JP2002032035A5 - - Google Patents
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- JP2002032035A5 JP2002032035A5 JP2001140333A JP2001140333A JP2002032035A5 JP 2002032035 A5 JP2002032035 A5 JP 2002032035A5 JP 2001140333 A JP2001140333 A JP 2001140333A JP 2001140333 A JP2001140333 A JP 2001140333A JP 2002032035 A5 JP2002032035 A5 JP 2002032035A5
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001140333A JP5041627B2 (en) | 2000-05-12 | 2001-05-10 | EL display device, electronic equipment |
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000-140751 | 2000-05-12 | ||
| JP2000140751 | 2000-05-12 | ||
| JP2000140751 | 2000-05-12 | ||
| JP2001140333A JP5041627B2 (en) | 2000-05-12 | 2001-05-10 | EL display device, electronic equipment |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011155440A Division JP5298167B2 (en) | 2000-05-12 | 2011-07-14 | EL display device |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2002032035A JP2002032035A (en) | 2002-01-31 |
| JP2002032035A5 true JP2002032035A5 (en) | 2008-05-22 |
| JP5041627B2 JP5041627B2 (en) | 2012-10-03 |
Family
ID=26591814
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2001140333A Expired - Lifetime JP5041627B2 (en) | 2000-05-12 | 2001-05-10 | EL display device, electronic equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP5041627B2 (en) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6762735B2 (en) * | 2000-05-12 | 2004-07-13 | Semiconductor Energy Laboratory Co., Ltd. | Electro luminescence display device and method of testing the same |
| JP3437152B2 (en) | 2000-07-28 | 2003-08-18 | ウインテスト株式会社 | Apparatus and method for evaluating organic EL display |
| JP3701924B2 (en) | 2002-03-29 | 2005-10-05 | インターナショナル・ビジネス・マシーンズ・コーポレーション | EL array substrate inspection method and inspection apparatus |
| JP4653775B2 (en) * | 2002-04-26 | 2011-03-16 | 東芝モバイルディスプレイ株式会社 | Inspection method for EL display device |
| JP3527726B2 (en) | 2002-05-21 | 2004-05-17 | ウインテスト株式会社 | Inspection method and inspection device for active matrix substrate |
| JP4112300B2 (en) | 2002-07-26 | 2008-07-02 | 株式会社半導体エネルギー研究所 | Electrical inspection method and manufacturing method of semiconductor display device |
| JP2004294457A (en) * | 2002-12-16 | 2004-10-21 | Agilent Technologies Japan Ltd | Active matrix display and its testing method |
| US7205986B2 (en) | 2002-12-18 | 2007-04-17 | Semiconductor Energy Laboratory Co., Ltd. | Image display device and testing method of the same |
| JP4624109B2 (en) | 2003-03-25 | 2011-02-02 | 株式会社半導体エネルギー研究所 | Semiconductor device inspection circuit |
| JP3628014B1 (en) | 2003-09-19 | 2005-03-09 | ウインテスト株式会社 | Display device and inspection method and device for active matrix substrate used therefor |
| US7518602B2 (en) | 2004-12-06 | 2009-04-14 | Semiconductor Energy Laboratory Co., Ltd. | Test circuit and display device having the same |
| JP4974517B2 (en) * | 2004-12-06 | 2012-07-11 | 株式会社半導体エネルギー研究所 | Inspection circuit |
| KR101358697B1 (en) | 2005-12-02 | 2014-02-07 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | Semiconductor device, display device, and electronic device |
| JP2008052111A (en) * | 2006-08-25 | 2008-03-06 | Mitsubishi Electric Corp | Tft array substrate, inspection method for same, and display device |
| JP5224729B2 (en) * | 2007-06-14 | 2013-07-03 | 株式会社ジャパンディスプレイウェスト | Display device and pixel driving method |
| JP5218269B2 (en) | 2009-05-13 | 2013-06-26 | ソニー株式会社 | Display device and drive control method |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63246782A (en) * | 1987-04-01 | 1988-10-13 | 松下電器産業株式会社 | Defect detection of liquid crystal display device |
| JP2728748B2 (en) * | 1989-10-30 | 1998-03-18 | 松下電子工業株式会社 | Image display device and inspection method thereof |
| US5684365A (en) * | 1994-12-14 | 1997-11-04 | Eastman Kodak Company | TFT-el display panel using organic electroluminescent media |
| JPH1092201A (en) * | 1996-09-17 | 1998-04-10 | Toshiba Corp | Light emitting device, light emitting device driving method, and light emitting device array |
| JP3413043B2 (en) * | 1997-02-13 | 2003-06-03 | 株式会社東芝 | Liquid crystal display |
| JPH11219133A (en) * | 1998-02-02 | 1999-08-10 | Tdk Corp | Image display unit |
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2001
- 2001-05-10 JP JP2001140333A patent/JP5041627B2/en not_active Expired - Lifetime