JP2002043007A - Ic socket - Google Patents

Ic socket

Info

Publication number
JP2002043007A
JP2002043007A JP2000251632A JP2000251632A JP2002043007A JP 2002043007 A JP2002043007 A JP 2002043007A JP 2000251632 A JP2000251632 A JP 2000251632A JP 2000251632 A JP2000251632 A JP 2000251632A JP 2002043007 A JP2002043007 A JP 2002043007A
Authority
JP
Japan
Prior art keywords
socket
pressing
cover
connecting member
shaft
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000251632A
Other languages
Japanese (ja)
Inventor
Kazuhisa Ozawa
一久 小澤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MIS TECHNOLOGY KK
Original Assignee
MIS TECHNOLOGY KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MIS TECHNOLOGY KK filed Critical MIS TECHNOLOGY KK
Priority to JP2000251632A priority Critical patent/JP2002043007A/en
Publication of JP2002043007A publication Critical patent/JP2002043007A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Connecting Device With Holders (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide an IC socket, capable of coping with a burn-in test or the problems such as small and slight contact pressure of a socket for packaging accompanying the tendency toward high densification for a semiconductor element, and a fine electrode, while being small-sized and simple in constitution. SOLUTION: This IC socket opens and closes pressure contact connection between an IC device mounted by vertical motion of a cover where an operating cam face is formed. A curved groove shaft guide part is provided on the cover, and a lateral groove is formed in the socket body. A connecting member where an engagement part with the operating cam face is formed on one side, and a connecting member formed on the other end side, is fitted to both of the shaft guide part of the cover and the long groove of the socket body, and is supported by shaft a integral with it. A pressing member having a pressing part is supported on an interlocking member by the integral shaft, and a spring resiliently pressing in the pressing direction is disposed between the pressing member and the linking member.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、ICパッケージや
素子等のICデバイスの検査や実装用の治具として使用
される接続用ICソケットに関し、特には、ICパッケ
ージや素子等のICデバイスをICソケットに上下動可
能に配設したカバーの上方から挿脱し得るようにし、回
路基板との接続をカバーの上下動により行うようにした
ICソケットに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a connection IC socket used as a jig for inspecting and mounting an IC device such as an IC package or an element, and more particularly to an IC socket such as an IC package or an element. The present invention relates to an IC socket that can be inserted into and removed from above a cover that is vertically movable on a socket, and that is connected to a circuit board by vertically moving the cover.

【0002】[0002]

【従来の技術】ICデバイスは、一般に製造後バーンイ
ンテストが行われるが、その際、搭載台を有するICソ
ケットにICデバイスを装着して、所定の条件下で加熱
して電気的特性を試験する。
2. Description of the Related Art Generally, a burn-in test is performed on an IC device after its manufacture. At this time, the IC device is mounted on an IC socket having a mounting table and heated under a predetermined condition to test electrical characteristics. .

【0003】ところで、ICデバイスとしては、近時半
導体素子の高密度化が進み、電極として接続用半田ボー
ルをアレイ状或いはマトリックス状に配列したBGA
(Ball Grid Array)、或いは半田ボー
ルが搭載されていないLGA(Land Grid A
rray)等のパッケージが用いられており、さらには
ウエファ(Wafer)、CSP(Chip Size
Package)等の素子自体の開発が進んでいる。
これらのパッケージ等に対しては、精度の高い位置決め
の技術や、精度良く各電極部(接点)に微妙な接触圧を
与えるなど、これらICデバイスの良否をテストするた
めの電気的特性検査用ICソケットが必要とされてい
る。
In recent years, as an IC device, the density of a semiconductor element has been increased, and a BGA in which solder balls for connection are arranged in an array or matrix as electrodes.
(Ball Grid Array) or LGA (Land Grid A) without solder balls
(Rray) and the like, and further, a wafer (Wafer) and a CSP (Chip Size).
(Package) and the like are under development.
For these packages, etc., ICs for electrical characteristic inspection for testing the quality of these IC devices, such as high-precision positioning technology and precise application of delicate contact pressure to each electrode (contact). Sockets are needed.

【0004】従来、リードレスIC用のICソケットと
しては、ICデバイスの電極(接点)をソケット内のコ
ンタクトピンを利用して、そのピンの自由端に載せ押圧
することでその接触圧を得るようにし、その押圧接触状
態を保持するため、ソケット本体の一端に押えカバーを
開閉可能に取り付け、 他端に設けたロック部材で上記
カバーを閉合保持することで上記ICデバイスを保持
し、接触圧を確保する構成の押えカバー方式のICソケ
ットが知られている。
Conventionally, as an IC socket for a leadless IC, an electrode (contact) of an IC device is placed on a free end of the pin using a contact pin in the socket and pressed to obtain the contact pressure. In order to maintain the pressed contact state, a holding cover is openably and closably attached to one end of the socket body, and the cover is closed and held by a lock member provided at the other end to hold the IC device and reduce the contact pressure. 2. Description of the Related Art There is known an IC socket of a press cover type having a configuration for securing it.

【0005】しかるに、上記ICのソケットへの挿脱
は、その都度上記押えカバーをロック部材の係脱操作と
共に開閉して行わなければならず、作業効率を著しく低
下させるという問題があった。一方において、作業の自
動化が一般的に行われているが、上記押えカバーをロッ
ク部材の係脱操作と共に開閉する構成は、かかる自動化
に容易に対応できないという問題を有していた。又、一
端側を支軸として開閉する押えカバーは、装填したIC
デバイスに対し垂直に押し込むことが困難ということか
ら、押えカバーを二重にして、内側のカバーがICデバ
イスに対して垂直に押し込む作用をなすようにした種々
のソケットも提案されている。しかし、この場合には機
構が複雑になって、やはり自動化においても問題がある
と共に、コスト高にもなるという問題をも有していた。
However, each time the IC is inserted into or removed from the socket, the presser cover must be opened and closed together with the operation of engaging and disengaging the lock member, and there is a problem that the working efficiency is significantly reduced. On the other hand, work automation is generally performed, but the configuration in which the presser cover is opened and closed together with the operation of engaging and disengaging the lock member has a problem that such automation cannot be easily accommodated. The presser cover that opens and closes with one end as a support shaft is
Because it is difficult to push vertically into the device, various sockets have been proposed in which the holding cover is doubled so that the inner cover acts to push vertically into the IC device. However, in this case, the mechanism becomes complicated, and there is also a problem in automation as well as a problem of high cost.

【0006】さらに又、上方が開放されたカバーをソケ
ット本体に上下動可能に配設すると共に、回路基板との
接続が行えるようにしたソケットのICデバイス搭載台
に、ICデバイスを上記カバーの上方開放部から装着し
て、カバーへの操作力を解除することによりICデバイ
ス搭載台に置かれたICデバイスを保持し、回路接続を
なすようにした、いわゆるオープントップ型のICソケ
ットも知られている。このようなオープントップ型IC
ソケットによれば、上方からのICデバイスの挿脱が可
能でカバー操作と共に自動化が容易であるという特徴が
ある。
Further, a cover whose upper part is open is disposed on the socket body so as to be movable up and down, and the IC device is mounted on the IC device mounting base of the socket which can be connected to a circuit board. A so-called open-top type IC socket is also known, in which the IC device is mounted on an open part and releases the operating force on the cover to hold the IC device placed on the IC device mounting base and make a circuit connection. I have. Such open-top type IC
According to the socket, there is a feature that the IC device can be inserted and removed from above, and automation can be easily performed together with the cover operation.

【0007】[0007]

【発明が解決しようとする課題】リードレスICに適合
する上記オープントップ型ICソケットとしては、たと
えば、特開昭62−128463がある。このソケット
は、導電性を有する多数のコンタクトが設けられたコネ
クターベースに対し、上部が開口された蓋状のアクチュ
エータ部材の該開口部を介してICデバイスを装着し、
フリーフローティングに配されたラッチによって上記I
Cデバイスを押圧固定するものである。しかし、このソ
ケットの場合は、コネクターベース上に載置されたIC
デバイスをフリーフローティングのラッチで押圧固定さ
せるものであり、その固定機構が不安定であり、微細な
接続コンタクトとの圧着接続は適正に行われ難いという
問題があった。
An open-top type IC socket suitable for a leadless IC is disclosed, for example, in Japanese Patent Application Laid-Open No. Sho 62-128463. In this socket, an IC device is mounted on a connector base provided with a large number of conductive contacts through the opening of a lid-shaped actuator member having an open top.
The above-mentioned I is provided by a latch arranged in a free floating state.
The device C is pressed and fixed. However, in the case of this socket, the IC mounted on the connector base
The device is pressed and fixed by a free-floating latch. The fixing mechanism is unstable, and there has been a problem that it is difficult to properly perform crimp connection with a fine connection contact.

【0008】また、特開平8−185944には、装着
したICデバイスを押えレバーで押圧すると共に、IC
デバイスの挿脱時には押圧レバーが離間移動する構成の
ソケットが開示されている。即ち、このソケットは、カ
バーの下に押えレバーを横方向に延在して軸支し、該レ
バーの一端をカバーの上下動に追随して上下動するよう
にカバーとリンク結合し、他端をカバーの上下動に伴い
逆方向に上下動させてICデバイスの上面を押圧しIC
デバイスを保持させるようにしたもので、カバーの下降
時には、さらに上記リンク結合部を介して前後に摺動可
能に支持された該押えレバーを、ICデバイスから離間
するように移動させるようにしたものである。
Japanese Patent Application Laid-Open No. 8-185944 discloses that a mounted IC device is pressed by a holding lever, and
There is disclosed a socket having a configuration in which a pressing lever moves away when a device is inserted or removed. That is, in this socket, the holding lever extends laterally under the cover and is supported in a horizontal direction, and one end of the lever is link-coupled to the cover so as to move up and down following the up and down movement of the cover. Is moved up and down in the opposite direction with the up and down movement of the cover to press the upper surface of the IC device and
A device for holding the device, wherein when the cover is lowered, the holding lever slidably supported back and forth through the link connecting portion is moved so as to be separated from the IC device. It is.

【0009】ところで、かかるソケットの場合、ICデ
バイスの押えレバーはカバーの下に横方向に延在して支
持されるもので、ソケットとして横方向の寸法が大きく
ならざるをえず、ICデバイスを個々に装着してバーン
インテストを行う際に、ソケットをテスト回路基板上に
大量に配列して処理できず、テスト効率が悪いという問
題があり、又、押えレバーの圧着力は、カバーの上方押
上移動用のばねの弾発力によっており、微細な接続コン
タクトとの圧着力は不安定となり微妙な圧着接続は適正
に行われ難いという問題があった。
In the case of such a socket, the holding lever of the IC device is supported under the cover so as to extend in the horizontal direction. Therefore, the size of the socket as the socket must be increased. When performing the burn-in test by mounting them individually, there is a problem that the sockets cannot be arranged in large numbers on the test circuit board and the test efficiency is poor, and the pressing force of the presser lever is pushed upward from the cover. Due to the resiliency of the moving spring, there is a problem that the crimping force with the fine connecting contact becomes unstable and the delicate crimping connection is not properly performed.

【0010】本発明は、近時の半導体素子の高密度化、
電極の微細化等の傾向に伴う、バーンインテスト或いは
実装用等のソケットの接触圧の微小化等に対し、上述従
来技術の問題点を解消することを課題とし、小型で、簡
単な構成でありながら、接触圧の微小、微妙なソケット
として適正に対応できるICソケットを提供することを
目的とする。
[0010] The present invention provides a recent increase in the density of semiconductor devices,
The object of the present invention is to solve the above-mentioned problems of the related art with respect to miniaturization of the contact pressure of a socket for a burn-in test or mounting, etc., due to the trend of miniaturization of electrodes, etc. An object of the present invention is to provide an IC socket which can appropriately cope with a small and delicate socket having a small contact pressure.

【0011】[0011]

【課題を解決するための手段】上記目的を達成するため
に、本発明のICソケットは、外部回路(主としてテス
ト回路)と接続されるべきICデバイスを装着するIC
搭載台を有し、該外部回路の基板に配設されるソケット
本体に対し、作動カム面が形成され上部が開口したカバ
ーを上下動可能に装架し、該カバーの上下動に従って前
記IC搭載台に装着したICデバイスとその下部に配設
された外部回路との圧着接続を開閉するようにしたIC
ソケットであって、さらに前記カバーには曲線状の溝で
形成した軸案内部を設けると共に、ソケット本体には横
長の溝を形成し、一方、一端側に前記作動カム面と係合
する係合部を有すると共に他端側に連繋部を形成した連
繋部材を、一体に設けた支承軸を前記カバーの軸案内部
及び前記ソケット本体の長溝に共に嵌合係合せしめて支
承させ、さらに、端部に押え部を有する押さえ部材を一
体の支承軸によって前記連繋部材に支承せしめ、さらに
又、該押え部材と連繋部材との間には、押え部材の押え
方向に弾圧するばね部材などの弾性部材を配設したもの
である。
In order to achieve the above object, an IC socket according to the present invention comprises an IC for mounting an IC device to be connected to an external circuit (mainly a test circuit).
A cover having an operating cam surface and an open top is mounted on a socket body disposed on a board of the external circuit so as to be vertically movable, and the IC is mounted according to the vertical movement of the cover. An IC that opens and closes a crimp connection between an IC device mounted on a table and an external circuit disposed below the IC device
A socket, wherein the cover further includes a shaft guide formed by a curved groove, and a laterally elongated groove is formed in the socket body; A supporting member having a connecting portion and a connecting portion formed on the other end side, the supporting shaft integrally provided is supported by fitting and engaging the shaft guide portion of the cover and the long groove of the socket body together. A pressing member having a pressing portion is supported by the connecting member by an integral support shaft, and further, an elastic member such as a spring member that elastically presses in the pressing direction of the pressing member is provided between the pressing member and the connecting member. It is arranged.

【0012】これによって、本発明のソケットは、カバ
ーを押下げることによって連繋部材の支承軸は、カバー
の軸案内部と本体の長溝に共に嵌合係合して移動しなが
ら、係合部がカバーの作動カム面に沿って押されるの
で、連繋部材は支承軸に関して回動もさせられる。従っ
て、連繋部材上に支承された押え部材は、弾性部材によ
って押え方向に弾性偏倚されて連繋部材の連繋部に弾圧
された状態で一体的に回動移動し、ソケット本体のIC
デバイス搭載部は開放する。
Thus, in the socket of the present invention, when the cover is pushed down, the support shaft of the connecting member is fitted and engaged with the shaft guide portion of the cover and the long groove of the main body, and the engagement portion is moved. As it is pushed along the working cam surface of the cover, the linking member is also pivoted about the bearing shaft. Accordingly, the pressing member supported on the connecting member is elastically biased in the pressing direction by the elastic member, and integrally rotates while being elastically pressed by the connecting portion of the connecting member.
The device mounting section is open.

【0013】そこで、ICデバイスをインナーキャリア
に収納するなどして上方開口部から搭載部に装着し、カ
バーの押下げ力を解除しカバーを上方に戻し移動させれ
ば、連繋部材は上記と逆の動きをし、係合部が作動カム
面から開放されると共に支承軸が搭載部方向に移動す
る。従って、押え部材の押え部は、搭載されたICデバ
イスに対して退避していた位置から関与する範囲内に移
動し、最終的にICデバイスの縁部上方から押さえるこ
ととなり、ICデバイスの電極と外部回路との圧着接続
がなされる。
[0013] Therefore, if the IC device is housed in the inner carrier or the like and mounted on the mounting portion from the upper opening, the pressing force of the cover is released, and the cover is returned upward, the connecting member is reversed. , The engaging portion is released from the operation cam surface, and the bearing shaft moves toward the mounting portion. Accordingly, the holding portion of the holding member moves from the position where the holding member is retracted to the range concerned, and finally holds the IC device from above the edge of the IC device. A crimp connection to an external circuit is made.

【0014】又、前記押え部材の前記連繋部材への支承
は、上下方向に長孔・軸嵌合によって支承されるように
しておけば、装着されるICデバイスの異なる厚さに対
応して押え部材が上下動して、押え部は適正に押え作用
を行うことができる。
Further, if the holding member is supported by the connecting member in the vertical direction by fitting a long hole and a shaft, the holding member can be held in accordance with different thicknesses of IC devices to be mounted. The member moves up and down, so that the pressing portion can appropriately perform the pressing operation.

【0015】さらに、ICデバイスの所定のIC搭載台
への装填は、ICデバイスの種々異なる厚さ、大きさに
それぞれ対応したインナーキャリアを予め用意し、各適
合したものに収納して行い、その際、好ましくはICデ
バイスの厚さと同じ内部高さのインナーキャリアに装着
し、ICデバイスの上面がインナーキャリアの収納部高
さと同じになるようにしておけば、前記押え部材の押え
部は、直接ICデバイスのみを押圧することなくインナ
ーキャリアと共に一体的に押圧するので、収納したIC
デバイスに過度の押圧力や押圧量を与えることが全くな
いので、ICデバイス保護に極めて有効である。
Further, the loading of the IC device into a predetermined IC mounting table is performed by preparing in advance inner carriers respectively corresponding to various thicknesses and sizes of the IC device, and storing the inner carriers in respective suitable ones. At this time, preferably, the mounting portion of the pressing member is directly mounted on the inner carrier having the same internal height as the thickness of the IC device so that the upper surface of the IC device is the same as the storage portion height of the inner carrier. Because the IC device is pressed together with the inner carrier without pressing only the IC device, the stored IC
Since no excessive pressing force or amount of pressing is applied to the device, it is extremely effective in protecting IC devices.

【0016】さらに又、前記連繋部材は回転方向には自
由状態に置かれるが、必要により予め押え部材自体、或
いは押え部の荷重をやや大きくしておき、押え方向への
極微小の回転偏倚力が生じるようにしておくか、又は、
連繋部材の支承軸部において係合部の作動カム面方向へ
の回動力を与える極微小のばね偏倚力を与えなどによ
り、押え部材に微小の押え方向の回転力を与えるように
しておく。これにより、連繋部材はカバーの上下動に従
いその作動カム面に沿って回動移動し、押さえ部材の押
え部を装着したICデバイス対し、適正に押圧、開放、
退避させることができる。
Further, the linking member is placed in a free state in the rotating direction. However, if necessary, the load of the pressing member itself or the pressing portion is slightly increased, and an extremely small rotational biasing force in the pressing direction is set. Should occur, or
At the bearing shaft portion of the connecting member, a very small spring biasing force is applied to the pressing member in the direction of the operating cam surface of the engaging portion so as to apply a small rotational force to the pressing member in the pressing direction. With this, the linking member rotates and moves along the operation cam surface according to the vertical movement of the cover, and appropriately presses and releases the IC device on which the holding portion of the holding member is mounted.
Can be evacuated.

【0017】[0017]

【発明の実施の形態】以下、本発明の実施の態様につい
て図面に基づいて説明する。図1は、本発明の一実施形
態におけるICソケットの概略外観斜視図、図2は、同
ソケットのカバーをはずした状態の一部を破断した斜視
図である。ソケット本体1には、カバー2が上下方向に
移動可能に配設され、図示しないコイルばねにより上方
に押し上げられストッパー3により所定の位置関係で係
止されている。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a schematic external perspective view of an IC socket according to an embodiment of the present invention, and FIG. 2 is a partially cutaway perspective view of the IC socket with a cover removed. A cover 2 is disposed on the socket body 1 so as to be movable in the vertical direction, is pushed up by a coil spring (not shown), and is locked by a stopper 3 in a predetermined positional relationship.

【0018】カバー2には、一方の対向する側面左右に
対称的に軸案内部としての曲線状の軸案内溝4が、下方
が開放されて形成されており、四隅には係止部5が設け
られた溝6が形成されている。又、他方の対向する側面
には上部から内方に湾曲して作動カム面7が形成されて
いる。さらに、該作動カム面7の下方部分に一定間隔で
対向して規制部8が形成され、上面には開口9が形成さ
れている。ソケット本体1の側面には、カバー2の軸案
内溝4と関連する位置に、横方向の長溝10が形成さ
れ、中央部は開口してICデバイス又は図6に示すイン
ナーキャリア21の装着部11が形成されている。
The cover 2 is formed with a curved shaft guide groove 4 serving as a shaft guide portion symmetrically on one of the opposite side surfaces left and right, with its lower part being opened, and locking portions 5 at four corners. The provided groove 6 is formed. An operating cam surface 7 is formed on the other opposing side surface so as to curve inward from the top. Further, a regulating portion 8 is formed facing the lower portion of the operation cam surface 7 at a constant interval, and an opening 9 is formed on the upper surface. On the side surface of the socket body 1, a laterally long groove 10 is formed at a position related to the shaft guide groove 4 of the cover 2, and the center portion is opened to mount the IC device or the mounting portion 11 of the inner carrier 21 shown in FIG. Are formed.

【0019】図3は、連繋部材12及び押え部材13を
組み合わせた押えブロックの斜視図であるが、連繋部材
12の上部にはカバー2の作動カム面7と係合する係合
部としての係合シャフト14が配設されており、その両
側外方には突部15が形成されている。又、中間部には
支承軸16が貫通配設され突出した両側端部が、図2に
示されるように本体1の横方向の長溝10及びカバー2
の軸案内溝4に共に嵌合係合されている。又、下端部は
連繋部17によって受面を形成している。
FIG. 3 is a perspective view of a pressing block in which the linking member 12 and the pressing member 13 are combined, and an upper portion of the linking member 12 serves as an engaging portion for engaging with the operating cam surface 7 of the cover 2. A joint shaft 14 is provided, and projections 15 are formed outward on both sides thereof. A support shaft 16 is provided in the middle part and both ends protruding therefrom are provided with a laterally long groove 10 of the main body 1 and a cover 2 as shown in FIG.
Are engaged with each other in the shaft guide groove 4. In addition, the lower end forms a receiving surface by the connecting portion 17.

【0020】押え部材13は、一端側に押え部18を有
し他端側が支承軸19によって連繋部材12の上下方向
の長溝20に嵌合支承され(図4参照)、支承軸19に
対し連繋部材12及び押え部材13間に配設されたばね
21によって左旋力(図3上)が与えられている。
The holding member 13 has a holding portion 18 at one end, and the other end is fitted and supported by a supporting shaft 19 in a vertically long groove 20 of the connecting member 12 (see FIG. 4). A left turning force (upper in FIG. 3) is given by a spring 21 disposed between the member 12 and the pressing member 13.

【0021】図5は、インナーキャリア22を示してお
り、ICデバイスの大きさ、厚さに応じて適合したもの
を使用し、ICデバイスを収納してソケット本体1のI
Cデバイス装着部11に装着する。
FIG. 5 shows the inner carrier 22, which is suitable for the size and thickness of the IC device.
It is mounted on the C device mounting section 11.

【0022】次いで、上述構成の本発明ICソケットの
作用を説明する。本発明のICソケットは、図4に作動
説明用として示すように、カバー2を押し下げる前は同
図右半分の状態にあり、この状態ではカバー2の作動カ
ム面7の最下部は連繋部材12の係合シャフト14とは
まだ接触していない。但し、連繋部材12の上部左右の
突部15は規制部8と接している。従って、押え部材1
8は、ばね21により図上左旋して連繋部17に圧接し
た状態で連繋部材12と一体的になっている。この時、
連繋部材12の支承軸16は、図4において軸案内溝4
及び長溝10の作動範囲のそれぞれ最下部及び中心寄り
部にある。又、押え部材13の支承軸19は、同図上長
溝20の下部にある。
Next, the operation of the IC socket of the present invention having the above configuration will be described. The IC socket of the present invention is in the state of the right half before pushing down the cover 2 as shown in FIG. 4 for explanation of operation. In this state, the lowermost part of the operation cam surface 7 of the cover 2 is connected to the connecting member 12. Has not yet come into contact with the engagement shaft 14 of the head. However, the upper left and right protrusions 15 of the connecting member 12 are in contact with the restricting portion 8. Therefore, the holding member 1
8 is integrated with the linking member 12 in a state where the spring 8 is turned leftward in the figure by a spring 21 and pressed against the linking portion 17. At this time,
The support shaft 16 of the connecting member 12 is connected to the shaft guide groove 4 in FIG.
And at the bottom and near the center of the working range of the slot 10, respectively. The support shaft 19 of the holding member 13 is located below the long groove 20 in FIG.

【0023】次いで、カバー2を手動或いは自動操作で
押し下げれば、図4の左半分に示すように、カバー2の
作動カム面7は押し下げられ、連繋部材12の係合シャ
フト14は、該作動カム面7に沿って作動範囲の最上部
へ移動する。この際同時に、連繋部材12の支承軸16
は、軸案内溝4に案内されると共に長溝10にも案内さ
れ、それぞれそれらの最上部及び中心から最も離反した
位置に移動する。従って、連繋部材12上に支承された
押え部材13も、一体となって移動する。
Next, when the cover 2 is pushed down manually or automatically, as shown in the left half of FIG. 4, the operating cam surface 7 of the cover 2 is pushed down, and the engaging shaft 14 of the connecting member 12 It moves along the cam surface 7 to the top of the working range. At this time, at the same time, the support shaft 16 of the connecting member 12 is
Are guided by the shaft guide groove 4 and also by the long groove 10, and move to the positions farthest from the uppermost portion and the center thereof, respectively. Accordingly, the holding member 13 supported on the linking member 12 also moves integrally.

【0024】そこで、作動カム面7の曲面形状及び軸案
内溝4の案内面形状を適宜に設定しておけば、上記カバ
ー2の押し下げ動作に伴い、連繋部材12の係合シャフ
ト14の動き及び支承軸16の動きが規制されるので、
一体の押え部材13の押え部18が、ICデバイス装着
部11の範囲内から一旦上方に動いた後、その範囲外に
退避移動するように上記カム面7及び溝4を設定してお
く。
If the shape of the curved surface of the operating cam surface 7 and the shape of the guide surface of the shaft guide groove 4 are appropriately set, the movement of the engagement shaft 14 of the connecting member 12 and Since the movement of the bearing shaft 16 is regulated,
The cam surface 7 and the groove 4 are set so that the pressing portion 18 of the integral pressing member 13 once moves upward from within the range of the IC device mounting portion 11 and then retreats outside the range.

【0025】かくして、カバー2の押し下げ状態で、押
え部18がICデバイス装着部11から退避しているの
で、カバー2の開口9からICデバイスをそのまま或い
は図5に示すインナーキャリア22に装填して手動或い
は自動で内部に挿入し、ICデバイス装着部11に装着
した後、カバー2の押圧を解除すれば、カバー2の上昇
と共に連繋部材12等は図4の右半分に示す状態に戻
る。その過程で、押え部材13は上記の退避移動時と逆
の動きをし、押え部18が退避位置から装着されている
ICデバイス及びインナーキャリア22の領域内に入
り、その後降下してICデバイス及びインナーキャリア
22を押さえる。
Since the holding portion 18 is retracted from the IC device mounting portion 11 in the state where the cover 2 is pushed down, the IC device is loaded from the opening 9 of the cover 2 as it is or into the inner carrier 22 shown in FIG. If the cover 2 is manually or automatically inserted into the inside and mounted on the IC device mounting section 11 and then the pressing of the cover 2 is released, the connecting member 12 and the like return to the state shown in the right half of FIG. In the process, the holding member 13 moves in the opposite direction to the above-described evacuation movement, and the holding section 18 enters the area of the IC device and the inner carrier 22 mounted from the evacuation position, and then descends to move the IC device and Hold down the inner carrier 22.

【0026】この際、押え部18による押圧力はばね2
1のみの力なので、ばね21の弾性力をICデバイスの
種類により適宜に設定すれば、適正な押圧力を容易に得
ることができる。尚、装着したICデバイス或いはイン
ナーキャリア22を取り出す際は、上述カバー2の押し
下げ時の作用と同様で、押え部18は一旦、装着したI
Cデバイス或いはインナーキャリア22から上昇して離
れた後、装着領域から退避するので、ICデバイス等に
悪影響を与えない。
At this time, the pressing force of the pressing portion 18 is
Since the force is only 1, an appropriate pressing force can be easily obtained by appropriately setting the elastic force of the spring 21 according to the type of the IC device. When the mounted IC device or the inner carrier 22 is taken out, the pressing portion 18 is once attached to the I
After being lifted away from the C device or the inner carrier 22, the device is retracted from the mounting area, so that there is no adverse effect on the IC device and the like.

【0027】又、押え部18の押え作用時における連繋
部材12の係合シャフト14は、作動カム面7から離間
する可能性もあるが、押え作用時位置においては係合シ
ャフト14の離間を規制する規制部が設けられているの
で、連繋部材12は後方に逃げることなく押え部18の
圧着作用は適正に行われる。又、カバー2には図示しな
い押し上げ用のばね力のみしか作用しておらず、カバー
2の押し下げ時においては、連繋部材12からの力は何
ら作用せず、押し下げ力は小さくて済む。又、装着する
ICデバイス或いはインナーキャリアの厚さが厚い場合
には、押え部材13の支承軸19は長溝20内を移動
し、その差寸法を容易に吸収できると共にICデバイス
に対して垂直に押圧力を与えることが可能になる。
Further, the engaging shaft 14 of the connecting member 12 may be separated from the operating cam surface 7 when the pressing portion 18 presses, but the separation of the engaging shaft 14 is restricted at the pressing position. Since the restricting portion is provided, the press-fitting action of the pressing portion 18 is properly performed without the connecting member 12 escaping backward. Further, only a pushing-up spring force (not shown) acts on the cover 2, and when the cover 2 is pushed down, no force from the linking member 12 acts and the pushing-down force is small. When the thickness of the IC device or the inner carrier to be mounted is large, the support shaft 19 of the holding member 13 moves in the long groove 20 to easily absorb the difference between the length and the vertical direction with respect to the IC device. It becomes possible to apply pressure.

【0028】尚、連繋部材12がその回動作用が不安定
である場合には、必要により予め押え部材13自体、或
いは押え部18部分の荷重をやや大きくしておき、押え
方向への極微小の回転偏倚力が生じるようにしておく
か、又は、連繋部材12の支承軸16部において係合シ
ャフト14の作動カム面7方向への回動力を与える極微
小のばね偏倚力を与えなどにより、押え部材13に微小
の押え方向の回転力を与えるようにしておく。これによ
り、連繋部材12はカバー2の上下動に従いその作動カ
ム面7に沿って回動移動し、押さえ部材13の押え部1
8を装着したICデバイス対し、適正に押圧、開放、退
避させることができる。
If the pivoting action of the linking member 12 is unstable, the load on the pressing member 13 itself or the pressing portion 18 is slightly increased in advance if necessary, so that an extremely small Or a very small spring biasing force is applied at the support shaft 16 of the linking member 12 to apply a rotating force to the working cam surface 7 of the engagement shaft 14. A small rotational force in the pressing direction is applied to the pressing member 13. As a result, the linking member 12 pivotally moves along the operation cam surface 7 according to the vertical movement of the cover 2, and the pressing portion 1 of the pressing member 13.
8 can be properly pressed, opened, and retracted with respect to the IC device to which the IC device 8 is attached.

【0029】[0029]

【発明の効果】本発明によれば、近時の半導体素子の高
密度化、電極の微細化等の傾向に伴う、バーンインテス
ト或いは実装用等のソケットの接触圧の微小化等に対
し、小型で、簡単な構成でありながら、接触圧の微小、
微妙なソケットとして適正に対応できるICソケットと
なし得る。
According to the present invention, miniaturization of the contact pressure of a socket for a burn-in test or mounting, etc., due to the recent trend of high density of semiconductor elements and miniaturization of electrodes, etc. With a simple configuration, the contact pressure is small,
An IC socket that can properly cope with a delicate socket can be provided.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施形態におけるICソケットの概
略外観斜視図である。
FIG. 1 is a schematic external perspective view of an IC socket according to an embodiment of the present invention.

【図2】同上ソケットの一部を破断した斜視図である。FIG. 2 is a perspective view in which a part of the socket is cut away.

【図3】同上ソケットの連繋部材及び押え部材からなる
押えブロックの斜視図である。
FIG. 3 is a perspective view of a holding block including a connecting member and a holding member of the socket.

【図4】右半分は同上ソケットのカバーを開放した状
態、左半分は同カバーを押し下げた状態のそれぞれ断面
を示す作動説明図である。
FIG. 4 is an operation explanatory view showing a cross section in a state where the cover of the socket is opened on the right half and a state where the cover is pushed down on the left half.

【図5】インナーキャリアの一例を示す斜視図である。FIG. 5 is a perspective view showing an example of an inner carrier.

【符号の説明】[Explanation of symbols]

1 ソケット本体 12 連
繋部材 2 カバー 13 押
え部材 3 ストッパー 14 係
合シャフト 4 軸案内溝 15 突
起 5 係止部 16 支
承軸 6 溝 17 連
繋部 7 作動カム面 18 押
え部 8 規制部 19 支
承軸 9 開口 20 長
溝 10 長溝 21 ば
ね 11 装着部 22 イ
ンナーキャリア
DESCRIPTION OF SYMBOLS 1 Socket main body 12 Connecting member 2 Cover 13 Pressing member 3 Stopper 14 Engagement shaft 4 Axis guide groove 15 Projection 5 Locking part 16 Support shaft 6 Groove 17 Connecting part 7 Working cam surface 18 Pressing part 8 Restriction part 19 Support shaft 9 Opening Reference Signs List 20 long groove 10 long groove 21 spring 11 mounting part 22 inner carrier

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 装着されたICデバイスと外部回路との
圧着接続がなされるようにしたソケット本体に対し、作
動カム面を有し上下動可能に装架した上部開口のカバー
を設け、該カバーの上下動に従って前記ICデバイスの
外部回路との圧着接続を開閉するようにしたICソケッ
トにおいて、前記カバーには軸案内部及び前記ソケット
本体には長溝がそれぞれさらに設けられ、一端側に前記
作動カム面と係合する係合部を有し他端側に連繋部を有
すると共に支承軸が形成されて該支承軸が前記カバーの
軸案内部及び前記本体の長溝に共に嵌合支承された連繋
部材と、押え部を有し該押え部を押え方向に弾圧する弾
性部材が前記連繋部材との間に配されて前記連繋部材に
支承軸で支承された押え部材とが配設されて成り、カバ
ーの下方動作で連繋部材の支承軸は軸案内部と共に長溝
を移動し、押え部材の押え部が装着されたICデバイス
の押圧作用を解除した後ICデバイス外に退避するよう
にしたことを特徴とするICソケット。
1. A cover having an upper opening having an operating cam surface and being mounted vertically movably on a socket body in which a mounted IC device and an external circuit are connected by crimping. The cover is further provided with a shaft guide portion and a long groove in the socket body, respectively, and the operating cam is provided on one end side of the IC socket. A connecting member having an engaging portion for engaging with the surface, a connecting portion on the other end side, a supporting shaft formed, and the supporting shaft fitted and supported by the shaft guide portion of the cover and the long groove of the main body; An elastic member having a pressing portion and pressing the pressing portion in the pressing direction is disposed between the connecting member and a pressing member supported by a supporting shaft on the connecting member; Linked by downward movement of An IC socket characterized in that a supporting shaft of a member moves in a long groove together with a shaft guide portion, and the pressing portion of the pressing member is released from the IC device after releasing the pressing action of the mounted IC device.
【請求項2】 前記押え部材の前記連繋部材への支承
は、支承軸が上下方向の長溝と嵌合して行われるように
したことを特徴とする請求項1記載のICソケット。
2. The IC socket according to claim 1, wherein the support of the holding member to the connecting member is performed by fitting a support shaft into an elongated groove in a vertical direction.
【請求項3】 ICデバイスの前記ICソケット本体へ
の装着は、前記ソケット本体の所定部に装着されるイン
ナーキャリア内にICデバイスが装着されて前記押え部
材の押え部により押圧固定されるようにしたことを特徴
とする請求項1又は請求項2記載のICソケット。
3. The mounting of the IC device on the IC socket main body is such that the IC device is mounted in an inner carrier mounted on a predetermined portion of the socket main body and is pressed and fixed by a pressing portion of the pressing member. The IC socket according to claim 1 or 2, wherein the IC socket is formed.
【請求項4】 前記カバーには、少なくとも該カバーの
下方移動の最終段階で前記連繋部材の係合部が該カバー
の作動カム面に沿うように規制する規制部が設けられて
いることを特徴とする請求項1、2又は3記載のICソ
ケット。
4. The cover is provided with a restricting portion for restricting an engaging portion of the connecting member to follow an operating cam surface of the cover at least at a final stage of the downward movement of the cover. The IC socket according to claim 1, 2, or 3.
【請求項5】 前記連繋部材には、該連繋部材の係合部
が前記カバーの作動カム面と係合する方向の偏倚力が与
えられていることを特徴とする請求項1、2又は3記載
のICソケット。
5. The connecting member is provided with a biasing force in a direction in which an engaging portion of the connecting member is engaged with an operating cam surface of the cover. The described IC socket.
JP2000251632A 2000-07-19 2000-07-19 Ic socket Pending JP2002043007A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000251632A JP2002043007A (en) 2000-07-19 2000-07-19 Ic socket

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000251632A JP2002043007A (en) 2000-07-19 2000-07-19 Ic socket

Publications (1)

Publication Number Publication Date
JP2002043007A true JP2002043007A (en) 2002-02-08

Family

ID=18741001

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000251632A Pending JP2002043007A (en) 2000-07-19 2000-07-19 Ic socket

Country Status (1)

Country Link
JP (1) JP2002043007A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008311073A (en) * 2007-06-14 2008-12-25 Alps Electric Co Ltd Socket for electronic component
TWI419425B (en) * 2009-07-14 2013-12-11 Yamaichi Electronics Co Ltd Semiconductor device socket
KR20160119538A (en) * 2015-04-06 2016-10-14 (주)마이크로컨텍솔루션 Test socket
CN111417857A (en) * 2018-10-10 2020-07-14 黄东源 Socket device for semiconductor device test
KR102219472B1 (en) * 2020-04-16 2021-02-24 디플러스(주) Socket for testing a product
KR20220043477A (en) * 2020-09-29 2022-04-05 포톤데이즈(주) A Test Device for a Laser Diode of an Optical Communication

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008311073A (en) * 2007-06-14 2008-12-25 Alps Electric Co Ltd Socket for electronic component
TWI419425B (en) * 2009-07-14 2013-12-11 Yamaichi Electronics Co Ltd Semiconductor device socket
KR20160119538A (en) * 2015-04-06 2016-10-14 (주)마이크로컨텍솔루션 Test socket
KR101677708B1 (en) 2015-04-06 2016-11-21 (주)마이크로컨텍솔루션 Test socket
CN111417857A (en) * 2018-10-10 2020-07-14 黄东源 Socket device for semiconductor device test
CN111417857B (en) * 2018-10-10 2022-03-22 黄东源 Socket device for semiconductor device test
KR102219472B1 (en) * 2020-04-16 2021-02-24 디플러스(주) Socket for testing a product
KR20220043477A (en) * 2020-09-29 2022-04-05 포톤데이즈(주) A Test Device for a Laser Diode of an Optical Communication
KR102440328B1 (en) 2020-09-29 2022-09-05 포톤데이즈(주) A Test Device for a Laser Diode of an Optical Communication

Similar Documents

Publication Publication Date Title
JP4721582B2 (en) socket
US5518410A (en) Contact pin device for IC sockets
JP3742742B2 (en) Socket for electrical parts
JP3270716B2 (en) Socket and mounting method of semiconductor device
US6749443B2 (en) Socket for mounting an electronic device
US7214084B2 (en) Socket for electrical parts
JP2003217774A (en) Contact pin and ic socket
US6776641B2 (en) Socket for electrical parts
JP2006294308A (en) Socket for electrical component
US20010053628A1 (en) Socket for electrical parts
JP2007109607A (en) Socket for electronic device
US7235991B2 (en) Insert having independently movable latch mechanism for semiconductor package
US7134892B2 (en) Socket for electrical parts
JP2002043007A (en) Ic socket
US20020187665A1 (en) IC socket
US6428337B2 (en) Socket for electrical parts
JPH09245920A (en) Ic pressing mechanism of ic socket
US6767236B2 (en) Socket for electrical parts
US5486771A (en) Burn-in socket testing apparatus
KR100577756B1 (en) Carrier module for semiconductor test handler
KR100502052B1 (en) Carrier Module
US20060094279A1 (en) Socket for electrical parts
JP2003303655A (en) Socket for electric component
JPH11214105A (en) Ic socket
KR100570201B1 (en) Carrier Module for Semiconductor Test Handler