JP2005222019A (en) 2004-01-07 2005-08-18 Seiko Epson Corp Electrooptical device and electronic equipment, and method for manufacturing electrooptical device
JP5151337B2 (en) * 2007-09-14 2013-02-27 セイコーエプソン株式会社 Electro-optical device and electronic apparatus
KR20210063424A (en) 2018-09-28 2021-06-01 비아비 솔루션즈 아이엔씨. Coating Control Using Forward Parameter Correction and Enhanced Reverse Engineering
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