JP2001502423A5 - - Google Patents
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- Publication number
- JP2001502423A5 JP2001502423A5 JP1998517958A JP51795898A JP2001502423A5 JP 2001502423 A5 JP2001502423 A5 JP 2001502423A5 JP 1998517958 A JP1998517958 A JP 1998517958A JP 51795898 A JP51795898 A JP 51795898A JP 2001502423 A5 JP2001502423 A5 JP 2001502423A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Description
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19642680.4 | 1996-10-16 | ||
DE19642680 | 1996-10-16 | ||
PCT/EP1997/005211 WO1998016802A1 (de) | 1996-10-16 | 1997-09-23 | Optische positionsmesseinrichtung |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2001502423A JP2001502423A (ja) | 2001-02-20 |
JP2001502423A5 true JP2001502423A5 (ja) | 2005-05-12 |
JP3999274B2 JP3999274B2 (ja) | 2007-10-31 |
Family
ID=7808916
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP51795898A Expired - Fee Related JP3999274B2 (ja) | 1996-10-16 | 1997-09-23 | 光学位置測定装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US6151128A (ja) |
EP (1) | EP0932819B1 (ja) |
JP (1) | JP3999274B2 (ja) |
AT (1) | ATE212714T1 (ja) |
DE (2) | DE19741848A1 (ja) |
WO (1) | WO1998016802A1 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10333772A1 (de) * | 2002-08-07 | 2004-02-26 | Dr. Johannes Heidenhain Gmbh | Interferenzielle Positionsmesseinrichtung |
US9212990B1 (en) | 2011-12-06 | 2015-12-15 | Zybertec Llc | System and methods for molecular detection using intracavity laser absorption spectroscopy |
JP6705649B2 (ja) * | 2015-12-22 | 2020-06-03 | 株式会社ミツトヨ | エンコーダ |
JP6664211B2 (ja) * | 2015-12-22 | 2020-03-13 | 株式会社ミツトヨ | エンコーダ |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3239108A1 (de) * | 1982-10-22 | 1984-04-26 | Dr. Johannes Heidenhain Gmbh, 8225 Traunreut | Positionsmessverfahren und einrichtungen zur durchfuehrung des verfahrens |
GB8413955D0 (en) * | 1984-05-31 | 1984-07-04 | Pa Consulting Services | Displacement measuring apparatus |
DE3541199C1 (de) * | 1985-11-21 | 1987-06-25 | Heidenhain Gmbh Dr Johannes | Lichtelektrische Positionsmesseinrichtung |
US5283434A (en) * | 1991-12-20 | 1994-02-01 | Canon Kabushiki Kaisha | Displacement detecting device with integral optics |
JP3005131B2 (ja) * | 1992-12-28 | 2000-01-31 | キヤノン株式会社 | 変位検出装置 |
DE4316221C2 (de) * | 1993-05-14 | 1995-11-23 | Heidenhain Gmbh Dr Johannes | Positionsmeßeinrichtung |
JP3196459B2 (ja) * | 1993-10-29 | 2001-08-06 | キヤノン株式会社 | ロータリーエンコーダ |
EP0662603B1 (de) * | 1993-12-08 | 1997-03-12 | Dr. Johannes Heidenhain GmbH | Längenmesssystem |
JP3513251B2 (ja) * | 1994-03-14 | 2004-03-31 | キヤノン株式会社 | 光学式変位センサ |
DE19507613C2 (de) * | 1995-03-04 | 1997-01-23 | Heidenhain Gmbh Dr Johannes | Längen- oder Winkelmeßeinrichtung |
DE19521295C2 (de) * | 1995-06-10 | 2000-07-13 | Heidenhain Gmbh Dr Johannes | Lichtelektrische Positionsmeßeinrichtung |
EP0750179B1 (de) * | 1995-06-22 | 2000-04-26 | Dr. Johannes Heidenhain GmbH | Positionsmesseinrichtung |
-
1997
- 1997-09-23 WO PCT/EP1997/005211 patent/WO1998016802A1/de active IP Right Grant
- 1997-09-23 DE DE19741848A patent/DE19741848A1/de not_active Withdrawn
- 1997-09-23 US US09/242,705 patent/US6151128A/en not_active Expired - Fee Related
- 1997-09-23 DE DE59706261T patent/DE59706261D1/de not_active Expired - Lifetime
- 1997-09-23 JP JP51795898A patent/JP3999274B2/ja not_active Expired - Fee Related
- 1997-09-23 EP EP97943885A patent/EP0932819B1/de not_active Expired - Lifetime
- 1997-09-23 AT AT97943885T patent/ATE212714T1/de not_active IP Right Cessation