JP2001513452A - 連続的に変化し得る平坦化及び研磨パッドシステム - Google Patents
連続的に変化し得る平坦化及び研磨パッドシステムInfo
- Publication number
- JP2001513452A JP2001513452A JP2000507089A JP2000507089A JP2001513452A JP 2001513452 A JP2001513452 A JP 2001513452A JP 2000507089 A JP2000507089 A JP 2000507089A JP 2000507089 A JP2000507089 A JP 2000507089A JP 2001513452 A JP2001513452 A JP 2001513452A
- Authority
- JP
- Japan
- Prior art keywords
- pad
- layers
- polishing
- changing
- pad system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/22—Lapping pads for working plane surfaces characterised by a multi-layered structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/16—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the load
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/02—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
- B24D3/20—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
- B24D3/22—Rubbers synthetic or natural
- B24D3/26—Rubbers synthetic or natural for porous or cellular structure
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US5490797P | 1997-08-06 | 1997-08-06 | |
| US60/054,907 | 1997-08-06 | ||
| PCT/US1998/016266 WO1999007518A1 (en) | 1997-08-06 | 1998-08-05 | Continuously variable planarization and polishing pad system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2001513452A true JP2001513452A (ja) | 2001-09-04 |
| JP2001513452A5 JP2001513452A5 (https=) | 2006-01-05 |
Family
ID=21994296
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000507089A Pending JP2001513452A (ja) | 1997-08-06 | 1998-08-05 | 連続的に変化し得る平坦化及び研磨パッドシステム |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP2001513452A (https=) |
| WO (1) | WO1999007518A1 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004511083A (ja) * | 2000-06-30 | 2004-04-08 | ロデール ホールディングス インコーポレイテッド | 研磨パッド用ベースパッド |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6093085A (en) * | 1998-09-08 | 2000-07-25 | Advanced Micro Devices, Inc. | Apparatuses and methods for polishing semiconductor wafers |
| US6390890B1 (en) | 1999-02-06 | 2002-05-21 | Charles J Molnar | Finishing semiconductor wafers with a fixed abrasive finishing element |
| US6641463B1 (en) | 1999-02-06 | 2003-11-04 | Beaver Creek Concepts Inc | Finishing components and elements |
| US6746311B1 (en) * | 2000-01-24 | 2004-06-08 | 3M Innovative Properties Company | Polishing pad with release layer |
| US6962521B2 (en) | 2000-07-10 | 2005-11-08 | Shin-Etsu Handotai Co., Ltd. | Edge polished wafer, polishing cloth for edge polishing, and apparatus and method for edge polishing |
| US20220048156A1 (en) * | 2020-08-14 | 2022-02-17 | Steven Anneker | Polishing pad assembly |
| KR102594068B1 (ko) * | 2021-10-12 | 2023-10-24 | 에스케이엔펄스 주식회사 | 연마패드 및 이를 이용한 반도체 소자의 제조방법 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04201181A (ja) * | 1990-11-30 | 1992-07-22 | Ichikawa Woolen Textile Co Ltd | 研磨用フェルト |
| JPH0963995A (ja) * | 1995-08-28 | 1997-03-07 | Hitachi Ltd | 研磨装置およびそれを用いた研磨方法 |
| JPH09115862A (ja) * | 1995-10-20 | 1997-05-02 | Hitachi Ltd | 研磨工具と、それを用いた研磨方法および研磨装置 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4220491A (en) * | 1978-10-19 | 1980-09-02 | Ppg Industries, Inc. | Method for forming an accurately assembled laminate utilizing a vacuum holding press |
| US5081421A (en) * | 1990-05-01 | 1992-01-14 | At&T Bell Laboratories | In situ monitoring technique and apparatus for chemical/mechanical planarization endpoint detection |
| US5196353A (en) * | 1992-01-03 | 1993-03-23 | Micron Technology, Inc. | Method for controlling a semiconductor (CMP) process by measuring a surface temperature and developing a thermal image of the wafer |
| US5310455A (en) * | 1992-07-10 | 1994-05-10 | Lsi Logic Corporation | Techniques for assembling polishing pads for chemi-mechanical polishing of silicon wafers |
| US5551986A (en) * | 1995-02-15 | 1996-09-03 | Taxas Instruments Incorporated | Mechanical scrubbing for particle removal |
| US5665656A (en) * | 1995-05-17 | 1997-09-09 | National Semiconductor Corporation | Method and apparatus for polishing a semiconductor substrate wafer |
-
1998
- 1998-08-05 JP JP2000507089A patent/JP2001513452A/ja active Pending
- 1998-08-05 WO PCT/US1998/016266 patent/WO1999007518A1/en not_active Ceased
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04201181A (ja) * | 1990-11-30 | 1992-07-22 | Ichikawa Woolen Textile Co Ltd | 研磨用フェルト |
| JPH0963995A (ja) * | 1995-08-28 | 1997-03-07 | Hitachi Ltd | 研磨装置およびそれを用いた研磨方法 |
| JPH09115862A (ja) * | 1995-10-20 | 1997-05-02 | Hitachi Ltd | 研磨工具と、それを用いた研磨方法および研磨装置 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004511083A (ja) * | 2000-06-30 | 2004-04-08 | ロデール ホールディングス インコーポレイテッド | 研磨パッド用ベースパッド |
| JP4916638B2 (ja) * | 2000-06-30 | 2012-04-18 | ローム アンド ハース エレクトロニック マテリアルズ シーエムピー ホウルディングス インコーポレイテッド | 研磨パッド用ベースパッド |
Also Published As
| Publication number | Publication date |
|---|---|
| WO1999007518A1 (en) | 1999-02-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A524 | Written submission of copy of amendment under article 19 pct |
Free format text: JAPANESE INTERMEDIATE CODE: A524 Effective date: 20050801 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20050801 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20070807 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20080108 |