JP2001526447A - 飛行時間型質量分析計及び線形イオントラップを含む装置におけるイオン分析法 - Google Patents

飛行時間型質量分析計及び線形イオントラップを含む装置におけるイオン分析法

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Publication number
JP2001526447A
JP2001526447A JP2000524809A JP2000524809A JP2001526447A JP 2001526447 A JP2001526447 A JP 2001526447A JP 2000524809 A JP2000524809 A JP 2000524809A JP 2000524809 A JP2000524809 A JP 2000524809A JP 2001526447 A JP2001526447 A JP 2001526447A
Authority
JP
Japan
Prior art keywords
ions
linear
quadrupole
fragment
exciting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2000524809A
Other languages
English (en)
Japanese (ja)
Inventor
ジェイ ダグラス，ドナルド
エム キャンプベル，ジェニファー
エイ コリングズ，ブルース
Original Assignee
ユニヴァーシティー オブ ブリティッシュ コロンビア
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ユニヴァーシティー オブ ブリティッシュ コロンビア filed Critical ユニヴァーシティー オブ ブリティッシュ コロンビア
Publication of JP2001526447A publication Critical patent/JP2001526447A/ja
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
JP2000524809A 1997-12-05 1998-12-03 飛行時間型質量分析計及び線形イオントラップを含む装置におけるイオン分析法 Withdrawn JP2001526447A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US6757097P 1997-12-05 1997-12-05
US60/067,570 1997-12-05
PCT/CA1998/001106 WO1999030350A1 (fr) 1997-12-05 1998-12-03 Procede d'analyse d'ions dans un appareil comprenant un spectrometre de masse a temps de vol et un piege a ions lineaire

Publications (1)

Publication Number Publication Date
JP2001526447A true JP2001526447A (ja) 2001-12-18

Family

ID=22076906

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000524809A Withdrawn JP2001526447A (ja) 1997-12-05 1998-12-03 飛行時間型質量分析計及び線形イオントラップを含む装置におけるイオン分析法

Country Status (6)

Country Link
EP (1) EP1051731B1 (fr)
JP (1) JP2001526447A (fr)
AU (1) AU1329899A (fr)
CA (1) CA2312806A1 (fr)
DE (1) DE69806415T2 (fr)
WO (1) WO1999030350A1 (fr)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003507874A (ja) * 1999-08-26 2003-02-25 ユニバーシティ オブ ニュー ハンプシャー 多段型の質量分析計
JP2003512702A (ja) * 1999-10-19 2003-04-02 シマヅ リサーチ ラボラトリー（ヨーロッパ）リミティド 四重極イオントラップ装置を駆動する方法と装置
JP2005044594A (ja) * 2003-07-28 2005-02-17 Hitachi High-Technologies Corp 質量分析計
JP2006073390A (ja) * 2004-09-03 2006-03-16 Hitachi High-Technologies Corp 質量分析装置
JP2008257982A (ja) * 2007-04-04 2008-10-23 Hitachi High-Technologies Corp 質量分析装置
JP2009146913A (ja) * 2009-03-30 2009-07-02 Hitachi High-Technologies Corp 質量分析計

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE39099E1 (en) * 1998-01-23 2006-05-23 University Of Manitoba Spectrometer provided with pulsed ion source and transmission device to damp ion motion and method of use
CA2227806C (fr) * 1998-01-23 2006-07-18 University Of Manitoba Spectrometre muni d'une source d'ions pulsee et dispositif de transmission pour amortir la vitesse des ions, et methode d'utilisation
US6331702B1 (en) 1999-01-25 2001-12-18 University Of Manitoba Spectrometer provided with pulsed ion source and transmission device to damp ion motion and method of use
WO1999062101A1 (fr) * 1998-05-29 1999-12-02 Analytica Of Branford, Inc. Spectrometrie de masse avec guides d'ions multipolaires
US6621077B1 (en) 1998-08-05 2003-09-16 National Research Council Canada Apparatus and method for atmospheric pressure-3-dimensional ion trapping
CA2255188C (fr) 1998-12-02 2008-11-18 University Of British Columbia Methode et appareil pour la spectrometrie de masse en plusieurs etapes
DE60114394T2 (de) 2000-03-14 2006-07-06 National Research Council Canada, Ottawa FAIMS Vorrichtung und Verfahren mit Ionisierungsquelle auf Laserbasis
US6545268B1 (en) * 2000-04-10 2003-04-08 Perseptive Biosystems Preparation of ion pulse for time-of-flight and for tandem time-of-flight mass analysis
US6720554B2 (en) 2000-07-21 2004-04-13 Mds Inc. Triple quadrupole mass spectrometer with capability to perform multiple mass analysis steps
US7060972B2 (en) 2000-07-21 2006-06-13 Mds Inc. Triple quadrupole mass spectrometer with capability to perform multiple mass analysis steps
GB2404784B (en) 2001-03-23 2005-06-22 Thermo Finnigan Llc Mass spectrometry method and apparatus
DE60238953D1 (de) 2001-11-22 2011-02-24 Micromass Ltd Massenspektrometer
AU2003220320A1 (en) * 2002-03-21 2003-10-08 Thermo Finnigan Llc Ionization apparatus and method for mass spectrometer system
WO2004040612A2 (fr) * 2002-04-10 2004-05-13 Johns Hopkins University Detecteur de spectrometre de masse d'agent chimique/biologique combine
CA2502445C (fr) 2002-09-25 2011-08-23 Ionalytics Corporation Appareil de spectrometrie a mobilite ionique de formes d'onde a champ asymetrique eleve et procede de separation ionique
GB2394290A (en) * 2002-10-14 2004-04-21 Boris Zachar Gorbunov Method and apparatus for counting ions in a sample
US7385187B2 (en) 2003-06-21 2008-06-10 Leco Corporation Multi-reflecting time-of-flight mass spectrometer and method of use
GB0404285D0 (en) 2004-02-26 2004-03-31 Shimadzu Res Lab Europe Ltd A tandem ion-trap time-of flight mass spectrometer
GB0511083D0 (en) 2005-05-31 2005-07-06 Thermo Finnigan Llc Multiple ion injection in mass spectrometry
US7582864B2 (en) 2005-12-22 2009-09-01 Leco Corporation Linear ion trap with an imbalanced radio frequency field
CN103903955B (zh) * 2014-03-21 2017-01-25 广州禾信分析仪器有限公司 大气压离子源飞行时间质谱仪的离子富集引入装置与方法
CN106711009A (zh) * 2017-02-23 2017-05-24 昆山禾信质谱技术有限公司 高离子引出效率的离子阱飞行时间质谱仪及其实现方法
CN109752444B (zh) * 2018-12-31 2022-04-05 聚光科技(杭州)股份有限公司 离子阱质谱仪的质谱测定方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5179278A (en) * 1991-08-23 1993-01-12 Mds Health Group Limited Multipole inlet system for ion traps
US5689111A (en) * 1995-08-10 1997-11-18 Analytica Of Branford, Inc. Ion storage time-of-flight mass spectrometer
US5420425A (en) * 1994-05-27 1995-05-30 Finnigan Corporation Ion trap mass spectrometer system and method
DE19517507C1 (de) * 1995-05-12 1996-08-08 Bruker Franzen Analytik Gmbh Hochfrequenz-Ionenleitsystem
US5576540A (en) * 1995-08-11 1996-11-19 Mds Health Group Limited Mass spectrometer with radial ejection
WO1997007530A1 (fr) * 1995-08-11 1997-02-27 Mds Health Group Limited Spectrometre a champ axial

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003507874A (ja) * 1999-08-26 2003-02-25 ユニバーシティ オブ ニュー ハンプシャー 多段型の質量分析計
JP2003512702A (ja) * 1999-10-19 2003-04-02 シマヅ リサーチ ラボラトリー（ヨーロッパ）リミティド 四重極イオントラップ装置を駆動する方法と装置
JP4668496B2 (ja) * 1999-10-19 2011-04-13 シマヅ リサーチ ラボラトリー（ヨーロッパ）リミティド 四重極イオントラップ装置を駆動する方法と装置
JP2005044594A (ja) * 2003-07-28 2005-02-17 Hitachi High-Technologies Corp 質量分析計
US6967323B2 (en) 2003-07-28 2005-11-22 Hitachi High-Technologies Corporation Mass spectrometer
JP4690641B2 (ja) * 2003-07-28 2011-06-01 株式会社日立ハイテクノロジーズ 質量分析計
JP2006073390A (ja) * 2004-09-03 2006-03-16 Hitachi High-Technologies Corp 質量分析装置
JP4643206B2 (ja) * 2004-09-03 2011-03-02 株式会社日立ハイテクノロジーズ 質量分析装置
JP2008257982A (ja) * 2007-04-04 2008-10-23 Hitachi High-Technologies Corp 質量分析装置
US8129674B2 (en) 2007-04-04 2012-03-06 Hitachi High-Technologies Corporation Mass spectrometric analyzer
JP2009146913A (ja) * 2009-03-30 2009-07-02 Hitachi High-Technologies Corp 質量分析計

Also Published As

Publication number Publication date
EP1051731A1 (fr) 2000-11-15
CA2312806A1 (fr) 1999-06-17
EP1051731B1 (fr) 2002-07-03
DE69806415D1 (de) 2002-08-08
DE69806415T2 (de) 2003-02-20
AU1329899A (en) 1999-06-28
WO1999030350A1 (fr) 1999-06-17

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Legal Events

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A300 Withdrawal of application because of no request for examination

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Effective date: 20060207