JP2001518654A - 複数の出力をプログラム可能な基準電圧源 - Google Patents

複数の出力をプログラム可能な基準電圧源

Info

Publication number
JP2001518654A
JP2001518654A JP2000514179A JP2000514179A JP2001518654A JP 2001518654 A JP2001518654 A JP 2001518654A JP 2000514179 A JP2000514179 A JP 2000514179A JP 2000514179 A JP2000514179 A JP 2000514179A JP 2001518654 A JP2001518654 A JP 2001518654A
Authority
JP
Japan
Prior art keywords
charging current
reference voltage
sample
circuit
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000514179A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001518654A5 (enExample
Inventor
ジレット・ギャリー・シー
Original Assignee
クリーダンス システムズ コーポレイション
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by クリーダンス システムズ コーポレイション filed Critical クリーダンス システムズ コーポレイション
Publication of JP2001518654A publication Critical patent/JP2001518654A/ja
Publication of JP2001518654A5 publication Critical patent/JP2001518654A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current 
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current 
    • G05F1/46—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • General Engineering & Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Control Of Voltage And Current In General (AREA)
JP2000514179A 1997-09-29 1998-09-28 複数の出力をプログラム可能な基準電圧源 Pending JP2001518654A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/939,572 US5905403A (en) 1997-09-29 1997-09-29 Multiple output programmable reference voltage source
US08/939,572 1997-09-29
PCT/US1998/020378 WO1999017179A1 (en) 1997-09-29 1998-09-28 Multiple output programmable reference voltage source

Publications (2)

Publication Number Publication Date
JP2001518654A true JP2001518654A (ja) 2001-10-16
JP2001518654A5 JP2001518654A5 (enExample) 2006-01-05

Family

ID=25473395

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000514179A Pending JP2001518654A (ja) 1997-09-29 1998-09-28 複数の出力をプログラム可能な基準電圧源

Country Status (5)

Country Link
US (1) US5905403A (enExample)
EP (1) EP1025476A4 (enExample)
JP (1) JP2001518654A (enExample)
KR (1) KR100636864B1 (enExample)
WO (1) WO1999017179A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015032209A (ja) * 2013-08-05 2015-02-16 日置電機株式会社 定電流発生回路、定電流発生装置、および定電流発生方法、並びに、抵抗測定装置、および、抵抗測定方法

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6282682B1 (en) 1999-02-05 2001-08-28 Teradyne, Inc. Automatic test equipment using sigma delta modulation to create reference levels
US6374379B1 (en) 1999-02-05 2002-04-16 Teradyne, Inc. Low-cost configuration for monitoring and controlling parametric measurement units in automatic test equipment
US6449669B1 (en) * 1999-08-30 2002-09-10 Intel Corporation Method and apparatus for providing bimodal voltage references for differential signaling
US6321282B1 (en) 1999-10-19 2001-11-20 Rambus Inc. Apparatus and method for topography dependent signaling
US6577179B2 (en) * 1999-11-15 2003-06-10 Intel Corporation Dynamic line termination with self-adjusting impedance
US6766484B2 (en) * 2002-10-15 2004-07-20 Sun Microsystems, Inc. Method and apparatus for fully characterizing propagation delay through an n-input circuit
KR100546327B1 (ko) * 2003-06-03 2006-01-26 삼성전자주식회사 피드백 제어 시스템 및 방법
CN101739995B (zh) * 2008-11-06 2012-07-18 瑞昱半导体股份有限公司 脚位共用的模拟前端处理装置及其脚位共用方法
US8990592B2 (en) * 2012-01-25 2015-03-24 Smsc Holdings S.A.R.L. Overcoming limited common-mode range for USB systems
KR102430386B1 (ko) * 2015-12-31 2022-08-09 엘지디스플레이 주식회사 유기발광표시장치, 데이터 드라이버 및 샘플 홀드 회로
CN119597092A (zh) * 2024-12-05 2025-03-11 北京芯算科技有限公司 一种光芯片高精度电压源矩阵自校正方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5170158A (en) * 1989-06-30 1992-12-08 Kabushiki Kaisha Toshiba Display apparatus
US5510748A (en) * 1994-01-18 1996-04-23 Vivid Semiconductor, Inc. Integrated circuit having different power supplies for increased output voltage range while retaining small device geometries
US5694063A (en) * 1994-08-11 1997-12-02 Ltx Corporation High speed IDDQ monitor circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015032209A (ja) * 2013-08-05 2015-02-16 日置電機株式会社 定電流発生回路、定電流発生装置、および定電流発生方法、並びに、抵抗測定装置、および、抵抗測定方法

Also Published As

Publication number Publication date
KR100636864B1 (ko) 2006-10-19
EP1025476A1 (en) 2000-08-09
WO1999017179A1 (en) 1999-04-08
EP1025476A4 (en) 2005-07-13
US5905403A (en) 1999-05-18
KR20010024327A (ko) 2001-03-26

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